TY - CONF A1 - Retzko, Iris A1 - Treu, Dieter A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Schulz, H. T1 - Analysis of carbon materials and plasma polymers by x-ray photoelectron spectroscopy and x-ray absorption spectroscopy (XPS, XAS) T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4373 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Paatsch, Wolfgang A1 - Kaiander, I. A1 - Sellin, R. T1 - A new type of certified reference material for the analysis of surface structures in the nanometre range T2 - Eurointerfinish 2003 - Nanotechnology and coatings for novel applications CY - Praglia, Italy DA - 2003-10-23 PY - 2003 AN - OPUS4-4383 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Kühn, Gerhard A1 - Mix, Renate A1 - Koprinarov, Ivaylo T1 - Vergleich plasmaschemische Methoden zur Funktionalisierung von Polymeroberflächen T2 - X. Erfahrungsaustausch zu "Oberflächentechnologie mit Plasmaprozessen" CY - Klingenthal, Germany DA - 2003-03-18 PY - 2003 AN - OPUS4-4203 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray photoelectroscopy and X-ray absorption spectroscopy in interface analysis of metallized polymers T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Charakterisierung von Siliziumoxidschichten auf Silizium mit ESCA: Ein Beitrag zur Präszisionsbestimmung der Avogadro-Konstanten T2 - EMASS 2000 CY - Berlin, Germany DA - 2000-11-10 PY - 2000 AN - OPUS4-3446 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - A reference material for calibration and testing of instruments with nanometric lateral resolution T2 - SIMS Europe 2002 CY - Münster, Germany DA - 2002-09-15 PY - 2002 AN - OPUS4-3225 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas T1 - XPS/ESCA: Ringversuchserebnisse T2 - Seminar Oberflächenanalytik: Technische Aspekte der Akkreditierung nach ISO/IEC 17025, SOFA' 03 CY - Berlin, Germany DA - 2003-01-24 PY - 2003 AN - OPUS4-4395 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - Practical Surface Analysis PSA-04 & 5th Korea-Japan International Symposium on Surface Analysis - KJISSA CY - Jeju, South Korea DA - 2004-10-04 PY - 2004 AN - OPUS4-4598 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Retzko, Iris A1 - Schulze, Rolf-Dieter A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive depth profilino and semiquantitative determination of unsaturated carbon species in pulse plasma deposited organic films T2 - ECASIA `03 CY - Berlin, Germany DA - 2003-10-06 PY - 2003 AN - OPUS4-4672 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films prepared from Organic Molecules: Characterization by Surface Analytical Tools T2 - KRISS Meeting - NanoSurface Group CY - Daejeon, South Korea DA - 2004-10-11 PY - 2004 AN - OPUS4-4600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Unveren, E. T1 - A comparison study between Time-of-Flight Static Secondary lon Mass Spectrometry (TOF-SSIMS) and X-Ray Photoelectron Spectroscopy (XPS) in terms of Poly-dimethyl-siloxane (PDMS) contemination of Polystyrene (PS) samples T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5024 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Retzko, Iris A1 - Treu, Dieter A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destruktive depth profiling and semi-quantitative determination of unsaturated carbon species in pulse plasma deposited organic films T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5043 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absoption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3. BAMline Seminar, BESSY CY - Berlin, Germany DA - 2004-11-29 PY - 2004 AN - OPUS4-5018 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Koprinarov, Ivaylo A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Chromium-evaporated Polymers and Organic Films Investigated by X-ray Absorption Spectroscopy (XAS) and X-ray Photoelectron Spectroscopy (XPS) T2 - IPCM´99: 6th conference on interfacial phenomena in composite materials CY - Berlin, Germany DA - 1999-09-08 PY - 1999 AN - OPUS4-6076 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - EMASS1999 CY - Neuhausen am Rheinfall, Switzerland DA - 1999-10-25 PY - 1999 AN - OPUS4-6052 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Brita A1 - Jancke, Harald A1 - Müller, Bernd R. A1 - Müller, Ralf A1 - Unger, Wolfgang A1 - Reinsch, Stefan A1 - Nofz, Marianne T1 - Strukturbildungsprozesse in Solen und Gelen T2 - XXV. Tagung des Arbeitskreises "Nichtkristalline und partiellkristalline Strukturen" der Deutschen Gesellschaft für Kristallographie CY - Wolfersdorf, Germany DA - 2004-09-27 PY - 2004 AN - OPUS4-5619 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Tailor-made functionalized polymer coatings generated by pulsed r. f. plasma T2 - 6th International Conference on Adhesion and Surface Analysis CY - Loughborough, England DA - 2000-04-18 PY - 2000 AN - OPUS4-6092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - FDS/NEMA Workshop und Präsentation: Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie CY - Bergisch Gladbach, Germany DA - 2000-05-11 PY - 2000 AN - OPUS4-6093 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Hutton, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - ESCA of activated powder Cr2O3 catalysts T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5045 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E.B.M. A1 - Unger, Wolfgang A1 - Wetzig, K. T1 - Emission spectrum of copper in an argon glow discharge containing hydrogen T2 - ECASIA´99 CY - Seville, Spain DA - 1999-10-04 PY - 1999 AN - OPUS4-6080 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Böse, Olaf A1 - Lippitz, Andreas A1 - Fritz, Thomas A1 - Gelius, U. T1 - VAMA TMA2 Project A2, Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples: Report on an inter-laboratory comparison T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik (AOFA 11) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6116 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy and X-ray Absorption Spectroscopy in Interface Analysis of Metallized Polymers T2 - Materials Week 2000 CY - Munich, Germany DA - 2000-09-28 PY - 2000 AN - OPUS4-6117 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Retzko, Iris A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Ein neues Polymerisationsverfahren T2 - Berliner Polymertage 2000 (Humboldt Universität zu Berlin) CY - Berlin, Germany DA - 2000-10-11 PY - 2000 AN - OPUS4-6119 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Koprinarov, Ivaylo A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Chromium-evaporated Polymers and Organic Films Investigated by X-ray Absorption Spectroscopy (XAS) and X-ray Photoelectron Spectroscopy (XPS) T2 - BESSY Nutzertreffen CY - Berlin, Germany DA - 1999-12-09 PY - 1999 AN - OPUS4-6131 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - FDS/NEMA Workshop und Präsentation: Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie CY - Chemnitz, Germany DA - 2000-07-08 PY - 2000 AN - OPUS4-6094 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Assessment of SIMS as an analytical tool in nanotechnology T2 - SIMS Europe 2000 CY - Münster, Germany DA - 2000-09-18 PY - 2000 AN - OPUS4-6114 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profile measurements of electrically non-conductive layered samples by RF-GDOES, HFM plasma SNMS and TOF-SIMS T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11 CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, B. A1 - Schiel, D. A1 - Danzebrink, H. A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Müller, J.-P. T1 - Physical and Chemical Characterization of thermal and native Siliconoxide layers on Silicon T2 - Symposium "Reference Materials for Technologies in the New Millenium" CY - Berlin, Germany DA - 2000-05-22 PY - 2000 AN - OPUS4-6136 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. A1 - Unger, Wolfgang A1 - Reiners, Georg A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Glow discharge optical emission spectrometry (GD-OES) on samples containing hydrogen T2 - European Winter Conference on Plasma Spectrochemistry CY - Lillehammer, Norway DA - 2001-02-02 PY - 2001 AN - OPUS4-6147 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Unger, Wolfgang A1 - Wetzig, K. T1 - The effect of hydrogen on analytical lines in glow discharge optical emission spectrometry T2 - 10th Biennal National Atomic Spectrometry Symposium, Sheffield University CY - Sheffield, England DA - 2000-07-17 PY - 2000 AN - OPUS4-6137 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. A1 - Unger, Wolfgang A1 - Reiners, Georg A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Glow discharge optical emission spectrometry (GD-OES) on samples containing hydrogen T2 - Kolloquium zur Einweihung des neuen Wasserstofflabors der BAM, CY - Berlin, Germany DA - 2001-10-18 PY - 2001 AN - OPUS4-6148 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - TIME-OF-FLIGHT SIMS AND XPS CHARACTERIZATION OF METAL DOPED POLYMERS T2 - 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics CY - Nara, Japan DA - 2001-11-11 PY - 2001 AN - OPUS4-6149 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Treu, Dieter A1 - Unger, Wolfgang T1 - Verfahren zur Bestimmung des Gehaltes and organischen Siliziumverbindungen auf der Oberfläche von Elastomerformteilen T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11 CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6139 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Elektronenspektroskopien in der chemischen Oberflächenanalytik T2 - DGM Fortbildungsseminar "Schicht- und Oberflächenanalytik" CY - Kaiserslautern, Germany DA - 2001-05-28 PY - 2001 AN - OPUS4-6152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methods and Applications of Surface and Thin Film Analysis - BAM Laboratory VIII.23 T2 - Colloquium at Mechanical Engineering Laboratory (MEL) CY - Tsukuba, Japan DA - 2001-03-13 PY - 2001 AN - OPUS4-6151 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3rd International Symposium on Practical Surface Analysis and 5th Korea-Japan International Symposium on Surface Analysis (PSA-04) CY - Jeju, South Korea DA - 2004-09-26 PY - 2004 AN - OPUS4-6447 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Schulze, Rolf-Dieter A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - X-ray Absorption and Photoelectron Spectroscopy on Plasma-polymerized Films Prepared from Organic Molecules (Ethylene, Allyl alcohol, Styrene) T2 - 9th Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-6449 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Brita A1 - Jancke, Harald A1 - Müller, Bernd R. A1 - Unger, Wolfgang A1 - Reinsch, Stefan A1 - Nofz, Marianne T1 - Strukturbildungsprozesse in Gelglässern T2 - XXV. Tagung des Arbeitskreises "Nichtkristalline und partiellkristalline Strukturen" der Deutschen Gesellschaft für Kristallographie CY - Wolfersdorf, Germany DA - 2004-09-27 PY - 2004 AN - OPUS4-6241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Kaiander, I. A1 - Sellin, R.L. A1 - Bimberg, D. T1 - Testing the lateral resolution in the nanometre range with a new type of certified reference material T2 - NanoScale 2004 CY - Braunschweig, Germany DA - 2004-03-25 PY - 2004 AN - OPUS4-6429 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Retzko, Iris A1 - Schulze, Rolf-Dieter A1 - Lippitz, Andreas A1 - Wirth, Thomas A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - Study of effects of plasma parameters by characterization of pulse plasma deposited organic films T2 - 22nd BESSY Users' Meeting CY - Berlin, Germany DA - 2003-12-04 PY - 2003 AN - OPUS4-6445 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Retzko, Iris A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Unsaturated carbon species at polymer surfaces: The potential of X-ray absorption spectroscopy T2 - ECASIA 2001 CY - Avignon, France DA - 2001-09-30 PY - 2001 AN - OPUS4-6165 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ramm, M. A1 - Ata, M. A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - PLASMA-POLYMERIZED C60 FILMS T2 - International Conference on Materials for Advanced Technologies CY - Singapore DA - 2001-07-01 PY - 2001 AN - OPUS4-6210 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - OH group density at polymer surfaces T2 - CCQM Surface Analysis Working Group Meeting for 2004, BIPM CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-6427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Characterization by XAS, XPS und ToF-SIMS T2 - 12. Bundesdeutsche Fachtagung Plasmatechnologie der Deutschen Gesellschaft für Plasmatechnologie CY - Braunschweig, Germany DA - 2005-03-21 PY - 2005 AN - OPUS4-7293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Schmidt, M. T1 - Messung der Hydrophilie von mikroskopischen Bereichen an mikrofluidischen Bauteilen T2 - Status Seminar: Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen (DFG-SPP 1159) CY - Freiburg, Germany DA - 2005-02-28 PY - 2005 AN - OPUS4-7136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface and Micro/Nano Analysis Activities at the Federal Institute for Materials Research and Testing (BAM) T2 - Seminar: MolecularSciences Laboratory, Interfacial and Nano Science Facility, Pacific North West National Laboratory CY - Richland, WA, USA DA - 2005-04-07 PY - 2005 AN - OPUS4-7358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Procop, Mathias T1 - Pilot study on standard-free quantification in EPMA: Status report 2005 T2 - Meeting of the Surface Analytical Working Group @ CCQM CY - Sèvres, France DA - 2005-04-13 PY - 2005 AN - OPUS4-7359 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Westermann, J. A1 - Roll, U. A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Development and Characterisation of Reference Materials for Nanotechnology: High Lateral Resolution Auger Electron Spectroscopy on Semiconductor Heterostructures T2 - 23rd European Conference on Surface Science ECOSS 23 CY - Berlin, Germany DA - 2005-09-04 PY - 2005 AN - OPUS4-10833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas T1 - (Pulsed) R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Chemical Characterization by XAS, XPS and ToF-SIMS T2 - Seminar: Dept. of Engineering Physics, Ecole Polytechnique CY - Montreal, Canada DA - 2005-08-15 PY - 2005 AN - OPUS4-10821 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - A new nanoscaled strip-pattern for the determination of lateral resolution in surface analysis T2 - 11th European Conference on Applications of Surface and Interface Analysis ECASIA`05 CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-10861 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas T1 - The lateral resolution of ToF-SIMS analysed by means of an advanced nanoscale strip-pattern T2 - 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) CY - Manchester, England DA - 2005-09-12 PY - 2005 AN - OPUS4-10872 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Matsubayashi, N. T1 - R.F. Plasma-polymerized Polymer Films: Comprehensive Surface and in Depth Chemical Characterization by XAS, XPS and ToF-SIMS T2 - 11th Eurpean Conference on Applications of Surface and Interface Analysis, ECASIA`05 CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-11283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias T1 - New Work Item (Technical Report): Surface chemical analysis - General procedures - Guide for the determination of lateral resolution of imaging instruments in the nanometre range T2 - ISO/TC201 14th Plenary and SC Meetings, Hotel Budapest CY - Budapest, Hungary DA - 2005-09-22 PY - 2005 AN - OPUS4-11219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Friedrich, Jörg F. T1 - TOF-SIMS analysis of plasma chemically deposited co-polymer films T2 - 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) CY - Manchester, England DA - 2005-09-12 PY - 2005 AN - OPUS4-11279 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - Project A8: New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range T2 - VAMAS TWA 2 Meeting CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-11218 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas T1 - Project A8: New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range T2 - VAMAS Technical Working Area 2 on Surface Chemical Analysis, Meeting of National Representatives, Project Leaders and Observers CY - Morgan Hill, CA, USA DA - 2006-11-12 PY - 2006 AN - OPUS4-14223 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Meyer-Plath, Asmus A1 - Lippitz, Andreas A1 - Swaraj, Sufal A1 - Oran, Umut T1 - Surface chemical characterization of plasma-polymerized organic films: State-of-the-art and shortcomings T2 - 10th International Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2006-09-10 PY - 2006 AN - OPUS4-13062 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range (VAMAS Projekt A8) T2 - VAMAS TWA 2 "Surface Chemical Analysis" Meeting 2007 CY - Brussels, Belgium DA - 2007-09-09 PY - 2007 AN - OPUS4-15879 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Results of a german survey on topics of interest in surface chemical analysis of organic surfaces in 2006: topics and priorities T2 - ISO/TC201 15th Plenary and SC Meetings (Morgan Hill Meeting) CY - Morgan Hill, CA, USA DA - 2006-11-09 PY - 2006 AN - OPUS4-14232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: certified reference materials and R&D on plasma polymerization of organics T2 - Seminar, National ESCA and Surface Analysis Center for Biomedical Problems (NESCA/BIO), University of Washington CY - Seattle, WA, USA DA - 2006-06-29 PY - 2006 AN - OPUS4-12506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Jagst, Eda A1 - Lippitz, Andreas A1 - Treu, Dieter T1 - Amino group determination on 4,4'-Methylenebis(2,6-diethylaniline) film surfaces by XPS and NEXAFS applying derivatization reactions T2 - ECASIA'07 CY - Brussels, Belgium DA - 2007-09-10 PY - 2007 AN - OPUS4-15843 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - CRG Evaluation of the Bending Magnet Beamline HE-SGM: Future scientific program T2 - CRG Evaluation of the BM Beamline HE-SGM CY - Berlin, Germany DA - 2007-03-20 PY - 2007 AN - OPUS4-14649 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias T1 - Neuartig räumlich strukturierte Testproben für die Bestimmung der Abbildungsqualität und die Kalibrierung der Längenskala in der Rastersondenmikroskopie T2 - 2. Statuskolloquium des DFG SPP 1159 "Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen" CY - Jena, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12451 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Unger, Wolfgang A1 - Schmidt, M. T1 - Measurement of the hydrophilic character of microscopic areas at microfluide components T2 - 2. Statuskolloquium des DFG SPP 1159 "Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen" CY - Jena, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12431 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Lippitz, Andreas T1 - Ageing studies of plasma deposited organic films by surface chemical analysis (ESCA, ToF-SIMS, XAS) T2 - International Conference on Processing & Manufacturing of Advanced Materials CY - Vancouver, Canada DA - 2006-07-04 PY - 2006 AN - OPUS4-12251 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: Development of certified reference materials and surface characterisation of plasma polymerized thin films T2 - Seminar im Lab. of Physical-Chemistry of Surfaces (CNRS-ENSCP), Ecole Nationale Superieure de Chemie de Paris CY - Paris, France DA - 2006-04-04 PY - 2006 AN - OPUS4-12286 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Controlled deposition from the gaseous phase: application of micro-surface analysis T2 - Marie Curie Actions: MINDE Micro and Nano Deposition (Course) European Academy of Surface Technology (EAST) CY - Schwäbisch Gmünd, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Determination of modulation transfer function by imaging of square-wave gratings with different periods in the nanometre range T2 - NanoScale 2006 CY - Bern, Switzerland DA - 2006-04-24 PY - 2006 AN - OPUS4-12287 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Friedrich, Jörg F. A1 - Mix, Renate T1 - Charakterisierung von Plasmapolymeren: "Viel hilft viel!" T2 - AK Plasma, Frühjahrstreffen 2006 CY - Berlin, Germany DA - 2006-05-30 PY - 2006 AN - OPUS4-12497 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - CCQM surface analysis working group (SAWG): introduction for WG meeting 2006 & summary 2006 and next steps T2 - CCQM Surface Analysis Working Group Meeting 2006 CY - Sèvres, France DA - 2006-04-05 PY - 2006 AN - OPUS4-12289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Analysis Working Group (SAWG) Report for 2005/06 T2 - CCQM Plenary Meeting 2006, BIPM CY - Sèvres, France DA - 2006-04-06 PY - 2006 AN - OPUS4-12285 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias A1 - Unger, Wolfgang T1 - Standard-free quantification in EPMA T2 - CCQM Surface Analysis Working Group Meeting 2006 CY - Sèvres, France DA - 2006-04-05 PY - 2006 AN - OPUS4-12306 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Girard-Lauriault, P.-L. A1 - Truica-Marasescu, F. A1 - Lerouge, S. A1 - Mwale, F. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Desjardins, P. A1 - Wertheimer, M. R. T1 - Nitrogen-rich plasma polymers ("PPE:N") for biomedical applications: comparison of films deposited in atmospheric- and low-pressure plasmas T2 - International Symposium on Polymeric Materials for Regenerative Medicine - PMRM 2007 CY - Montreal, Canada DA - 2007-04-02 PY - 2007 AN - OPUS4-14614 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Wertheimer, M. R. A1 - Girard-Lauriault, P.-L. A1 - Truica-Marasescu, F. A1 - Lerouge, S. A1 - Mwale, F. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Desjardins, P. T1 - Nitrogen-rich Plasma Polymers ("PPE:N") for Bio-medical Applications in Orthopaedic and Vascular Therapies T2 - International Conference on Plasma Medicine (ICPM) - I CY - Corpus Christi, TX, USA DA - 2007-10-15 PY - 2007 AN - OPUS4-15697 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan T1 - BAM Reference materials for surface and nano analysis: status and projects T2 - 4th International Symposium on Practical Surface Analysis (PSA-07) and 6th Korea-Japan International Symposium on Surface Analysis CY - Kanazawa, Japan DA - 2007-11-25 PY - 2007 AN - OPUS4-16384 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Baytekin, H. Tarik A1 - Schmidt, M. T1 - Investigation of wettability of surface modified polymer wafers used in micro fluidic device fabrication T2 - 4th International Symposium on Practical Surface Analysis (PSA-07) and 6th Korea-Japan International Symposium on Surface Analysis CY - Kanazawa, Japan DA - 2007-11-25 PY - 2007 AN - OPUS4-16381 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Die AG Schicht- und Oberflächenanalytik der BAM: Methodische Mögllichkeiten und ausgewählte Forschungsergebnisse T2 - Workshop Electronic materials and processes for organic FETs BASF Polymer Physics, Rheology and Materials Properties CY - Ludwigshafen am Rhein, Germany DA - 2007-10-31 PY - 2007 AN - OPUS4-16167 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Graf, Nora A1 - Dietrich, Paul A1 - Weigel, W. A1 - Lippitz, Andreas A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Surface analytical measurements (XPS, ToF-SIMS, NEXAFS) of organosilane functionalized substrates to be used as microarray platforms T2 - 11th Status Seminar "Chip Technologies" (Dechema) CY - Frankfurt am Main, Germany DA - 2009-03-05 PY - 2009 AN - OPUS4-19028 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Moritz, W. A1 - Tausche, A. A1 - Cherkaschinin, G. A1 - Molajew, R. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Linke, S. T1 - Catalytic Properties of Ternary Alloys Continuous Gradient - High Throughput Screening Macroscope - CG-HTSM T2 - 216th Electrochemical Society (ECS) Meeting CY - Vienna, Austria DA - 2009-10-04 PY - 2009 AN - OPUS4-19528 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nietzold, Carolin A1 - Dietrich, Paul A1 - Holzweber, Markus A1 - Lippitz, Andreas A1 - Panne, Ulrich A1 - Unger, Wolfgang A1 - Ivanov-Pankov, S. A1 - Weigel, W. T1 - XPS studies of epoxy surfaces used for potential carbohydrate reference arrays T2 - JCF spring, symposium CY - Jena, Germany DA - 2014-03-26 PY - 2014 AN - OPUS4-30589 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Wasserroth, S. A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Gorgoi, M. A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Chemical Depth Profiles of Ternary Pd Alloys by HAXPES and First Spectra Simulations T2 - 76. Jahrestagung der DPG und DPG-Frühjahrstagung, DS 18: Thins film characterization: structure analysis and composition (Spectroscopy) CY - Berlin, Germany DA - 2012-03-25 PY - 2012 AN - OPUS4-25691 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Girard-Lauriault, P.-L. A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Min, H. A1 - Wirth, Thomas A1 - Castelli, R. A1 - Seeberger, P. H. A1 - Unger, Wolfgang T1 - Carbohydrate-functionalized surfaces: Analysis by a multi-method approach T2 - 6. Senftenberger Innovationsforum: Multiparameteranalytik mit zellulären Assays CY - Senftenberg, Germany DA - 2012-03-16 PY - 2012 AN - OPUS4-25683 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - How successful is surface chemical analysis in the characterization of (model) diagnostic devices exploiting probe-target interaction? T2 - 65th IUVSTA Workshop "Measuring molecular adsorption at the solid liquid interface" CY - Peckforton, England DA - 2012-05-14 PY - 2012 AN - OPUS4-25968 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Wasserroth, S. A1 - Wirth, Thomas A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - A comprehensive Auger electron spectroscopy study on a PdxNiyCo1-x-y-/LaF3/SiO2/Si multi-layer system for H2 detection T2 - 2. Berliner Chemie Symposium CY - Berlin, Germany DA - 2012-04-03 PY - 2012 AN - OPUS4-25687 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Funk, Ch. A1 - Gross, Thomas A1 - Weigel, W. A1 - Unger, Wolfgang T1 - Epoxy-functionalized Surfaces: Surface chemical analysis and fluorescence labeling of surface species T2 - 6. Senftenberger Innovationsforum: Multiparameteranalytik mit zellulären Assays CY - Senftenberg, Germany DA - 2012-03-16 PY - 2012 AN - OPUS4-25684 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Wasserroth, S. A1 - Wirth, Thomas A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Hight-throughtput surface analysis of catalyst libraries based on ternary Pd thin film alloys T2 - PHI European Users Meeting 2012 CY - Eibelstadt, Germany DA - 2012-04-18 PY - 2012 AN - OPUS4-25869 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Analytik an Microarrays mittels physikalischer Methoden der chemischen Oberflächenanalytik T2 - Workshop "Funktionalisierung von Oberflächen für bioananlytische Anwendungen" CY - Berlin, Germany DA - 2012-07-24 PY - 2012 AN - OPUS4-26185 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology in Surface and Micro/Nano Analysis T2 - CCQM Plenary Meeting 2012 CY - Paris, France DA - 2012-04-19 PY - 2012 AN - OPUS4-25967 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Neukammer, J. A1 - Kummrow, A. A1 - Foy, C. A1 - Huggett, J. A1 - Parkes, H. A1 - Zel, J. A1 - Milavec, M. A1 - Simonet, J. A1 - Schimmel, H. A1 - Grunert, H.-P. A1 - Zeichhardt, H. A1 - Akgöz, M. A1 - Honeyborne, I. A1 - McHugh, T. T1 - Metrology for Monitoring Infectious Diseases, Antimicrobial Resistance, and Harmful Micro-Organisms T2 - 30th IFBLS World Congress (International Federation of Biomedical Laboratory Science) CY - Berlin, Germany DA - 2012-08-18 PY - 2012 AN - OPUS4-26555 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Jörg F. T1 - Multiscale simulation of localization phenomena using XFEM² T2 - ECCOMAS 2012 CY - Vienna, Austria DA - 2012-09-10 PY - 2012 AN - OPUS4-26532 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzweber, Markus A1 - Unger, Wolfgang A1 - Hutter, H. T1 - Sputtering of Liquid Surfaces -Emission of Molecular Secondary Ions from Ionic Liquids N2 - Static secondary ion mass spectrometry (SIMS) has become a major analytical technique for the analysis of solid surfaces. In the last years it has also been used for the analysis of liquid/frozen surfaces from ionic liquids1-5. However, the mechanism for the emission of secondary ions has not been investigated so far, especially for the state of the art liquid metal ion guns (LMIG), such as the Bi or the BiMn LMIGs. These sources are not only able to provide monoatomic primary ions, but also singly and doubly charged polyatomic primary ion cluster. This new development has led to the investigation of the primary ion particle to specific parameters in order to determine the capabilities of such LMIGs on different target samples. To further the principle understanding of secondary ion emission, a systematic study using Bi1-7+ and Bi1,3,5,7++ primary ions on ionic liquids with considerably different strength of inter-ionic interactions was performed. As model samples the ionic liquids 1-butyl-3-methylimidazolium acetate and 1-butyl-3-methylimidazolium hexafluorophosphate ([C4C1im][Ac] and [C4C1im][PF6]) were used. To compare spectra or the performance of primary ion particles on substances or substance classes, the SIMS data were evaluated by calculating secondary ion yields, static SIMS limit, disappearing cross section, ion formation efficiency and fragmentation. T2 - SIMS Europe CY - Münster, Germany DA - 2012-09-09 PY - 2012 AN - OPUS4-27165 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa A1 - Procop, M. T1 - Test Materials and Procedures for the day-by-day Performance Check of X-Ray Spectrometers attached to a SEM in Compliance with ISO 15632 T2 - 17. Arbeitstagung "Angewandte Oberflächenanalytik" AOFA CY - Soest, Germany DA - 2012-09-24 PY - 2012 AN - OPUS4-27149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Girard-Lauriault, P.-L. A1 - Unger, Wolfgang A1 - Dietrich, Paul A1 - Gross, Thomas T1 - Is Quantitative CD-XPS of Plasma Deposited Organic Coatings a Valid Analytical Procedure? T2 - 13th International Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2012-09-10 PY - 2012 AN - OPUS4-27144 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzweber, Markus A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Kollmer, F. T1 - BAM-L200: Anew type of refrence material for the determination of lateral resolution and the calibration of length scale T2 - Fachtagung Nano-Additive CY - Berlin, Germany DA - 2012-11-19 PY - 2012 AN - OPUS4-27182 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Tobias A1 - Hecht, Mandy A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Rurack, Knut T1 - Development of a dual XPS and Fluorescence Label for the Analysis of Surface Amino Groups T2 - ThGOT, 8. Thementage Grenz und Oberflächentechnik CY - Leipzig, Germany DA - 2012-09-04 PY - 2012 AN - OPUS4-26850 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Optimierung von Microarrays durch Anwendung physikalischer Methoden der chemischen Oberflächenanalytik T2 - Arbeitstreffen "Quantitative Analytik von (Protein-)Microarrays" CY - Potsdam, Germany DA - 2012-10-04 PY - 2012 AN - OPUS4-27145 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Referenzmaterialien für die Oberflächen- und Mikrobereichsanalytik: Stand und zukünftige Entwicklungen T2 - Festkolloquium 100 Jahre Referenzmaterialien der BAM 1912 - 2012 CY - Berlin, Germany DA - 2012-11-15 PY - 2012 AN - OPUS4-27141 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Zum Stand von Normung in der Oberflächenanalytik T2 - 17. Arbeitstreffen "Angewandte Oberflächenanalytik" AOFA CY - Soest, Germany DA - 2012-09-24 PY - 2012 AN - OPUS4-27150 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - X-ray Photoelectron Spectroscopy (XPS) T2 - Workshop: Instrumentierung für das Avogadro-Projekt CY - Berlin, Germany DA - 2012-08-03 PY - 2012 AN - OPUS4-27142 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Gorgoi, M. A1 - Nörthemann, K. A1 - Moritz, W. T1 - Composition and Chemistry of Pd-Ni-Co thin film alloy studied by HAXPES T2 - DPG-Frühjahrstagung der Sektion Kondensierte Materie (SKM), DS 30: Thin Film Characterization: Structure Analysis and Composition II CY - Regensburg, Germany DA - 2013-03-10 PY - 2013 AN - OPUS4-28043 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -