TY - CONF A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Britzke, Ralf A1 - Bruno, Giovanni A1 - Mueller, Bernd R. A1 - Hentschel, Manfred P. T1 - Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing N2 - Grating interferometric set-ups have been established in the last decade. They are promising candidates to obtain enhanced image contrast from weakly absorbing micro and nano structures. They are based on X-ray refraction and near-field diffraction using the Talbot effect. At the expense of taking multiple images, Talbot-Lau grating interferometry allows separating the absorption, refraction, and scattering contributions by analysing the disturbances of a phase grating interference pattern. Contrary to other refraction enhanced methods, this technique can be applied using conventional X-ray tubes (divergent, polychromatic source). This makes it attractive to solve typical non-destructive testing problems. We investigated the efficiency of phase gratings, i.e. the visibility (the amplitude of oscillations) upon variation of propagation distance and phase grating rotation around an axis parallel to the grid lines. This grating rotation changes the grating shape (i.e. the distributions of phase shifts). This can yield higher visibilities than derived from rectangular shapes. Our study includes experimental results obtained from synchrotron radiation, as well as simulations for monochromatic radiation. The advantages of Talbot-Lau interferometry are demonstrated at the example of glass capillaries. T2 - WCNDT2016 CY - Munich, Germany DA - 13.06.2016 KW - Phase-contrast X-ray imaging KW - Talbot- Lau interferometry KW - Phase grating KW - Visibility KW - Synchrotron radiation PY - 2016 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-365987 SN - 978-3-940283-78-8 VL - BB 158 SP - Tu.3.G.2., 1 EP - 9 AN - OPUS4-36598 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -