TY - RPRT A1 - Schmidt, Alexandra A1 - Bresch, Harald A1 - Kämpf, K. A1 - Bachmann, V. A1 - Peters, T. A1 - Kuhlbusch, T. T1 - Development of a specific OECD Test Guideline on Particle Size and Particle Size Distribution of Nanomaterials N2 - In this research project, a new OECD Test Guideline (TG) for the determination of “Particle Size and Particle Size Distributions of Nanomaterials” was developed as the existing OECD TG 110 is considered to be outdated in terms of applicable size range (not covering sizes <200 nm) and methods. By its scope with an applicable size range from 1 to 1000 nm the new Test Guideline (TG PSD) covers the whole nanoscale. The TG PSD is applicable for particulate and fibrous nanomaterials. The prescribed, pairwise measurement of fibre diameter and length in the TG PSD allows for the first time to differen-tiate fibres with regard to their size-dependent hazard properties. Measurement instructions for each included method were validated within two separated interlaboratory comparisons, as a distinction between near spherical particles and fibres when applying the methods has to be made. Besides information on content and structure of the TG PSD, this final report outlines essential steps, considerations and organisational aspects during the development of the TG. Insights into the selec-tion, preparation and prevalidation of test materials used in the interlaboratory comparison are given. Finally, main results of the interlaboratory comparisons and their impacts on the TG PSD are pre-sented. N2 - Im Rahmen des Forschungsprojekts wurde eine neue OECD-Prüfrichtlinie (TG) für die Bestimmung von Partikelgrößen und Partikelgrößenverteilungen von Nanomaterialien entwickelt, da die existie-rende OECD TG 110 zur Bestimmung von Partikelgrößen in Bezug auf den anwendbaren Größenbe-reich und die gegebenen Methoden veraltet ist bzw. den Nanometerbereich < 200 nm nicht abdeckt. Mit ihrem Anwendungsbereich von 1 bis 1000 nm deckt die neue Prüfrichtlinie (TG PSD) die gesamte Nanoskala ab. Die TG PSD ist für partikel- und faserförmige Nanomaterialien anwendbar. Durch die, in der TG PSD vorgeschriebene, paarweise Messung von Faserdurchmesser und -länge ermöglicht diese TG zum ersten Mal Fasern hinsichtlich ihrer größenabhängigen Gefahrstoffeigenschaften zu unter-scheiden. Die Messanweisungen aller enthaltenen Methoden wurden im Rahmen von zwei getrennten Ringversuchen validiert, da bei der Anwendung der Methoden eine Unterscheidung zwischen Parti-keln und Fasern gemacht werden muss. Neben Angaben zum Inhalt und Struktur der TG PSD, befasst sich der vorliegende Abschlussbericht mit den wesentlichen Schritten, Überlegungen und organisatorischen Aspekten bei der Entwicklung der Prüfrichtlinie. Darüber hinaus werden Einblicke in die Auswahl, Vorbereitung und Prävalidierung der im Ringversuch verwendeten Testmaterialien gegeben. Schließlich werden die wichtigsten Ergeb-nisse aus den Ringversuchen und ihre Auswirkungen auf die TG PSD vorgestellt. KW - Nano KW - OECD KW - Particle size distribution KW - Testguideline KW - Nanoparticle PY - 2021 VL - 2021 SP - 1 EP - 47 PB - German Environment Agency CY - Dessau AN - OPUS4-54021 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Piquemal, François A1 - Hoffmann, Johannes A1 - Gautier, Brice A1 - Hertwig, Andreas A1 - Frabricius, Norbert T1 - Publishable Summary for 20IND12 Elena Electrical nanoscale metrology in industry N2 - Consumer electronics, innovative quantum technologies, and Internet of Things applications all rely on semiconductors, where reliable characterisation of electrical properties at the nanoscale is essential for European innovation and competitiveness. The measurement of these properties allows the evaluation of critical parameters used to define the performance of electronic materials and components. Currently, Conductive Atomic Force Microscopes and Scanning Microwave Microscopes enable nanoscale electrical characterisation, but they are costly, complicated and, in many cases where they are used, unreliable as measurements are not traceable. The aim of the project was to make such measurements traceable for the first time, with stated uncertainties, and affordable by developing and testing cost effective instrumentation and the first “out of lab” reference standards from DC to GHz and by elaborating robust calibration methods and good practice guides using simplified uncertainty budgets. All the objectives were achieved. The project has successfully improved the user-friendly uncertainty quantification for the electrical measurements at the nanoscale in the industrial environment. The design of calibration standards has been improved and new standards for DC resistance / current as well as HF impedance have been introduced and quantified. Good practice guides for the calibration and uncertainty quantification have been written and will be available to the users’ community. New ways of determining the properties of standard samples like ellipsometry have been evaluated. The interaction with stakeholders and industry collaborators was very important for the consortium and several case studies were carried out with industry-relevant samples. All data, procedures, and example uncertainty data from the project are included into the standardisation process and two IEC standards projects have been started during this project. These standards will be used as one important dissemination ways for the results of the project. KW - Electrical Properties KW - Nanometrology KW - Scanning Probe Microscopy KW - Optical Surface Analysis PY - 2024 SP - 1 EP - 9 AN - OPUS4-61812 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bresch, Harald A1 - Schmidt, Alexandra A1 - Kämpf, K. A1 - Bachmann, V. A1 - Peters, T. A1 - Kuhlbusch, T. T1 - Draft OECD Test Guideline for the Testing of Chemicals - Particle Size and Particle Size Distribution of Nanomaterials N2 - Final Draft of the OECD Test Guideline for Particle Size and Particle Size Distribution of Nanomaterials. The OECD Working Party on Manufactured Nanomaterials (WPMN) has actively worked towards understanding possible safety issues for manufactured nanomaterials and has contributed significantly to resolving these by developing Test Guidelines, Guidance Documents, Test Reports and other publications with the aim of a safe use of manufactured nanomaterials. The OECD website (www.oecd.org/science/nanosafety) and the referenced publications contain more background information. Among others, the OECD Test Guideline “Particle Size Distribution/Fibre Length and Diameter Distributions” (TG 110, adopted in 1981) was identified to require an update to address the specific needs of manufactured nanomaterials as the TG 110 is currently only valid for particles and fibres with sizes above 250 nm. The WPMN prioritised to either update TG 110 to be applicable also to particles at the nanoscale or draft a new nanomaterial specific Test Guideline (TG). Eventually, it was decided to develop a new TG for particle size and particle size distribution measurements of nanomaterials covering the size range from 1 nm to 1000 nm for further justification. This TG overlaps with TG 110 in the size range from 250 nm to 1000 nm. When measuring particulate or fibrous materials, the appropriate TG should be selected depending on the size range of particles tested. In line with TG 110, the new TG for nanomaterials includes separate parts for particles and fibres. For the part of this TG which addresses particles, several methods applicable to nanomaterials were reviewed and included to take into account developments since 1981 when the TG110 was adopted. This TG includes the following methods: Atomic Force Microscopy (AFM), Centrifugal Liquid Sedimentation (CLS)/Analytical Ultracentrifugation (AUC), Dynamic Light Scattering (DLS), Differential Mobility Analysis System (DMAS), (Nano)Particle Tracking Analysis (PTA/NTA), Small Angle X-Ray Scattering (SAXS), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM). For measuring the diameter and length of fibres, analysing images captured with electron microscopy is currently the only method available. This TG includes Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). To test the validity of this TG, an ILC was performed. Test materials were chosen to reflect a broad 68 range of nanomaterial classes, e.g. metals, metal oxides, polymers and carbon materials. Where possible, well-characterised test materials were used. Additionally, the test materials were chosen, so that they reflect a broad range of sizes representing the size range 1 nm to 1000 nm and finally, for fibres only, aspect ratios from length/diameter of 3 to > 50. KW - Nano KW - OECD KW - Test guideline KW - Nanomaterial KW - Nanoparticle PY - 2021 UR - https://www.oecd.org/chemicalsafety/testing/draft-test-guideline-particle-size-distribution-nanomaterials.pdf SP - 1 PB - Organisation for Economic Co-operation and Development CY - Paris AN - OPUS4-53828 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bresch, Harald A1 - Schmidt, Alexandra A1 - Kämpf, K. A1 - Bachmann, V. A1 - Peters, T. A1 - Kuhlbusch, T. T1 - Test Guideline No. 125 - Nanomaterial Particle Size and Size Distribution of Nanomaterials N2 - The OECD Working Party on Manufactured Nanomaterials (WPMN) has actively worked towards understanding possible safety issues for manufactured nanomaterials and has contributed significantly to resolving these by developing Test Guidelines, Guidance Documents, Test Reports and other publications with the aim of a safe use of manufactured nanomaterials. To address the specific needs of manufactured nanomaterials, the OECD Test Guideline No. 110 “Particle Size Distribution/Fibre Length and Diameter Distributions” was identified as one of the test guidelines (TGs) to require an update. The current TG 110 (adopted in 1981) is only valid for particles and fibres with sizes above 250 nm. The WPMN prioritised to either update TG 110 to be applicable also to particles at the nanoscale or draft a new nanomaterial specific (TG). Eventually, it was decided to develop a new TG that covers the size range from 1 nm to 1000 nm, intended for particle size and particle size distribution measurements of nanomaterials. Paragraph 11 provides further justification on the need for such measurements for nanomaterials. This TG overlaps with TG 110 in the size range from 250 nm to 1000 nm. When measuring particulate or fibrous materials, the appropriate TG should be selected depending on the size range of particles tested. In line with TG 110, the new TG for nanomaterials includes separate parts for particles and fibres. For the part of this TG which addresses particles, several methods applicable to nanomaterials were reviewed and included to take into account developments since 1981 when the TG 110 was adopted. This TG includes the following methods: Atomic Force Microscopy (AFM), Centrifugal Liquid Sedimentation (CLS)/Analytical Ultracentrifugation (AUC), Dynamic Light Scattering (DLS), Differential Mobility Analysis System (DMAS), (Nano)Particle Tracking Analysis (PTA/NTA), Small Angle X-Ray Scattering (SAXS), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM). The method Single Particle Inductively Coupled Plasma Mass Spectrometry (sp-ICP-MS) could not be sufficiently validated within the interlaboratory comparison (ILC) carried out for the different methods in this TG (see also paragraph 6 for further details on the ILC). Applicability of sp-ICP-MS is strongly limited to nanomaterials with high mass values in combination with a sufficiently high particle size. However, the general method ICP-MS is widely used and the sp-mode for the size measurement of specific nanomaterials was successfully performed in ILCs elsewhere. The method is therefore included in the Appendix Part C of this TG, which further details the limitations of sp-ICP-MS. For measuring the diameter and length of fibres, analysing images captured with electron microscopy is currently the only method available. This TG includes Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). To test the validity of this TG, an ILC was performed. Test materials were chosen to reflect a broad range of nanomaterial classes, e.g. metals, metal oxides, polymers and carbon materials. Where possible, well-characterised test materials were used. Additionally, the test materials were chosen to reflect a broad range of sizes representing the size range 1 nm to 1000 nm. Specifically for fibres, a broad range of aspect ratios was included (length/diameter of 3 to > 50). Some of the test materials used are commercially available and further references are given in the validation report of the ILC. Sample preparation for physical chemical characterisation is critical for all listed methods. Due to the differences between individual nanomaterials and due to the wide range of individual material properties it is impossible to have a generic protocol to obtain the best possible sample preparation for every nanomaterial. Therefore, a generic protocol on sample preparation is not part of this TG. Information on sample preparation is given in the paragraphs 25-29, 33, 34 and 39 for particles and in paragraphs 159) for fibres. Further information on sample preparation of nanomaterials for physical chemical characterisation can be found in the OECD Guidance on Sample Preparation and Dosimetry for the Safety Testing of Manufactured Nanomaterials and elsewhere. KW - Nano KW - Nanomaterial KW - Nanoparticle KW - OECD KW - Test guideline PY - 2022 DO - https://doi.org/10.1787/20745753 SP - 1 EP - 72 PB - Organisation for Economic Co-operation and Development CY - Paris AN - OPUS4-55191 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kolmangadi, Mohamed Aejaz T1 - Dynamics and conductivity of nanoconfined amino acid based superdiscs: Influence of the side chain length N2 - Ionic Liquid Crystals (ILCs) are emerging class of materials that combine the properties of liquid crystals with the ionic conduction similar to ionic liquids. It’s known that liquid crystals exhibit intriguing properties when confined and are of importance from both fundamental and technological perspective. Here, we study the molecular dynamics and electrical conductivity of a homologous series of Dopamine (DOPA) based ILCs, ILCn (n = 12,14,16) confined in self ordered nanoporous alumina oxide membrane of 180 nm pore size using Broadband Dielectric Spectroscopy (BDS). We aim to understand how the alkyl chain length and confinement influence the dynamics in this system. In the bulk, for all ILCs, we observe two relaxation modes in the crystalline phase, the  and α1 relaxation respectively, and one relaxation mode in the columnar phase, the α2 relaxation, but for ILC16, where two relaxation modes (α2 and α3) are detected in the columnar phase. For the confined case, all relaxation processes slowdown compared to the bulk. For ILC16, the α1 relaxation is completely suppressed. For all ILCs, the absolute values of DC conductivity are reduced by some three orders of magnitude. We discuss in detail the possible molecular origin of the relaxation processes and the charge transport in this system. T2 - CONFIT 2022 CY - Grenoble, France DA - 10.10.2022 KW - Ionic Liquid crystals KW - Nanoconfinement KW - Conductivity PY - 2022 AN - OPUS4-57341 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Bonse, Jörn A1 - Kirner, Sabrina V. A1 - Krüger, Jörg ED - Sugioka, K. T1 - Laser-induced periodic surface structures (LIPSS) N2 - Laser-induced periodic surface structures (LIPSS) are a universal phenomenon and can be generated on almost any material by irradiation with linearly polarized radiation. This chapter reviews the current state in the field of LIPSS, which are formed in a “self-ordered” way and are often accompanying materials processing applications. LIPSS can be produced in a single-stage process and enable surface nanostructuring and, in turn, adaption of optical, mechanical, and chemical surface properties. Typically, they feature a structural size ranging from several micrometers down to less than 100 nm and show a clear correlation with the polarization direction of the light used for their generation. Various types of LIPSS are classified, relevant control parameters are identified, and their material-specific formation mechanisms are analyzed for different types of inorganic solids, i.e., metals, semiconductors, and dielectrics. Finally, technological applications featuring surface functionalization in the fields of optics, fluidics, medicine, and tribology are discussed. KW - Femtosecond laser KW - Laser ablation KW - Laser-induced periodic surface structures (LIPSS) KW - Microstructures KW - Nanostructures PY - 2021 SN - 978-3-319-69537-2 DO - https://doi.org/10.1007/978-3-319-69537-2_17-2 SP - 1 EP - 59 PB - Springer Nature CY - Cham, Switzerland ET - 2 AN - OPUS4-51493 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Liu, Y. A1 - Gruner, A. A1 - Aboud, D. G. K. A1 - Bonse, Jörn A1 - Schille, J. A1 - Loeschner, U. A1 - Kietzig, A.-M. T1 - Polarization effects on laser-inscribed angled micro-structures N2 - The polarization of the laser beam exhibits more substantial differences in laser micromachining as the angle of incidence deviates from zero. In the reported work, our focus was to explore the effects of circularly, p- and s-polarized laser on angled ultrashort pulse laser micromachining of micropillar arrays. The examination encompassed laser process factors, including angles of incidence, microstructure dimensions, and inter-pillar spacing. A comparison between the resulting structures demonstrated that p-polarized laser beam was the most efficient in material removal in angled laser micromachining, followed by circularly polarized laser. While the s-polarized beam exhibited the lowest ablation efficiency among the three. Such distinction is mainly attributed to the distinguishing reflectivity of the three states of polarization on tilted planes. The development of structural heights during ablation processes was examined, and potential defects in laser processing methodologies were interpreted. The dependency of structural heights on inter-pillar spacing was analyzed. This study bridges the gap between existing studies on angled ultrashort pulse laser machining and the influences of polarization on laser machining. The comparison between structures produced using laboratory-scale and industrial-scale laser systems also yielded pertinent recommendations for facilitating a smooth transition of angled laser micromachining from laboratory-scale research to industrial applications. KW - Laser processing KW - Laser-induced periodic surface structures (LIPSS) KW - Microstructures KW - Nanostructures PY - 2024 UR - https://www.sciencedirect.com/science/article/pii/S0169433223028714 DO - https://doi.org/10.1016/j.apsusc.2023.159191 SN - 0169-4332 VL - 649 SP - 1 EP - 15 PB - Elsevier AN - OPUS4-59329 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Omar, Hassan T1 - Investigations of Ultrathin Polymer Films Supported on Inorganic Substrates N2 - Interactions between a polymer and a substrate interface play a vital role in understanding the improvement in thin film material properties as well as serving as a model for nanocomposites. For any non-repulsive polymer-substrate interactions, polymer segments form an irreversibly adsorbed layer and show a slowdown in the glassy dynamics and thus an increase in the thermal glass transition temperature compared to the bulk-like values. The growth kinetics of the adsorbed layer showed a deviation for both poly (bisphenol-A carbonate) (PBAC) and polysulfone (PSU), two bulky polymers containing a functional group (phenyl ring) in the backbone. T2 - Royal Society of Chemistry (RSC) Online Poster Conference CY - Online meeting DA - 05.03.2024 KW - Adsorbed Layer KW - Thin Films KW - Atomic Force Microscopy KW - Ellipsometry PY - 2024 AN - OPUS4-59625 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kuchenbecker, Petra A1 - Lindemann, Franziska T1 - Particle size determination of a commercially available CeO2 nano powder - SOPs and reference data N2 - Compilation of detailed SOPs for characterization of a commercially available CeO2 nano powder including - suspension preparation (indirect and direct sonication), - particle size determination (Dynamic Light Scattering DLS and Centrifugal Liquid Sedimentation CLS) with reference data, respectively. For sample preparation and analysis by Scanning Electron Microscopy (SEM) of this powder see related works (submitted, coming soon). KW - Wet dispersion KW - Nano powder KW - Particle size KW - CeO2 KW - Ceria KW - DLS KW - CLS PY - 2023 DO - https://doi.org/10.5281/zenodo.10061079 PB - Zenodo CY - Geneva AN - OPUS4-58785 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kuchenbecker, Petra A1 - Lindemann, Franziska T1 - SOP and reference data for determination of the Volume-specific Surface Area (VSSA) of a commercially available CeO2 nano powder N2 - Detailed SOP and reference data for the determination of the VSSA of a commercially available CeO2 nano powder: specific (BET-) Surface Area by gas adsorption (Ar and N2) skeletal (true solid state) density by gas pycnometry. Estimation of the particle size by VSSA screening method. KW - Nano powder KW - VSSA KW - Volume specific surface area KW - Screening method KW - Ceria KW - CeO2 PY - 2023 DO - https://doi.org/10.5281/zenodo.10061235 PB - Zenodo CY - Geneva AN - OPUS4-58786 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -