TY - CONF A1 - Madkour, Sherif A1 - Szymoniak, Paulina A1 - Heidari, Mojdeh A1 - von Klitzing, Regine A1 - Schönhals, Andreas T1 - Evidence of a three-layered structure in ultra-thin PVME and PVME/PS blend films by nano-sized relaxation spectroscopy N2 - Despite the many controversial discussions about the nanometric confinement effect and the predictions of the three-layer model, much remain not understood and/or experimentally unproven. Here, a combination of Broadband Dielectric Spectroscopy (BDS), Specific Heat Spectroscopy (SHS), and ellipsometry was utilized to investigate the glassy dynamics of ultra-thin films of Poly (vinyl methyl ether) (PVME) and PVME/Polystyrene (PS) 50:50 wt-% miscible blend (thicknesses: 8nm - 200nm). For BDS measurements, a recently developed nano-structured sample arrangement; where ultra-thin films are spin-coated on an ultra-flat highly conductive silicon wafer and sandwiched between a wafer with nanostructured silica nano-spacers, was used. For PVME films, two processes were observed and interpreted to be the α-processes of a bulk-like layer and an absorbed layer to the substrate. BDS and SHS showed that glassy dynamics are bulk-like. However, for films lower than 15nm, BDS showed weakly slowed dynamics. For PVME/PS blend, by a self-assembling process, a nanometer-thin surface layer with a higher molecular mobility is formed at the polymer/air interface. By measuring the dynamic Tg in dependence on the film thickness, both BDS and SHS, showed that the Tg of the whole film was strongly influenced by that nanometer thick surface layer, with a lower Tg. T2 - 80. Jahrestagung der DPG und DPG-Frühjahrstagung CY - Regensburg DA - 06.03.2016 KW - Ultra-thin films PY - 2016 AN - OPUS4-35540 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -