TY - GEN A1 - Kern, Simon A1 - Liehr, Sascha A1 - Wander, Lukas A1 - Bornemann-Pfeiffer, Martin A1 - Müller, S. A1 - Maiwald, Michael A1 - Kowarik, Stefan T1 - Training data of quantitative online NMR spectroscopy for artificial neural networks N2 - Data set of low-field NMR spectra of continuous synthesis of nitro-4’-methyldiphenylamine (MNDPA). 1H spectra (43 MHz) were recorded as single scans. Two different approaches for the generation of artificial neural networks training data for the prediction of reactant concentrations were used: (i) Training data based on combinations of measured pure component spectra and (ii) Training data based on a spectral model. Synthetic low-field NMR spectra First 4 columns in MAT-files represent component areas of each reactant within the synthetic mixture spectrum. Xi (“pure component spectra dataset”) Xii (“spectral model dataset”) Experimental low-field NMR spectra from MNDPA-Synthesis This data set represents low-field NMR-spectra recorded during continuous synthesis of nitro-4’-methyldiphenylamine (MNDPA). Reference values from high-field NMR results are included. KW - NMR spectroscopy KW - Real-time process monitoring KW - Artificial neural networks KW - Online NMR spectroscopy KW - Automation KW - Process industry PY - 2020 U6 - https://doi.org/10.5281/zenodo.3677139 PB - Zenodo CY - Geneva AN - OPUS4-50456 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kowarik, Stefan A1 - Pithan, L. T1 - kowarik-labs/AI-reflectivity: v0.1 N2 - AI-reflectivity is a code based on artificial neural networks trained with simulated reflectivity data that quickly predicts film parameters from experimental X-ray reflectivity curves. This project has a common root with (ML-reflectivity)[https://github.com/schreiber-lab/ML-reflectivity] and evolved in parallel. Both are linked to the following publication: Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks A. Greco, V. Starostin, C. Karapanagiotis, A. Hinderhofer, A. Gerlach, L. Pithan, S. Liehr, F. Schreiber, S. Kowarik (2019). J. Appl. Cryst. For an online live demonstration using a pre-trained network have a look at github. KW - Artificial neural networks KW - X-ray reflectivity PY - 2019 U6 - https://doi.org/10.5281/zenodo.3477583 PB - Zenodo CY - Geneva AN - OPUS4-51888 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -