TY - JOUR A1 - Beyranvand, S. A1 - Pourghobadi, Z. A1 - Sattari, S. A1 - Soleymani, K. A1 - Donskyi, Ievgen A1 - Gharabaghi, M. A1 - Unger, Wolfgang A1 - Farjanikish, G. A1 - Nayebzadeh, H. A1 - Adeli, M. T1 - Boronic acid functionalized graphene platforms for diabetic wound N2 - While noncovalent interactions between graphene derivatives and biosystems are extensively studied, less knowledge about their covalent multivalent interactions at biointerfaces is available. Due to the affinity of boronic acids towards cis-diol bearing biosystems, graphene sheets with this functionality were synthesized and their covalent interactions with the bacteria and nematode were investigated. As expected, graphene platforms with boronic acid functionality were able to wrap bacteria and destroy it in a short time. Surprisingly, body of nematodes was ruptured and their viability decreased to 30% after 24 h incubation with the functionalized graphene sheets. Because of their antibacterial and antiparasitic activities as well as their ability for wound dressing, graphene platforms with the boronic acid functionality were further investigated for diabetic wound healing. In vivo experiments showed that graphene platforms are more efficient than the commercially available drug, phenytoin, and restore both infected and non-infected diabetic wounds in ten days. Taking advantage of their straightforward synthesis, strong interactions with different biosystems as well as their ability to heal diabetic wounds, the boronic Acid functionalized graphene sheets are promising candidates for a broad range of future biomedical applications. KW - Graphene KW - Boronic acid KW - Functionalized graphene KW - XPS PY - 2020 UR - https://www.sciencedirect.com/science/article/abs/pii/S0008622319310954 DO - https://doi.org/doi.org/10.1016/j.carbon.2019.10.077 VL - 158 SP - 327 EP - 336 PB - Elsevier Ltd. AN - OPUS4-50559 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - International standardization and metrology as tools to address the comparability and reproducibility challenges in XPS measurements N2 - The status of standardization related to x-ray photoelectron spectroscopy (XPS, ESCA) at ASTM International (Subcommittee E42.03) and ISO (TC 201) is presented and commented upon in a structured manner. The survey also identifies other active bodies, here VAMAS Technical Working Area 2 and the Surface Analysis Working Group at the International Meter Convention, contributing to prestandardization Research and metrology of XPS and reports their specific activities. It is concluded that existing standardization is delivering good practices in the use of XPS and has a high potential to avoid the recently observed erroneous use, misapplications, and misinterpretation by new and inexperienced users of the method—which seems to be the main reason for the “reproducibility crisis” in the field of XPS applications. A need for a more proactive publicizing of international documentary standards by experienced XPS users, specifically those who are involved in standardization, is identified. Because the existing portfolio of standards addressing the use of XPS is not complete, future standardization projects planned or already ongoing are mentioned. The way the standardization bodies are identifying future needs is shortly explained. KW - Standardisation KW - Comparability KW - Reproducibility KW - XPS KW - VAMAS KW - Metrology PY - 2020 DO - https://doi.org/10.1116/1.5131074 VL - 38 IS - 2 SP - 021201-1 EP - 021201-8 PB - AVS AN - OPUS4-50560 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gollwitzer, C. T1 - Computation of scattering curves for particles with arbitrary shapes using Debye’s formula N2 - Small-angle scattering data from particle dispersions with narrow size distributions are usually analysed by fitting a model function to the data, which is composed of a monodisperse form factor with a size distribution and, optionally, a structure factor. For common particle shapes like solid spheres, core-shell particles, ellipsoids or rods, the form factor can be computed analytically, and several software packages are readily available which provide a compilation of form factors.1,2 Recently, highly monodisperse nanoparticles with a variety of shapes have been synthesized, e.g. cubes and bipyramids3,4 with lightly capped edges, for which analytic form factors are harder to derive. We compute an approximation to the scattering curve of arbitrary shapes by filling the shape with a quasi-random distribution of point scatterers and using Debye’s formula to get the overall scattering curve. The highly optimized debyer code is used to perform an efficient evaluation of Debye’s formula,5 which can perform the evaluation of 500,000 point scatterers in two minutes on commodity hardware. Moderate polydispersity is handled by interpolating the computed scattering curve over q from a master curve. In this way, the code is fast enough to perform data fitting of particle ensembles with moderate polydispersity for arbitrary shapes to experimental data. This work was partly funded by the 17NRM04 nPSize project of the EMPIR programme co-financed by the EMPIR participating states and by the European Union’s Horizon 2020 research and innovation programme. T2 - 17th Nordic Workshop on Scattering from Soft Matter CY - Linköping, Sweden DA - 14.01.2020 KW - X-ray scattering KW - Nanoparticles KW - Particle shape KW - Modelling KW - Form factor PY - 2020 UR - http://nssm2020.se/ AN - OPUS4-50368 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Minimale Anforderungen an Referenzdaten anhand von Beispielen aus der Elektronenmikroskopie und Oberflächenanalytik N2 - In dem Vortrag werden, anhand ausgewählten Beispielen aus der Elektronenmikroskopie und Oberflächenanalytik (EDX und XPS), die minimalen Anforderungen an Referenzdaten für zuverlässige und reproduzierbare Ergebnisse (z.B. Partikelgrößenverteilung, Elementzusammensetzung) vorgestellt und diskutiert. T2 - Workshop "Referenzdaten" CY - Berlin, Germany DA - 13.03.2020 KW - Referenzdaten KW - Nanopartikel KW - Elektronenmikroskopie KW - Oberflächenanalytik KW - Standardarbeitsanweisung KW - SOP KW - Standardisierung PY - 2020 AN - OPUS4-50571 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - An interlaboratory comparison on measuring the chemical composition of functionalized graphene nanoplatelets N2 - The results of the international interlaboratory comparison ""Chemical Composition of functionalized graphene with X-ray photoelectron spectroscopy (XPS) under the auspice of VAMAS TWA 2 (Surface Chemical Analysis) will be presented. T2 - Kratos German User Meeting 2023 CY - Berlin, Germany DA - 25.10.2023 KW - Graphene KW - Interlaboratory Comparison KW - X-ray photoelectron spectroscopy PY - 2023 AN - OPUS4-58683 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Accurate Measurement of Size of Graphene Oxide Flakes by Scanning Electron Microscopy (SEM) N2 - Accurate characterisation of the morphology (size) and chemistry of graphene-related 2D materials (GR2M) is key in understanding their extraordinary functionalities. Hence, not only the tailoring of these functionalities aiming at applications of increased-performance becomes possible, but also the correlation of the physico-chemical properties with the understanding of the potential toxicity eventually enables a safe and sustainable development of the GR2M for new applications. Whilst AFM and Raman Spectroscopy are recommended to measure the thickness of GO flakes, Scanning Electron Microscopy (SEM) is the most suited method to assess their lateral size, which varies between tens of µm down to below 100 nm. In this paper, procedures for the accurate determination of lateral size of graphene oxide (GO) flakes by SEM are presented. The prerequisite for accurate flake size analysis is the proper sample preparation, i.e. deposition of ideally isolated flakes on a substrate, with the flakes being unfolded, non-overlapped, parallel with the substrate, and having a high coverage density. Examples of optimum image caption conditions and image analysis procedures will be presented. The size descriptors and their measurement are described in the context of the corresponding analysis approach: i) length and width of the flakes with a quick and rough, but robust procedure, and ii) exact contouring of the flakes as part of a highly accurate, but more time-consuming measurement approach. The possibility of application of automated image analysis is discussed as the alternative to the manual flakes analysis. T2 - Graphene 2023 CY - Manchester, UK DA - 27.07.2023 KW - Graphene oxide KW - SEM KW - Size KW - Standardisation PY - 2023 UR - https://www.grapheneconf.com/2023/index.php AN - OPUS4-57910 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cios, Grzegorz A1 - Hodoroaba, Vasile-Dan T1 - High throughput nanoparticle analysis using transmission Kikuchi diffraction N2 - In the present paper we show an approach of measuring large numbers of nanoparticles in a single scan TKD. TiO2 anatase nanoparticles (NP) of bipyramidal shape were deposited on standard carbon grid used for TEM. The procedure used promoted formation of NP ‘monolayer’ islands with uniform distribution of NPs on the carbon surface which allowed mapping of large number of nanoparticles in the single island. Collection of whole map covering ~2800 nanoparticles took nearly 20 minutes. Inverse pole figure color coded map indicates that the NPs are either lying on a {101} facet (within 10° range around perfect {101} parallel to the carbon surface orientation) on the carbon film or are lying on a {100} facet (within 10° range around the perfect {100} parallel to the carbon surface orientation). Very unlikely was the NP orientation standing on a {001} face. The NPs size distribution described as equivalent circle diameter (ECD) has been also evaluated and the mean NP ECD was 59 nm with standard deviation of 15 nm, i.e. in good agreement with electron microscopy or AFM results. This study shows high potential of the technique for crystalline NPs analysis with respect to geometrical orientation of the particles on the substrate. With known orientation, the 3D dimensional characterisation of such non-spherical NPs becomes possible from 2D projection electron micrographs. Moreover, the NP size distribution can be easily extracted. Superior accuracies down to 1-2 nm are achievable. The approach is applicable also on thin lamellae extracted from particulate (or mesoporous) layers. T2 - EMAS 2023 - 17th European Workshop on Modern Developmennts and Applications in Microbeam Analysis CY - Krakow, Poland DA - 07.05.2023 KW - Nanoparticles KW - TKD KW - Electron microscopy KW - TiO2 KW - Orientation PY - 2023 UR - https://www.microbeamanalysis.eu/events/event/60-emas-2023-17th-european-workshop-on-modern-developments-and-applications-in-microbeam-analysis AN - OPUS4-57519 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS Regional Report Germany N2 - Regional standardisation activities and how VAMAS can help in any way to promote activities are reported. Activities related to organisational updates, government initiatives/priorities (especially related to Materials), details of any strategy documents publicly available, networks within Germany and how we engage are presented. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 48th Steering Committee Meeting CY - New Delhi, India DA - 09.10.2023 KW - VAMAS KW - Standardisation PY - 2023 UR - https://www.nplindia.org/index.php/amcsnzt_2023/ AN - OPUS4-58572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abram, Sarah-Luise A1 - Mrkwitschka, Paul A1 - Thünemann, Andreas A1 - Radnik, Jörg A1 - Häusler, I. A1 - Bresch, Harald A1 - Hodoroaba, Vasile-Dan A1 - Resch-Genger, Ute T1 - Iron Oxide Nanocubes as a New Certified Reference Material for Nanoparticle Size Measurements N2 - The rational design and increasing industrial use of nanomaterials require a reliable characterization of their physicochemical key properties like size, size distribution, shape, and surface chemistry. This calls for nanoscale reference materials (nanoRMs) for the validation and standardization of commonly used characterization methods closely matching real-world nonspherical nano-objects. This encouraged us to develop a nonspherical nanoRM of very small size consisting of 8 nm iron oxide nanocubes (BAM-N012) to complement spherical gold, silica, and polymer nanoRMs. In the following, the development and production of this nanoRM are highlighted including the characterization by transmission electron microscopy (TEM) and small-angle X-ray scattering (SAXS) as complementary methods for size and shape parameters, homogeneity and stability studies, and calculation of a complete uncertainty budget of the size features. The determination of the nanocubes’ edge length by TEM and SAXS allows a method comparison. In addition, SAXS measurements can also provide the mean particle number density and the mass concentration. The certified size parameters, area equivalent circular diameter and square edge length, determined by TEM with a relative expanded uncertainty below 9%, are metrologically traceable to a natural constant for length, the very precisely known (111) lattice spacing of silicon. Cubic BAM-N012 qualifies as a certified nanoRM for estimating the precision and trueness, validation, and quality assurance of particle size and shape measurements with electron microscopy and SAXS as well as other sizing methods suitable for nanomaterials. The production of this new iron oxide nanocube RM presents an important achievement for the nanomaterial community, nanomaterial manufacturers, and regulators. KW - Certification KW - SAXS KW - Homogeneity KW - Nano KW - Particle KW - Iron oxide KW - Quality assurance KW - Reference material KW - Size KW - Electron microscopy KW - Stability KW - Shape PY - 2023 DO - https://doi.org/10.1021/acs.analchem.3c00749 SN - 0003-2700 VL - 95 IS - 33 SP - 12223 EP - 12231 PB - American Chemical Society CY - Columbus, Ohio AN - OPUS4-58176 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rühle, Bastian A1 - Hodoroaba, Vasile-Dan T1 - Automatic Image Segmentation and Analysis using Neural Networks N2 - We present a workflow for obtaining fully trained artificial neural networks that can perform automatic particle segmentations of agglomerated, non-spherical nanoparticles from electron microscopy images “from scratch”, without the need for large training data sets of manually annotated images. This is achieved by using unsupervised learning for most of the training dataset generation, making heavy use of generative adversarial networks and especially unpaired image-to-image translation via cycle-consistent adversarial networks. The whole process only requires about 15 minutes of hands-on time by a user and can typically be finished within less than 12 hours when training on a single graphics card (GPU). After training, SEM image analysis can be carried out by the artificial neural network within seconds, and the segmented images can be used for automatically extracting and calculating various other particle size and shape descriptors. T2 - Machine Learning Workshop CY - Online Meeting DA - 18.03.2021 KW - Electron Microscopy KW - Neural Networks KW - Artificial Intelligence KW - Image Segmentation KW - Automated Image Analysis PY - 2021 AN - OPUS4-52304 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Chemello, Giovanni T1 - Characterization of industrial graphene using HAXPES N2 - A comparative analysis is performed by XPS, HAXPES and SEM of industrial functionalised graphene powder of different morphology. The chemical analysis carried out by XPS, which probing depth is around 10nm, and HAXPES, which can reach up to 30nm probing depth. By combining these two techniques is possible to get a rough, non-destructive depth profiling of the sample's surface. The results show a higher concentration of the functionlisation elements on the surface of the sample and the influence of the morphology on the functionalisation process and the C/O ratio. T2 - SALSA Make and Measure 2022 CY - Berlin, Germany DA - 15.09.2022 KW - Graphene KW - XPS KW - HAXPES KW - SEM KW - Graphene funcionalisation PY - 2022 AN - OPUS4-55971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Cios, G. A1 - Tokarski, T. A1 - Mansfeld, Ulrich A1 - Ortel, Erik A1 - Mielke, Johannes A1 - Pellegrino, F. A1 - Maurino, V. T1 - Towards 3D Understanding of Non-spherical Nanoparticles by Transmission Kikuchi Diffraction (TKD) for Improved Particle Size Distribution by Electron Microscopy N2 - In this paper one refined approach is applied to determine the exact orientation of bipyramidal TiO2 nanoparticles prepared with good dispersion as almost isolated particles on a carbon TEM grid. The advantages of the recently developed high-throughput Transmission Kikuchi Diffraction (TKD) are used to identify quickly and reliably the geometrical orientation of the crystalline TiO2 nanoparticle bipyramids (anatase) on a statistically relevant number of particles. KW - Nanoparticles KW - Transmission Kikuchi Diffraction (TKD) KW - Electron microscopy KW - TiO2 KW - 3D PY - 2020 DO - https://doi.org/10.1017/S1431927620013999 VL - 26 IS - S2 SP - 260 EP - 261 PB - Cambridge University Press CY - Cambridge, UK AN - OPUS4-51772 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -