TY - CONF A1 - Schumacher, David A1 - Zscherpel, Uwe A1 - Ewert, Uwe T1 - Recent developments of photon counting and energy discriminating detectors for radiographic imaging T2 - Proceedings of 2017 Far East NDT New Technology & Application Forum (FENDT) N2 - The direct detection of X-ray photons into electrical signals is enabled by usage of highly absorbing photo conducting materials (e.g. CdTe) as detection layer of an underlying CMOS semiconductor X-ray image detector. If the read-out speed is high enough (ca. 50 - 100 ns dead time) single X-ray photons can be counted and their energy measured. Read-out noise and dark image correction can be diminished. By setting energy thresholds, selected energy ranges of the X-ray spectrum can be detected or suppressed. This allows material discrimination or reduction of scattered radiation, which results in an enhanced contrast sensitivity. T2 - Far East NDT New Technology & Application Forum (FENDT) CY - Xi'an, China DA - 22.06.2017 KW - Industrial X-ray imaging KW - Photon counting KW - Energy discrimination KW - Dual energy imaging KW - Direct detection PY - 2018 UR - https://ieeexplore.ieee.org/document/8584559 SN - 978-1-5386-1615-4 DO - https://doi.org/10.1109/FENDT.2017.8584559 VL - 2017 SP - 281 EP - 285 PB - IEEE Xplore AN - OPUS4-47175 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -