TY - JOUR A1 - Lüdicke, M. G. A1 - Hildebrandt, Jana A1 - Schindler, C. A1 - Sperling, R. A. A1 - Maskos, M. T1 - Automated QuantumDots Purification via Solid Phase Extraction N2 - The separation of colloidal nanocrystals from their original synthesis medium is an essential process step towards their application, however, the costs on a preparative scale are still a constraint. A new combination of approaches for the purification of hydrophobic Quantum Dots is presented, resulting in an efficient scalable process in regard to time and solvent consumption, using common laboratory equipment and low-cost materials. The procedure is based on a combination of solvent-induced adhesion and solid phase extraction. The platform allows the transition from manual handling towards automation, yielding an overall purification performance similar to one conventional batch precipitation/centrifugation step, which was investigated by thermogravimetry and gas chromatography. The distinct miscibility gaps between surfactants used as nanoparticle capping agents, original and extraction medium are clarified by their phase diagrams, which confirmed the outcome of the flow chemistry process. Furthermore, the solubility behavior of the Quantum Dots is put into context with the Hansen solubility parameters framework to reasonably decide upon appropriate solvent types. KW - Quantum Dots KW - Purification PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-559590 DO - https://doi.org/10.3390/nano12121983 SN - 2079-4991 VL - 12 IS - 12 PB - MDPI CY - Basel AN - OPUS4-55959 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Yusenko, Kirill T1 - Reaction of high-entropy alloys with hydrogen under extreme conditions N2 - In the current study, we investigate an interaction under high-pressure high-temperature of single phase fcc-, hcp- and bcc-structured high-entropy alloys with hydrogen, carbon and nitrogen to obtain high-entropy hydrides, carbides and nitrides. Structural changes in high-entropy alloys upon compression and heating in the presence of these light elements are in the focus of our investigation. An easy route to high-entropy hydrides, carbides and nitrides will open new synthetic horizons in compositionally complex materials. Our study suggests that high-entropy alloys form high- entropy hydrides mainly with a composition close to M:H 1:1 ratio. Hydrides can be obtained under compression with hydrogen as a pressure compression medium or using hydrogen fluid as reactive agent. T2 - Intermetallics 2023 CY - Bad Staffelstein, Germany DA - 03.10.2023 KW - HEA PY - 2023 AN - OPUS4-58555 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lifka, S. A1 - Harsányi, K. A1 - Baumgartner, E. A1 - Pichler, L. A1 - Baiko, D. A1 - Wasmuth, Karsten A1 - Heitz, J. A1 - Meyer, M. A1 - Joel, A.-C. A1 - Bonse, Jörn A1 - Baumgartner, W. ED - Mail, M. T1 - Laser-processed antiadhesive bionic combs for handling nanofibers inspired by nanostructures on the legs of cribellate spiders N2 - Nanofibers are drawing the attention of engineers and scientists because their large surface-to-volume ratio is favorable for applications in medicine, filter technology, textile industry, lithium-air batteries, and optical sensors. However, when transferring nanofibers to a technical product in the form of a random network of fibers, referred to as nonwoven fabric, the stickiness of the freshly produced and thus fragile nanofiber nonwoven remains a problem. This is mainly because nanofibers strongly adhere to any surface because of van der Waals forces. In nature, there are animals that are actually able to efficiently produce, process, and handle nanofibers, namely cribellate spiders. For that, the spiders use the calamistrum, a comb-like structure of modified setae on the metatarsus of the hindmost (fourth) legs, to which the 10–30 nm thick silk nanofibers do not stick due to a special fingerprint-like surface nanostructure. In this work, we present a theoretical model of the interaction of linear nanofibers with a sinusoidally corrugated surface. This model allows for a prediction of the adhesive interaction and, thus, the design of a suitable surface structure to prevent sticking of an artificially nonwoven of nanofibers. According to the theoretical prediction, a technical analogon of the nanoripples was produced by ultrashort pulse laser processing on different technically relevant metal surfaces in the form of so-called laser-induced periodic surface structures (LIPSS). Subsequently, by means of a newly established peel-off test, the adhesion of an electrospun polyamide fiber-based nonwoven was quantified on such LIPSS-covered aluminium alloy, steel, and titanium alloy samples, as well as on polished (flat) control samples as reference and, additionally, on samples with randomly rough surfaces. The latter revealed that the adhesion of electrospun nanofiber nonwoven is significantly lowered on the nanostructured surfaces compared with the polished surfaces. KW - Laser-induced periodic surface structures (LIPSS) KW - Cribellate spiders KW - Calamistrum KW - Electrospinning KW - Nanofibers PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-561799 DO - https://doi.org/10.3762/bjnano.13.105 SN - 2190-4286 VL - 13 SP - 1268 EP - 1283 PB - Beilstein-Institut zur Förderung der Chemischen Wissenschaften CY - Frankfurt, M. AN - OPUS4-56179 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fritzsche, Sven A1 - Jaenisch, Gerd-Rüdiger A1 - Pavasaryte, Lina A1 - Funk, Alexander T1 - XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution N2 - Direct Laser Writing (DLW) and X-ray computed tomography (XCT) both offer unique possibilities in their respective fields. DLW produces full three-dimensional (3D) polymer structures on the microscale with resolutions below 100 nm. The fabricated structures can be analysed by XCT or X-ray microscopy (XRM), which incorporates additional X-ray lenses, in three dimensions down to a minimal basic spatial resolution of about 500 nm or 50 nm, respectively. In this work, two different DLW structures are analysed via XCT. Internal defects are detected and analysed for the purpose of quality control. Defects and structures with sizes down to 1.5 µm are successfully analysed. A 3D reconstruction and internal, hidden features of the fabricated structures are shown and discussed. In a first-of-its-kind study, we demonstrate the detectability of a single-voxel line inside a fabricated structure that would not be detectable with SEM or light microscopy. Furthermore, the direct fabrication on a PET substrate is shown to overcome the high X-ray absorbance of commonly used glass substrates. Attenuation spectra of SZ2080 and glass substrates are compared to a fabrication route direct on a 170 µm PET foil. The practical aspects of XCT measurements for DLW structures on different substrates will be discussed. KW - Non-destructive testing KW - Two-photon polymerization KW - X-ray microscopy KW - XCT KW - 2PP KW - Direct laser writing PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-560525 DO - https://doi.org/10.3390/app122010488 VL - 12 IS - 20 SP - 1 EP - 15 PB - MDPI CY - Basel AN - OPUS4-56052 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bonse, Jörn A1 - Krüger, Jörg T1 - Structuring of thin films by ultrashort laser pulses N2 - Modern life and global communication would not be possible without technologically tailored thin films; they are omnipresent in daily life applications. In most cases, the films are deposited entirely at the carrying substrates in a specific processing step of the device or sample. In some cases, however, removal or modification must be performed locally, i.e., site-controlled and material selective through an additional laser processing step. For that ultrashort laser pulses with durations in the femtosecond and picosecond range can provide unique advantages and capabilities in industrially scalable schemes. This article reviews the current state of the research and corresponding industrial transfer related to the structuring of thin films by ultrashort pulsed lasers. It focuses on the pertinent historic developments, reveals the relevant physical and chemical effects, explores the ultimate limits, and discusses selected industrial and scientific applications. KW - Thin films KW - Laser processing KW - Ultrashort lasers KW - Laser damage KW - Femtosecond laser ablation PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-565732 DO - https://doi.org/10.1007/s00339-022-06229-x SN - 0947-8396 SN - 1432-0630 VL - 129 IS - 1 SP - 1 EP - 38 PB - Springer CY - Berlin AN - OPUS4-56573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - OECD Prüfrichtlinie 125 N2 - Diese Präsentation ist eine Einführung in die OECD TG 125 zur Bestimmung der Partikelgrößen von Nanomaterialien. Es wird auf die verchiedenen Probleme der Partikelgrößenbestimmung eingegangen wie z.B. verschiedene Oberflächenschichten, Äquivalenzdurchmesser und Verteilungsfunktionen. Gleichzeitig werden die neuen Begrifflichkeiten eingeführt, die in der TG 125 definiert neu werden. T2 - BAM Akademie Digitaler Info-Tag "Nano or not Nano" CY - Online meeting DA - 16.02.2023 KW - Nano KW - Partikel KW - Größe KW - Partikeldurchmesser KW - Äquivalenzdurchmesser PY - 2023 AN - OPUS4-58449 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - Differentielles Mobilitäts Analyse System (DMAS) N2 - Die Bestimmung der Nanopartikelgrößen- und -formverteilung nach OECD TG 125 mit einem Differentiellen Mobilitäts Analyse System (DMAS), auch bekannt als SMPS, wird vorgestellt: - Generelles Messprinzip - Welchen Durchmesser misst die Methode? - Welche Partikel kann diese Methode messen? - Welche Informationen kann diese Methode liefern? - Wo stößt die Methode an ihre Grenzen? - Implementierung und Datenauswertung, - Reporting. Anschließend wurde eine Q&A-Session für DMAS/SMPS organisiert. T2 - BAM Akademie Digitaler Info-Tag "Nano or not Nano" CY - Online meeting DA - 16.02.2023 KW - Partikel KW - Nanopartikel KW - SMPS KW - Größenbestimmung KW - DMAS PY - 2023 AN - OPUS4-58450 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Costache, F. A1 - Valette, S. A1 - Bonse, Jörn T1 - Editorial: Special Issue “Dynamics and Processes at Laser-Irradiated Surfaces—A Themed Issue in Honor of the 70th Birthday of Professor Jürgen Reif” N2 - The Special Issue “Dynamics and Processes at Laser-irradiated Surfaces” is dedicated to the 70th birthday of Jürgen Reif, retired full professor, former Chair of Experimental Physics II of the Faculty of Physics of the Brandenburg University of Technology Cottbus—Senftenberg in Germany. KW - Laser ablation KW - Laser-induced periodic surface structures (LIPSS) KW - Surface functionalization KW - Femtosecond laser PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-569482 DO - https://doi.org/10.3390/nano13030611 SN - 2079-4991 VL - 13 IS - 3 SP - 1 EP - 3 PB - MDPI CY - Basel AN - OPUS4-56948 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cappella, Brunero A1 - Spaltmann, Dirk A1 - Gee, M. T1 - Editorial: Tribology and Atomic Force Microscopy - Towards Single Asperity Contact N2 - The concept behind this Research Topic (RT) was to collect works, in which Atomic Force Microscopy (AFM) techniques are employed to study tribological phenomena and to push the resolution of measurements towards single asperity contact. Thanks to the direct determination of sample height with sub-nanometer resolution and the possibility of measuring local friction, AFM can be employed after a tribotest to detect topography and friction changes at the nanometer scale. Recently, efforts are being expended to use AFM cantilevers as tribometers, i.e., as probes altering the volume of suitable samples, thereby measuring tip and/or sample wear and friction at the nano/microscale. Thus, single asperity contact, friction, and wear can be investigated. Since friction and wear at the macroscale are the result of asperities interactions, such experiments are of great importance for better understanding of tribological processes. KW - Nanotribology KW - Friction KW - Wear KW - Single asperity KW - AFM PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-571037 DO - https://doi.org/10.3389/fmech.2022.853934 SN - 2297-3079 VL - 8 SP - 1 EP - 2 PB - Frontiers Media CY - Lausanne AN - OPUS4-57103 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas T1 - On the use of spectroscopic imaging ellipsometry for quantification and characterisation of defects in thin films for power electronics N2 - Compound semiconductors (CS) are promising materials for the development of high-power electrical applications. They have low losses, can withstand high temperatures and can operate at very high voltages and currents. This makes them a key technology for the electrification of many high energy applications, especially electromobility and HVDC power lines. The challenge with CS technology is that most of the process technology has to be developed anew to the high standards required by electronic applications. Today, compound semiconductors can be produced in thin layers on top of substrates fabricated from classical crystal growth processes that are already well established. A promising method for this is metal organic vapour phase epitaxy (MOVPE). With this method, many different compounds with semiconducting properties can be synthesized. Additionally, this process technology is a direct thin layer deposition method. Therefore, complex multilayer systems can be generated directly by the deposition process and without the need of doping after growing. There are a number of critical defects that can originate from the deposition process of these thin film devices. Within this project, we intend to develop new correlative imaging and analysis techniques to determine defect types, to quantify defect size and number density, as well as to characterise defects for process optimisation. We report here on the use of spectroscopic ellipsometry and imaging ellipsometry to investigate defects in several different compound semiconductor materials used in high-power electronic devices. The materials we investigated are β-Ga2O3, SiC, GaN, AlN, and AlGaN materials as well as oxidised SiC surfaces. All of these materials have their typical defects and require optimised measurement and analysis schemes for reliable detection and analysis. Spectroscopic ellipsometry is a highly sensitive method for determining the thicknesses and dielectric function of thin layers, yielding potentially a high number of microscopic properties. The combined method between ellipsometry and optical microscopy is called imaging ellipsometry and is especially powerful for the large amount of data it produces. We have analysed defects in SiC- and AlN-based thin film semiconductors as well as characterised the properties of different types of SiO2 layers created on top of SiC monocrystals. We developed ellipsometric models for the data analysis of the different semiconductor materials. If the defects have geometric features, it is useful to combine the ellipsometric analysis with topometry method like interference microscopy and scanning probe microscopy. We have successfully characterised function-critical defects in MOVPE SiC layers and correlated the findings with topography from WLIM measurements. We have developed an imaging ellipsometric measurement methodology that allows to estimate the relative defect area on a surface by a statistical raw data analysis. T2 - EMRS Spring Meeting 2024 - ALTECH 2024 CY - Strasbourg, France DA - 27.05.2024 KW - compound semiconductors KW - Ellipsometry KW - Layer Materials KW - Defect Analysis PY - 2024 AN - OPUS4-61005 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -