TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of sterilized Fe2O3 nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized Fe2O3 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - XPS KW - HAXPES KW - SEM KW - NanoSolveIT KW - Fe2O3 nanoparticles PY - 2023 DO - https://doi.org/10.5281/zenodo.7941001 PB - Zenodo CY - Geneva AN - OPUS4-57665 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Weigert, Florian A1 - Müller, A. A1 - Häusler, I. A1 - Geißler, Daniel A1 - Skroblin, D. A1 - Unger, Wolfgang A1 - Radnik, Jörg A1 - Resch-Genger, Ute T1 - Combining HR‑TEM and XPS to elucidate the core–shell structure of ultrabright CdSe/CdS semiconductor quantum dots N2 - Controlling thickness and tightness of surface passivation shells is crucial for many applications of core–shell nanoparticles (NP). Usually, to determine shell thickness, core and core/shell particle are measured individually requiring the availability of both nanoobjects. This is often not fulfilled for functional nanomaterials such as many photoluminescent semiconductor quantum dots (QD) used for bioimaging, solid state lighting, and display technologies as the core does not show the applicationrelevant functionality like a high photoluminescence (PL) quantum yield, calling for a whole nanoobject approach. By combining high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS), a novel whole nanoobject approach is developed representatively for an ultrabright oleic acid-stabilized, thick shell CdSe/CdS QD with a PL quantum yield close to unity. The size of this spectroscopically assessed QD, is in the range of the information depth of usual laboratory XPS. Information on particle size and monodispersity were validated with dynamic light scattering (DLS) and small angle X-ray scattering (SAXS) and compared to data derived from optical measurements. In addition to demonstrating the potential of this novel whole nanoobject approach for determining architectures of small nanoparticles, the presented results also highlight challenges faced by different sizing and structural analysis methods and method-inherent uncertainties. KW - Photoluminescence KW - Single particle KW - Microscopy KW - Particle architecture KW - Thickness KW - SAXS KW - Shell KW - XPS KW - TEM KW - Semiconductor KW - Quantum dot KW - Photophysics KW - Quantum yield PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-517911 DO - https://doi.org/10.1038/s41598-020-77530-z VL - 10 IS - 1 SP - 20712 PB - Springer Nature AN - OPUS4-51791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - 1,3-Dimethyl-imidazolium dimethyl phosphate ([MMIM]+[DMP]−) analyzed by XPS and HAXPES N2 - The ionic liquid 1,3-dimethyl-imidazolium-dimethylphosphate ([MMIM]+[DMP]−) was analyzed using (hard) x-ray photoelectron spectroscopy. Here, XPS and HAXPES spectra are shown in comparison. For the acquisition of the XPS spectra, monochromatic Al Kα radiation at 1486.6 eV was used, while for the acquisition of the HAXPES spectra, monochromatic Cr Kα radiation at 5414.8 eV was applied. Here, survey scans and high-resolution spectra of P 2p, P 2s, C 1s, O 1s, and N 1s for both methods and P 1s, P KL2,3L2,3, and P KL1L2,3 for HAXPES are shown. KW - C7H15N2O4P KW - [MMIM]+[DMP]− KW - Lonic liquid KW - Hard x-ray photoelectron spectroscopy KW - HAXPES KW - XPS PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-571604 DO - https://doi.org/10.1116/6.0002297 VL - 30 IS - 1 SP - 1 EP - 20 PB - AIP Publishing AN - OPUS4-57160 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ciornii, Dmitri T1 - Identification of toxicologically relevant functional groups on micro- and nanoplastic particles’ surface by means of X-Ray photoelectron spectroscopy N2 - Microplastic and nanoplastic particles (MNP) are spread all over the world in various types, shapes and sizes making it very challenging to accurately analyse them. Each sampling procedure, sample preparation method and detection technique needs suitable reference materials to validate the method for accurate results. Furthermore, the effects of these MNPs should be evaluated by risk and hazard assessment with test particles close to reality. To better understand MNP behavior and aid in clarification of their interactions with organisms, we produced several MNP materials by top-down procedure and characterized their properties. Since surface properties mostly determine particles’ toxicity, the aim of the present study was to determine which functional groups are present on MNPs and how the surface can be affected by the production process and particle’s environment. T2 - SETAC 34th Meeting CY - Seville, Spain DA - 05.05.2024 KW - Microplastics KW - Nanoplastics KW - Polypropylene KW - XPS KW - SEM PY - 2024 AN - OPUS4-60037 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Mrkwitschka, Paul A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - XPS/HAXPES and EDS spectra with ROI N2 - XPS/HAXPES spectra as well as EDS spectra and SEM micrographs with regions of interest. Measurement scheme included as a powerpoint presentation. Investigated materials: Ionic liquid and commercial and lab-synthesized graphene oxide. KW - EDX KW - XPS KW - Graphene Oxide KW - Ionic Liquid PY - 2026 DO - https://doi.org/10.5281/zenodo.18231732 PB - Zenodo CY - Geneva AN - OPUS4-65624 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mrkwitschka, Paul A1 - Sahre, Mario A1 - Corrao, Elena A1 - Pellegrino, Francesco A1 - Alonso, Beatriz A1 - Zurutuza, Amaia A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Standardized Elemental Composition Analysis of Graphene‐Related 2D Materials (GR2M) With SEM/EDS and XPS Works Reliably N2 - Reliable quantification of the chemical composition of graphene‐related 2D materials (GR2M) as powders and liquid suspensions is a challenging task. Analytical methods such as X‐ray photoelectron spectroscopy (XPS), inductively coupled plasma mass spectrometry (ICP‐MS), thermogravimetric analysis (TGA) and Fourier transform infrared spectroscopy (FTIR) are recommended by standardization bodies. The specific parameters to be measured are also defined, e.g., the oxygen‐to‐carbon (O/C) atomic ratio, the trace metal impurities, or the functional groups. In this contribution, for the first time, results of a systematic study on the capability of energy‐dispersive X‐ray spectroscopy (EDS) at a scanning electron microscope (SEM) to reliably quantify the O/C ratio and impurities remained from the synthesis of selected GR2M are reported. The robustness of SEM/EDS analysis is verified for various measurement conditions (different excitations and EDS detectors) and the validity of the results is tested by comparison to the established XPS analysis. Moreover, an ionic liquid is used as a reference material for the quantification of the light elements such as C, N, O and F. The study clearly demonstrates the reliability of the fast and widely available SEM/EDS as a standard method for the quantification of the elemental composition of GR2M and generally of light materials. KW - Graphene oxide flakes KW - Impurities KW - O/C ratio KW - SEM/EDS KW - Standard KW - XPS PY - 2026 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-656748 DO - https://doi.org/10.1002/smll.202511283 SN - 1613-6810 SP - 1 EP - 10 PB - Wiley-VHC GmbH AN - OPUS4-65674 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -