TY - JOUR ED - Simon, P. ED - Ihlemann, J. ED - Bonse, Jörn T1 - Special issue "Laser-generated periodic nanostructures" N2 - The study of laser-fabricated periodic nanostructures is one of the leading topics of today’s photonics research. Such structures on the surface of metals, semiconductors, dielectrics, or polymers can generate new material properties with special functionalities. Depending on the specific material parameters and the morphology of the structures, new devices such as microlasers, optical nanoswitches, optical storage devices, sensors or antifraud features can be realized. Furthermore, laser-generated surface textures can be used to improve the tribological properties of surfaces in contact and in relative motion—to reduce friction losses or wear, to modify the wettability or the cell and biofilm growth properties of surfaces through bioinspired laser engineering, for emerging medical applications, or as decoration elements for the refinement of precious goods. This Special Issue “Laser-Generated Periodic Nanostructures” focuses on the latest experimental and theoretical developments and practical applications of laser-generated periodic structures that can be generated in a “self-organized” way (laser-induced periodic surface structures, LIPSS, ripples) or via laser interference-based direct ablation (often referred to as direct laser interference patterning, DLIP). We aimed to attract both academic and industrial researchers in order to collate the current knowledge of nanomaterials and to present new ideas for future applications and new technologies. By 8 August 2021, 22 scientific articles have been published in the Special Issue. KW - Laser-induced periodic surface structures (LIPSS) KW - Direct laser-interference patterning (DLIP) KW - Surface functionalization KW - Laser processing KW - Applications PY - 2021 UR - https://www.mdpi.com/journal/nanomaterials/special_issues/laser-generated_periodic SN - 2079-4991 VL - 10(1)-11(8) SP - 147-1 EP - 2054-7 PB - MDPI CY - Basel AN - OPUS4-53099 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Hörenz, Christoph A1 - Pellegrino, F. A1 - Maurino, V. A1 - Durand, B. A1 - Taché, O. T1 - Nanoparticle size, shape, and concentration measurement at once – two VAMAS pre-standardization projects ready to start N2 - A case study on the TEM analysis of the size and shape distribution of TiO2 bipyramidal nanoparticles prepared on TEM grids was included in the recently published ISO standard ISO 21363. It was agreed to organize at a later stage a second inter-lab comparison with the nanoparticles distributed to the participants as a liquid suspension. Protocols for uniform nanoparticle deposition on suited supports developed and optimized within the EMPIR nPSize project are also prepared to be distributed. For this, we have chosen the VAMAS platform (www.vamas.org) which offers an excellent international infrastructure of laboratories with high competence in nanoparticle measurement. The VAMAS technical working area dedicated to nanoparticle measurement is TWA 34 ‘Nanoparticle populations’. For this type of nanoparticles, the size and shape distributions are the primary parameters to be reported. Due to the good deposition protocols developed, an automated image analysis is enabled (in contrast to the manual analysis of irregular TiO2 nanoparticles. In parallel with the TiO2 nanoparticle exercise, two spherical SiO2 nanoparticle samples with bi-modal size distributions (nominal relative number concentrations of 1:1 and 10:1) are prepared for a second VAMAS inter-lab comparison. Here, the nanoparticle concentration is the primary parameter to be measured. For the imaging methods it is targeted to measure the relative nanoparticle concentrations of the two modes. For the absolute nanoparticle concentration to be measured by imaging methods it is necessary to control the volume of the liquid suspension deposited on the substrate and to obtain such a homogeneous nanoparticle deposition on the substrate which allows to count (or extrapolate) all the deposited particles. KW - Electron microscopy KW - Inter-laboratory comparison KW - Nanoparticles KW - SiO2 KW - TiO2 KW - VAMAS PY - 2021 DO - https://doi.org/10.1017/S1431927621008126 VL - 27 IS - Suppl. 1 SP - 2250 EP - 2251 PB - Cambridge University Press AN - OPUS4-53124 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN ED - Simon, P. ED - Ihlemann, J. ED - Bonse, Jörn T1 - Laser-generated periodic nanostructures N2 - This book is a reprint collection of articles from the Special Issue published online in the open access journal Nanomaterials. KW - Laser-induced periodic surface structures (LIPSS) KW - Direct laser-interference patterning (DLIP) KW - Applications KW - Numerical simulations PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-535146 UR - https://www.mdpi.com/books/pdfview/book/4426 SN - 978-3-0365-2027-8 SN - 978-3-0365-2028-5 DO - https://doi.org/10.3390/books978-3-0365-2028-5 SP - 1 EP - 328 PB - MDPI CY - Basel AN - OPUS4-53514 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Przyklenk, A. A1 - Balsamo, A. A1 - O'Connor, D. A1 - Evans, Alexander A1 - Yandayan, T. A1 - Akgöz, S. A1 - Flys, O. A1 - Zeleny, V. A1 - Czułek, D. A1 - Meli, F. A1 - Ragusa, C. A1 - Bosse, H. T1 - New European Metrology Network for advanced manufacturing N2 - Advanced manufacturing has been identified as one of the key enabling technologies with applications in multiple industries. The growing importance of advanced manufacturing is reflected by an increased number of publications on this topic in recent years. Advanced manufacturing requires new and enhanced metrology methods to assure the quality of manufacturing processes and the resulting products. However, a high-level coordination of the metrology community is currently absent in this field and consequently this limits the impact of metrology developments on advanced manufacturing. In this article we introduce the new European Metrology Network (EMN) for Advanced Manufacturing within EURAMET, the European Association of National Metrology Institutes (NMIs). The EMN is intended to be operated sustainably by NMIs and Designated Institutes in close cooperation with Stakeholders interested in advanced manufacturing. The objectives of the EMN are to set up a permanent stakeholder dialogue, to develop a Strategic Research Agenda for the metrology input required for advanced manufacturing technologies, to create and maintain a knowledge sharing programme and to implement a web-based service desk for stakeholders. The EMN development is supported by a Joint Network Project within the European Metrology Programme for Innovation and Research. KW - Stakeholder KW - Advanced manufacturing KW - Metrology KW - European Metrology Networks (EMNs) KW - Strategic Research Agenda (SRA), PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-530618 DO - https://doi.org/10.1088/1361-6501/ac0d25 VL - 32 IS - 11 SP - 111001 PB - IOP Publishing AN - OPUS4-53061 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Resch-Genger, Ute T1 - Tumore abbilden, Biomarker nachweisen, Messungen standardisieren N2 - Zu den am häufigsten eingesetzten Analysemethoden in den Lebens- und Materialwissenschaften gehören Lumineszenzmethoden. Sie nutzen die Emission von Licht nach Absorption von Energie, um Signale zu erzeugen, und umfassen spektroskopische und mikroskopische Messungen. KW - Quality assurance KW - Sensor KW - Imaging KW - Reference material KW - Nano KW - Particle KW - Nanomaterial KW - Upconversion KW - Nanoparticle KW - Lanthanide KW - Photoluminescence KW - Quantum yield KW - Photophysics KW - Lifetime KW - Excitation KW - Power density KW - Single particle KW - Brightness KW - NIR PY - 2021 SP - 75 EP - 77 PB - GDCH AN - OPUS4-53526 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rühle, Bastian A1 - Krumrey, Julian Frederic A1 - Hodoroaba, Vasile-Dan T1 - Workflow towards automated segmentation of agglomerated, non‑spherical particles from electron microscopy images using artificial neural networks N2 - We present a workflow for obtaining fully trained artificial neural networks that can perform automatic particle segmentations of agglomerated, non-spherical nanoparticles from scanning electron microscopy images “from scratch”, without the need for large training data sets of manually annotated images. The whole process only requires about 15 minutes of hands-on time by a user and can typically be finished within less than 12 hours when training on a single graphics card (GPU). After training, SEM image analysis can be carried out by the artificial neural network within seconds. This is achieved by using unsupervised learning for most of the training dataset generation, making heavy use of generative adversarial networks and especially unpaired image-to-image translation via cycle-consistent adversarial networks. We compare the segmentation masks obtained with our suggested workflow qualitatively and quantitatively to state-of-the-art methods using various metrics. Finally, we used the segmentation masks for automatically extracting particle size distributions from the SEM images of TiO2 particles, which were in excellent agreement with particle size distributions obtained manually but could be obtained in a fraction of the time. KW - Electron microscopy KW - Neural networks KW - Artificial intelligence KW - Image segmentation KW - Automated image analysis PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-522454 DO - https://doi.org/10.1038/s41598-021-84287-6 VL - 11 IS - 1 SP - 4942 PB - Springer Nature AN - OPUS4-52245 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Rühle, Bastian A1 - Krumrey, Julian Frederic A1 - Hodoroaba, Vasile-Dan T1 - Dataset accompanying the publication "Workflow towards automated segmentation of agglomerated, non-spherical particles from electron microscopy images using artificial neural networks" N2 - This dataset accompanies the following publication, first published in Scientific Reports (www.nature.com/articles/s41598-021-84287-6): B. Ruehle, J. Krumrey, V.-D. Hodoroaba, Scientific Reports, Workflow towards Automated Segmentation of Agglomerated, Non-Spherical Particles from Electron Microscopy Images using Artificial Neural Networks, DOI: 10.1038/s41598-021-84287-6 It contains electron microscopy micrographs of TiO2 particles, the corresponding segmentation masks, and their classifications into different categories depending on their visibility/occlusion. Please refer to the publication and its supporting information for more details on the acquisition and contents of the dataset, as well as the GitHub repository at https://github.com/BAMresearch/automatic-sem-image-segmentation KW - Electron microscopy KW - Neural networks KW - Image segmentation KW - Automated image analysis PY - 2021 DO - https://doi.org/10.5281/zenodo.4563942 PB - Zenodo CY - Geneva AN - OPUS4-52246 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fiedler, Saskia A1 - Tserkezis, C. A1 - Wolff, C. A1 - Mortensen, N. A. A1 - Raza, S. A1 - Stamatopoulou, E. P. A1 - Sugimoto, H. A1 - Fuji, M. T1 - Cathodoluminescence of Silicon Nanoparticles N2 - In this work, Mie resonances in single Si nanoparticles (NPs) of different sizes have been systematically studied, using dark field (DF) and cathodoluminescence (CL) spectroscopy. An analytical method has been developed to compare experiment with theory. Experimental CL spectra are averaged over entire Si NPs, allowing for direct comparison to DF spectra of identical NPs. Theoretical spectra clarify the assignment of Mie resonances within the NP which contribute with different intensity in DF and CL, resulting in an apparent spectral shift. Furthermore, a substrate effect appears. A 100 nm-Si NP on 15 nm SiN results in a broad peak, spectrally in between that of the calculated electric and magnetic dipole, a NP on 50 nm SiN exhibits two separated peaks as theoretically predicted. High spatial resolution of electron beam excitation allows to study the spectral CL changes at varying beam impact parameters. Theory and experiment agree that depending on beam position within a small Si NP, relative intensity of electric and magnetic dipole change; electric dipole vanishing in the center of the NP. Similar results are found for larger (d = 210 nm) Si NPs although the mode assignment is challenging as higher order modes appear and overlap with others. In conclusion, comparison of CL and DF spectra is not trivial, in fact, excitation/radiation of distinct Mie resonances within a single Si NP are dependent on beam placement. However, substrate effects need to be considered in CL. T2 - European Material Research Society Fall Meeting 2021 CY - Online meeting DA - 20.09.21 KW - Cathodoluminescence KW - Silicon nanoparticles KW - Mie resonances PY - 2021 AN - OPUS4-53439 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Florian, Camilo A1 - Deziel, J.-L. A1 - Kirner, Sabrina V. A1 - Siegel, J. A1 - Bonse, Jörn T1 - Femtosecond laser-induced oxidation in the formation of periodic surface structures N2 - Micro- and nanostructuring with laser-induced periodic surface structures (LIPSS) has been demonstrated to be feasible in a wide variety of materials including metals, semiconductors and dielectrics. Suitable processing regimes for flat, curved and complex surfaces have been identified for many materials, allowing the generation of diverse applications in fields such as optics, tribology and medicine, to name a few. A common side effect when producing such structures in air environment is the formation of a thin surface oxide layer in the laser irradiated areas. Previous studies have shown that oxidation plays an important role in the tribological performance for which the structures where created, and very recently it has been shown that the laser-induced oxide graded layers may contribute to the formation of a new type of embedded low-spatial frequency LIPSS (LSFL) with annomalous orientation parallel to the laser polarization, in addition to the appearance of the well-known high-spatial frequency LIPSS (HSFL) at the surface. In this contribution, we explore this effect experimentally for chromium nitride (CrN) irradiated with femtosecond laser pulses and compare the findings to finite-difference time-domain (FDTD) simulations of the intensity distributions at different depth positions. T2 - 2021 Conference on Lasers and Electro-Optics/Europe – European Quantum Electronics Virtual Conferences CY - Munich, Germany DA - 21.06.2021 KW - Femtosecond laser ablation KW - Finite-difference time-domain calculations KW - Laser-induced periodic surface structures (LIPSS) KW - Surface oxidation PY - 2021 SN - 978-1-6654-1876-8 DO - https://doi.org/10.1109/CLEO/Europe-EQEC52157.2021.9542774 VL - 2021 SP - 1 PB - Institute of Electrical and Electronics Engineers (IEEE) CY - Piscataway, NJ, USA AN - OPUS4-53457 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Marcoulaki, E. A1 - M. López de Ipina, J. A1 - Vercauteren, S. A1 - Bouillard, J. A1 - Himly, M. A1 - Lynch, I. A1 - Witters, H. A1 - Shandilya, N. A1 - van Duuren-Stuurman, B. A1 - Kunz, Valentin A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan A1 - Bard, D. A1 - Evans, G. A1 - Jensen, K. A. A1 - Pilou, M. A1 - Viitanen, A.-K. A1 - Bochon, A. A1 - Duschl, A. A1 - Geppert, M. A1 - Persson, K. A1 - Votgreave, I. A1 - Niga, P. A1 - Gini, M. A1 - Eleftheriadis, K. A1 - Scalbi, S. A1 - Caillard, B. A1 - Arevalillo, A. A1 - Frejafon, E. A1 - Aguerre-Chariol, O. A1 - Dulio, V. T1 - Blueprint for a self-sustained European Centre for service provision in safe and sustainable innovation for nanotechnology N2 - The coming years are expected to bring rapid changes in the nanotechnology regulatory landscape, with the establishment of a new framework for nano-risk governance, in silico approaches for characterisation and Risk assessment of nanomaterials, and novel procedures for the early identification and management of nanomaterial risks. In this context, Safe(r)-by-Design (SbD) emerges as a powerful preventive approach to support the development of safe and sustainable (SSbD) nanotechnology-based products and processes throughout the life cycle. This paper summarises the work undertaken to develop a blueprint for the deployment and operation of a permanent European Centre of collaborating laboratories and research organisations supporting safe Innovation in nanotechnologies. The proposed entity, referred to as “the Centre”, will establish a ‘one-stop shop’ for nanosafety-related services and a central contact point for addressing stakeholder questions about nanosafety. Its operation will rely on significant business, legal and market knowledge, as well as other tools developed and acquired through the EU-funded EC4SafeNano project and subsequent ongoing activities. The proposed blueprint adopts a demand-driven service update scheme to allow the necessary vigilance and flexibility to identify opportunities and adjust its activities and services in the rapidly evolving regulatory and nano risk governance landscape. The proposed Centre will play a major role as a conduit to transfer scientific knowledge between the Research and commercial laboratories or consultants able to provide high quality nanosafety services, and the end-users of such services (e.g., industry, SMEs, consultancy firms, and regulatory authorities). The Centre will harmonise service provision, and bring novel risk assessment and management approaches, e.g. in silico methodologies, closer to practice, notably through SbD/SSbD, and decisively support safe and sustainable innovation of industrial production in the nanotechnology industry according to the European Chemicals Strategy for Sustainability. KW - Nanotechnology KW - European Centre KW - Nano-safety KW - Nanomaterials KW - analytical service PY - 2021 DO - https://doi.org/10.1016/j.impact.2021.100337 VL - 23 SP - 100337 PB - Elsevier B.V. AN - OPUS4-52942 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -