TY - CONF A1 - Radnik, Jörg T1 - Comparative chemical analysis of Ni-Fe oxide nanoparticles N2 - Ni-Fe oxide nanoparticles have gained a lot of interest because of their high activity in the oxygen evolution reaction (OER) which is crucial for water splitting. [1] Although there have been great efforts in the last years, the understanding of the synergistic effect between Fe and Ni is still under discussion. Therefore, we prepared different Ni-Fe oxide nanoparticles with different compositions from pure iron oxide to pure nickel oxide adapting a known procedure. [2,3] Size and morphology of the nanoparticles depend on the composition which was shown with Transmission Electron Microscopy (TEM). The compositions of the nanoparticles were measured with a comparative approach using X-ray Photoelectron Spectroscopy (XPS), Hard X-ray Photoelectron Spectroscopy (HAXPES), and Energy Dispersive X-Ray Spectroscopy (EDS) coupled with the TEM providing detailed chemical information of the nanoparticles in different sample regions. EDS reveals that the different sample regions are dominated by one of the components, Fe or Ni, but a slight mixing between the components can be found (see Figure 1), which was confirmed with X-ray Diffraction (XRD). XPS indicates the enrichment of Fe at the sample surface, while HAXPES and EDS data agree on the stoichiometry of the bulk. High-resolution XPS and HAXPES exhibit some differences in the valence states of Fe and Ni, whereas Ni seems to be easier to reduce than Fe. Further investigations combining these different techniques and additionally Secondary Ion Mass Spectrometry (ToF-SIMS) are ongoing by using in situ approaches and coupling cyclic voltammetry to the analytical techniques. T2 - ECASIA 2024 CY - Gothenburg, Sweden DA - 09.06.2024 KW - Oxygen evolution reaction KW - Transmission Electron Microscopy KW - (Hard) X-ray Photoelectron Spectroscopy KW - Synergistic effects PY - 2024 AN - OPUS4-60534 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mezera, Marek T1 - Influence of the pulse repetition rate on the chemical and morphological properties of laser generated surface structures N2 - Inter-pulse accumulation of heat could affect the chemical and morphological properties of the laser processed material surface. Hence, the laser pulse repetition rate may restrict the processing parameters for specific laser-induced surface structures. In this study, the evolution of various types of laser-induced micro- and nanostructures at various laser fluence levels, effective number of pulses and at different pulse repetition rates (1 – 400 kHz) are studied for common metals/alloys (e.g. steel or titanium alloy) irradiated by near-infrared ultrashort laser pulses (925 fs, 1030 nm) in air environment. The processed surfaces were characterized by optical and scanning electron microscopy (OM, SEM), energy dispersive X-ray spectroscopy (EDX) as well as time of flight secondary ion mass spectrometry (TOF-SIMS). The results show that not only the surface morphology could change at different laser pulse repetition rates and comparable laser fluence levels and effective number of pulses, but also the surface chemistry is altered. Consequences for medical applications are outlined. T2 - European Materials Research Society Spring 2021 Meeting CY - Online meeting DA - 31.05.2021 KW - Laser-induced pariodic surface structures KW - LIPSS PY - 2021 AN - OPUS4-52778 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pellegrino, F. A1 - Sordello, F. A1 - Mino, L. A1 - Prozzi, M. A1 - Mansfeld, Ulrich A1 - Hodoroaba, Vasile-Dan A1 - Minero, C. T1 - Polyethylene Glycol as Shape and Size Controller for the Hydrothermal Synthesis of SrTiO3 Cubes and Polyhedra N2 - Understanding the correlation between the morphological and functional properties of particulate materials is crucial across all fields of physical and natural sciences. This manuscript reports on the investigation of the effect of polyethylene glycol (PEG) employed as a capping Agent in the synthesis of SrTiO3 crystals. The crucial influence of PEG on both the shape and size of the strontium titanate particles is revealed, highlighting the effect on the photocurrents measured under UV–Vis irradiation. KW - Polyethylene glycol KW - Strontium titanate KW - Controlled morphology KW - Photoelectrochemistry KW - Electron microscopy KW - EDS PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-512892 DO - https://doi.org/10.3390/nano10091892 VL - 10 IS - 9 SP - 1892 PB - MDPI CY - Basel, CH AN - OPUS4-51289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Standardized Chemical Composition Analysis of Graphene Oxide Flakes with SEM/EDS and XPS Works Reliably N2 - Reliable quantification of the chemical composition of graphene-related 2D materials (GR2M) as powders and liquid suspensions is a challenging task. Analytical methods such as XPS, ICP-MS, TGA and FTIR are recommended in projects at standardization bodies. The parameters to be measured are also defined, e.g. the oxygen-to-carbon (O/C) concentration ratio, the trace metal impurities, or the functional groups present. In this contribution, for the first time, the capability of SEM/EDS to reliably quantify the O/C ratio in a well-characterized graphene oxide (GO) material is evaluated. The robustness of the SEM/EDS results under various measurement conditions is tested by comparison to the established XPS analysis. A crucial step is the sample preparation from liquid suspension with GO flakes onto a substrate for analysis with both EDS and XPS. It is demonstrated that if a closed and enough thick drop-cast spot is deposited on a substrate, both surface-sensitive XPS analysis and bulk-characterizing EDS result in very similar elemental composition of oxygen and carbon. Hence, the theoretical, expected O/C atomic ratio values for pure GO of ~0.5 are achieved with both methods. Further, the effect of untight deposited material causing co-analysis of the silicon substrate, is evaluated for both methods, XPS and EDS. Note that all the EDS results in this study have been quantified standardless. The standard measurement procedure including the GO material considered here as a candidate reference material will make a significant contribution to analyse reliably the chemical composition of GR2M with SEM/EDS as one of the most widely used methods in analytical laboratories. T2 - Graphene Week 2025 CY - Vicenza, Italy DA - 22.09.2025 KW - EDX KW - Graphene-related 2D materials KW - O/C ratio KW - Standardisation KW - Samle preparation KW - XPS PY - 2025 AN - OPUS4-64261 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mrkwitschka, Paul A1 - Sahre, Mario A1 - Corrao, Elena A1 - Pellegrino, Francesco A1 - Hodoroaba, Vasile-Dan T1 - Wire-Print as a Sample Preparation Procedure Suitable for Accurate Morphological Characterization of Constituent Particles for Graphene-Related 2D-Materials N2 - In this study we have systematically tested the efficacy of a new deposition procedure for graphene-related 2D materials (GR2M’s) from liquid suspension onto a substrate for quantitative analysis of their size and shape distribution with electron microscopy. The technique is an extension of the conventional drop-casting method, and we have designated it “wire-print” deposition. It consists of two steps, first one being usual drop-casting on a copper substrate and second one involving a thin copper wire with a sub-mm diameter being dipped into the deposited droplet and retracted with a corresponding half-spherical droplet attached on its tip and final deposition of this entire nL-amount of suspension onto e.g. a silicon wafer for microscopical, detailed analysis. 11 series of such a wire-print deposition for a graphene-based ink have been considered, whereby various conditions (treatment of the starting suspension) have been experimented with a repetition of up to 10 times per condition, all together 86 spots on a silicon wafer of 10 mm x 10 mm. The evaluation of one series of 8 repeated wire-print depositions reveal that the deposited spots are visualized with SEM. The weak presence of coffee-rings, irregular spot shape, and presence of agglomerates should be noticed. Both the mean value of the 8 ECD distributions and the total number of flakes deposited in each spot show a variance in the range of 17% and 22%, respectively. In the context of accurate analysis of such challenging complex materials these numbers can be considered as excellent and demonstrate the high benefit of the wire-print deposition for accurate morphological measurements on GR2M’s. KW - Sample preparation KW - Imaging KW - 2D materials KW - Morphology KW - Size distribution PY - 2025 DO - https://doi.org/10.1093/mam/ozaf048.219 VL - 31 IS - 7 SP - 436 EP - 437 PB - Oxford Academic AN - OPUS4-63821 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Marcoulaki, E. T1 - Blueprint for a sustainable new European Centre to support safe innovation for nanotechnology N2 - This paper presents the blueprint for the operation of a sustainable and permanent European Centre of collaborating reference laboratories and research centres, to establish a one-stop shop for a wide variety of nanosafety related services, and to provide a central contact point for questions about nanosafety in Europe. The Centre aims to harmonise service provision, and bring novel risk assessment and management approaches closer to practice. T2 - NANOSAFE 2020 CY - Online meeting DA - 16.11.2020 KW - EC4SafeNano KW - European Centre KW - Nanomaterials KW - Nanosafety KW - Catalogue of Services (CoS) PY - 2020 UR - https://www.nanosafe.org/cea-tech/pns/nanosafe/en AN - OPUS4-51694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Habibimarkani, Heydar A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan A1 - John, Elisabeth T1 - Probing Surface Changes in Fe–Ni Oxide Nanocatalysts with a ToF-SIMS-Coupled Electrochemistry Setup and Principal Component Analysis N2 - Understanding catalyst surface dynamics under operating conditions is essential for improving electrocatalytic performance. Here, we present a novel approach combining electrochemical treatment with contamination-free transfer to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), followed by principal component analysis (PCA), to probe surface and interfacial changes in Ni–Fe oxide nanoparticles stabilized by polyvinylpyrrolidone (PVP) during the oxygen evolution reaction (OER). The surface analysis at three distinct treatment stages revealed distinct chemical fingerprints across pristine nanoparticles, after exposure to 1 M KOH electrolyte, and after cyclic voltammetry treatment. The results highlight a progressive transition from ligand-rich to ligand-depleted interfaces, with PVP-related fragments dominant in the early stages and metal- and electrolyte-derived species emerging after activation. Complementary ToF-SIMS analysis of electrolyte deposited on Si wafers after each treatment step confirms the concurrent leaching of PVP and Fe–Ni-based fragments during OER. These findings underscore the dynamic nature of catalyst–electrolyte interfaces and demonstrate a robust strategy for monitoring surface-sensitive chemical changes associated with the nanoparticles, especially during the initial cycles of the OER. KW - Fe-Ni oxide KW - Nanocatalysts KW - ToF-SIMS KW - Electrochemistry KW - PCA (principal component analysis) KW - OER PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-652667 DO - https://doi.org/10.1021/acs.analchem.5c03894 SN - 0003-2700 SP - 1 EP - 8 PB - American Chemical Society (ACS) AN - OPUS4-65266 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mirabella, Francesca T1 - ToF-SIMS as a new tool for nano-scale investigation of ps-laser-generated surface structures on titanium substrates N2 - In recent years, the fabrication of laser-generated surface structures on metals such as titanium surfaces have gained remarkable interests, being technologically relevant for applications in optics, medicine, fluid transport, tribology, and wetting of surfaces. The morphology of these structures, and so their chemistry, is influenced by the different laser processing parameters such as the laser fluence, wavelength, pulse repetition rate, laser light polarization type and direction, angle of incidence, and the effective number of laser pulses per beam spot area. However, the characterization of the different surface structures can be difficult because of constraints regarding the analytical information from both depth and the topographic artifacts which may limit the lateral and depth resolution of elemental distributions as well as their proper quantification. A promising technique to investigate these structures even at the nano-scale is Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), a very surface sensitive technique that at the same time allows to perform depth-profiling, imaging and 3D-reconstruction of selected ion-sputter fragment distributions on the surface. In this study we combine chemical analyses such as Energy Dispersive X-ray spectroscopy (EDX) and high-resolution scanning electron microscopy (SEM) analyses with ToF-SIMS to fully characterize the evolution of various types of laser-generated micro- and nanostructures formed on Ti and Ti alloys at different laser fluence levels, effective number of pulses and at different pulse repetition rates (1 – 400 kHz), following irradiation by near-infrared ultrashort laser pulses (925 fs, 1030 nm) in air environment or under argon gas flow. We show how this combined surface analytical approach allows to evaluate alteration in the surface chemistry of the laser-generated surface structures depending on the laser processing parameters and the ambient environment. T2 - European Materials Research Society (EMRS) Fall Meeting 2021 CY - Online meeting DA - 20.09.2021 KW - ToF SIMS KW - Nano characterization PY - 2021 AN - OPUS4-53366 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and Chemical Nanoscale Analysis of Mesoporous Mixed IrO x TiO y Thin Films as Electrode Materials N2 - Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach (1). Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too. In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted. T2 - Microscopy and Microanalysis 2024 CY - Cleveland, OH, USA DA - 28.07.2024 KW - Auger electron spectroscopy KW - Iridium oxide KW - Mesoporous thin films KW - SIMS KW - Titanium oxide KW - Porosity PY - 2024 AN - OPUS4-60805 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bresch, Harald A1 - Hodoroaba, Vasile-Dan A1 - Schmidt, Alexandra A1 - Rasmussen, K. A1 - Rauscher, H. T1 - Counting Small Particles in Electron Microscopy Images — Proposal for Rules and Their Application in Practice N2 - Electron microscopy (EM) is the gold standard for the characterisation of the morphology (size and shape) of nanoparticles. Visual observation of objects under examination is always a necessary first step in the characterisation process. Several questions arise when undertaking to identify and count particles to measure their size and shape distribution. In addition to challenges with the dispersion and identification of the particles, more than one protocol for counting particles is in use. This paper focuses on precise rules for the counting of particles in EM micrographs, as this influences the measurement accuracy of the number of particles, thus implicitly affecting the size values of the counted particles. We review and compare four different, commonly used methods for counting, which we then apply in case studies. The impact of the selected counting rule on the obtained final particle size distribution is highlighted. One main aim of this analysis is to support the application of a specific, well-defined counting approach in accordance with regulatory requirements to contribute to achieving more reliable and reproducible results. It is also useful for the new harmonised measurement procedures for determining the particle size and particle size distribution of nanomaterials. KW - Nano KW - Particle size distribution KW - Nanoparticle KW - Nanomaterial KW - OECD PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-551891 DO - https://doi.org/10.3390/nano12132238 SN - 2079-4991 VL - 12 IS - 13 SP - 2238 PB - MDPI CY - Basel AN - OPUS4-55189 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - Nano and Advanced Materials - Competences at BAM and perspectives N2 - This presentation gives an overview about the competencies and the characterization possibilities of nanoparticles at BAT, based on this the development of the OECD TG 125 at BAM. It further describes research activities at BAM concerning the characterization of nanoparticles and the way to the digital representation of these characterization possibilities. It concludes with the challenges of a digital product passport (DPP) for nanomaterial based products and the need of a digital materials passport (DMP). Finally, the activities of BAM are presented which address the former mentioned challenges from ESRP and DPP. T2 - Austausch Helmholtz Hereon / Digipass & BAM CY - Berlin, Germany DA - 07.07.2025 KW - Nanomaterials KW - ESPR KW - DPP KW - Nano KW - Advanced Materials PY - 2025 AN - OPUS4-64974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hülagü, Deniz A1 - Tobias, Charlie A1 - Dao, R. A1 - Komarow, P. A1 - Rurack, Knut A1 - Hodoroaba, Vasile-Dan T1 - Dataset accompanying the publication "Towards 3D determination of the surface roughness of core-shell microparticles as a routine quality control procedure by scanning electron microscopy" N2 - This dataset accompanies the following publication: Hülagü, D., Tobias, C., Dao, R., Komarov, P., Rurack, K., Hodoroaba, V.-D., Towards 3D determination of the surface roughness of core-shell microparticles as a routine quality control procedure by scanning electron microscopy. Sci.Rep, 14, 17936 (2024), https://doi.org/10.1038/s41598-024-68797-7. It contains SEM and AFM-in-SEM images of polystyrene (PS) core particles, polystyrene-iron oxide (PS/Fe3O4) core-shell particles, and polystyrene-iron oxide-silica (PS/Fe3O4/SiO2) core-shell-shell particles. Please refer to the publication and its supporting information for more details on the acquisition and contents of the dataset, as well as the GitHub repository at https://github.Com/denizhulagu/roughness-analysis-by-electron-microscopy. The investigated particles were produced at BAM laboratories as previously described in: Hülagü, D. et al. Generalized analysis approach of the profile roughness by electron microscopy with the example of hierarchically grown polystyrene–iron oxide–silica core–shell–shell particles. Adv. Eng. Mater. 24, 2101344, https://doi.org/10.1002/adem.202101344 (2022). Tobias, C., Climent, E., Gawlitza, K. & Rurack, K. Polystyrene microparticles with convergently grown mesoporous silica shells as a promising tool for multiplexed bioanalytical assays. ACS Appl. Mater. Interfaces 13, 207, https://dx.doi.org/10.1021/acsami.0c17940 (2020). KW - Core–shell particles KW - Image analysis KW - Roughness KW - Scanning electron microscopy KW - Atomic force microscopy KW - Tilting KW - Batch analysis PY - 2024 UR - https://zenodo.org/records/11108726 DO - https://doi.org/10.5281/zenodo.11108725 PB - Zenodo CY - Geneva AN - OPUS4-60760 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Terborg, R. A1 - Boehm, S. A1 - Kim, K. J. T1 - Analysis of elemental composition of Fe1-xNix and Si1-xGex alloy thin films by electron probe microanalysis and micro-focus X-ray fluorescence N2 - The present study reports on results of analysis of the elemental composition of thin films by electron probe microanalysis with energy dispersive (ED-EPMA) X-ray spectrometry in conjunction with the dedicated thin-film analysis software package Stratagem and by X-ray fluorescence in its version with a micro-focus X-ray fluorescence (μ-XRF) source attached to a scanning electron microscope (SEM). Two thin-film systems have been analyzed: Fe1-xNix on silicon wafer and Si1-xGex on Al2O3 substrate, in both cases the layers being grown to a thickness of about 200 nm by ion beam sputter deposition. Samples of five different atomic fractions have been produced and analyzed for each thin-film system. Moreover, reference samples with certified elemental composition and thickness have been also available. This study is part of an interlaboratory comparison organized in the frame of standardization technical committee ISO/TC 201 “Surface chemical analysis.” Two laboratories have been analyzed by ED-EPMA (one laboratory standardless and one laboratory using both standardless and with standards variants) and one laboratory by μ-XRF (standardless and with standards). All the elemental compositions obtained with different methods are in very good agreement for the complete two sets of five samples each. KW - Thin films KW - Elemental composition KW - FeNi KW - SiGe KW - Electron probe microanalysis KW - X-ray Fluorescence PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509262 DO - https://doi.org/10.1002/sia.6834 SN - 0142-2421 VL - 52 IS - 12 SP - 929 EP - 932 PB - John Wiley & Sons Ltd AN - OPUS4-50926 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Abram, Sarah-Luise T1 - Iron oxide nanoparticles as a reference material candidate for particle size measurements N2 - This poster presentation covers the development of iron oxide nanoparticles as reference material candidate in the context of the project "Nanoplattform". T2 - EMRS Spring Meeting CY - Online meeting DA - 31.05.2021 KW - Iron oxide nanoparticles KW - Reference material KW - Particle size KW - Transmission electron microscopy KW - Small angle x-ray scattering PY - 2021 AN - OPUS4-52773 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of sterilized Ce0.25Zr0.75O2 nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized Ce0.25Zr0.75O2 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - XPS KW - HAXPES KW - SEM KW - NanoSolveIT KW - Ce0.25Zr0.75O2 nanoparticles PY - 2023 DO - https://doi.org/10.5281/zenodo.7966165 PB - Zenodo CY - Geneva AN - OPUS4-57674 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of sterilized Co1.5Fe1.5O4 nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized Co1.5Fe1.5O4 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - XPS KW - HAXPES KW - SEM KW - NanoSolveIT KW - Co1.5Fe1.5O4 nanoparticles PY - 2023 DO - https://doi.org/10.5281/zenodo.7940271 PB - Zenodo CY - Geneva AN - OPUS4-57662 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of sterilized TiO2 nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized TiO2 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - XPS KW - HAXPES KW - SEM KW - NanoSolveIT KW - TiO2 nanoparticles PY - 2023 DO - https://doi.org/10.5281/zenodo.7941566 PB - Zenodo CY - Geneva AN - OPUS4-57668 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of sterilized TiO2 PVP nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of sterilized TiO2 PVP nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - HAXPES KW - XPS KW - SEM KW - Nanoparticles KW - TiO2 PVP PY - 2023 DO - https://doi.org/10.5281/zenodo.7966354 PB - Zenodo CY - Geneva AN - OPUS4-57761 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of sterile ZnO nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of ZnO nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - HAXPES KW - XPS KW - SEM KW - Nanoparticles KW - ZnO PY - 2023 DO - https://doi.org/10.5281/zenodo.7990213 PB - Zenodo CY - Geneva AN - OPUS4-57762 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of Ce0.9Zr0.1O2 nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of Ce0.9Zr0.1O2 nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - HAXPES KW - XPS KW - SEM KW - Ce0.9Zr0.1O2 KW - Nanoparticles PY - 2023 DO - https://doi.org/10.5281/zenodo.7986672 PB - Zenodo CY - Geneva AN - OPUS4-57758 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -