TY - CONF A1 - Beck, Uwe A1 - Griepentrog, Michael A1 - Hertwig, Andreas A1 - Hielscher-Hofinger, Stefan A1 - Lange, Thorid A1 - Weise, Matthias T1 - Uncertainty budgets in surface technology: stepheigt, layerthickness, indentation hardness, adehesive strength N2 - The object (sample) and the measurement/testing procedure may always have unknown degrees of freedom, i.e. instead of 𝐯 ≥ n – 1 in many cases 𝐯 ≫ n - 1 may apply, in particular in the micro- and nano-world! T2 - 10. VDI-Fachtagung, Messunsicherheit und Prüfprozesse CY - Erfurt, Germany DA - 10.11.2021 KW - Methodology in metrology KW - Methodology in testing KW - Spectroscopic Ellipsometry KW - Instrumented Indentation Testing (IIT) KW - Centrifugal Adhesion Testing (CAT) PY - 2021 AN - OPUS4-53986 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Griepentrog, Michael A1 - Hertwig, Andreas A1 - Hielscher-Hofinger, S. A1 - Lange, Thorid A1 - Weise, Matthias T1 - Uncertainty budgets in surface techno-logy: step height, layer thickness, indentation hardness, adehesive strength N2 - The object (sample) and the measurement/testing procedure may always have unknown degrees of freedom, i.e. instead of 𝐯 ≥ n – 1 in many cases 𝐯 ≫ n - 1 may apply, in particular in the micro- and nano-world! T2 - 10. VDI-Fachtagung, Messunsicherheit und Prüfprozesse CY - Erfurt, Germany DA - 10.11.2021 KW - Methodology in metrology KW - Methodology in testing KW - Spectroscopic Ellipsometry KW - Instrumented Indentation (IIT) KW - Centrifugal Adhesion Testing (CAT) PY - 2021 AN - OPUS4-53739 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Baier, Jennifa A1 - Fischer, Daniel A1 - Griepentrog, Michael A1 - Hertwig, Andreas A1 - Hielscher-Hofinger, Stefan A1 - Sahre, Mario A1 - Stockmann, Jörg Manfred A1 - Weise, Matthias T1 - Mapping und Imaging modifizierter Oberflächen: Generische Kenngrößen, Fehlstellen, Reinigungszustand und Haftfestigkeit N2 - Der Vortrag widmet sich dem Mapping und Imaging modifizierter Oberflächen: Generische Kenngrößen, Fehlstellen, Reinigungszustand und Haftfestigkeit. Es werden Untersuchungsmethoden zu ihrer Prüfung dargestellt. T2 - 37. ak-adp 2021, Jena CY - Online meeting DA - 16.06.2021 KW - Qualitätssicherung KW - Mapping modifizierter Oberflächen KW - Generische Kenngrößen KW - Haftfestigkeit KW - Klebfestigkeit PY - 2021 AN - OPUS4-52870 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Mitzkus, Anja A1 - Sahre, Mario A1 - Lange, Thorid A1 - Weise, Matthias A1 - Bartholmai, Matthias A1 - Schukar, Vivien A1 - Basedau, Frank A1 - Hofman, Detlef A1 - Köppe, Enrico T1 - From on line sensor validation to in-situ monitoring of layer growth: coatings around fibre bragg gratings N2 - The lack of on-line validation procedures for structure-embedded fiber-optical strain sensors, in particular fiber-Bragg-gratings (FBG), resulted in limited applications in structural health monitoring (SHM). Degradation under service conditions and ageing as a result of climatic influences or delamination under load were unsolved Validation issues. This could be overcome by means of an auto-diagnosis procedure based on FBG-sensors coated by electrochemical deposition (ECD) with a magnetostrictive NiFe-coating on top of an adhesive Cu/Cr adhesive layer deposited by physical vapour deposition (PVD) around the FBG strain sensor. This allows at any time under Service a validation of sensor functionality, stability, and reliability. For this purpose, a magnetic strain-proportional reference field is introduced. The optical read-out is realized by the measurement of the Bragg-wavelength shift. The ratio of resulting strain and exciting magnetic reference field should be constant given that the sensor is in proper function. In principle, the magnetostrictive coating around the FBG should also work as on-line magnetic field sensor and other applications in material science. One of these applications is the in-situ monitoring of ECD processes as the deposition of the ECD NiFe-layer on the FBG revealed. Challenges are the monitoring of temperature, deposition stages/thickness, and resulting mechanical stress under given plating conditions. Monitoring problems can be solved by applying a pre-coated FBG to the electrolytic process as the shift of the Bragg wavelength is affected by both the temperature of the electrolyte near the substrate and the stress formation in the growing layer. The experimental FBG set-up and the quantitative determination of temperature- and stress-related strain are described for a nickeliron electrolyte. The in-situ measurement of Bragg wavelength shifts of a pre-coated FBG during electrochemical deposition allows a detailed analysis of stress states due to changes in the growth morphology of the layer. The separation of mechanical and thermal contributions to this shift provides information on the individual Deposition processes in terms of a process fingerprint. T2 - ICMCTF 2021 San Diego/on-line CY - Online meeting DA - 28.04.2021 KW - Fiber- Bragg-gratings (FBG) KW - Physical vapour deposition (PVD) KW - Electrochemical deposition (ECD) KW - Magnetostrictive coating KW - ECD NiFe-layer PY - 2021 AN - OPUS4-52898 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Hertwig, Andreas A1 - Hielscher, Stefan A1 - Weise, Matthias T1 - Characterization of Materials: Uncertainty Budgets in Measurement and Testing N2 - The comprehensive knowledge of material properties as engineered and the material behavior in use is of huge importance for the functionality and reliability of processes and products. Hence, the accurate determination of material properties is a prerequisite for the applicability of a given material. Nowadays, macroscopic product features are originated by material properties on the microscopic and nanoscopic scale. This is a general challenge for uncertainty budgets in measurement and testing based on a conformity assesment. Testing labs accreditated according to DIN EN ISO/IEC 17025 have to meet these demands. This paper focuses on the measurement of physical quantities (measurand with value and unit) and on the testing of material properties (qualitative, semi-quantitative or quantitative characteristics) of solid state materials. For both measurement and testing, the expression of uncertainty according to GUM is essential. Regarding the object/sample one has to subdivide in surface and bulk features, from the measurement/testing point of view destructive vs. nondestructive procedures have to be distinguished. Moreover, direct mesurement/testing and model-based determination of quantities/properties of interest require different approaches regarding the expression of uncertainty. For surface quantities and properties as discussed here, further considerations have to be made with respect to localized (lateral extension, native or artificial) or stratified (homogeneity and isotropy) material features vs. mapping (integration area) and imaging (lateral resolution and field of analysis) specifications of the measurement/testing procedure. The concept of uncertainty budgets and the expression of uncertainty is introduced and discussed in more detail for the nondestructive model-based determination of thickness by spectroscopic ellipsometry (SE), the destructive determination of adhesion by means of centrifugal adhesion testing (CAT). It is shown that the expression of uncertainty for these examples and real materials requires different approaches resulting in either quantitity values with unit or qualitative/quantititative attributes with calculated/estimated uncertainties in agreement with GUM. T2 - The 4th International Conference on Competitive Materials and Technology Processes, ic-cmtp4, 2016 CY - Miskolc-Lillafüred, Hungary DA - 03.10.2016 KW - Measurement and testing KW - Uncertainty budgets KW - Expression of uncertainty PY - 2016 AN - OPUS4-37841 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Hertwig, Andreas T1 - Ringversuch zur Klassifizierung von Kohlenstoffschichten mittels Ellipsometrie N2 - Der Vortrag widmet sich dem „Ringversuch zur Klassifizierung von Kohlenstoffschichten mittels Ellipsometrie“ und beschreibt die experimentellen Eckdaten, die Ellipsometrie als Messmethode am Beispiel DLC auf Stahl, Proben vs. n-k Ebene vs. Ergebnisse des Ringversuches, messtechnische Bewertung des Ringversuches und normative Bewertung des Ringversuches sowie Schlussfolgerungen. T2 - 9. Sitzung DIN NA 062-01-64 „Kohlenstoffschichten“ CY - Berlin, Deutschland DA - 09.05.2016 KW - Amorphe Kohlenstoffschichten KW - Optische Konstanten KW - Ellipsometrie KW - Klassifizierungssystem PY - 2016 AN - OPUS4-38041 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Unger, Wolfgang A1 - Griepentrog, Michael A1 - Hertwig, Andreas T1 - Plasma Germany, Fachausschuss Normung, Herbstsitzung 2016 N2 - Der Stand der Normung im Bereich der Oberflächentechnik wird zusammengefasst. Aktuelle Normungsvorhaben zur chemischen Oberflächenanalyse, Rastersondenmikroskopie, Nanotechnologie, Oberflächenmesstechnik im Mikro- und Nanobereich, für Anwendungen von Kohlenstoffschichten sowie von Mess- und Prüfverfahren für metallische und anorganische Überzüge werden vorgestellt. Ein Ringversuch zur Klassifizierung von Kohlenstoffschichten mittels Ellipsometrie wird diskutiert. Abschließend wird das DIN-Terminologie Portal erläutert. T2 - Lenkungsausschuss von Plasma Germany, Fachausschuss Normung, Herbstsitzung 2016 CY - Stuttgart, Germany DA - 27.10.2016 KW - Stand der Normung KW - Oberflächentechnik KW - Schichttechnik PY - 2016 AN - OPUS4-38068 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Hiratsuka, M. A1 - Spindler, Ch. A1 - Ohtake, N. A1 - Hertwig, Andreas A1 - Becker, J. A1 - Gäbler, J. A1 - Neubert, Th. A1 - Vergöhl, M. A1 - Winkler, J. A1 - Eypert, C. T1 - Interlaboratory comparison: optical property classification of carbon-based films by ellipsometry N2 - The paper addresses the “INTERLABORATORY COMPARISON: OPTICAL PROPERTY CLASSIFICATION OF CARBON-BASED FILMS BY ELLIPSOMETRY” and the following points are discussed in more detail: Established classification for mechanical properties, Complementary classification for optical properties, Ellipsometry for determination of optical constants n-k plane as material fingerprint, Samples, participants & set-ups (samples: Japan, participants: Japan, Germany, France, set-ups: Japan, Germany, USA) and Results of interlaboratory comparison: thickness, n & k. T2 - ISO TC 107 Meeting Tokyo CY - Tokio, Japan DA - 17.01 2017 KW - Interlaboratory Comparison KW - Optical Property KW - Carbon-based Films KW - Ellipsometry PY - 2017 AN - OPUS4-39028 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Griepentrog, Michael A1 - Hielscher, Stefan A1 - Lange, Thorid T1 - Haftung und Haftfestigkeit: Grundlagen, Einflussgrößen, Prüfverfahren – Eine Übersicht N2 - Der Vortrag widmet sich Haftung und Haftfestigkeit bezüglich Grundlagen, Einflussgrößen sowie Prüfverfahren und beschreibt die Punkte: Generische und spezifische Motivation, Einflussgrößen auf Haftfestigkeit und Haftung von Beschichtungen, Prüfverfahren zur quantitativen Bestimmung der Haftfestigkeit und zur qualitativen Klassifizierung bzw. semi-quantitativen Bewertung der Haftung im Einzelnen. T2 - EFDS, 17. Wörlitzer Workshop "Schichthaftung - Anwendungsbeispiele aus der Praxis" CY - Oranienbaum-Wörlitz, Germany DA - 06.06.2016 KW - Haftfestigkeit KW - Klebfestigkeit KW - Verbundfestigkeit PY - 2016 AN - OPUS4-37479 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe A1 - Hielscher, Stefan A1 - Stockmann, Jörg M. T1 - Zentrifugentechnologie in der Beanspruchung auf Zug und Druck; Zug-und Zugscherprüfung von CFK N2 - Der Vortrag widmet sich der Zentrifugentechnologie und beschreibt die Punkte der Beanspruchung auf Zug und Druck, Zug- und Zugscherprüfung von geklebten CFK-Platten im Einzelnen. T2 - Videokonferenz CY - Dingolfing, Germany DA - 13.06.2016 KW - Zentrifugentechnologie KW - Klebfestigkeit KW - Härteprüfung KW - CFK PY - 2016 AN - OPUS4-37494 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -