TY - CONF A1 - Winkelmann, Aimo A1 - Nolze, Gert A1 - Voss, M. A1 - Salvat-Pujol, F. A1 - Werner, W. S. M. T1 - Physics-based simulation models for EBSD: advances and challenges N2 - EBSD has evolved into an effective tool for microstructure investigations in the scanning electron microscope. The purpose of this contribution is to give an overview of various simulation approaches for EBSD Kikuchi patterns and to discuss some of the underlying physical mechanisms. T2 - EMAS 2015 - 14th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS CY - Portoroz, Slovenia DA - 03.05.2015 KW - Electron backscatter diffraction KW - Simulation KW - Dynamical theory KW - Kinematic theory PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-377469 VL - 109 SP - 012018-1 EP - 012018-13 AN - OPUS4-37746 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bachmann, Marcel A1 - Gumenyuk, Andrey A1 - Rethmeier, Michael T1 - Welding with high-power lasers: trends and developments N2 - High-power laser beam welding became new stimuli within the last 10 years due to the availability of a new generation of high brightness multi kilowatt solid state lasers. In the welding research new approaches have been developed to establish reliable and praxis oriented welding processes meeting the demands of modern industrial applications during this time. The paper focuses on some of the current scientific and technological aspects in this research field like hybrid laser arc welding, simulation techniques, utilization of electromagnetic fields or reduced pressure environment for laser beam welding processes, which contributed to the further development of this technology or will play a crucial role in its further industrial implementation. T2 - 9th International Conference on Photonic Technologies - LANE 2016 CY - Fürth, Germany DA - 19.09.2016 KW - High-power Laserbeam Welding KW - Electromagnetic Force KW - Vacuum KW - Simulation PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-377280 VL - 83 SP - 15 EP - 25 PB - Elsevier B.V. CY - Berlin, Germany AN - OPUS4-37728 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Kolkoori, Sanjeevareddy A1 - Deresch, Andreas T1 - Influence of scattered radiation on the efficiency of dual high-energy X-Ray imaging for material characterization N2 - In this contribution, we discuss the influence of scattered radiation on materials’ effective attenuation coefficients at higher X-ray energies. The selected X-ray spectra for the dual-energy experiments correspond to 3 MV and 7.5 MV acceleration potential of the used betatron. Experiments were performed on a test phantom containing step wedges of different low- and high-Z materials. We evaluated the ratio between low- and high-energy X-ray attenuation coefficients quantitatively based on simulated poly-energetic high-energy X-ray source spectra and the detector sensitivity using the “analytical Radiographic Testing inspection simulation tool” (aRTist) developed at BAM. Furthermore, the influence of scattered radiation is evaluated using an efficient Monte-Carlo simulation. The simulation results are compared quantitatively with experimental investigations. Finally, important applications of the proposed technique in the context of aviation security are discussed. T2 - 19th World Conference on Nondestructive Testing CY - Munich, Germany DA - 13.06.2016 KW - Monte Carlo methods KW - Dual-energy imaging KW - Simulation KW - Experiments PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-365925 SN - 978-3-940283-78-8 VL - 158 SP - 1 EP - 10 PB - DGZfP CY - Berlin, Germany AN - OPUS4-36592 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Deresch, Andreas A1 - Jaenisch, Gerd-Rüdiger A1 - Bellon, Carsten T1 - A fast general spectrum model for quantitative radiography simulation N2 - One essential step on the way towards accurate quantitative simulation of radiographic testing is an accurate description of the utilized energy spectrum of X-ray photons. For use in general purpose simulation tools, the spectra of X-ray tubes have to be described by a model covering at least the intended range of applications. This range includes transmission tubes as well as direct beam tubes with varying angles of incidence and emission, for a number of typical target materials. In radiographic testing acceleration voltages frequently reach up to 450 kV for direct beam targets and up to 225 kV for transmission targets, with even higher voltages available or being developed. Currently used models are unable to cover the whole range of configurations. Here a model is presented that employs a unified approach for simulating the photon energy spectra for transmission and direct beam targets composed of arbi-trary homogeneous materials. In order to achieve this, a detailed model of electron transport within the target is employed. The validity of the developed model is shown through comparisons with Monte Carlo simulations as well as measurements for a number of different configurations. T2 - 19th World Conference on Nondestructive Testing CY - Munich, Germany DA - 13.06.2016 KW - Measurements KW - X-ray spectra KW - Simulation KW - Electron transport PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-365959 SN - 978-3-940283-78-8 VL - 158 SP - 1 EP - 7 PB - DGZfP CY - Berlin, Germany AN - OPUS4-36595 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bellon, Carsten A1 - Jaenisch, Gerd-Rüdiger A1 - Deresch, Andreas T1 - Combining analytical and Monte Carlo modelling for industrial radiology N2 - Modelling becomes more and more important in modern NDE. It is increasingly used to optimize techniques for complex applications, to support the preparation of written procedures, and for education purposes. To describe the complete chain of RT, the model includes simulating all necessary properties of X- or Gamma-ray sources, the interaction of photons with material with special attention to scattered radiation, the detection process, and the complete geometrical RT setup handling arbitrary parts or constructions. Depending on the given inspection problem and the influencing factors that should be addressed by the simulation, an appropriate physical model has to be chosen to describe the underlying interaction mechanisms. The simulator aRTist combines analytical and Monte Carlo methods to efficiently model the radiation transport such that transmission as well as scatter techniques can be modelled. In this contribution we Focus on Monte Carlo Simulation of scatter contribution within aRTist. Examples for RT/tomographic applications and back-scatter techniques are presented to demonstrate the usability of the presented simulation tool for a broad range of radiological applications. T2 - 19th Wolrd Conference on Nondestructive Testing CY - Munich, Germany DA - 13.06.2016 KW - Radiography KW - Computed tomography KW - Simulation KW - Monte Carlo methods PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-365856 SN - 978-3-940283-78-8 VL - 158 SP - 1 EP - 9 PB - Deutsche Gesellschaft für zerstörungsfreie Prüfung (DGZfP) CY - Berlin, Germany AN - OPUS4-36585 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Jaenisch, Gerd-Rüdiger A1 - Kolkoori, Sanjeevareddy A1 - Bellon, Carsten T1 - Quantitative simulation of back scatter X-ray imaging and comparison to experiments N2 - X-ray backscatter imaging is a well established NDT technique to inspect complex objects using only a single-sided access. In difference to conventional transmission X-ray radiography, the X-ray backscatter imaging utilizes the scattered radiation caused by the Compton scattering effect. In order to achieve high backscatter intensities from a test object, it is necessary to optimize the backscatter system parameters namely the angle between source and slit camera, the slit collimator system, the shielding between source and scatter camera, and the type of detector. In addition, the scatter phenomena in to the investigated object need to be understood. In this contribution, we present a Monte Carlo model McRay which considers all relevant single and multiple interactions of photons and electrons. This model can be used to simulate back scatter techniques. It allows not only calculating the scatter image for a given experimental setup but also registering the spectrum of the detected scattered photons. Both aspects are important to understand the imaging process, to interpret the results, and to optimize the backscatter camera investigated here. Additionally experimental results will be presented and compared with simulations. T2 - 19th World Conference on Nondestructive Testing CY - Munich, Germany DA - 13.06.2016 KW - Radiology KW - Back-scatter techniques KW - Simulation KW - Monte Carlo methods KW - Measurements PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-365897 SN - 978-3-940283-78-8 VL - 158 SP - 1 EP - 11 PB - Deutsche Gesellschaft für zerstörungsfreie Prüfung (DGZfP) CY - Berlin, Germany AN - OPUS4-36589 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -