TY - JOUR A1 - Friedrich, Sebastian A1 - Cappella, Brunero T1 - Application of contact-resonance AFM methods to polymer samples JF - Beilstein Journal of Nanotechnology N2 - Contact-resonance AFM (CR-AFM) has been used in recent years for the measurement of mechanical properties. Compared with other techniques, CR-AFM has a much shorter acquisition time, compensating the incomplete theoretical understanding of the underlying physical phenomena. In the present paper, we propose a procedure, which allows to determine the elastic modulus of the sample as a parameter of the fit of the CR frequency as a function of the load. It is concluded that CR measurements are not appropriate for polymer samples. Major drawbacks are the bad resolution for moduli lower than ca. 10 GPa and the lack of a comprehensive physical model. KW - Atomic force microscopy KW - Contact resonance KW - Mechanical properties KW - Polymers KW - Wear PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-515621 DO - https://doi.org/10.3762/bjnano.11.154 VL - 11 SP - 1714 EP - 1727 AN - OPUS4-51562 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fahrbach, M. A1 - Friedrich, Sebastian A1 - Behle, H. A1 - Xu, Min A1 - Cappella, Brunero A1 - Brand, U. A1 - Peiner, E. T1 - Customized piezoresistive microprobes for combined imaging of topography and mechanical properties JF - Measurement: Sensors N2 - Customized piezoresistive cantilever microprobes with a deflection range of 120 μm and silicon tips of 100 μm height were operated in a Cypher AFM showing their functionality for measuring topography together with stiffness, adhesion, and viscoelastic properties of thin films. KW - Cantilever microprobe KW - Piezoresistive KW - Atomic force microscopy KW - Force-distance curves KW - Contact resonance KW - Lubricants PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-524225 DO - https://doi.org/10.1016/j.measen.2021.100042 VL - 15 SP - 100042 PB - Elsevier Ltd. AN - OPUS4-52422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -