TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas T1 - The lateral resolution of ToF-SIMS analysed by means of an advanced nanoscale strip-pattern T2 - 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) CY - Manchester, England DA - 2005-09-12 PY - 2005 AN - OPUS4-10872 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Matsubayashi, N. T1 - R.F. Plasma-polymerized Polymer Films: Comprehensive Surface and in Depth Chemical Characterization by XAS, XPS and ToF-SIMS T2 - 11th Eurpean Conference on Applications of Surface and Interface Analysis, ECASIA`05 CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-11283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias T1 - New Work Item (Technical Report): Surface chemical analysis - General procedures - Guide for the determination of lateral resolution of imaging instruments in the nanometre range T2 - ISO/TC201 14th Plenary and SC Meetings, Hotel Budapest CY - Budapest, Hungary DA - 2005-09-22 PY - 2005 AN - OPUS4-11219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Friedrich, Jörg F. T1 - TOF-SIMS analysis of plasma chemically deposited co-polymer films T2 - 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) CY - Manchester, England DA - 2005-09-12 PY - 2005 AN - OPUS4-11279 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - Project A8: New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range T2 - VAMAS TWA 2 Meeting CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-11218 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas T1 - Project A8: New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range T2 - VAMAS Technical Working Area 2 on Surface Chemical Analysis, Meeting of National Representatives, Project Leaders and Observers CY - Morgan Hill, CA, USA DA - 2006-11-12 PY - 2006 AN - OPUS4-14223 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Meyer-Plath, Asmus A1 - Lippitz, Andreas A1 - Swaraj, Sufal A1 - Oran, Umut T1 - Surface chemical characterization of plasma-polymerized organic films: State-of-the-art and shortcomings T2 - 10th International Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2006-09-10 PY - 2006 AN - OPUS4-13062 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range (VAMAS Projekt A8) T2 - VAMAS TWA 2 "Surface Chemical Analysis" Meeting 2007 CY - Brussels, Belgium DA - 2007-09-09 PY - 2007 AN - OPUS4-15879 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Results of a german survey on topics of interest in surface chemical analysis of organic surfaces in 2006: topics and priorities T2 - ISO/TC201 15th Plenary and SC Meetings (Morgan Hill Meeting) CY - Morgan Hill, CA, USA DA - 2006-11-09 PY - 2006 AN - OPUS4-14232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: certified reference materials and R&D on plasma polymerization of organics T2 - Seminar, National ESCA and Surface Analysis Center for Biomedical Problems (NESCA/BIO), University of Washington CY - Seattle, WA, USA DA - 2006-06-29 PY - 2006 AN - OPUS4-12506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Jagst, Eda A1 - Lippitz, Andreas A1 - Treu, Dieter T1 - Amino group determination on 4,4'-Methylenebis(2,6-diethylaniline) film surfaces by XPS and NEXAFS applying derivatization reactions T2 - ECASIA'07 CY - Brussels, Belgium DA - 2007-09-10 PY - 2007 AN - OPUS4-15843 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - CRG Evaluation of the Bending Magnet Beamline HE-SGM: Future scientific program T2 - CRG Evaluation of the BM Beamline HE-SGM CY - Berlin, Germany DA - 2007-03-20 PY - 2007 AN - OPUS4-14649 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias T1 - Neuartig räumlich strukturierte Testproben für die Bestimmung der Abbildungsqualität und die Kalibrierung der Längenskala in der Rastersondenmikroskopie T2 - 2. Statuskolloquium des DFG SPP 1159 "Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen" CY - Jena, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12451 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Unger, Wolfgang A1 - Schmidt, M. T1 - Measurement of the hydrophilic character of microscopic areas at microfluide components T2 - 2. Statuskolloquium des DFG SPP 1159 "Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen" CY - Jena, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12431 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Lippitz, Andreas T1 - Ageing studies of plasma deposited organic films by surface chemical analysis (ESCA, ToF-SIMS, XAS) T2 - International Conference on Processing & Manufacturing of Advanced Materials CY - Vancouver, Canada DA - 2006-07-04 PY - 2006 AN - OPUS4-12251 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: Development of certified reference materials and surface characterisation of plasma polymerized thin films T2 - Seminar im Lab. of Physical-Chemistry of Surfaces (CNRS-ENSCP), Ecole Nationale Superieure de Chemie de Paris CY - Paris, France DA - 2006-04-04 PY - 2006 AN - OPUS4-12286 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Controlled deposition from the gaseous phase: application of micro-surface analysis T2 - Marie Curie Actions: MINDE Micro and Nano Deposition (Course) European Academy of Surface Technology (EAST) CY - Schwäbisch Gmünd, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Determination of modulation transfer function by imaging of square-wave gratings with different periods in the nanometre range T2 - NanoScale 2006 CY - Bern, Switzerland DA - 2006-04-24 PY - 2006 AN - OPUS4-12287 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Friedrich, Jörg F. A1 - Mix, Renate T1 - Charakterisierung von Plasmapolymeren: "Viel hilft viel!" T2 - AK Plasma, Frühjahrstreffen 2006 CY - Berlin, Germany DA - 2006-05-30 PY - 2006 AN - OPUS4-12497 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - CCQM surface analysis working group (SAWG): introduction for WG meeting 2006 & summary 2006 and next steps T2 - CCQM Surface Analysis Working Group Meeting 2006 CY - Sèvres, France DA - 2006-04-05 PY - 2006 AN - OPUS4-12289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -