TY - CONF A1 - Radnik, Jörg A1 - Chemello, Giovanni A1 - Hodoroaba, Vasile-Dan A1 - Howe, T. A1 - Vyas, N. A1 - Reed, B. P. A1 - Pollard, A. J. A1 - Clifford, C. A. T1 - Reliable Chemical Characterization Protocols for Industrial Graphene-Related Materials N2 - Since its isolation, graphene has received growing attention from academia and industry due to its unique properties. Promising opportunities for applications are discussed in different field like electronics and optoelectronics, detection, and sensing devices, biosystems or chemical and environmental corrosion inhibition. Here, functionalization with elements like oxygen, nitrogen or fluorine can broaden the application, for example in composite materials. However, lack of generally accepted operation procedures hinders the commercialization, the so-called “what is my material” barrier. Therefore, first efforts were done to develop common, reliable, and reproducible ways to characterize the morphological and chemical properties of the industrially produced material. In this contribution, our efforts in the development of reliable chemical characterizations protocols for functionalized graphene are presented. An ISO standard for the chemical characterization of graphene-related (GRM) is under development with X-ray photoelectron spectroscopy (XPS) having a prominent role. With its information depth of around 10 nm, which is the similar length scale as the thickness of particles of 2D materials consisting of a few monolayers, XPS seems to be highly suitable for the quantitative analysis of (functionalized) GRM. Thereby, different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. Furthermore, different morphologies like stacks of graphene layers (left figure) or irregular particles (right figure) lead to different analysis results for the chemical composition. For the validation of the quantification with XPS and the further development of standards an international interlaboratory comparison was initiated under the head of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results are reported showing the suitability of the protocols. Finally, the XPS results are compared with the elemental composition results obtained after quantification with energy-dispersive X-ray spectroscopy (EDS) as a fast analytical method which is usually combined with electron microscopy. T2 - nanoSAFE 2023 CY - Grenoble, France DA - 05.06.2023 KW - X-ray photoelectron spectroscopy KW - Functionalized graphene KW - Interlaboratory comparison KW - VAMAS PY - 2023 AN - OPUS4-57652 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Chemello, Giovanni A1 - Hodoroaba, Vasile-Dan A1 - Howe, T. A1 - Vyas, N. A1 - Reed, B.P. A1 - Pollard, A.J. A1 - Clifford, C.A. T1 - Reliable chemical characterization of industrial graphene related materials N2 - International standards describing reliable protocols will facilitate the commercialization of graphene and related 2D materials. One physico-chemical key property next to flake size and thickness is the chemical composition of the material. Therefore, an ISO standard is under development with X-ray photoelectron spectroscopy having a prominent role. With its information depth of around 10 nm which is the similar length scale as the thickness as of particles of 2D materials consisting of a few monolayer XPS seems to be highly suitable for this purpose. Different sample preparation methods like pressing the powders onto adhesive tapes, into recesses, or into solid pellets result in inconsistencies in the quantification. For the validation of the quantification with XPS an interlaboratory comparison was initiated under the auspice of the “Versailles Project on Advanced Materials and Standards” (VAMAS). First results confirm that the sample preparation method (pellet vs. powder) influences the quantification results clearly. Considering this effect, a good agreement of the results from the different participants were observed. Similar results were observed for raw, N- and F-functionalized graphene. T2 - Graphene CY - Manchester, England, UK DA - 27.06.2023 KW - X-ray photoelectron spectroscopy KW - Functionalized graphene KW - Interlaboratory comparison KW - VAMAS PY - 2023 AN - OPUS4-57895 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dalgic, Mete-Sungur T1 - Lösemittelfreie Probenpräparation zur Untersuchung von Polymerblends mittels MALDI-TOF MS N2 - Die Probenpräparation ist ein wichtiger Schritt für die Qualität der Massenspektren in MALDI-TOF MS. Es werden Polymerproben, die lösungsmittelbasiert und lösungsmittelfrei präpariert worden sind, verglichen. Dabei werden die Intensitätsverhältnisse von ternären Mischungen von PEG-, PS- und PMMA-Polymeren beachtet. T2 - 28. Kolloquium - Massenspektrometrische Techniken zur Untersuchung synthetischer Polymere CY - Berlin, Germany DA - 14.05.2024 KW - Polymere KW - Massenspektrometrie KW - Probenpräparation PY - 2024 AN - OPUS4-60032 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Altmann, Korinna T1 - Mikroplastik Detektion mit Thermoanalytischen Methoden: Analytik, Referenzmaterial, Ringversuche N2 - Ich dem Vortrag geht es um die Vorstellung von thermoanalytischen Methoden für die Mikroplastik-Detektion. Verschiedene Kopplungsmöglichkeiten werden gezeigt und die Funktionsweise der TED-GC/MS wird erklärt. Im zweiten Teil werden Referenzmaterialien für die Mikroplastik-Analytik diskutiert. PET -Tabletten des PlasticTrace Projektes werden vorgestellt. Am Ende wird der VAMAS Ringversuch zur Mikroplastik-Detektion gezeigt. T2 - Plastik, Mikroplastik, Nanopartikel, PFAS und Verunreinigungen (Agilent Workshop) CY - Hamburg, Germany DA - 28.05.2024 KW - Mikroplastik KW - TED-GC/MS KW - Polymer 3R KW - Ringversuche KW - Referenzmaterial PY - 2024 AN - OPUS4-60155 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -