TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - Delivering Impact - A new ISO standard on the identification of nanoparticles N2 - Nanoparticles (NPs) are tiny – around 1 to 100 billionths of a meter – and can have different chemistries and behaviours than the same material of larger size. This property has led to advances in a wide range of industries, but it can also confer toxicity. Size measurements are the main way NPs are identified but a lack of standardised methods for identifying ones with complex shapes has hindered evaluation of their potential harm. KW - Nanoparticles KW - Standardisation KW - Particle size distribution KW - nPSize KW - ISO 21363 PY - 2024 UR - https://www.euramet.org/casestudies/casestudiesdetails/news/default-c3b26209e8 SP - 1 EP - 2 PB - EURAMET CY - Braunschweig AN - OPUS4-59626 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Pauw, Brian Richard T1 - Glimpses of the future: Systematic investigations of 1200 mofs using a highly automated, full-stack materials research laboratory N2 - By automatically recording as much information as possible in automated laboratory setups, reproducibility and traceability of experiments are vastly improved. This presentation shows what such an approach means for the quality of experiments in an X-ray scattering laboratory and an automated synthesis set-up. T2 - Winter School on Metrology and Nanomaterials for Clean Energy CY - Claviere, Italy DA - 28.01.2024 KW - Digitalization KW - Automation KW - Digital laboratory KW - Scattering KW - Synthesis KW - Nanomaterials KW - Holistic science PY - 2024 AN - OPUS4-59621 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lindemann, Franziska T1 - Bestimmung der spezifischen Oberfläche mittels Gasadsorption (BET-Verfahren) N2 - Im Rahmen des 2. BAM-Akademie Info-Tages "Nano or not Nano" wurde die OECD TG 124 "Volume Specific Surface Area of Manufactured Nanomaterials" vorgestellt. Der Vortrag beschreibt die Bestimmung der spezifischen Oberfläche von dispersen und/oder porösen Pulvern mittels Gasadsorption nach dem BET-Verfahren. Es wird auf die Anwendbarkeit der Methode eingegangen und es werden praktische Hinweise zur Probenvorbereitung und Messung von Nanomaterialien gegeben. T2 - BAM Akademie II: Info-Tage "Nano or not Nano" CY - Online meeting DA - 25.01.2024 KW - OECD TG 124 KW - Nanopulver KW - VSSA KW - Nano powder KW - BET KW - Spezifische Oberfläche PY - 2024 AN - OPUS4-59623 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fareed, Adnan A1 - Rosalie, Julian M. A1 - Kar, Satyakam A1 - Fähler, Sebastian A1 - Maaß, Robert T1 - Small-scale functional fatigue of a Ni-Mn-Ga Heusler alloy N2 - Functional fatigue of shape-memory alloys is a considerable threat to the reliable service of actuation devices. Here, we demonstrate the essentially degradation-free cyclic phase-transformation behavior of Ni-Mn-Ga microcrystals up to one million stress-driven superelastic cycles. Cyclic dissipation amounts to about 1/5 of the bulk counterpart and remains unaffected during cycling, even after the introduction of dislocation structures via plastic straining. Plastic yielding and the transformation stress largely exceed the known bulk values. However, the transformation-stress is found to depend on plastic pre-straining, which suggests that the size-affected transformation stress is sensitive to the initial defect structure and that it can be tuned by a targeted introduction of dislocations. These findings demonstrate the high suitability of Ni-Mn-Ga as a robust shape-memory alloy in small-scale functional device engineering. KW - Superelasticity KW - Shape-memory alloys KW - Functional fatigue KW - Ni-Mn-Ga PY - 2024 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-600695 DO - https://doi.org/10.1016/j.actamat.2024.119988 VL - 274 SP - 1 EP - 10 PB - Elsevier B.V. AN - OPUS4-60069 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Tokarski, T. A1 - Nolze, Gert T1 - Exploring Unconventional Uses of Kikuchi Pattern Analysis N2 - The characterization of really unknown phases typically uses 70 to 150 reflectors for lattice metric calculation. The determination of the lattice parameters follows with 4% accuracy. Including a Z correction up to 1% can be reached. The precision of the lattice parameters ratios (a:b:c) is, however, better than 0.1%. T2 - Oxford Users Meeting 2024 CY - Krakow, Poland DA - 14.05.2024 KW - EBSD KW - Kikuchi KW - Lattice parameters KW - Ratio refinement PY - 2024 AN - OPUS4-60086 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Wojciak, K. A1 - Tokarski, T. A1 - Cios, G. A1 - Nolze, Gert T1 - Precision and accuracy during standard-less mapping of local lattice distortions using ebsd and calm technique N2 - Electron Back Scatter Diffraction (EBSD) is a very versatile analytical technique allowing for the characterization of material structure. Historically, diffraction images (Kikuchi patterns) registered during EBSD analysis were solved using Hough/Radon transformation. The last decade brought several novel techniques of experimental pattern analysis, focusing entirely on image analysis routines such as pattern matching, or various variants of High-Resolution EBSD. However, all the above-mentioned techniques require prior knowledge of the material structure to perform orientation analysis. The recently presented algorithm employed in Crystallographic Analysis of Lattice Metric (CALM) software, effectively removes this limitation enabling a standard-less analytical approach in EBSD systems. At its core, the CALM technique couples accurate detection of the Kikuchi bands position, with a rigid construction of reciprocal lattice resulting from translational crystal symmetry. A unique characteristic of the methodology also gives an opportunity for application in the analysis of continuous lattice changes, for example tetragonality mapping. During mapping, however, the geometry of the gnomonic projection (represented by the projection center) is continuously altered decreasing overall algorithm efficiency. The work presents an analysis of the projection center in terms of precision and accuracy. T2 - Oxford User Meeting 2024 CY - Krakow, Poland DA - 14.05.2024 KW - EBSD KW - Kikuchi KW - Lattice parameters KW - Ratio refinement PY - 2024 AN - OPUS4-60087 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fiedler, Saskia A1 - Frenzel, Florian A1 - Würth, Christian A1 - Tavernaro, Isabella A1 - Grüne, M. A1 - Schweizer, S. A1 - Engel, A. A1 - Resch-Genger, Ute T1 - Interlaboratory Comparison on Absolute Photoluminescence Quantum Yield Measurements of Solid Light Converting Phosphors with Three Commercial Integrating Sphere Setups N2 - Scattering luminescent materials dispersed in liquid and solid matrices and luminescent powders are increasingly relevant for fundamental research and industry. Examples are luminescent nano- and microparticles and phosphors of different compositions in various matrices or incorporated into ceramics with applications in energy conversion, solid-state lighting, medical diagnostics, and security barcoding. The key parameter to characterize the performance of these materials is the photoluminescence/fluorescence quantum yield (Φf), i.e., the number of emitted photons per number of absorbed photons. To identify and quantify the sources of uncertainty of absolute measurements of Φf of scattering samples, the first interlaboratory comparison (ILC) of three laboratories from academia and industry was performed by following identical measurement protocols. Thereby, two types ofcommercial stand-alone integrating sphere setups with different illumination and detection geometries were utilized for measuring the Φf of transparent and scattering dye solutions and solid phosphors, namely, YAG:Ce optoceramics of varying surface roughness, used as converter materials for blue light emitting diodes. Special emphasis was dedicated to the influence of the measurement geometry, the optical properties of the blank utilized to determine the number of photons of the incident excitation light absorbed by the sample, and the sample-specific surface roughness. While the Φf values of the liquid samples matched between instruments, Φf measurements of the optoceramics with different blanks revealed substantial differences. The ILC results underline the importance of the measurement geometry, sample position, and blank for reliable Φf data of scattering the YAG:Ce optoceramics, with the blank’s optical properties accounting for uncertainties exceeding 20%. KW - Nano KW - Fluorescence KW - Reference material KW - Luminescence KW - Quantitative spectroscopy KW - Particle KW - Quantum yield KW - Quality assurance KW - Phosphor KW - Converter material KW - Lifetime KW - Interlaboratory comparison KW - Method KW - Uncertainty PY - 2024 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-600945 DO - https://doi.org/10.1021/acs.analchem.4c00372 SN - 0003-2700 SP - 6730 EP - 6737 PB - ACS Publications AN - OPUS4-60094 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Fontanges, Richard T1 - A new deep-learning AI tool for analysing images of complex nanoparticles N2 - A thousand times thinner than a human hair, nanoparticles (NPs) are finding applications in a range of modern products. However, as some can affect human health or the environment, knowing the types present is essential. Electron microscopy is the ‘gold standard’ for NP analysis, allowing identification based on manual size analysis, but a new method was required to analyse these particles quickly, accurately and in a consistent way. KW - Nanoparticles KW - Imaging KW - AI tool KW - Particle size and shape distribution PY - 2024 UR - https://www.euramet.org/casestudies/casestudiesdetails/news/a-new-deep-learning-ai-tool-for-analysing-images-of-complex-nanoparticles SP - 1 EP - 2 PB - EURAMET CY - Braunschweig AN - OPUS4-60095 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ongoing VAMAS ILC s on Nanoparticles and Graphene Oxide N2 - This contributions shows the first results of the ongoing interlaboratory comparisons under VAMAS/TWA 34 Nanoparticle populations related on the determination of pasrticle size distribution and relative concentration of nanoparticles and an example of an ILC running under VAMAS/TWA 41 Graphene and Related 2D Materials on the determination of the lateral diemsnions of graphene oxide flakes by Scanning Electron Microscopy. The link to related standardisation projects at ISO/TC Nanotechnologies are explained. T2 - Webinar Building the Foundation: Interlaboratory Comparisons and Reference Products for Advanced Materials CY - Berlin, Germany DA - 16.05.2024 KW - Nanoparticles KW - VAMAS KW - Interlaboratory comparison KW - Standardisation KW - Electron microscopy KW - AFM KW - SAXS PY - 2024 AN - OPUS4-60097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - About Interlaboratory Comparisons (ILCs) and VAMAS N2 - Advanced materials, such as nanomaterials, 2D materials, or thin films, play a crucial role in driving economic development and addressing major challenges in the coming years. These challenges include mitigating the impact of climate change, advancing lightweight engineering, enhancing catalysis, and improving medical applications. To comprehend the performance of these materials and ensure their acceptance across various sectors as safe and sustainable for both humans and the environment, the availability of reference procedures, materials, and data is essential. One versatile tool for establishing such references and evaluating the proficiency of individual laboratories and their competencies is through (international) interlaboratory comparisons (ILC). Notably, initiatives like the Versailles Project on Advanced Materials and Standards (VAMAS) provide a platform for conducting ILCs. This webinar will showcase various examples of interlaboratory comparisons, illustrating their impact on the development of reference products. T2 - Webinar Building the Foundation: Interlaboratory Comparisons and Reference Products for Advanced Materials CY - Berlin, Germany DA - 16.05.2024 KW - Interlaboratory comparison KW - Reference products KW - VAMAS KW - Standardisation PY - 2024 AN - OPUS4-60096 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -