TY - JOUR A1 - Borges de Oliveira, F. A1 - Reuter, T. A1 - Plotzki, David A1 - Wohlgemuth, F. A1 - Bartscher, M. A1 - Bellon, Carsten A1 - Kasperl, S. T1 - Assessment of 2D-based tests for the qualification of simulation software for dXCT JF - Measurement Science and Technology N2 - The interest in using computer simulations of dimensional x-ray computed tomography (dXCT) for various metrological purposes—such as measurement planning, performance prediction, performance optimisation and, finally, measurement uncertainty estimation—is increasing along with the ever-growing demand for more reliable measurements with dXCT. However, before a piece of simulation software can be used for tasks related to coordinate metrology, it has to be ensured that it is able to simulate physical laws, characteristic effects and basic CT system functionalities correctly and with sufficient accuracy. In short, the software must be qualified for dimensional metrology tasks. As one part of such a qualification process, a method is presented here for determining conformity intervals of 2D tests (projection-based tests) based on 3D tests (testing based on dimensional evaluations in a reconstructed volume) for the assessment of dXCT simulation software. The method consists of varying relevant parameter values in order to verify their influence on 3D measurement results. The results of the 3D tests with varied parameter values are then transferred to the quantities tested in the 2D tests and used as the basis for determining conformity intervals. Two approaches are applied for determining whether or not a variation of a parameter value is significant: (a) statistical and (b) heuristic. Two examples are presented, each based on simulated images, which show the application of the two different approaches for determining conformity intervals for the results of the 2D tests. KW - dXCT KW - X-ray computed tomography KW - Simulation PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-573316 DO - https://doi.org/10.1088/1361-6501/acc1f9 VL - 34 IS - 6 SP - 1 EP - 12 PB - IOP Publishing AN - OPUS4-57331 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -