TY - JOUR A1 - Beyranvand, S. A1 - Pourghobadi, Z. A1 - Sattari, S. A1 - Soleymani, K. A1 - Donskyi, Ievgen A1 - Gharabaghi, M. A1 - Unger, Wolfgang A1 - Farjanikish, G. A1 - Nayebzadeh, H. A1 - Adeli, M. T1 - Boronic acid functionalized graphene platforms for diabetic wound N2 - While noncovalent interactions between graphene derivatives and biosystems are extensively studied, less knowledge about their covalent multivalent interactions at biointerfaces is available. Due to the affinity of boronic acids towards cis-diol bearing biosystems, graphene sheets with this functionality were synthesized and their covalent interactions with the bacteria and nematode were investigated. As expected, graphene platforms with boronic acid functionality were able to wrap bacteria and destroy it in a short time. Surprisingly, body of nematodes was ruptured and their viability decreased to 30% after 24 h incubation with the functionalized graphene sheets. Because of their antibacterial and antiparasitic activities as well as their ability for wound dressing, graphene platforms with the boronic acid functionality were further investigated for diabetic wound healing. In vivo experiments showed that graphene platforms are more efficient than the commercially available drug, phenytoin, and restore both infected and non-infected diabetic wounds in ten days. Taking advantage of their straightforward synthesis, strong interactions with different biosystems as well as their ability to heal diabetic wounds, the boronic Acid functionalized graphene sheets are promising candidates for a broad range of future biomedical applications. KW - Graphene KW - Boronic acid KW - Functionalized graphene KW - XPS PY - 2020 UR - https://www.sciencedirect.com/science/article/abs/pii/S0008622319310954 DO - https://doi.org/doi.org/10.1016/j.carbon.2019.10.077 VL - 158 SP - 327 EP - 336 PB - Elsevier Ltd. AN - OPUS4-50559 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - International standardization and metrology as tools to address the comparability and reproducibility challenges in XPS measurements N2 - The status of standardization related to x-ray photoelectron spectroscopy (XPS, ESCA) at ASTM International (Subcommittee E42.03) and ISO (TC 201) is presented and commented upon in a structured manner. The survey also identifies other active bodies, here VAMAS Technical Working Area 2 and the Surface Analysis Working Group at the International Meter Convention, contributing to prestandardization Research and metrology of XPS and reports their specific activities. It is concluded that existing standardization is delivering good practices in the use of XPS and has a high potential to avoid the recently observed erroneous use, misapplications, and misinterpretation by new and inexperienced users of the method—which seems to be the main reason for the “reproducibility crisis” in the field of XPS applications. A need for a more proactive publicizing of international documentary standards by experienced XPS users, specifically those who are involved in standardization, is identified. Because the existing portfolio of standards addressing the use of XPS is not complete, future standardization projects planned or already ongoing are mentioned. The way the standardization bodies are identifying future needs is shortly explained. KW - Standardisation KW - Comparability KW - Reproducibility KW - XPS KW - VAMAS KW - Metrology PY - 2020 DO - https://doi.org/10.1116/1.5131074 VL - 38 IS - 2 SP - 021201-1 EP - 021201-8 PB - AVS AN - OPUS4-50560 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gollwitzer, C. T1 - Computation of scattering curves for particles with arbitrary shapes using Debye’s formula N2 - Small-angle scattering data from particle dispersions with narrow size distributions are usually analysed by fitting a model function to the data, which is composed of a monodisperse form factor with a size distribution and, optionally, a structure factor. For common particle shapes like solid spheres, core-shell particles, ellipsoids or rods, the form factor can be computed analytically, and several software packages are readily available which provide a compilation of form factors.1,2 Recently, highly monodisperse nanoparticles with a variety of shapes have been synthesized, e.g. cubes and bipyramids3,4 with lightly capped edges, for which analytic form factors are harder to derive. We compute an approximation to the scattering curve of arbitrary shapes by filling the shape with a quasi-random distribution of point scatterers and using Debye’s formula to get the overall scattering curve. The highly optimized debyer code is used to perform an efficient evaluation of Debye’s formula,5 which can perform the evaluation of 500,000 point scatterers in two minutes on commodity hardware. Moderate polydispersity is handled by interpolating the computed scattering curve over q from a master curve. In this way, the code is fast enough to perform data fitting of particle ensembles with moderate polydispersity for arbitrary shapes to experimental data. This work was partly funded by the 17NRM04 nPSize project of the EMPIR programme co-financed by the EMPIR participating states and by the European Union’s Horizon 2020 research and innovation programme. T2 - 17th Nordic Workshop on Scattering from Soft Matter CY - Linköping, Sweden DA - 14.01.2020 KW - X-ray scattering KW - Nanoparticles KW - Particle shape KW - Modelling KW - Form factor PY - 2020 UR - http://nssm2020.se/ AN - OPUS4-50368 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Minimale Anforderungen an Referenzdaten anhand von Beispielen aus der Elektronenmikroskopie und Oberflächenanalytik N2 - In dem Vortrag werden, anhand ausgewählten Beispielen aus der Elektronenmikroskopie und Oberflächenanalytik (EDX und XPS), die minimalen Anforderungen an Referenzdaten für zuverlässige und reproduzierbare Ergebnisse (z.B. Partikelgrößenverteilung, Elementzusammensetzung) vorgestellt und diskutiert. T2 - Workshop "Referenzdaten" CY - Berlin, Germany DA - 13.03.2020 KW - Referenzdaten KW - Nanopartikel KW - Elektronenmikroskopie KW - Oberflächenanalytik KW - Standardarbeitsanweisung KW - SOP KW - Standardisierung PY - 2020 AN - OPUS4-50571 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - An interlaboratory comparison on measuring the chemical composition of functionalized graphene nanoplatelets N2 - The results of the international interlaboratory comparison ""Chemical Composition of functionalized graphene with X-ray photoelectron spectroscopy (XPS) under the auspice of VAMAS TWA 2 (Surface Chemical Analysis) will be presented. T2 - Kratos German User Meeting 2023 CY - Berlin, Germany DA - 25.10.2023 KW - Graphene KW - Interlaboratory Comparison KW - X-ray photoelectron spectroscopy PY - 2023 AN - OPUS4-58683 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Accurate Measurement of Size of Graphene Oxide Flakes by Scanning Electron Microscopy (SEM) N2 - Accurate characterisation of the morphology (size) and chemistry of graphene-related 2D materials (GR2M) is key in understanding their extraordinary functionalities. Hence, not only the tailoring of these functionalities aiming at applications of increased-performance becomes possible, but also the correlation of the physico-chemical properties with the understanding of the potential toxicity eventually enables a safe and sustainable development of the GR2M for new applications. Whilst AFM and Raman Spectroscopy are recommended to measure the thickness of GO flakes, Scanning Electron Microscopy (SEM) is the most suited method to assess their lateral size, which varies between tens of µm down to below 100 nm. In this paper, procedures for the accurate determination of lateral size of graphene oxide (GO) flakes by SEM are presented. The prerequisite for accurate flake size analysis is the proper sample preparation, i.e. deposition of ideally isolated flakes on a substrate, with the flakes being unfolded, non-overlapped, parallel with the substrate, and having a high coverage density. Examples of optimum image caption conditions and image analysis procedures will be presented. The size descriptors and their measurement are described in the context of the corresponding analysis approach: i) length and width of the flakes with a quick and rough, but robust procedure, and ii) exact contouring of the flakes as part of a highly accurate, but more time-consuming measurement approach. The possibility of application of automated image analysis is discussed as the alternative to the manual flakes analysis. T2 - Graphene 2023 CY - Manchester, UK DA - 27.07.2023 KW - Graphene oxide KW - SEM KW - Size KW - Standardisation PY - 2023 UR - https://www.grapheneconf.com/2023/index.php AN - OPUS4-57910 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cios, Grzegorz A1 - Hodoroaba, Vasile-Dan T1 - High throughput nanoparticle analysis using transmission Kikuchi diffraction N2 - In the present paper we show an approach of measuring large numbers of nanoparticles in a single scan TKD. TiO2 anatase nanoparticles (NP) of bipyramidal shape were deposited on standard carbon grid used for TEM. The procedure used promoted formation of NP ‘monolayer’ islands with uniform distribution of NPs on the carbon surface which allowed mapping of large number of nanoparticles in the single island. Collection of whole map covering ~2800 nanoparticles took nearly 20 minutes. Inverse pole figure color coded map indicates that the NPs are either lying on a {101} facet (within 10° range around perfect {101} parallel to the carbon surface orientation) on the carbon film or are lying on a {100} facet (within 10° range around the perfect {100} parallel to the carbon surface orientation). Very unlikely was the NP orientation standing on a {001} face. The NPs size distribution described as equivalent circle diameter (ECD) has been also evaluated and the mean NP ECD was 59 nm with standard deviation of 15 nm, i.e. in good agreement with electron microscopy or AFM results. This study shows high potential of the technique for crystalline NPs analysis with respect to geometrical orientation of the particles on the substrate. With known orientation, the 3D dimensional characterisation of such non-spherical NPs becomes possible from 2D projection electron micrographs. Moreover, the NP size distribution can be easily extracted. Superior accuracies down to 1-2 nm are achievable. The approach is applicable also on thin lamellae extracted from particulate (or mesoporous) layers. T2 - EMAS 2023 - 17th European Workshop on Modern Developmennts and Applications in Microbeam Analysis CY - Krakow, Poland DA - 07.05.2023 KW - Nanoparticles KW - TKD KW - Electron microscopy KW - TiO2 KW - Orientation PY - 2023 UR - https://www.microbeamanalysis.eu/events/event/60-emas-2023-17th-european-workshop-on-modern-developments-and-applications-in-microbeam-analysis AN - OPUS4-57519 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS Regional Report Germany N2 - Regional standardisation activities and how VAMAS can help in any way to promote activities are reported. Activities related to organisational updates, government initiatives/priorities (especially related to Materials), details of any strategy documents publicly available, networks within Germany and how we engage are presented. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 48th Steering Committee Meeting CY - New Delhi, India DA - 09.10.2023 KW - VAMAS KW - Standardisation PY - 2023 UR - https://www.nplindia.org/index.php/amcsnzt_2023/ AN - OPUS4-58572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abram, Sarah-Luise A1 - Mrkwitschka, Paul A1 - Thünemann, Andreas A1 - Radnik, Jörg A1 - Häusler, I. A1 - Bresch, Harald A1 - Hodoroaba, Vasile-Dan A1 - Resch-Genger, Ute T1 - Iron Oxide Nanocubes as a New Certified Reference Material for Nanoparticle Size Measurements N2 - The rational design and increasing industrial use of nanomaterials require a reliable characterization of their physicochemical key properties like size, size distribution, shape, and surface chemistry. This calls for nanoscale reference materials (nanoRMs) for the validation and standardization of commonly used characterization methods closely matching real-world nonspherical nano-objects. This encouraged us to develop a nonspherical nanoRM of very small size consisting of 8 nm iron oxide nanocubes (BAM-N012) to complement spherical gold, silica, and polymer nanoRMs. In the following, the development and production of this nanoRM are highlighted including the characterization by transmission electron microscopy (TEM) and small-angle X-ray scattering (SAXS) as complementary methods for size and shape parameters, homogeneity and stability studies, and calculation of a complete uncertainty budget of the size features. The determination of the nanocubes’ edge length by TEM and SAXS allows a method comparison. In addition, SAXS measurements can also provide the mean particle number density and the mass concentration. The certified size parameters, area equivalent circular diameter and square edge length, determined by TEM with a relative expanded uncertainty below 9%, are metrologically traceable to a natural constant for length, the very precisely known (111) lattice spacing of silicon. Cubic BAM-N012 qualifies as a certified nanoRM for estimating the precision and trueness, validation, and quality assurance of particle size and shape measurements with electron microscopy and SAXS as well as other sizing methods suitable for nanomaterials. The production of this new iron oxide nanocube RM presents an important achievement for the nanomaterial community, nanomaterial manufacturers, and regulators. KW - Certification KW - SAXS KW - Homogeneity KW - Nano KW - Particle KW - Iron oxide KW - Quality assurance KW - Reference material KW - Size KW - Electron microscopy KW - Stability KW - Shape PY - 2023 DO - https://doi.org/10.1021/acs.analchem.3c00749 SN - 0003-2700 VL - 95 IS - 33 SP - 12223 EP - 12231 PB - American Chemical Society CY - Columbus, Ohio AN - OPUS4-58176 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rühle, Bastian A1 - Hodoroaba, Vasile-Dan T1 - Automatic Image Segmentation and Analysis using Neural Networks N2 - We present a workflow for obtaining fully trained artificial neural networks that can perform automatic particle segmentations of agglomerated, non-spherical nanoparticles from electron microscopy images “from scratch”, without the need for large training data sets of manually annotated images. This is achieved by using unsupervised learning for most of the training dataset generation, making heavy use of generative adversarial networks and especially unpaired image-to-image translation via cycle-consistent adversarial networks. The whole process only requires about 15 minutes of hands-on time by a user and can typically be finished within less than 12 hours when training on a single graphics card (GPU). After training, SEM image analysis can be carried out by the artificial neural network within seconds, and the segmented images can be used for automatically extracting and calculating various other particle size and shape descriptors. T2 - Machine Learning Workshop CY - Online Meeting DA - 18.03.2021 KW - Electron Microscopy KW - Neural Networks KW - Artificial Intelligence KW - Image Segmentation KW - Automated Image Analysis PY - 2021 AN - OPUS4-52304 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Chemello, Giovanni T1 - Characterization of industrial graphene using HAXPES N2 - A comparative analysis is performed by XPS, HAXPES and SEM of industrial functionalised graphene powder of different morphology. The chemical analysis carried out by XPS, which probing depth is around 10nm, and HAXPES, which can reach up to 30nm probing depth. By combining these two techniques is possible to get a rough, non-destructive depth profiling of the sample's surface. The results show a higher concentration of the functionlisation elements on the surface of the sample and the influence of the morphology on the functionalisation process and the C/O ratio. T2 - SALSA Make and Measure 2022 CY - Berlin, Germany DA - 15.09.2022 KW - Graphene KW - XPS KW - HAXPES KW - SEM KW - Graphene funcionalisation PY - 2022 AN - OPUS4-55971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Cios, G. A1 - Tokarski, T. A1 - Mansfeld, Ulrich A1 - Ortel, Erik A1 - Mielke, Johannes A1 - Pellegrino, F. A1 - Maurino, V. T1 - Towards 3D Understanding of Non-spherical Nanoparticles by Transmission Kikuchi Diffraction (TKD) for Improved Particle Size Distribution by Electron Microscopy N2 - In this paper one refined approach is applied to determine the exact orientation of bipyramidal TiO2 nanoparticles prepared with good dispersion as almost isolated particles on a carbon TEM grid. The advantages of the recently developed high-throughput Transmission Kikuchi Diffraction (TKD) are used to identify quickly and reliably the geometrical orientation of the crystalline TiO2 nanoparticle bipyramids (anatase) on a statistically relevant number of particles. KW - Nanoparticles KW - Transmission Kikuchi Diffraction (TKD) KW - Electron microscopy KW - TiO2 KW - 3D PY - 2020 DO - https://doi.org/10.1017/S1431927620013999 VL - 26 IS - S2 SP - 260 EP - 261 PB - Cambridge University Press CY - Cambridge, UK AN - OPUS4-51772 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Miropoltsev, M. A1 - Wegner, Karl David A1 - Häusler, I. A1 - Hodoroaba, Vasile-Dan A1 - Resch-Genger, Ute T1 - Influence of Hydrophilic Thiol Ligands of Varying Denticity on the Luminescence Properties and Colloidal Stability of Quaternary Semiconductor Nanocrystals N2 - Binary photoluminescent semiconductor nanocrystals (quantum dots, QDs) are one of the best studied fluorescent nanomaterials, and their unique optoelectronic properties paved the road to many applications in (bio)nanophotonics, optoelectronics, and photovoltaics. However, concerns related to their toxic constituents like cadmium or lead and the emerging interest in greener chemistry synthesis approaches hamper their future applicability. Interesting alternatives for some applications like biosensing or bioimaging are heavy-metal-free ternary QDs like AgInS2 (AIS), CuInS2 (CIS), and quaternary QDs such as AIS-ZnS (ZAIS). In this context, we explored the effect of ligand denticity on the organic-to-aqueous phase transfer of oleylamine-stabilized ZAIS QDs with the hydrophilic ligands mercaptopropionic acid (MPA), dihydrolipoic acid (DHLA), and 3-mercapto-2,2-bis(mercaptomethyl)propanoic acid (3MPA), bearing mono-, bi-, and trialkyl thiol groups. Spectroscopic studies of the resulting water-dispersible ZAIS QDs revealed a considerable influence of ligand denticity and ligand-to-QD ratio on the spectral position and width (FWHM; full width at half-maximum) of the photoluminescence (PL) bands, the PL quantum yields (PL QY), and the PL decay kinetics. Thiol capping and phase transfer resulted in a loss in PL by at least a factor of 2. The ligand-induced PL quenching observed particularly for ligands bearing two or three thiol groups was attributed to the facilitated formation of surface-bound disulfides. The best colloidal stability under high dilution conditions was observed for 3MPA. KW - Quantum dots KW - Ligand exchange KW - Lifetime analysis KW - Thiols PY - 2022 DO - https://doi.org/10.1021/acs.jpcc.2c05342 SN - 1932-7447 VL - 126 IS - 47 SP - 20101 EP - 20113 PB - ACS Publications AN - OPUS4-56707 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul T1 - Correlative analysis with electron microscopy applied in different operating modes (SEM, STEM-in-SEM and TEM) for the accurate morphological characterisation of non-spherical fine nanoparticles N2 - Electron microscopy applied in different operating modes, e.g., SEM, TEM or STEM-in-SEM, is the gold standard method to investigate the exact size and shape of individual nanoparticles. However, when fine nanoparticles with a non-monodisperse size distribution and non-spherical shapes are analysed, achieving an accurate result is challenging. Deviations in size measurements of more than 10% may occur. Understanding of the contrasts and sensitivities characteristic to the individual operating modes of an electron microscope is key in interpreting and evaluating quantitatively the measurement uncertainties needed for an eventual certification of specific nanoparticles via traceable results. Further, beyond the pure measurement, the other components in the analysis workflow with significant impact on the overall measurement uncertainties are the sample preparation and the image segmentation. In the present study the same areas of selected iron oxide fine nanoparticles (<25 nm) as reference nanomaterial (candidate) prepared on substrate for electron microscopy imaging are analysed correlatively with SEM, STEM-in-SEM and TEM with respect to their size and shape distribution. Individual significant measurement uncertainties are discussed, e.g., the sensitivity of secondary electron detectors of InLens-type to the surface morphology, particularly to the presence of an ultrathin organic coating or signal saturation effects on the particle edges, to electron beam exposure, to surface contamination, or the selection of the threshold for image segmentation. Another goal of this study is to establish a basis of analysis conditions which shall guarantee accurate results when both manual and particularly (semi-)automated segmentation approaches are applied. Advantages as well as limitations of the use of different electron microscopy operating modes, applied individually and correlatively, are highlighted. T2 - E-MRS 2024 Spring Meeting CY - Strasbourg, France DA - 27.05.2024 KW - Nanoparticles KW - Electron Microscopy KW - Metrology KW - Imaging KW - Reference materials PY - 2024 AN - OPUS4-60436 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul A1 - Hodoroaba, Vasile-Dan T1 - Understanding Correlative Electron Microscopy Imaging with SEM, STEM in SEM and TEM for the Accurate Characterization of Size and Shape of FeOx Nanoparticles N2 - The recently certified reference material (CRM) BAM-N012 as cubical iron oxide FeOx nanoparticles (NPs) of 8 nm area equivalent square edge length (ESL) and the RM candidate BAM-N013 as nearly spherical NPs of 22 nm size were analyzed in detail by electron microscopy (EM). For the metrological characterization with SEM, STEM in SEM and TEM, the understanding of the imaging contrasts and sensitivities, and the correct interpretation of the (art)effects which are inherent to each detection mode is necessary. The same sample areas with NPs deposited on a TEM grid were analyzed by two SEM acquisition modes, i. e. SE InLens and STEM in SEM using a dedicated transmission sample holder, and further, correlatively, analyzed with TEM. With increasing kV, SE InLens shows increasing particle size (unless overcharging at the particle boundaries is filtered), as a known effect. For STEM-in-SEM the particle size decreases significantly and individual particles are identified easier (at 2 kV only a few single particles can be detected automatically). ❑ Documentation of the sample preparation and measurement conditions (including optimization process) is important for reproducibility. ❑ Plasma cleaning, analysis in the transmission mode at SEM is recommended for FeOx NPs. ❑ Selection of the threshold algorithm can significantly alter the reported ECD. T2 - Microscopy and Microanalysis 2024 CY - Cleveland, OH, USA DA - 28.07.2024 KW - Nanoparticles KW - Electron microscopy KW - Iron oxide KW - Reference materials KW - Correlative microscopy KW - Size and shape distribution PY - 2024 AN - OPUS4-60806 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Wegner, Karl David T1 - One-Pot Heat-Up Synthesis of ZnSe Magic-Sized Clusters Using Thiol Ligands N2 - The unique optoelectronic properties of semiconductor nanocrystals, also termed quantum dots (QDs), have led to many advances in optoelectronic devices, bioimaging, and biosensing. This strong potential in a wide range of applications sparked the interest for a better understanding of the QD formation mechanisms. Recent studies have shown that atomically defined, zero-dimensional magic-size clusters (MSCs) play a crucial role during the nucleation and growth of QDs. Thereby MSCs consist of discrete numbers of ions leading to narrow size distributions and thus narrow absorption peaks, which evolve in discrete steps from one stable size to the next. The formation of MSCs was found in the synthesis of II-VI and III-V QDs but only limited synthesis approaches are available for the synthesis of MSCs in single-ensemble form without coexistence of other-size QDs. These MSCs can further self-assemble into two- and three-dimensional hybrid structures using organic ligands like diamines, leading to enhanced photoluminescence properties and catalytic activities. In this contribution, we present a synthesis strategy for the preparation of single-sized ZnSe MSCs. With a band gap of 2.7 eV and being an earth-abundant material, ZnSe QDs are interesting for light-emitting devices, blue-green lasers, photocatalysis, and fluorescence probes. In contrast to other studies, our approach is based on a one-pot heat-up synthesis and uses less toxic and dangerous zinc precursors (e.g. zinc stearate). Knowing that thiol-based ligands can alter the formation process of ZnSe QDs, we investigated the influence of 1-dodecanethiol on the ZnSe MSC formation using absorption spectroscopy, TEM, XPS, and XRD. By variation of the thiol ligand concentration and reaction temperature, we were able to synthesize two new ZnSe MSC sizes, the largest so far, by using easy-to-handle precursors. T2 - NANOHYBRID - Hamburg Conference on Complex Nanostructures CY - Hamburg, Germany DA - 04.10.2022 KW - ZnSe KW - Magic-sized cluster KW - Nanoparticle KW - Synthesis KW - Nanomaterial PY - 2022 AN - OPUS4-56193 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul T1 - Understanding Correlative Electron Microscopy Imaging with SEM, STEM-in-SEM and TEM for the Accurate Characterization of Size and Shape of FeOx Nanoparticles N2 - The recently certified reference material (CRM) BAM-N012 as cubical iron oxide FeOx nanoparticles (NPs) of 8 nm area equivalent square edge length (ESL) and the RM candidate BAM-N013 as nearly spherical NPs of 22 nm size were analyzed in detail by electron microscopy (EM). For the metrological characterization with SEM, STEM in SEM and TEM, the understanding of the imaging contrasts and sensitivities, and the correct interpretation of the (art)effects which are inherent to each detection mode is necessary. The same sample areas with NPs deposited on a TEM grid were analyzed by two SEM acquisition modes, i. e. SE InLens and STEM in SEM using a dedicated transmission sample holder, and further, correlatively, analyzed with TEM. With increasing kV, SE InLens shows increasing particle size (unless overcharging at the particle boundaries is filtered), as a known effect. For STEM-in-SEM the particle size decreases significantly and individual particles are identified easier (at 2 kV only a few single particles can be detected automatically). ❑ Documentation of the sample preparation and measurement conditions (including optimization process) is important for reproducibility. ❑ Plasma cleaning, analysis in the transmission mode at SEM is recommended for FeOx NPs. ❑ Selection of the threshold algorithm can significantly alter the reported ECD. T2 - SALSA Make and Measure 2024: Interfaces CY - Berlin, Germany DA - 11.09.2024 KW - Correlative microscopy KW - Electron microscopy KW - Iron oxide KW - Nanoparticles KW - Reference materials KW - Size and shape distribution PY - 2024 AN - OPUS4-62347 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul T1 - Understanding Correlative Electron Microscopy Imaging with SEM, STEM in SEM and TEM for the Accurate Characterization of Size and Shape of FeOx Nanoparticles N2 - The recently certified reference material (CRM) BAM-N012 as cubical iron oxide FeOx nanoparticles (NPs) of 8 nm area equivalent square edge length (ESL) and the RM candidate BAM-N013 as nearly spherical NPs of 22 nm size were analyzed in detail by electron microscopy (EM). For the metrological characterization with SEM, STEM in SEM and TEM, the understanding of the imaging contrasts and sensitivities, and the correct interpretation of the (art)effects which are inherent to each detection mode is necessary. The same sample areas with NPs deposited on a TEM grid were analyzed by two SEM acquisition modes, i. e. SE InLens and STEM in SEM using a dedicated transmission sample holder, and further, correlatively, analyzed with TEM. With increasing kV, SE InLens shows increasing particle size (unless overcharging at the particle boundaries is filtered), as a known effect. For STEM-in-SEM the particle size decreases significantly and individual particles are identified easier (at 2 kV only a few single particles can be detected automatically). ❑ Documentation of the sample preparation and measurement conditions (including optimization process) is important for reproducibility. ❑ Plasma cleaning, analysis in the transmission mode at SEM is recommended for FeOx NPs. ❑ Selection of the threshold algorithm can significantly alter the reported ECD T2 - 2. Treffen des DGE-Arbeitskreises SEM CY - Stuttgart, Germany DA - 26.09.2024 KW - Correlative microscopy KW - Electron microscopy KW - Iron oxide KW - Nanoparticles KW - Reference materials KW - Size and shape distribution PY - 2024 AN - OPUS4-62349 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ankli, P.P. A1 - Ali, A. A1 - Hodzic, S. A1 - Logachov, A. A1 - Maciejczuk, K. A1 - Milochiv, A. A1 - Hardy, S. A1 - Hardy, B. A1 - Novak, S. A1 - Kranjc, E. A1 - Kononenko, V. A1 - Saje, S. A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg A1 - Akmal, Loay A1 - Mrkwitschka, Paul A1 - Pellegrino, F. A1 - Rossi, A. A1 - Alladio, E. A1 - Sordello, F. A1 - Gulumian, M. A1 - Valsami-Jones, E. A1 - Andraos, C. A1 - Wepener, V. A1 - Jurkschat, K. A1 - Jones, E. A1 - Singh, D. A1 - Ibrahim, B. A1 - van der Zande, M. A1 - Fernandez-Poulussen, D. A1 - Queipo, P. A1 - Drobne, D. T1 - Data management for image-based characterisation of 2D nano-materials N2 - The ACCORDs project, funded through Horizon Europe, is pioneering a novel approach to investigate Graphene Family Materials (GFMs) through image analysis. Our aim is to unveil how these materials might influence health and the environment. To achieve this, we are developing a platform designed for the easy retrieval, access, sharing, and utilisation of GFM data and the coordination between biological and physico-chemical data formats. Integral to this platform is an OMERO-based library for image storage, alongside data collection forms and image analysis tools. Efforts are underway to streamline the process for researchers to upload and disseminate their findings, manage information within a database and navigate the data with ease. Adhering to REMBI guidelines, which set the standard for annotating biological images with metadata, we ensure our data collection is comprehensive and adheres to established best practices. Initially, we are employing thresholding and basic machine learning techniques for image segmentation, laying the groundwork for advanced analysis through deep learning to gain more profound insights. Upon completion, the project will deliver a comprehensive platform facilitating efficient data and image management concerning GFMs. This platform will enable the straightforward discovery and use of protocols and results, all organised in accordance with the FAIR principles – Findable, Accessible, Interoperable, and Reusable. This initiative is poised to significantly impact materials science, enhancing our comprehension of the safety and environmental implications of 2D materials. KW - Graphene KW - Image analysis KW - Data management PY - 2024 DO - https://doi.org/10.1016/j.toxlet.2024.07.655 VL - 399 SP - S271 PB - Elsevier B.V. AN - OPUS4-61011 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - You Ask – ACEnano Replies N2 - The workshop starts with introductory information about the workshop and the H2020 project ACEnano, followed by two expert round tables, focussing on how the project could address regulator and industry needs, respectively. This is be followed by parallel sessions on tools (based on preferences expressed by those registered to attend, see “Questions”) and finally a question-and-answer session with the attendees. The experts invited in Round Table 1 have been prepared to answer to questions related to obstacles and advantages for stakeholders such as SMEs to use the ACEnano approaches/tools. Standardisation needs are discussed. T2 - nanoSafety Cluster Training (NSC) Day @ NanoSAFE 2020: ACEnano users’ workshop “You Ask – ACEnano Replies” CY - Online meeting DA - 23.11.2020 KW - ACEnano KW - Standardisation KW - Nanomaterials KW - Nano-characterisation PY - 2020 UR - https://www.nanosafetycluster.eu/ SP - 1 EP - 2 AN - OPUS4-51693 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -