TY - CONF A1 - Halisch, M. A1 - Kruschwitz, Sabine A1 - Schmitt, M. A1 - Weller, Andreas T1 - Quantification of rock structures with high resolution X-Ray μ-CT for laboratory SIP measurements N2 - Spectral Induced Polarization (SIP) measurements are used in many different ways to characterize natural rocks and soils. Main foci of interest are the enhanced characterization of the causes of IP-effects in clastic rocks (especially sandstones), the interactions between the matrix-fluid-system and within the electrical double layers as well as the correlation with “classical” petrophysical parameters, such as specific surface area, permeability, mercury intrusion capillary pressure (MICP) and others. Nevertheless, for all of these investigations, knowledge of the inner structure of the sample material is essential in order to create reliable and validated models as well as to interpret and to assess the data most completely. Unfortunately, many of the methods used, to get access to the inner structure of rocks are destructive (e.g. MICP, thin sectioning, etc.) and the valuable sample is lost. In addition, data is either of volume integrated nature or only available for the 2D case and the usage of sister cores does not necessarily lead to reliable results. In this paper, the authors showcase the possibilities of non-destructive and three dimensional X-ray computed tomography and of enhanced image analysis capabilities for the quantification of rock structures at the pore scale. T2 - IP Workshop 2016 CY - Aarhus, Denmark DA - 06.06.2016 KW - SIP KW - μ-CT imaging KW - Rock structure KW - Digital image analysis KW - Pore geometry KW - Grain geometry PY - 2016 AN - OPUS4-37000 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -