TY - CONF A1 - Zscherpel, Uwe A1 - Schumacher, David A1 - Ewert, Uwe T1 - Recent developments of photon counting and energy discriminating detectors for radiographic testing N2 - The direct detection of X-ray photons into electrical signals is enabled by usage of highly absorbing photo conducting materials (e.g. CdTe) as detection layer of an underlying CMOS semiconductor X-ray image detector. If the read-out speed is high enough (ca. 50 – 100 ns dead time) single X-ray photons can be counted and their energy measured. Read-out noise and dark image correction can be diminished. By setting energy thresholds, selected energy ranges of the X-ray spectrum can be detected or suppressed. This allows material discrimination or reduction of scattered radiation, which results in an enhanced contrast sensitivity. T2 - 2017 Far East Forum on Nondestructive Evaluation & Testing CY - Xi`an, China DA - 21.06.2017 KW - Industrial X-ray imaging KW - Direct detection KW - Photon counting KW - Energy discrimination KW - Dual energy imaging PY - 2017 AN - OPUS4-41133 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -