TY - JOUR A1 - Unger, Wolfgang A1 - Beiranvand, Z. A1 - Kakanejadifard, A. A1 - Donskyi, Ievgen A1 - Faghani, A. A1 - Tu, Z. A1 - Lippitz, Andreas A1 - Sasanpour, P. A1 - Maschietto, F. A1 - Paulus, B. A1 - Haag, R. A1 - Adeli, M. T1 - Functionalization of fullerene at room temperature: toward new carbon vectors with improved physicochemical properties N2 - In this work, fullerene has been functionalized with cyanuric Chloride at room temperature by a nitrene mediated [2 + 1] cycloaddition reaction. The adduct after functionalization is inherently in the form of azafulleroid and shows broad UV absorption in the wavelength range of 200–800 nm, as well as photothermal conversion and fluorescence with a high quantum yield. KW - Functionalization of fullerenes KW - XPS KW - NEXAFS PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-387076 DO - https://doi.org/10.1039/c6ra23419d SN - 2046-2069 VL - 6 IS - 114 SP - 112771 EP - 112775 PB - Royal Society of Chemistry (RSC) AN - OPUS4-38707 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mielke, Johannes A1 - Dohányosová, P. A1 - Lopez, S. A1 - Hodoroaba, Vasile-Dan T1 - Electrospray deposition of nanoparticles on TEM grids N2 - The authors have tested the prototype of an electrospray deposition system developed by the company RAMEM under its trademark IONER. To test the prototype and assess its performance, several materials have been sprayed onto TEM grids and the resulting particle distributions were compared to more traditional sample preparation strategies like the “drop on grid” method. Operation parameters such as the sample flow-rate, capillary – substrate distance, electric field strength and sampling period length have been optimized. It was found that the particles deposited by electrospray generally show a much more homogeneous spatial distribution on the substrate and a substantial increase of the number of single particles, which are much better suited to an automatic image evaluation procedure than the agglomerated particles observed otherwise. The applicability of the technique to a broad range of materials is demonstrated by various examples, but also the influence of the substrate, the choice of the particular TEM grid, on the obtained spatial particle distribution is assessed. KW - Electrspray deposition KW - Electron microscopy KW - Nanoparticles KW - Sample preparation PY - 2016 UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/electrospray-deposition-of-nanoparticles-on-tem-grids/459E634B7F74D474A19E15E69DA82E5D DO - https://doi.org/10.1017/S1431927616010072 SN - 1431-9276 SN - 1435-8115 VL - 22 IS - Suppl 3 SP - 1846 EP - 1847 PB - Cambridge AN - OPUS4-38436 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mielke, Johannes T1 - Evaluation of particle sizing techniques for the implementation of the EC definition of a nanomaterial N2 - What is a nanomaterial? Beyond a pure academic interest, this question has substantial im-plications for consumer protection and regulatory purposes. The European Commission has recommended a definition of nanomaterial (2011/696/EU), which states that a given material is considered a nanomaterial if more than 50 % of the particles in the number size distribution have a smallest dimension between 1 and 100 nm. Although several well established particle sizing techniques exist, the implementation of this definition for any particulate material remains a metrological challenge. The European research project NanoDefine (http://www.nanodefine.eu) has the aim of pro-viding help for the implementation of the definition. One central task is the performance evaluation of the available particle sizing techniques. For this purpose, a wide variety of real world materials has been selected. All available sizing techniques, including imaging, mobility-based and static scattering techniques, independent whether being counting, fractionating, spectroscopic or integrally sizing, will be applied to all of the projects materials to test the techniques performance and to establish their ranges of applicability. Because most of the techniques do not measure in number metrics as required in the nanomaterial definition, the quality of the conversion to the number based particle size distribution is assessed as well. Special care is taken on suitable sample preparation procedures as one of the most chal-lenging issues towards reaching a highly accurate result. Within this contribution, first results of the performance testing of state of the art characterisation techniques on the unique set of NanoDefine real world materials are going to be presented. From these results, first conclu-sions about the material dependent ranges of applicability for the considered particle sizing techniques can be drawn. The technique specific advantages and shortcomings with respect to the application of the EC definition as well as the analytical challenges encountered will be highlighted. Acknowledgements: The research leading to these results has received funding from the European Community's Seventh Framework Programme (FP7/2007-2013) under grant agreement n° 604347. T2 - PARTEC CY - Nürnberg, Germany DA - 19.04.2016 KW - Nanomaterial PY - 2016 AN - OPUS4-35802 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Berger, D. T1 - Determination of the Effective Detector Area of an Energy-Dispersive X-Ray Spectrometer at the Scanning Electron Microscope Using Experimental and Theoretical X-Ray Emission Yields N2 - A method is proposed to determine the effective detector area for energy-dispersive X-ray spectrometers (EDS). Nowadays, detectors are available for a wide range of nominal areas ranging from 10 up to 150mm2. However, it remains in most cases unknown whether this nominal area coincides with the “net active sensor area” that should be given according to the related standard ISO 15632, or with any other area of the detector device. Moreover, the specific geometry of EDS installation may further reduce a given detector area. The proposed method can be applied to most scanning electron microscope/EDS configurations. The basic idea consists in a comparison of the measured count rate with the count rate resulting from known X-ray yields of copper, titanium, or silicon. The method was successfully tested on three detectors with known effective area and applied further to seven spectrometers from different manufacturers. In most cases the method gave an effective area smaller than the area given in the detector description. KW - Energy-dispersive X-ray spectrometer (EDS) KW - EDX KW - Effective area KW - X-ray emission yield KW - Geometrical collection efficiency PY - 2016 UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/div-classtitledetermination-of-the-effective-detector-area-of-an-energy-dispersive-x-ray-spectrometer-at-the-scanning-electron-microscope-using-experimental-and-theoretical-x-ray-emission-yieldsdiv/E15B2E67C349201CF323E778EB9C6D94 DO - https://doi.org/10.1017/S1431927616011788 VL - 22 IS - 6 SP - 1360 EP - 1368 PB - Cambridge University Press CY - New York, NY, USA AN - OPUS4-38858 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Can today’s methods afford to easily and reliably classify nanomaterials? N2 - In the contribution the NanoDefine sizing techniques are discussed after their systematic evaluation on NanoDefine materials. The results of the comparative study BET versus electron microscopy are also discussed. Furthermore, recommendations for application of the gained knowledge are given. T2 - NanoDefine Workshop Analytical Challenges and Industry Needs CY - Frankfurt, Germany DA - 08.02.2016 KW - Nanomaterial PY - 2016 AN - OPUS4-35924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Method evaluation and selection N2 - In this contribution the particle sizing techniques evaluated in NanoDefine are presented together with recommendations for their application/implementation on real-world materials. The experimental evaluation is discussed based on examples on NanoDefine materials. A systematic study on volume specific surface area as derived from BET measurements versus electron microscopy on powdered materials is also presented. T2 - NanoDefine NSC Synergy workshop CY - Brussels, Belgium DA - 02.02.2016 KW - nanomaterial PY - 2016 AN - OPUS4-35923 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - From k-values to elemental composition by EMPA (EDX & WDX) N2 - k-values (k-ratio, K-value) is defined as ratio of the X-ray photon intensity I measured for a particular characteristic peak from the unknown sample to the value measured for the same X-ray peak from a reference material of known composition under identical conditions of beam energy, spectrometer efficiency and electron dose. T2 - CCQM - Surface and Micro/Nano Analysis Working Group (SAWG) Meeting for 2016 CY - Paris, France DA - 19.04.2016 KW - k-values KW - EPMA KW - EDX KW - WDX PY - 2016 AN - OPUS4-35794 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Proposal of an inter-laboratory comparison on shape of bipyramidal TiO2 nanoparticles by TEM N2 - A proposal of an inter-laboratory study (ILC) on determination of size and shape distribution of TiO2 nanoparticles (NPs) by transmission electron microscopy is presented. The anatase NPs synthesized in a controllable fashion within the EU/FP7 project SETNanoMetro can be considered as shape-defined (bipyramidal) and are offered to complete the list of case studies already in progress within ISO/TC229/JWG2. The main points of the measurement procedure are presented as well as a proposed procedure to evaluate the size and shape according to the standard operation procedure already developed within SETNanoMetro is discussed. Potential ILC participants and a plan with next step to be carried out are proposed. T2 - Joint Meeting IEC TC 113 'Nanotechnology for electrotechnical products and systems' and ISO/TC229/JWG2 'Nanotechnologies'/'Measurement and characterization' CY - Lowell, MA, USA DA - 09.05.2016 KW - Nanoparticles KW - TiO2 KW - TEM KW - Shape KW - Inter-laboratory comparison KW - ISO PY - 2016 AN - OPUS4-38900 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mielke, Johannes A1 - Babick, F. A1 - Uusimäki, T. A1 - Müller, P. A1 - Verleysen, E. A1 - Hodoroaba, Vasile-Dan T1 - Evaluation of electron microscopy techniques for the purpose of classification of nanomaterials N2 - Electron microscopy techniques such as TEM, STEM, SEM or TSEM (transmission in SEM) are capable of assessing the size of individual nanoparticles accurately. Nevertheless, the challenging aspect is sample preparation from powder or liquid form on the substrate, so that a homogeneous distribution of well-separated (deagglomerated) particles is attained. The systematic study in this work shows examples where the extraction of the critical, smallest particle dimension - as the decisive particle parameter for the classification as a NM - is possible by analysing the sample after ist simple, dry preparation. The consequences of additional typical issues like loss of information due to screening of smaller particles by larger ones or the (in)ability to access the constituent particles in aggregates are discussed. KW - Nanomaterial KW - Electron microscopy KW - Particle size distribution KW - Classification PY - 2016 UR - https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/evaluation-of-electron-microscopy-techniques-for-the-purpose-of-classification-of-nanomaterials/0B66A25EA7F7A5A3622C02A359C8304F DO - https://doi.org/10.1017/S1431927616005523 SN - 1431-9276 SN - 1435-8115 VL - 22 IS - Suppl. 3 SP - 936 EP - 937 PB - Cambridge AN - OPUS4-38445 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K. J. A1 - Kim, A. S. A1 - Jang, J. S. A1 - Suh, J. K. A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Araujo, J. R. A1 - Archanjo, B. S. A1 - Galhardo, C. E. A1 - Damasceno, J. A1 - Achete, C. A. A1 - Wang, H. A1 - Wang, M. A1 - Bennett, J. A1 - Simons, D. A1 - Kurokawa, A. A1 - Terauchi, S. A1 - Fujimoto, T. A1 - Streeck, C. A1 - Beckhoff, B. A1 - Spencer, S. A1 - Shard, A. T1 - Measurement of mole fractions of Cu, In, Ga and Se in Cu(In,Ga)Se2 films N2 - CCQM key comparison K-129 for the quantitative analysis of Cu(In,Ga)Se2 (CIGS) films has been performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The objective of this key comparison is to compare the equivalency of the National Metrology Institutes (NMIs) and Designated Institutes (DIs) for the measurement of mole fractions of Cu, In, Ga and Se in a thin CIGS film. The measurand of this key comparison is the average mole fractions of Cu, In, Ga and Se of a test CIGS alloy film in the unit of mole fraction (mol/mol). Mole fraction with the metrological unit of mol/mol can be practically converted to atomic fraction with the unit of at%. In this key comparison, a CIGS film with certified mole fractions was supplied as a reference specimen to determine the relative sensitivity factors (RSFs) of Cu, In, Ga and Se. The mole fractions of the reference specimen were certified by isotope dilution - inductively coupled plasma/mass spectrometry (ID-ICP/MS) and are traceable to the SI. A total number counting (TNC) method was recommended as a method to determine the signal intensities of the constituent elements acquired in the depth profiles by Secondary Ion Mass Spectrometry (SIMS), X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES). Seven NMIs and one DI participated in this key comparison. The mole fractions of the CIGS films were measured by depth profiling based-SIMS, AES and XPS. The mole fractions were also measured by non-destructive X-Ray Fluorescence (XRF) Analysis and Electron Probe Micro Analysis (EPMA) with Energy Dispersive X-ray Spectrometry (EDX). In this key comparison, the average degrees of equivalence uncertainties for Cu, In, Ga and Se are 0.0093 mol/mol, 0.0123 mol/mol, 0.0047 mol/mol and 0.0228 mol/mol, respectively. These values are much smaller than that of Fe in a Fe-Ni alloy film in CCQM K-67 (0.0330 mol/mol). This means that the quantification of multi-element alloy films is possible by depth profiling analysis using the TNC method. KW - CIGS KW - Key comparison KW - CCQM KW - SIMS KW - XPS KW - AES KW - XRF KW - EPMA PY - 2016 UR - http://iopscience.iop.org/article/10.1088/0026-1394/53/1A/08011 DO - https://doi.org/10.1088/0026-1394/53/1A/08011 SN - 0026-1394 SN - 1681-7575 VL - 53, Technical Supplement SP - Article 08011, 1 EP - 19 PB - IOP Publishing AN - OPUS4-38110 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -