TY - CONF A1 - Eggert, Claudia A1 - Hodoroaba, Vasile-Dan T1 - Welcome and Introduction N2 - Nanotechnology has emerged over the past decade as a key field involving the design, characterization, production, and application of materials, structures, devices, and systems at the nanometer scale. Due to their large specific surface area and significant surface chemistry, nanomaterials offer enhanced material properties and product functionalities. However, alongside these advancements comes the potential risk to humans and the environment. The development of nanomaterials has provided new opportunities to understand matter at the nanoscale, accelerating the creation of innovative advanced materials and devices. The expertise gained in the standardization and regulation of nanomaterials, particularly in characterizing nanoparticulate matter, should be applied to other innovative advanced materials, such as (nano)composites, 2D structures, additive manufactured materials, gels, and foams. Initial guidance for the safe-and-sustainable-by-design (SSbD) development of advanced materials during the early innovation phase has been introduced by various groups and projects. Additionally, digital material passports (DMP) and digital product passports (DPP) need to be defined and implemented uniformly across Europe. In 2024, the Innovative Advanced Materials Initiative (IAM-I) was launched by European stakeholders to contribute to a "Research and Innovation ecosystem that will significantly accelerate the time-to-market of sustainable innovative advanced materials (IAMs) and associated technologies designed for a digital circular economy." Knowledge transfer is a crucial pillar of this ecosystem, and a future IAM-I Academy could be a valuable tool. Initially, it is essential to define "education & training needs to boost Europe’s competitiveness and sovereignty within the area of IAM." T2 - Nano and Beyond - What can we learn from Nano for other Innovative Advanced Materials? CY - Online meeting DA - 04.07.2025 KW - Advance Materials KW - Nanomaterials KW - IAM-I KW - SSbD KW - DMP KW - DPP PY - 2025 UR - https://www.bam-akademie.de/kursangebot/kurs/webinar-nano-and-beyond-55.html?lang=en AN - OPUS4-63690 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced physico-chemical Characterisation & Correlation of Results with different Methods for GFMs N2 - An accurate characterisation of the morphological, structural, and chemical properties of nano and advanced materials is key for the understanding of the material functionality and constitutes the basis for future optimisation or even prediction of the product performance. Further, the correlation of the physical-chemical properties with results from biological testing leads to an understanding of the potential toxicological effects so that a minimisation of the materials risks becomes possible. The presentation will highlight with examples the importance of the selection of the relevant parameters/descriptors and particularly their measurement for the reliable characterisation of the morphology, structure, and chemistry of graphene-related 2D-materials (GR2M’s) [1-3]. One crucial aspect is also one of most challenging ones in the characterisation chain: the proper sample preparation, which shall be tailored to the accurate measurement of the defined analytical parameter. Practical examples of measurement of morphological descriptors of GR2M’s, such as equivalent circular diameter (ECD), minimum and maximum Feret, and aspect ratio with electron microscopy, or of the thickness with atomic force microscopy (AFM) will be showed, together with quantitative chemical characterisation with X-ray photoelectron spectroscopy (XPS) and, newly, with energy-dispersive X-ray spectroscopy with a scanning electron microscope (SEM/EDX) [4] by evaluating accurately the elemental content as the ratio of O/C and the composition of impurities. Another relevant, but challenging part of the characterisation of GR2M’s, particularly as the final products containing mostly low amounts of GR2M’s, is the analysis of homogeneity of the chemical composition by sensitive imaging methods. Examples of successful analysis with secondary ion mass spectrometry (SIMS), even if not quantitative, will be presented. T2 - Joint online Workshop: Harmonisation & Standardisation of Test Methods for Nano- and Advanced Materials CY - Paris, France DA - 19.06.2025 KW - Physico-chemical characterisation KW - Graphene-related 2D materials KW - OECD KW - Standardisation KW - GO flakes PY - 2025 UR - https://macrame-project.eu/macrame-meetings-workshops/ws_hamonisation_standardisation_2023/ AN - OPUS4-63557 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - (Pre)Standardisation and Metrology in Microbeam Analysis – Ongoing Activities and Opportunities N2 - The presentation addresses the current ongoing projects as well as the gaps and opportunities in microbeam analysis within ISO/TC 202 Microbeam Analysis standardisation body and in-liaison Technical Working Areas (TWAs) at the pre-standardization platform of VAMAS (Versailles Project on Advanced Materials and Standards). T2 - EMAS 2023 - 17th European Workshop on Modern Developmennts and Applications in Microbeam Analysis - General Assembly CY - Krakow, Poland DA - 07.05.2023 KW - Microbeam analysis KW - EDS KW - Electron microscopy KW - Inter-laboratory comparison KW - EBSD KW - Standardisation PY - 2023 AN - OPUS4-57483 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of the Lateral Size of Graphene Oxide Flakes by SEM N2 - The progress of the VAMAS interlaboratory comparison Project P13 "Lateral size of graphene oxide flakes by SEM" within the Technical Working Area 41 "Graphene and Related 2D Materials" is presented. The challenges at sample preparation on substrates for accurate measurement and image analysis as well as two different analysis approaches, containing exact guidance how to measure the main descriptors for the lateral size measurement of the imaged graphene oxide flakes with Scanning Electron Microscopy are highlighted. The size and shape distributions as measured by 17 laboratories are showed expressed in size and shape descriptors extracted from SEM images by using two proposed measurement approaches. The implementation of the results into the corresponding ISO technical specification AWI/TS 23879 is discussed and planned, in relation with the AFM part. T2 - ISO/TC 229 Nanotechnologies Meeting Week CY - Stockholm, Sweden DA - 19.05.2025 KW - Graphene oxide KW - Interlaboratory comparison KW - SEM KW - Lateral size KW - VAMAS KW - ISO/TC 229 Nanotechnologies PY - 2025 AN - OPUS4-63189 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sachse, René A1 - Moor, Maëlle A1 - Kraehnert, Ralph A1 - Hodoroaba, Vasile-Dan A1 - Hertwig, Andreas T1 - Ellipsometry-based approach for the characterization of mesoporous thin films for H2 technologies N2 - Porous thin layer materials are gaining importance in different fields of technology and pose a challenge to the accurate determination of materials properties important for their function. In this work, we demonstrate a hybrid measurement technique using ellipsometry together with other independent methods for validation. Ellipsometry provides information about the porosity of different mesoporous films (PtRuNP/OMC = 45%; IrOx = 46%) as well as about the pore size (pore radius of ca. 5 nm for PtRuNP/OMC). In addition, the electronic structure of a material, such as intraband transitions of a mesoporous IrOx film, can be identified, which can be used to better understand the mechanisms of chemical processes. In addition, we show that ellipsometry can be used as a scalable imaging and visualization method for quality assurance in production. These require accurate and traceable measurements, with reference materials playing an important role that include porosity and other related properties. We show that our novel analytical methods are useful for improving analytical work in this entire field. KW - Porous materials KW - Electrolysis KW - Spectroscopic ellipsometry KW - Hybrid metrology measurement KW - Electron microscopy PY - 2021 DO - https://doi.org/10.1002/adem.202101320 SP - 1 EP - 17 PB - Wiley-VCH AN - OPUS4-53960 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS interlaboratory comparisons on nanoparticles associated with the outcomes of the EMPIR project nPSize N2 - Following points are presented and discussed: i) nPSize as an EMPIR project on the nanoparticle size and shape distribution of (more) complex particles including sample preparation and machine learning approaches; ii) parallel development of ISO 21363 (PSSD by TEM), ISO 19749 (PSSD by SEM), ISO 22292 (3D TEM), ISO 52408 (NP Prep for AFM and EM), iii) VAMAS and pre-standardisation, TWA 34 „Nanoparticle Populations“ with two nPSize ILC projects P15 & P16 – results to be published and integrated in ISO 21363 (PSSD by TEM); iv) Remaining challenges: platelets, 2D materials (TiO2 and GR2M); v) Reference data sets as part of a complete Characterisation Workflow. T2 - How to identify Nanomaterials more effectively? Good Practices and Ways to Progress CY - Paris, France DA - 11.05.2023 KW - Nanoparticles KW - VAMAS KW - nPSize KW - Particle size distribution KW - Nanoparticle concentration KW - Interlaboratory comparison PY - 2023 UR - https://www.lne.fr/fr/service/formation/journee-technique-nanomateriaux-comment-identifier-efficacement-nanomateriaux?utm_source=Twitter&utm_medium=Tweet&utm_campaign=JT2301 AN - OPUS4-57485 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ongoing VAMAS ILC s on Nanoparticles and Graphene Oxide N2 - This contributions shows the first results of the ongoing interlaboratory comparisons under VAMAS/TWA 34 Nanoparticle populations related on the determination of pasrticle size distribution and relative concentration of nanoparticles and an example of an ILC running under VAMAS/TWA 41 Graphene and Related 2D Materials on the determination of the lateral diemsnions of graphene oxide flakes by Scanning Electron Microscopy. The link to related standardisation projects at ISO/TC Nanotechnologies are explained. T2 - Webinar Building the Foundation: Interlaboratory Comparisons and Reference Products for Advanced Materials CY - Berlin, Germany DA - 16.05.2024 KW - Nanoparticles KW - VAMAS KW - Interlaboratory comparison KW - Standardisation KW - Electron microscopy KW - AFM KW - SAXS PY - 2024 AN - OPUS4-60097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Habibimarkani, Heydar T1 - Time-of-flight secondary ion mass spectrometry (ToF-SIMS) for in situ investigation on FeNi nanoparticles N2 - The modern economy is dependent on catalysis, which is main efforts to create environmentally and energy-friendly technologies. The storage of excess electrical energy into chemical energy by splitting water into hydrogen and oxygen is a feasible solution to this energy demand. Due to their abundance on Earth and inherent stability in alkaline solution, transition-metal oxides have become one of several viable alternatives to noble-metal catalysts. Since NiFe oxide is one of the most active oxygen evolution reaction (OER) electrocatalysts for alkaline water electrolysis, it has been the subject of extensive research. In this work, NiFe2O4 nanoparticles (NPs) of various sizes, specific stoichiometric and non-stoichiometric Fe:Ni surface ratios are synthesized. we will use a combination of ultra-high vacuum surface analysis techniques, such as time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS), to obtain the detailed characterization of the OER electrocatalysts top-surface layer, which is required to identify the rate-limiting step intermediates, and surface morphological changes at the electrolyte/catalyst. T2 - SALSA Make&Measure 2022 CY - Berlin, Germany DA - 15.09.2022 KW - ToF-SIMS KW - FeNi nanoparticles PY - 2022 AN - OPUS4-56157 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - The next steps in the standardisation of graphene-related and other 2D materials (GR2M) N2 - The first products with graphene-related 2D material (GR2M) are on the market. In this phase trust is essential for the commercial success of these products, between the individual partners of the product value chain, and between the manufacturer and the consumer. Standards are an important tool for building this trust. The first steps have been taken in standardisation, e.g. in terminology and the characterization of raw materials. But there are still some challenges to overcome such as bringing the standards to the factory floor and real-world products. For the validation of new protocols and methods there is a need of reference data and materials. But not only the measurement should be reproducible, the whole analytical workflow from sample storage and preparation to data analysis should be reproducible. Another important issue is the establishment of credible structure-activity relationships which allows the prediction of the properties of the GR2M, but also of the biological activity including the safety for the human health and the environment. Such relationships can be used for read-across and grouping and can facilitate the regulation of the advanced materials. In addition, 2D materials beyond graphene should also be considered and can benefit from the experience from the standardisation of graphene and graphene oxide. T2 - Nanomaterials Standardization Strategy Forum - Europe - Republic of Korea CY - Online meeting DA - 08.07.2025 KW - Commercialisation KW - Product-value chain KW - Confidence building PY - 2025 AN - OPUS4-63731 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul T1 - Standardized Chemical Composition Analysis of Graphene Oxide Flakes with SEM/EDS and XPS Works Reliably N2 - Reliable quantification of the chemical composition of graphene-related 2D materials as powders and liquid suspensions is a challenging task. Analytical methods such as XPS, ICP-MS, TGA and FTIR are recommended to be used in ongoing projects at standardization bodies. The specific parameters to be measured are also defined, e.g. the oxygen-to-carbon (O/C) concentration ratio, the trace metal impurities, or the functional groups present [1]. In this contribution, for the first time, the results of a systematic study on the capability of SEM/EDS to reliably quantify the O/C ratio in a well-defined and well-characterized graphene oxide material [2] are presented. It is expected that the quantitative EDS analysis of light elements emitting characteristic X-ray lines below 1 keV to be provided with significantly larger measurement uncertainties than the analysis of elements with an atomic number of 11 (Na) or above [3]. The robustness of the SEM/EDS results obtained at various measurement conditions (various excitation energies) is tested by comparing the results to the established XPS analysis [4], which has been carried out on the same samples. A crucial step in sample preparation from liquid suspension with graphene oxides flakes onto a substrate for analysis with both XPS and EDS. It is demonstrated that if a closed and enough thick drop-cast deposited spot is succeeded to be deposited on a substrate, both surface-sensitive XPS analysis and bulk-characterizing EDS result in very similar elemental composition of oxygen and carbon. Hence, theoretical, expected O/C atomic ratio values for pure graphene oxide of ~0.5 [1] are achieved (with both methods), see Figure 1. Further, the effect of untight deposited material enabling co-analysis of the (silicon) substrate, is evaluated for both methods, XPS and EDS. To note that all the EDS results in this study have been quantified standardless. The effect of the variation of beam voltage on the result of the quantification of the O/C ratio is shown in Figure 2. No clear tendency is visible by varying the kV, which is a confirmation of the quality of the standardless analysis at the used EDS spectrometer. The results of this study demonstrate the reliability of the reference measurement protocol for SEM/EDS to be introduced into ISO/DTS 23359, including the dedicated sample preparation, particularly for the cases when the concentration of the GO flakes in stock liquid suspension is low. Further, also the consideration of this GO material as one of the very few available as a commercial material on the market as the very first GO reference material with regard to its morphology as well as chemical composition. Both the standard measurement procedure and the candidate reference material will immensely contribute to characterise reliably the chemical composition of graphene-related 2D materials with SEM/EDS as one of the most widely used methods in analytical laboratories. T2 - Microscopy and Microanalysis 2025 CY - Salt Lake City, UTAH, USA DA - 27.07.2025 KW - Graphene oxide flakes KW - SEM/EDS KW - XPS KW - O/C ratio KW - Impurities PY - 2025 AN - OPUS4-64085 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison report from VAMAS with ISO/TC 202 Microbeam Analysis N2 - The progress in the activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects/inter-laboratory comparisons. The recently started project FIB sample processing for TEM is presented. Next projects in the pipeline involving EBSD and TKD are shortly announced. The need of more promotion for the engagement of more experts from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. T2 - 29th Annual Meeting of ISO/TC 202 Microbeam Analysis CY - Online meeting DA - 28.11.2022 KW - VAMAS KW - ISO/TC 202 KW - Microbeam Analysis KW - EBSD KW - Electron microscopy KW - Thin films PY - 2022 AN - OPUS4-56424 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -