TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA 37 - Quantitative Microstructural Analysis & Liaison with ISO/TC 202 Microbeam Analysis, Liaison with ISO N2 - The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects. Need of more promotion for the engagement of more participants from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. Further, a short overview of the VAMAS areas of activities is given where Germany is involved. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 46th Steering Committee Meeting CY - Online meeting DA - 08.09.2021 KW - VAMAS KW - Nanoparticles KW - Standardisation KW - Inter-laboratory comparison KW - ISO/TC 202 KW - ISO/TC 229 KW - ISO/TC 201 KW - Microstructure KW - EBSD PY - 2021 UR - http://www.vamas.org/twa/ AN - OPUS4-53237 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - VAMAS ILC of functionalized Graphene by XPS and Graphene Oxide by SEM N2 - The ideas of the planned VAMAS interlaboratory comparisons of functionalized graphene and graphene oxide are presented. T2 - Stakeholder Advisory Board ISO-G-Scope CY - Online meeting DA - 12.01.2022 KW - Graphene KW - XPS KW - SEM PY - 2022 AN - OPUS4-54375 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Fagan, J. T1 - Contributors invited for two studies on concentration of bimodal silica nanoparticle and bipyramidal titania N2 - International standardisation network VAMAS is calling for participants in two studies on the measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension and the measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension. KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - TiO2 KW - SiO2 PY - 2021 UR - https://www.iom3.org/resource/contributors-invited-for-two-studies-on-concentration-of-bimodal-silica-nanoparticle-and-bipyramidal-titania.html SP - 1 EP - 2 PB - Institute of Materials, Minerals and Mining (IOM3) CY - London, UK AN - OPUS4-54410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - BAM reference data - EDS raw data of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) N2 - EDS spectra of Al-coated titania nanoparticles (JRCNM62001 and JRCNM62002a) provided by the JRC repository are provided. KW - EDS KW - Titania nanoparticles KW - BAM reference data PY - 2021 DO - https://doi.org/10.5281/zenodo.4986420 PB - Zenodo CY - Geneva AN - OPUS4-52833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bennet, Francesca A1 - Hodoroaba, Vasile-Dan T1 - BAM reference data - SEM raw data for the particles size distribution of Al-coated titania nanoparticles (JRCNM62001a and JRCNM62002a) N2 - SEM raw images of Al-coated titania nanoparticles (JRCNM62001 and JRCNM62002a) provided by the JRC repository are provided together with the particle size distribution of the minimum Feret Diameter extracted from the given images. KW - SEM KW - Titania nanoparticles KW - Particle size distribution KW - BAM reference data PY - 2021 DO - https://doi.org/10.5281/zenodo.5007367 PB - Zenodo CY - Geneva AN - OPUS4-52836 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Madbouly, Loay Akmal T1 - Chemical Analysis of Functionalized Graphene along the Production Chain N2 - Graphene has been commercialized for over a decade. It is usually used in the form of suspensions or inks. In this study, we analyze the starting material for commercial functionalized graphene (FG) solutions and inks as well as their starting material (FG powders) using X-ray photoelectron spectroscopy (XPS), scanning electron microscope (SEM), energy-dispersive X-Ray spectroscopy (EDX), time of flight secondary ion mass spectrometry (ToF-SIMS) and Auger electron spectroscopy (AES). Graphene was functionalized with fluorine, oxygen, ammonia, and carboxylic acid. Our results suggest a significant effect of water and commercial resins on the presence as well as the morphological behavior of graphene and associated functionalized group. For example, XPS analysis shows some significant differences between the solutions and the starting materials (powders). These changes can be explained by the location of the functionalization at the outer most surface as indicated by Chemello et al. T2 - MaterialsWeek 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Functionalized graphene KW - Commercial graphene KW - Graphene inks PY - 2024 AN - OPUS4-60448 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and chemical analysis of mesoporous mixed IrOx-TiOy thin films as electrode materials N2 - Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach (1). Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too. In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted. T2 - 2024 Spring Meeting of the European Materials Research Society (E-MRS) CY - Strasbourg, France DA - 27.05.2024 KW - Mesoporous KW - Thin films KW - Iridium oxide KW - Titanium oxide KW - Thin film analysis KW - Porosity KW - SIMS KW - Auger electron spectroscopy PY - 2024 AN - OPUS4-60185 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Chemical Nanoscale Analysis of Mesoporous Mixed IrOx-TiOx Thin Films N2 - Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach. Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too. In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted. T2 - MaterialsWeek 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Thin films KW - Mesoporous KW - IR oxide KW - Ti oxide KW - Porosity PY - 2024 AN - OPUS4-60452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matthews, Lauren T1 - Approaches to Surface Analysis of Modified Quartz Nanopipettes N2 - Nanopipettes are a type of solid-state nanopore with needle-like geometry. Their applications range from imaging, sensing, diagnostics, and use as injectors. The response of nanopipette sensors is highly dependent on the size, geometry and chemical properties of the sensing region. As they are increasingly tuned and modified for specific analytes, a better understanding of the surface chemistry and morphology of the inner channel is necessary. With the aim of developing a comprehensive approach for characterisation of such nanopipettes, this research focuses on combining surface-sensitive analysis methods with advanced sample preparation techniques. Quartz substrates were modified by gas phase silanization, a well-utilised technique in the field to enhance performance of nanopipettes, and further functionalised with a metal bis thiolate complex, to aid in chemical analysis. The sample characterisation involved scanning electron microscopy (SEM), low-energy dispersive x-ray spectroscopy (EDX), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and Auger electron spectroscopy (AES). Using focused ion beam (FIB) milling under gentle conditions, the inner surface of quartz nanopipettes was exposed whilst preserving the integrity of the overall structure (see figure). Owing to the challenging analysis conditions, modification and analysis of flat quartz substrates has been performed in parallel for optimisation purposes. The results demonstrate the first steps towards full characterisation of nanopipettes at the nanoscale, notably with access to the inner channel. The methods used here can be applied to gain further understanding of the response of these sensors to complex analytes and allow for the study of different surface functionalisations at the all-important sensing region. T2 - European Conference on Applications of Surface and Interface Analysis (ECASIA 2024) CY - Gothenburg, Sweden DA - 09.06.2024 KW - Quartz nanopipettes KW - Nanopipette modification KW - Silanization KW - Surface analysis KW - Focussed ion beam PY - 2024 AN - OPUS4-60447 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Graphene Flagship - Achievements and the way forward N2 - The activities of the Graphene in the field of standardization will be summarized. The future activities of the Graphene Flagship CSA which was established recently will be presented with the focus on future challenges in standardization and regulation of graphene and other 2D materials. T2 - Harmonisation & Standardisation of Test Methods for Nano- and Advanced Materials CY - Online meeting DA - 22.11.2023 KW - 2D materials KW - Regulation KW - Standardization PY - 2023 UR - https://macrame-project.eu/macrame-meetings-workshops/ws_hamonisation_standardisation_2023/ AN - OPUS4-59497 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matthews, Lauren T1 - Breaking the Wall of Rapid Diagnostics N2 - In this short presentation the diagnostics, biomarkers and analysis are interrelated. The specificity and sensitivity of the DNA structures as well as the high-throughput option of the nanopore sensing are discussed. T2 - Falling Walls Lab Berlin-Adlershof CY - Berlin, Germany DA - 21.09.2023 KW - Nanopipettes KW - Sensing KW - Diagnosis KW - DNA structures PY - 2023 AN - OPUS4-60450 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Salzmann, Christoph A1 - Pellegrino, Francesco A1 - Hodoroaba, Vasile-Dan T1 - STEM-in-SEM versus SE-InLens-type-SEM as a Reliable Analytical Pair-Tool for Measurement of Nanoparticle Size and Shape Distribution N2 - Following points are addressed in this contribution: Advantages of correlative analysis in electron microscopy; Measurement principle of the different electron microscopy modes used; Presentation of the nanomaterials used for this study; Role of sample preparation; and, with particular description, the Sequence kV-variation with InLens SE & transmission SEM detection of the same field-of-view. KW - Nanoparticles KW - Electron microscopy KW - Metrology KW - Particle size distribution PY - 2024 DO - https://doi.org/10.1093/mam/ozae044.308 VL - 30 IS - Supplement_1 SP - 650 EP - 651 PB - Oxford University Press (OUP) AN - OPUS4-61042 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Salzmann, Christoph A1 - Heilmann, Maria A1 - Pellegrino, Francesco A1 - Durand, Bénédicte A1 - Taché, Olivier A1 - Zurutuza, Amaia A1 - Hodoroaba, Vasile-Dan T1 - Ongoing International Interlaboratory Comparisons on Size, Shape and (Relative) Concentration of Complex Nanoparticles under the Pre-Standardization Platform of VAMAS N2 - An overview with the basics of size and shape measurement of particles and 2D structures according to established methodologies (and popular imaging processing software packages) with imaging techniques is given. Main descriptors are explained based on case studies with ongoing interlaboratory comparisons under the pre-standardisation platform of VAMAS. KW - VAMAS KW - Interlaboratory comparison KW - Imaging KW - Size distribution KW - Particle concentration KW - 2D materials PY - 2024 DO - https://doi.org/10.1093/mam/ozae044.319 VL - 30 IS - Supplement 1 SP - 669 EP - 670 PB - Oxford University Press (OUP) AN - OPUS4-61183 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Report VAMAS/TWA 37 "Quantitative Microstructural Analysis" & Liaison with ISO/TC 202 "Microbeam Analysis" N2 - The progress in activities on Quantitative MicroStructural Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 Microbeam Analysis is presented and discussed with respect to the identification and launching corresponding VAMAS projects. The ongoing projects "Development of guidelines for reproducible TEM specimen preparation by FIB processing", "Measurement of dislocation density in metallic materials by Transmission Electron Microscope (TEM)", "Repeatability of high angular resolution electron backscatter diffraction (HR-EBSD) analysis for elastic strain measurements", and "Measurement of grain size and distribution of nanocrystalline nickel by using Transmission Kikuchi Diffraction (TKD) in SEM" are presented in detail. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 49th Steering Committee Meeting CY - Rio de Janeiro, Brazil DA - 23.09.2024 KW - VAMAS KW - Interlaboratory comparison KW - Microbeam Analysis KW - FIB KW - SEM KW - TEM KW - Sample preparation PY - 2024 UR - www.vamas.org/twa37/index.html AN - OPUS4-61388 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schusterbauer, Robert T1 - Correlative chemical imaging to reveal the nature of different commercial graphene materials N2 - Since the original report in 2004 by Novoselov and Geim, Graphene gained incredible attention due to its fascinating properties. In the past 20 years, the synthesis and functionalization of graphene has evolved significantly[3]. Different synthesis techniques were developed which led to other graphenerelated materials such as graphene oxide (GO) or elemental-doped graphene. Further chemical functionalization can enhance but also alter or reduce specific properties of the graphene. To reveal the nature of these materials a proper physico‑chemical characterization with different analytical techniques is crucial. Single-layer GO flakes kindly provided by Graphenea (Spain) were prepared for systematic image analysis. These flakes were disposed on an alignment-marked SiO2 substrate and correlatively imaged by scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and Raman spectroscopy. The high lateral resolution and/ or extreme surface sensitivity of the mentioned techniques is necessary to explore monolayers. The ToF-SIMS images match well with the SEM and AFM images and provide information about the chemistry. With 2D Raman spectroscopy it is possible to differentiate between the number of stacked single-layer flakes. This is visualized in a 3D image (Figure b). Well-defined GO flakes could be used as a reference material for imaging of graphene-like structures but also of other types of 2D materials. In addition to these monolayer GO flakes, commercial graphene-containing inks (Haydale) with a more complex morphology were also correlatively imaged. ToF-SIMS and SEM images were merged to identify the origin of different chemical fragments. The findings correlate closely with the expectation that the specific functionalizations (with fluorine and nitrogen as marker elements) are present only on the graphene flakes as presumed from the SEM images. Energy-dispersive X-ray spectroscopy (EDX) supports these results, yet with a much lower sensitivity compared to ToF-SIMS. T2 - ECASIA 2024 CY - Gothenburg, Sweden DA - 09.06.2024 KW - Correlative imaging KW - ToF-SIMS KW - SEM KW - Graphene oxide flakes KW - Raman PY - 2024 AN - OPUS4-60680 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Standardisation needs for regulatory testing of graphene and related 2D materials. phy-chem properties N2 - The main properties and main methods which are needed for the physico-chemical characterisation of graphene related 2D materials are discussed. As expample for standardization, protocols for the measurement of the chemical composition with XPS are discussed. The results of an interlaboratory comparisons led to new recommendations for the reliable measurments protocols. T2 - Materials Week 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Standardisation KW - Functionalized graphene KW - Interlaboratory comparison KW - Endpoints PY - 2024 AN - OPUS4-60537 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Advanced materials for the energy transition N2 - The climate crisis is the burning issue of our time. In order to avert the impending consequences, global efforts are being made in a wide variety of social and scientific fields. This report looks at a small part of these efforts, a technical aspect, namely the question of which AdMa are currently considered in techniques to support the energy transition. AdMa, i.e. materials that are rationally designed to have new or enhanced properties, and/or targeted or enhanced structural features, are used in all sectors of the energy transition. Questions of energy generation, storage and saving are considered here. This report is based on literature research and contains a general compilation of various AdMa that are used in the energy transition or are being researched for this purpose. From this compilation, ten materials that are considered particularly relevant for various reasons were selected and examined in more detail in relation to their use. The specific question here lies in the conflicting objective that the development of technologies for the energy transition is welcomed, but the use of AdMa may entail possible challenges in view of chemical safety as well as sustainability and circular economy. KW - Energy generation KW - Energy saving KW - Eneergy storage KW - Energy transportation PY - 2025 DO - https://doi.org/10.60810/openumwelt-7853 SN - 1862-4804 VL - 83 SP - 1 EP - 64 PB - Umweltbundesamt CY - Dessau-Roßlau AN - OPUS4-63529 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison between ISO/TC 202 Microbeam Analysis and VAMAS/TWA 37 Quantitative Microstructural Analysis N2 - The liaison between ISO/TC 202 Microbeam Analysis and VAMAS/TWA 37 Quantitative Microstructural Analysis and other TWAs since the last Annual Meeting of ISO/TC 202 is reported. The VAMAS/TWA 37 projects initiated in the last year and the new ones in the planing phase are highlighted with technical and organisational details. T2 - 31st Plenary Meeting of ISO/TC202 Microbeam Analysis CY - Tokio, Japan DA - 29.10.2024 KW - ISO TC 202 KW - Microbeam Analysis KW - Interlaboratory comparison KW - VAMAS KW - Standardisation PY - 2024 AN - OPUS4-61513 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - John, Elisabeth T1 - Exploring the SIMS Matrix Effect in High-Entropy Alloy Thin-Films N2 - Compared with traditional alloys, which typically consist of one or two main elements and small amounts of secondary elements, High Entropy Alloys (HEA) are characterized by the presence of multiple principal elements in almost equal proportions. This unique composition results in a high degree of disorder at the atomic level, leading to exceptional mechanical, physical, and often unexpected properties. HEAs have garnered significant attention in materials science and engineering due to their potential applications in a wide range of industries, from aerospace and automotive to electronics and renewable energy. Analyzing materials composed of multiple elements with spectroscopic techniques such as X-ray Photoelectron Spectroscopy (XPS), Auger-Electron Spectroscopy (AES) or Electron Probe Microanalysis (EPMA), can be challenging due to spectral overlap. This challenge reaches its peak if neighboring 3d elements are present, as it is the case for the famous Cantor alloy which is composed of Cr, Mn, Fe, Co and Ni. Moreover, each analytical method introduces its own set of challenges, e.g., the strong secondary fluorescence effect for neighbor elements in EPMA, thus, making the accurate elemental quantification in such materials difficult. If the material is available as thin film, additional constraints are inherently present. To provide a reference material for these analytical challenges HEAs are excellent candidates. Currently, there is no thin film reference available containing more than two elements. Our goal is to prepare thin films with a homogeneous thickness and defined, homogenous chemical composition to be analyzed by various methods dedicated to surface analysis. ToF-SIMS is an excellent method for the (3D) analysis of thin films, however due to the dependence of element ion yield on the surrounding chemical state i.e., the matrix effect, it is considered a non-quantitative method. In HEAs the elements are each present in a homogenous matrix which makes these materials interesting for investigation of the matrix effect. Moreover, we evaluate methods to minimize the disturbances of oxygen enhancement during the beginning of the sputter analysis and the effect of recoil mixing at the film/substrate interface with the aim to measure accurate depth profiles. T2 - SIMS 24 CY - La Rochelle, France DA - 09.09.2024 KW - High-entropy alloy KW - ToF-SIMS KW - Matrix Effect PY - 2024 AN - OPUS4-62511 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Challenges in Correlative imaging of Advanced Materials N2 - Newly developed methodical approaches with an emphasis on correlative imaging analysis of morphology and chemistry of nanomaterials will be presented. Correlative imaging by high-resolution SEM with STEM-in-SEM as well as with EDS, and further with AFM, or with the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and as embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for the local surface chemistry will be highlighted. Examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy and the highest surface-sensitive methods XPS and ToF-SIMS as advanced surface characterization methods available in the Competence Centre nano@BAM will be showed. Particularly for the spatially resolved analysis of the chemistry of nanostructures, such in-depth and lateral gradients of chemistry within mesoporous thin layers, or the completeness of the shells of core-shell nanoparticles, the latter methods are inherent. Other dedicated developments like approaches for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM or the quantitative determination of the roughness of particle surface by high-resolution imaging with electron microscopy will be also presented. T2 - Workshop: Harmonisation & Standardisation of Test Methods for Nano- and Advanced Materials CY - Online meeting DA - 18.11.2024 KW - Imaging KW - Advanced materials KW - Correlative imaging KW - Nanomaterials KW - Electron microscopy KW - ToF-SIMS PY - 2024 UR - https://macrame-project.eu/macrame-meetings-workshops/2nd-joint-online-workshop-harmonisation-standardisation-of-test-methods-for-nano-and-advanced-materials/ AN - OPUS4-61858 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fernandez-Poulussen, D. A1 - Hodoroaba, Vasile-Dan T1 - Holistic, reliable and practical Characterization Framework for Graphene Family Materials, a correlated approach including Imaging based techniques N2 - ACCORDs is an Horizon Europe project working in the development of an imaging-based characterization framework (ACCORDs framework) for the holistic correlative assessment of Graphene Family Materials (GFMs) as a representative of 2D nanomaterials (NMs) to assess and predict 2D NMs health and environmental risks. The ACCORDs framework will operationalise safe and sustainable by design (SSbD) strategies proposed in past or ongoing H2020 projects or within OECD by correlating low-, medium-, and high-resolution physico-chemical-biological imaging-based methods with non-imaging methods in a tiered approach. ACCORDs will deliver the ACCORDs framework and user guidance, new imaging-based characterisation methods, reference in vitro tests, new reference 2D NMs for different matrices, a new minimum information reporting guideline for FAIR data sharing and reuse of images as well as an atlas with reference images for diagnostics of compromised safety of GFMs/GFM products. The new guidelines and standard proposals will be submitted to standardisation bodies to allow creation of regulatory ready products. The novelty of ACCORDs is in translating the principles of medical imaging-based diagnostics to 2D material hazard diagnostics. ACCORDs will accelerate industrial sectors in the area of aviation, marine construction, drone production, flexible electronics, photovoltaics, photocatalytics and print inks-based sensors. The value ACCORDs proposes to the graphene industry are practical, easy, imaging-based tools for GFM quality monitoring next to the production line with a possibility to be correlated with advanced highresolution imaging characterization methods in case hazard i.e. deviation from controls (benchmark values) are diagnosed. The ACCORDs framework and tools will contribute to the European Green Deal by addressing the topic: “Graphene: Europe in the lead” and to a new European strategy on standardization, released on 2nd February, 2022 T2 - Joint Regulatory Risk Assessors Summit – Advancing Safety & Sustainability Assessments of Advanced Materials CY - Paris, France DA - 19.06.2025 KW - Graphene-related 2D materials (GR2M) KW - Imaging KW - SSbD KW - ACCORDs PY - 2025 UR - https://macrame-project.eu/macrame-meetings-workshops/jointrras/#Agenda AN - OPUS4-63660 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Investigation of Fe-Ni-O nanoparticles for water splitting N2 - This study investigates the effect of varying iron-to-nickel ratios on the catalytic performance of Fe-Ni oxide nanoparticles (NPs) for the oxygen evolution reaction (OER). Addressing the issue of high energy wastage due to large overpotentials in OER, we synthesized and characterized different NP catalysts with different Fe: Ni oxide ratios. Transmission Electron Microscopy (TEM), Energy Dispersive X-ray Spectroscopy (EDS), and X-ray Diffraction (XRD) were employed to determine the morphology, elemental and phase composition of the NPs. Furthermore, in-depth profiling with X-rayPhotoelectron Spectroscopy (XPS) and Hard X-ray Photoelectron Spectroscopy (HAXPES) revealedthat iron predominantly exists as oxide, while nickel exhibits both metallic and oxidic forms depending on the Fe content. XPS indicated an enrichment of iron at the NP surface, whereas HAXPES and EDSdata agreed on the bulk stoichiometry. T2 - PhI European User Meeting 2025 CY - Eibelstadt, Germany DA - 29.04.2025 KW - Oxygen evolution reaction KW - In depth analysis KW - (Hard) X-ray Photoelectron Spectroscopy PY - 2025 AN - OPUS4-63334 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Methodological Challenges and Gaps: Physico-Chemical Characterisation N2 - The methodological challenges and gaps in the physico-chemical characterisation of graphene related 2D Materials (GR2M) are discussed. Solutions for filling the gaps are presented. T2 - OECD Graphene Expert Workshop CY - Paris, France DA - 26.11.2024 KW - Graphene related 2D materials KW - Structure activity relationsships KW - Classification PY - 2024 AN - OPUS4-61920 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fagan, Jeffrey A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA Nanoparticle Populations Projects 15 and 16 N2 - The progress in the VAMAS Project #15 "Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of electron microscopy (SEM, TEM, STEM-in-SEM), atomic force microscopy (AFM) and small angle X-ray scattering (SAXS). - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. Further, the VAMAS/TWA 34 Project #16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration by electron microscopy (SEM, TEM) and atomic force microscopy (AFM) and two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 49th Steering Committee Meeting CY - Rio de Janeiro, Brazil DA - 23.09.2024 KW - VAMAS KW - Nanoparticles KW - Nanoparticle size and shape distribution KW - Particle number concentration KW - Interlaboratory comparison KW - Standardisation PY - 2024 UR - http://www.vamas.org/twa34/index.html AN - OPUS4-61422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fagan, J. A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA 34 Nanoparticle Populations Combined Projects P15 and P16 N2 - The progress in the VAMAS Project #15 "Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of electron microscopy (SEM, TEM, STEM-in-SEM), atomic force microscopy (AFM) and small angle X-ray scattering (SAXS). - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. Further, the VAMAS/TWA 34 Project #16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration by electron microscopy (SEM, TEM) and atomic force microscopy (AFM) and two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. - Discussion of sample preparation issues - Publication of the results in 2026 T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting CY - London, United Kingdom DA - 14.09.2025 KW - VAMAS KW - Interlaboratory comparison KW - Particle size and shape distribution KW - Particle number concentration KW - Standardisation PY - 2025 UR - https://www.vamas.org/twa34/index.html AN - OPUS4-64234 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS Regional Report Advanced Materials Germany 2025 N2 - Regional standardisation activities and how VAMAS can help in any way to promote activities are reported. Activities related to organisational updates, government initiatives/priorities (especially related to Advanced Materials), details of any strategy documents publicly available, networks within Germany and how we engage are presented. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting CY - London, United Kingdom DA - 14.09.2025 KW - VAMAS KW - Interlaboratory comparison KW - Advanced materials KW - Standardisation PY - 2025 AN - OPUS4-64232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Stockmann, Jörg Manfred T1 - A new XPS test material for more reliable surface analysis of microstructures N2 - Small-area XPS analysis is one of the most popular and powerful methods for analysing the surface of features in the micro-range. When measuring microstructures, the ques-tion arises whether the measuring point is really located at the point intended to be ana-lysed. Information in a measured spectrum might originate within the field of view (FoV) on the surface of the sample, from outside the FoV, or even from inherent contamination. To ensure that small structures can be measured correctly regardless of user and instru-ment, certain instrument and sample settings must be known and selected correctly: beam and aperture size as well as the aperture settings and the approximate dimensions of the structure to be analysed. This is the only way to ensure that the information in the spectrum originates only from the FoV on the analysed structure. To test the performance of the XPS instruments, a dedicated test material was developed that consists of a gold surface on which 8 circles and 8 squares of chrome are incorpo-rated using a masking process, so that the Au substrate and the Cr structure surfaces are in the same surface plane. In order to be able to test as many as possible instruments from different manufacturers, the structures have been designed with a size ranging from 300 µm down to 7 µm. The layout of the test material has been optimised in regard of the handling. The structures are arranged along lines instead of a circumference, marking arrows around the smaller structures (≤50 µm) are added, and the lithography mask is optimised regarding edge and diffraction effects. Furthermore, the manufacturing process was changed from electron-beam deposition to mask lithography due to costs reasons. The structures on the test material were measured with a metrological SEM to determine their accurate dimensions and check the repeatability of the manufacturing process. XPS investigations with a Kratos AXIS Ultra DLD and an ULVAC-Phi Quantes demonstrates the suitability of this new test material for measuring the analysed area. T2 - ECASIA 2024 CY - Gothenburg, Sweden DA - 09.06.2024 KW - Small-area XPS KW - Test material KW - Field of view KW - Imaging PY - 2024 AN - OPUS4-60539 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matthews, Lauren T1 - Approaches to Surface Analysis of Modified Quartz Nanopipettes N2 - Nanopipettes are a type of solid-state nanopore with needle-like geometry. Their applications range from imaging, sensing, diagnostics, and use as injectors. The response of nanopipette sensors is highly dependent on the size, geometry and chemical properties of the sensing region. As nanopipettes are increasingly tuned and modified for specific analytes, a better understanding of the surface chemistry and morphology of the inner channel is necessary. For exploring these effects, quartz nanopipettes were modified by gas phase silanization, a well-utilised technique in the field to enhance performance of nanopipettes, and further functionalised with a metal bis thiolate complex, to aid in chemical analysis. The inner channel of the sensing region was exposed with focused ion beam (FIB) milling as a dedicated sample preparation method for nanoscale surface analysis. The sample characterisation involved scanning electron microscopy (SEM), Auger electron spectroscopy (AES) and low-energy energy dispersive x-ray spectroscopy (EDX). The results demonstrate the first steps towards full characterisation of nanopipettes at the nanoscale, notably with access to the inner channel. The methods used here can be applied to gain further understanding of the response of these sensors to complex analytes, and allow for the study of different surface functionalisation at the all-important sensing region. T2 - 2024 Spring Meeting of the European Materials Research Society (E-MRS) CY - Strasbourg, France DA - 27.05.2024 KW - Nanopipettes KW - FIB KW - Surface analysis KW - Surface modification KW - Silanisation PY - 2024 AN - OPUS4-60449 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heilmann, Maria A1 - Hodoroaba, Vasile-Dan T1 - Project 16 Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension N2 - The progress of the VAMAS Project 16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" in TWA 34 Nanoparticle Populations is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration • electron microscopy (SEM, TEM) and atomic force microscopy (AFM) • two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - VAMAS Regional Workshop 2023 - What can pre-normative research do for industry? CY - Online meeting DA - 24.01.2023 KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - SiO2 KW - Electron microscopy KW - AFM PY - 2023 UR - https://www.bam.de/Content/EN/Events/2023/2023-01-24-vamas-regional-workshop.html AN - OPUS4-57221 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - del Giorgio, Elena T1 - Visible and NIR emissive lanthanide(III) surfaces for new luminescent materials N2 - Luminescent lanthanides(III) offer exceptional optical properties that can overcome issues often encountered with other fluorophores (e.g. organic dyes). Their long lifetimes up to milliseconds, low photobleaching and sharp and characteristic emission peaks make the lanthanides extremely valuable for the development of advanced luminescent materials. Previous work on Ru(II) and Ir(III) gold surfaces further highlights the potential of employing the luminescence of metal complexes for the fabrication of sensing platforms and devices. Here, we incorporate visible and NIR-emitting lanthanide(III) complexes Ln2L3 (Ln = Eu(III), Nd(III), Yb(III)) to gold and plasmonic surfaces, translating the unique optical properties of the lanthanides(III) to practical devices. The Ln2L3 complexes are deposited on the surfaces with different methods, ranging from polymer aided physisorption to the covalent attachment on the gold surface. Furthermore, we exploit the high sensitivity to the coordination environment of lanthanides(III) to design and prepare a sensing platform. T2 - 17th Conference on Methods and Applications in Fluorescence (MAF 2022) CY - Göteborg, Sweden DA - 11.09.2022 KW - Luminescent materials KW - Lanthanide(III) KW - Surface morphology KW - AFM KW - SEM/EDS PY - 2022 UR - https://maf2022.com/ AN - OPUS4-56126 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas T1 - Normung in der Oberflächen-und Schichttechnik N2 - Report über Normungsaktivitäten im Bereich der Messtechnk an Oberflächen und dünnen Schichten. Übersicht über Methoden und Vorstellung von laufenden Projekten mit Bezug zur Normung T2 - PlasmaGermany Herbstmeeting 2022 CY - Bielefeld, Germany DA - 07.11.2022 KW - Oberflächenmesstechnik KW - Spektroskopie KW - Ellipsometrie KW - XPS KW - Dünne Schichten PY - 2022 AN - OPUS4-56483 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - External Liaison Report ISO/TC 202 'Microbeam Analysis' to ISO/TC 229 'Nanotechnologies' N2 - The liaison report from the ISO Technical Committee ISO/TC 202 'Microbeam Analysis' for the November 2022 ISO/TC 229 Nanotechnologies Plenary Meeting Nanotechnologies Liaison Coordination Group (NLCG) is provided. Essential Information such as newly published standards and projects in develeopment relevant for ISO/TC 229 resulted from the progress within the last year and additional comments on behalf of ISO/TC 202 are included in the report. KW - ISO/TC 202 KW - ISO/TC 229 KW - VAMAS KW - Nanotechnologies KW - Microbeam Analysis KW - Standardisation PY - 2022 SP - 1 EP - 4 CY - ISO, Geneva, CH AN - OPUS4-56734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Nanoparticle Populations N2 - Two new projects P15 Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension and P16 Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension have been started at VAMAS/TWA 34 under the lead of BAM. First results are presented and discussed. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 47th Steering Committee Meeting CY - Turin, Italy DA - 18.10.2022 KW - VAMAS KW - Nanoparticles KW - Inter-laboratory comparison KW - Particle size distribution KW - Nanoparticle concentration PY - 2022 AN - OPUS4-56196 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - (hard) x ray photoelectron spectroscopy as tool in nano-analytics N2 - Selected samples are used to show, that photoelectron spectroscopy is an important tool for measuring nano-objects, especially for determing the chemical composition and structure on the nanosacle. XPS with different energies offers new possibilities in depth-profiling. T2 - SFB 1073 Colloquium CY - Göttingen, Germany DA - 22.02.2024 KW - X-ray photoelectron spectroscopy KW - Core-shell nanoparticle KW - Graphene related 2D materials PY - 2024 AN - OPUS4-59589 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison of ISO/TC 202 Microbeam Analysis with VAMAS/TWA 37 Quantitative Microstructural Analysis N2 - The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the identification and launching corresponding VAMAS projects. The ongoing project "FIB sample processing for TEM" is presented in detail. T2 - 30th Meeting of ISO/TC 202 Microbeam Analysis CY - Berlin, Germany DA - 22.11.2023 KW - VAMAS KW - ISO/TC 202 KW - Microbeam Analysis KW - Standardisation KW - Electron microscopy KW - FIB PY - 2023 AN - OPUS4-58984 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Pellegrino, F. T1 - Safe-by-Design Synthesis of 2D Materials N2 - The use of a dedicated approach: DoE for synthesis + characterization + Chemometric Analysis, is a valuable method for the safe-by-design synthesis of several types of materials for large-scale application in catalysis, energy harvesting, biomedical and environmental applications, etc. This approach is not only related to the material synthesis, but can be expanded to any type of molecules/material, with relevant saving of solvents, energy and times. T2 - Congress of the Environment and Cultural Heritage - Section of Italian Chemistry Society CY - Ischia, Italy DA - 28.09.2023 KW - Safe-by-design KW - 2D materials KW - Synthesis KW - Chemometric analysis PY - 2023 UR - https://www.congressodabc.it/ AN - OPUS4-59780 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Terborg, R. A1 - Procop, Mathias T1 - Theoretical calculation and experimental determination of x-ray production efficiencies for copper, zirconium, and tungsten N2 - The X-ray intensities of the K-, L- and M-lines of copper, zirconium and tungsten have been measured with an energy-dispersive X-ray spectrometer of known efficiency as function of photon energy. X-ray production efficiencies were determined from the measured intensities for Kα- and L-series of Cu and Zr and for the L- and M-series of W. These data were compared to calculated X-ray production efficiencies based on the widely used matrix correction models of Pouchou and Pichoir (XPP) and Bastin (PROZA96). Our results indicate that a replacement of the stopping power in the PROZA96 algorithm by expressions of Joy and Jablonski has only a minor influence on the calculated X-ray production efficiencies. In contrast, the modifications of the ionization cross-section show a stronger effect. We replaced the ionization cross-sections for K lines of the PROZA96 algorithm with different models. The results for L- and M-Lines are different. For the L-lines of Cu the original XPP and PROZA96 models show the best agreement while using the Bote cross-sections result in an overestimation. For the Zr-L and W-L1, -L2, -L3 X-ray production efficiencies, the Bote cross-sections lead to a significant improvement compared to all other models. The original XPP model represents the best agreement for the M5 efficiencies but underestimates the M4 efficiencies. There is no superior model or modification because the parameter sets in the models need to be aligned to each other. However, using the ionization cross-sections of Bote, which are based on quantum mechanical calculations, show promising results in many cases. KW - X-ray production efficiency KW - EPMA KW - Copper KW - Zirconium KW - Tungsten PY - 2023 DO - https://doi.org/10.1093/micmic/ozad067.110 SN - 1435-8115 VL - 29 IS - Supplement 1 SP - 245 EP - 246 PB - Oxford University Press CY - Oxford AN - OPUS4-58339 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - Delivering Impact - A new ISO standard on the identification of nanoparticles N2 - Nanoparticles (NPs) are tiny – around 1 to 100 billionths of a meter – and can have different chemistries and behaviours than the same material of larger size. This property has led to advances in a wide range of industries, but it can also confer toxicity. Size measurements are the main way NPs are identified but a lack of standardised methods for identifying ones with complex shapes has hindered evaluation of their potential harm. KW - Nanoparticles KW - Standardisation KW - Particle size distribution KW - nPSize KW - ISO 21363 PY - 2024 UR - https://www.euramet.org/casestudies/casestudiesdetails/news/default-c3b26209e8 SP - 1 EP - 2 PB - EURAMET CY - Braunschweig AN - OPUS4-59626 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - INPR A1 - Corrao, Elena A1 - Gouasmi, Meriem A1 - Sordello, Fabrizio A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Joerg A1 - Maurino, Valter A1 - Pellegrino, Francesco T1 - Tailoring TiO2 Morphology and Surface Chemistry for Optimized Photocatalytic Activity in rGO Hybrids N2 - TiO2–reduced graphene oxide (rGO) hybrids were investigated in this study to elucidate how TiO2 morphology and surface chemistry govern charge-transfer pathways and, ultimately, reaction selectivity. Three anatase TiO2 nanostructures were compared: bipyramids predominantly exposing {101} facets (bipy) and two nanosheet-like samples enriched in {001} facets, either fluorinated (n-sh) or thermally defluorinated and {101}-enriched (n-sh_873K). A constant rGO loading (2 wt.%) was introduced via in situ hydrazine reduction of graphene oxide in the presence of TiO2. Photocatalytic activity was evaluated under Xe-lamp irradiation in two model reactions probing oxidative and reductive pathways: phenol degradation and H2 evolution using formic acid as a scavenger. rGO systematically enhanced phenol degradation for all morphologies, with bipy+rGO showing the highest activity. In contrast, H2 evolution was consistently suppressed upon rGO incorporation across all TiO2 samples, although the bipyramidal morphology remained the most active within each series. These results highlight that facet exposure and surface functionalization dictate the beneficial or detrimental role of rGO depending on the targeted photocatalytic pathway. KW - Photocatalytic activity KW - Reduced graphene oxide KW - TiO2 KW - Surface chemistry KW - 2D materials PY - 2026 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-653476 DO - https://doi.org/10.26434/chemrxiv-2026-65917 SP - 1 EP - 12 PB - American Chemical Society (ACS) AN - OPUS4-65347 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Madbouly, Loay Akmal T1 - Chemical analysis of commercial functionalized graphene along the production process N2 - Graphene has been commercialized for over a decade. For many applications like flexible electronics, coating of different materials like paper or for textiles, it used in the form of suspensions or inks. Functionalization enables tailoring the properties of graphene, such as the sheet resistance. X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy are used to characterize the chemical composition of graphene flakes, functionalized and otherwise. In this study, we investigate the following set of commercial materials: fluorine-functionalized graphene (F-graphene) and nitrogen-functionalized graphene (N-graphene) as well as unfunctionalized graphene (G-graphene, as the starting material) in the forms of powders, suspensions, and inks, the latter as the final commercial product. Raman spectroscopy and XPS are complementary techniques. Our results obtained from Raman spectroscopy confirmed the existence of graphene structures in all samples investigated and provided a comparative insight on the structural defects between samples. XPS was used to investigate the chemical states of elements in graphene, such as sp2 and sp3 hybridization states of carbon, as well as the chemical effect of functionalization on graphene. High resolution XPS analysis was performed for C 1s, F 1s and N 1s core-levels for all the graphene samples. The XPS results showed the elemental composition and the impurities of each sample. All powders showed less presence of carboxyl groups, compared to their respective suspensions and inks. F-functionalized suspension and inks showed a significant decrease in the at-% of fluorine relative to the powder. These valuable insights, particularly when correlated, allowed the tracking of the structural and chemical changes of graphene along its production process. T2 - 3rd FUB Nano Colloquium CY - Berlin, Germany DA - 15.07.2025 KW - Functionalized graphene KW - Graphene-related 2D materials (GR2M) KW - Raman Spectroscopy KW - XPS KW - Inks PY - 2025 AN - OPUS4-64116 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Madbouly, Loay Akmal A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Raman Spectroscopy and X-ray Photoelectron Spectroscopy of Commercial Functionalized Graphene N2 - Graphene has found widespread commercial use, particularly in flexible electronics and coatings for substrates such as paper and textiles, in the form of suspensions and inks (Zhang et al., 2017). Functionalization of graphene allows fine-tuning of properties like electrical conductivity. Structural and chemical features of graphene materials are typically analyzed by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS). While Raman spectroscopy plays a critical role in identifying the presence of graphene and characterizing its structural defects (Pollard et al., 2017), XPS examines the chemistry of graphene. This study investigates three types of graphene materials — graphene (unfunctionalized, G-graphene), fluorine-functionalized graphene (F-graphene), and nitrogen-functionalized graphene (N-graphene) — across three physical forms: powders, suspensions, and embedded in inks. Functionalization was performed via plasma treatment of G-graphene with fluorine or ammonia gases. Suspensions were obtained by dispersing powders in distilled water, while inks were formulated using diacetone alcohol, carbon black, and graphene. Raman spectroscopy analysis confirmed the graphitic nature of all materials and revealed differences in defect density across different forms. The characteristic D, G, and D’ bands varied in relative intensity, offering insight into structural integrity and functionalization effects. XPS measurements examined core-level spectra (C 1s, F 1s, N 1s), revealing chemical bonding environments and hybridization states, including the sp² and sp³ states. A notable decline in fluorine content in F-graphene suspensions and inks, relative to powders, was observed. Existence of organic fluorine and total absence of metallic fluorine were observed. Raman spectroscopy and XPS data provided a correlated view of structural and chemical evolution through the graphene production chain. T2 - Joint Regulatory Risk Assessors Summit – Advancing Safety & Sustainability Assessments of Advanced Materials CY - Paris, France DA - 19.06.2025 KW - Graphene-related 2D materials (GR2M) KW - Inks KW - Raman Spectroscopy KW - XPS KW - Functionalized graphene PY - 2025 UR - https://macrame-project.eu/macrame-meetings-workshops/jointrras/#Agenda AN - OPUS4-63661 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rastgou, Masoud A1 - Hülagü, Deniz A1 - Danilenko, Aleksandr A1 - Manoocheri, Farshid A1 - Hertwig, Andreas A1 - Ikonen, Erkki T1 - Comparison of thin-film thickness measurements using ellipsometry and reflectometry with uniform samples N2 - This study evaluates spectroscopic ellipsometry and reflectometry using high-quality SiO2 and Al2O3 thin-films on Si substrates, thereby facilitating a detailed assessment of consistency of measurement results and uncertainty analyses. The results with detailed uncertainty budgets indicate good agreement between the two methods across a broad layer thickness range from 10 nm to 2000 nm, with deviations remaining well within the measurement uncertainties. Ellipsometry results have lower uncertainty than reflectometry results especially with the thinner layers, whereas reflectometry uncertainties are lower with the thickest layers studied. This work underscores the importance of rigorous thickness characterization and reliable uncertainty evaluation as critical factors in advancing both modeling and measurement practices in thin-film metrology. KW - Ellipsometry KW - Reflectometry KW - Thin Film Metrology KW - Measurement Accuracy PY - 2026 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-655209 DO - https://doi.org/10.1088/1681-7575/ae3964 SN - 0026-1394 VL - 63 IS - 1 SP - 1 EP - 14 PB - IOP Publishing CY - Bristol, UK AN - OPUS4-65520 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Cano Murillo, Natalia A1 - Ghasem Zadeh Khorasani, Media A1 - Silbernagl, Dorothee A1 - Hahn, Marc Benjamin A1 - Hodoroaba, Vasile-Dan A1 - Sturm, Heinz T1 - Cover image for the article "Nanomechanical study of polycarbonate/boehmite nanoparticles/epoxy ternary composite and their interphases" N2 - The image designed by Natalia Cano Murillo and colleagues shows the cross section of a ternary composite (boehmite/polycarbonate/epoxy, 80μm x 80μm). The surface was measured by AFM kelvin probe microscopy, yielding the surface potential which is shown as 3D‐surface and contour lines. The sample was further subjected to AFM force spectroscopy with a lateral resolution of 1μm², yielding the local Young's modulus, projected in false colors on the 3D surface. The ternary system, containing boehmite nanoparticles, shows a broad distribution of modulus, desirable for optimized macroscopic mechanical properties, such as high stiffness as well as toughness. KW - Boehmite KW - Epoxy KW - Polycarbonate KW - AFM KW - BNP PY - 2020 DO - https://doi.org/10.1002/app.50400 SN - 0021-8995 SN - 1097-4628 VL - 138 IS - 12 SP - 1 PB - Wiley CY - New York, NY AN - OPUS4-51831 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Topolniak, Ievgeniia T1 - Micropatterning of mussel-inspired materials - Empower selective functionality N2 - Surface-modification platforms that are universally applicable are vital for the development of new materials, surfaces, and nanoparticles. Mussel-inspired materials (MIMs) are widely used in various fields because of their strong adhesive properties and post-functionalization reactivity. However, conventional MIM coating techniques have limited deposition selectivity and lack structural control, which has limited their use in microdevices that require full control over deposition. To overcome these limitations, we developed a micropatterning technique for MIMs using multiphoton lithography, which does not require photomasks, stamps, or multistep procedures. This method enables the creation of MIM patterns with micrometer resolution and full design freedom and paves the way for innovative applications of MIMs in various multifunctional systems and microdevices, such as microsensors, MEMS, and microfluidics. T2 - BioCHIP Berlin - International Forum on Biochips and Microfabrication CY - Berlin, Germany DA - 28.05.2024 KW - Mussel inspired materials KW - Multiphoton lithography KW - Two photon polymerisation PY - 2024 AN - OPUS4-60254 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - The role of Critical Raw Materials in Advanced Materials for the Energy Transition N2 - Based on the UBA report “Advanced materials for energy transition” by Xenia Knigge and Jörg Radnik the role of critical raw materials is discussed. Critical raw materials are needed in main fields of the energy transition, like photovoltaic, fuel cells, wind energy, and batteries. For the optimisation of the use of these materials different scenarios are discussed like (i) decreasing the needed amount of raw materials, (ii) searching for alternatives, (iii) using technologies which do not require critical raw materials, (iv) increasing the recycling rates, and (v) expanding the raw material sources. T2 - IRISS policy dialogue CY - Online meeting DA - 12.01.2026 KW - Solar Cells KW - Fuel cells KW - Batteries KW - Multi-use materials PY - 2026 AN - OPUS4-65451 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schusterbauer, Robert A1 - Mrkwitschka, Paul A1 - Sahre, Mario A1 - Corrao, Elena A1 - Zurutuza, Amaia A1 - Doolin, Alexander A1 - Pellegrino, Francesco A1 - Radnik, Jörg A1 - Donskyi, Ievgen S. A1 - Hodoroaba, Vasile-Dan T1 - Correlative Chemical Imaging to Reveal the Nature of Different Commercial Graphene Materials N2 - Proper physicochemical characterization of advanced materials and complex industrial composites remains a significant challenge, particularly for nanomaterials, whose nanoscale dimensions and mostly complex chemistry challenge the analysis. In this work, we employed a correlative analytical approach that integrates atomic force microscopy (AFM), scanning electron microscopy (SEM) coupled with energy‐dispersive X‐ray spectroscopy (EDS), time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS), Auger electron spectroscopy (AES), and Raman spectroscopy. This combination enables detailed chemical and structural characterization with sub‐micrometer spatial resolution. Three commercial graphene‐based materials of varying complexity were selected and investigated to test the analytical performance of this approach. Furthermore, one of the commercial graphene oxide samples was chemically functionalized via amination and fluorination. This allowed us to assess how surface modifications influence both the material properties and the limits of the applied analytical techniques. KW - Analytical methods KW - Commercial products KW - Correlative analysis KW - Graphene KW - Surface imaging PY - 2026 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-654765 DO - https://doi.org/10.1002/smtd.202502344 SN - 2366-9608 SP - 1 EP - 10 PB - Wiley VHC-Verlag AN - OPUS4-65476 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Habibimarkani, Heydar A1 - Prinz, Carsten A1 - Sahre, Mario A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - CV, TEM, XRD and XPS/HAXPES datasets of FeNi-based nanoparticles for the oxygen evolution reaction N2 - The datasets from Cyclic Voltammetry, Transmision Electron Microscopy, X-ray Diffraction, and (Hard Energy) X-ray Photoelectron Spectroscopy are related to the publication H. Habibimarkani, S.-L. Abram, A. Guilherme Buzanich, C. Prinz, M. Sahre, V.-D. Hodoroaba and J. Radnik "In-depth analysis of FeNi-based nanoparticles for the oxygen evolution reaction" Scientific Reports (2025), https://doi.org/10.1038/s41598-025-92720-3 Details of the materials and the experimental procedures are described in this publications. KW - Oxygen evolution reaction KW - Fe-Ni nanopartices KW - Comprehensive analysis PY - 2025 DO - https://doi.org/10.5281/zenodo.14975964 PB - Zenodo CY - Geneva AN - OPUS4-63335 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Madbouly, Loay Akmal T1 - Chemical analysis of commercial functionalized graphene along the production process N2 - Graphene has found widespread commercial use, particularly in flexible electronics and coatings for substrates such as paper and textiles, in the form of suspensions and inks (Zhang et al., 2017). Functionalization of graphene allows fine-tuning of properties like electrical conductivity. Structural and chemical features of graphene materials are typically analyzed by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS). While Raman spectroscopy plays a critical role in identifying the presence of graphene and characterizing its structural defects (Pollard et al., 2017), XPS examines the chemistry of graphene. This study investigates three types of graphene materials — graphene (unfunctionalized, G-graphene), fluorine-functionalized graphene (F-graphene), and nitrogen-functionalized graphene (N-graphene) — across three physical forms: powders, suspensions, and embedded in inks. Functionalization was performed via plasma treatment of G-graphene with fluorine or ammonia gases. Suspensions were obtained by dispersing powders in distilled water, while inks were formulated using diacetone alcohol, carbon black, and graphene. Raman spectroscopy analysis confirmed the graphitic nature of all materials and revealed differences in defect density across different forms. The characteristic D, G, and D’ bands varied in relative intensity, offering insight into structural integrity and functionalization effects. XPS measurements examined core-level spectra (C 1s, F 1s, N 1s), revealing chemical bonding environments and hybridization states, including the sp² and sp³ states. A notable decline in fluorine content in F-graphene suspensions and inks, relative to powders, was observed. Existence of organic fluorine and total absence of metallic fluorine were observed. Raman spectroscopy and XPS data provided a correlated view of structural and chemical evolution through the graphene production chain (Figure 1). T2 - RamanFest 2025 CY - Frankfurt, Germany DA - 02.07.2025 KW - Functionalized graphene KW - Graphene-related 2D materials (GR2M) KW - Raman Spectroscopy KW - XPS KW - Inks PY - 2025 AN - OPUS4-64114 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Madbouly, Loay Akmal T1 - Raman Spectroscopy and X-ray Photoelectron Spectroscopy of Commercial Functionalized Graphene N2 - Graphene has been commercialized for over a decade. For many applications like flexible electronics, coating of different materials like paper or for textiles, it used in the form of suspensions or inks [1]. Graphene powders are typically used as the starting material for the synthesize of graphene suspensions and graphene inks. Functionalization enables tailoring the properties of graphene, such as the sheet resistance. X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, along other techniques are used to characterize graphene flakes, functionalized and otherwise. Raman spectroscopy is necessary as a primary step to validate the existence of graphene structure in graphene powders [2]. XPS is commonly used to investigate the elemental composition, including impurities, and the chemical structure of graphene. In this study, we investigate the following set of commercial materials: fluorine-functionalized graphene (F-graphene) and nitrogen-functionalized graphene (N-graphene) as well as unfunctionalized graphene (G-graphene) in the forms of powders, suspensions, and inks. The functionalization process for the graphene powder was carried out in a plasma reactor by purging fluorine and ammonia gases, in separate processes, over the G-graphene powder. The suspensions were prepared by adding distilled water to the powders. The inks consist of diacetone alcohol, carbon black, and graphene powders. Raman spectroscopy and XPS are complementary techniques. Our results obtained from Raman spectroscopy confirmed the existence of graphene structures in all samples and provided a comparative insight on the structural defects between samples. XPS was used to investigate the chemical states of elements in graphene, such as sp2 and sp3 hybridization states of carbon, as well as the chemical effect of functionalization on graphene. High resolution XPS analysis was performed for C 1s, F 1s and N 1s core-levels for all the graphene samples: G-graphene, F-graphene, and N-graphene, in all forms. The XPS results showed the elemental composition and the impurities of each sample. All powders showed less presence of carboxyl groups, compared to their respective suspensions and inks. F-functionalized suspension and inks showed a significant decrease in the at% of fluorine relative to the powder. These valuable insights, independent and when correlated, allowed the tracking of the structural and chemical changes of graphene along its production process. T2 - E-MRS 2025 CY - Strasbough, France DA - 26.05.2025 KW - Functionalized graphene inks PY - 2025 AN - OPUS4-64113 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Habibimarkani, Heydar A1 - Abram, Sarah-Luise A1 - de Oliveira Guilherme Buzanich, Ana A1 - Prinz, Carsten A1 - Sahre, Mario A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - In-depth analysis of FeNi-based nanoparticles for the oxygen evolution reaction N2 - This study investigates the effect of varying iron-to-nickel ratios on the catalytic performance of Fe-Ni oxide nanoparticles (NPs) for the oxygen evolution reaction (OER). Addressing the issue of high energy wastage due to large overpotentials in OER, we synthesized and characterized different NP catalysts with different Fe: Ni oxide ratios. Transmission Electron Microscopy (TEM), Energy Dispersive X-ray Spectroscopy (EDS), and X-ray Diffraction (XRD) were employed to determine the morphology, elemental and phase composition of the NPs. Furthermore, in-depth profiling with X-ray Photoelectron Spectroscopy (XPS) and Hard X-ray Photoelectron Spectroscopy (HAXPES) revealed that iron predominantly exists as oxide, while nickel exhibits both metallic and oxidic forms depending on the Fe content. XPS indicated an enrichment of iron at the NP surface, whereas HAXPES and EDS data agreed on the bulk stoichiometry. The assessment of the catalytic activity via cyclic voltammetry (CV) showed that the Fe: Ni ratio of 2:3 exhibited superior performance, characterized by lower overpotential and a smaller Tafel slope. KW - Fe-Ni oxide KW - Nanoparticles KW - OER KW - Catalytic performance KW - Cyclic voltammetry PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-626932 UR - https://www.nature.com/articles/s41598-025-92720-3 DO - https://doi.org/10.1038/s41598-025-92720-3 VL - 15 IS - 1 SP - 1 EP - 17 PB - Springer Nature AN - OPUS4-62693 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -