TY - CONF A1 - Kindrachuk, Vitaliy A1 - Unger, Jörg F. T1 - A Multi-scale temporal integration scheme for viscoplatic solids subjected to fatigue deterioration N2 - Using a continuum mechanics framework for lifetime prediction requires numerical integration of evolving damage until the onset of failure. The primary challenge for the simulation of structural fatigue failure is caused by the enormous computational costs due to cycle by cycle temporal integration throughout the whole loading history, which is in the order of 10^3 - 10^7 cycles. As a consequence, most approaches circumvent this problem and use an empirical method such as Wöhler curves. They are well suited for approximation of the lifetime, but they are not capable to capture a realistic degradation of the material with a redistribution of the stresses. The main objective of the paper is to provide a technique for the long time response of a finite element (FE) model while reducing computational costs. A multi-scale temporal integration scheme is proposed, which adapts the conventional FE method for realistic modeling of deterioration in a structure subjected to cyclic loading. For a particular case of two-scale temporal homogenization, the displacement field is assumed to satisfy scale separation: a short time scale arises from the oscillatory loading and a long time scale is due to the slow response relating to yielding and damage evolution. The original boundary value Problem (BVP) is approximated by the time-Independent BVPs on the short time scale. Alternation of the displacement field on the long time scale is correlated with the damage evolution by means of the adaptive cycle jump method. The significant acceleration of FE simulations is demonstrated for a constitutive damage model where the progressive damage accumulation under fatigue loading is driven by viscoplastic deformation. T2 - ECCOMAS 2016 CY - Crete, Greece DA - June 5th KW - Fatigue PY - 2016 AN - OPUS4-38654 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Röhsler, Andreas A1 - Sobol, Oded A1 - Nolze, Gert A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Analysis of deuterium in austenitic stainless steel AISI 304L by Time-of-Flight Secondary Ion Mass Spectrometry N2 - Due to their excellent combination of ductility, strength and corrosive resistance, austenitic stainless steels (ASS) are widely used in many industrial applications. Thus, these steel grades can be found as structural components in the (petro-)chemical industry, in offshore applications and more recent for storage and transport of hydrogen fuel. Steels employed for these applications are exposed to aggressive environments and hydrogen containing media. The ingress and accumulation of hydrogen into the microstructure is commonly observed during service leading to a phenomenon called “hydrogen embrittlement”. A loss in ductility and strength, the formation of cracks and phase transformations are typical features of this hydrogen-induced degradation of mechanical properties. Although, great efforts are made to understanding hydrogen embrittlement, there is an ongoing debate of the underlying mechanisms. This knowledge is crucial for the safe use and durability of components on the one side and the development of new materials on the other. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was proven to be a powerful tool for depicting the distribution of the hydrogen isotope deuterium in the microstructure of austenitic and duplex steels. The combination with imaging techniques such as electron backscatter diffraction (EBSD) and scanning electron microscopy (SEM), delivering structural and morphological information, creates a comprehensive picture of the hydrogen/deuterium-induced effects in the materials. All the gathered data is treated with principal component analysis (PCA) and data fusion to enhance the depth of information. The mobility of hydrogen and deuterium in a steel microstructure is affected by external mechanical stress. To investigate the behaviour of deuterium in a strained microstructure, a new in situ experimental approach was developed. This gives the possibility of analysing samples in the SIMS instrument simultaneously to four-point-bending-tests. Specimens made from ASS AISI 304L were electrochemically charged with deuterium instead of hydrogen. This necessity stems from the difficulty to separate between artificially charged hydrogen and hydrogen existing in the pristine material or adsorbed from the rest gas in the analysis chamber. Nonetheless, similar diffusion, permeation and solubility data allow to draw qualitative conclusions from the experiments, which are relevant for the application addressed. T2 - SIMS Europe 2018 CY - Münster, Germany DA - 16.09.2018 KW - Hydrogen KW - Deuterium KW - Austenitic stainless steel KW - SIMS PY - 2018 AN - OPUS4-46029 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Jörg F. A1 - Kindrachuk, Vitaliy A1 - Titscher, Thomas A1 - Hirthammer, Volker T1 - A continuum damage model for the simulation of concrete under cyclic loading N2 - Lifetime aspects including fatigue failure of concrete structures were traditionally only of minor importance. Because of the growing interest in maxing out the capacities of concrete, its fatigue failure under compression has become an issue. A variety of interacting phenomena such as e.g. loss of prestress, degradation due to chemical reactions or creep and shrinkage influence the fatigue resistance. Failure due to cyclic loads is generally not instantaneous, but characterized by a steady damage accumulation. Therefore, a reliable numerical model to predict the performance of concrete over its lifetime is required, which accurately captures order effects and full three-dimensional stress states. Many constitutive models for concrete are currently available, which are applicable for specific loading regimes, different time scales and different resolution scales. However, a key limitation of those models is that they generally do not address issues related to fatigue on a structural level. Very few models can be found in the literature that reproduce deterioration of concrete under repeated loading-unloading cycles. This is due to the computational effort necessary to explicitly resolve every cycle which exceeds the currently available computational resources. The limitation can only be overcome by the application of multiscale methods in time. The objective of the paper is the development of numerical methods for the simulation of concrete under fatigue loading using temporal multiscale methods. First, a continuum damage model for concrete is developed with a focus on fatigue under compressive stresses. This includes the possibility to model stress redistributions and capture size effects. In contrast to cycle based approaches, where damage is accumulated based on the number of full stress cycles, a strain based approach is developed that can capture cyclic degradation under variable loading cycles including different amplitudes and loading frequencies. The model is designed to represent failure under static loading as a particular case of fatigue failure after a single loading cycle. As a consequence, most of the material parameters can be deduced from static tests. Only a limit set of additional constitutive parameters is required to accurately describe the evolution under fatigue loading. Another advantage of the proposed model is the possibility to directly incorporate other multi-physics effects such as creep and shrinkage or thermal loading on the constitutive level. Second, a multiscale approach in time is presented to enable structural computations of fatigue failure with a reduced computational effort. The damage rate within the short time scale corresponding to a single cycle is computed based on a Fourier based approach. This evolution equation is then solved on the long time scale using different implicit and explicit time integration schemes. Their performance and some limitations for specific loading regimes is discussed. Finally, the developed methods will be validated and compared to experimental data. T2 - Conference on Computational Modelling of concrete and concrete structures (EURO_C 2018') CY - Bad Hofgastein, Austria DA - 26.02.2018 KW - Fatigue KW - Concrete KW - Damage PY - 2018 AN - OPUS4-48001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Madkour, Sherif A1 - Lippitz, Andreas A1 - Schönhals, Andreas A1 - Unger, Wolfgang T1 - Anomalous surface composition in thin films of a poly(vinyl methyl ether) / polystyrene blend N2 - Highly surface-sensitive X-ray photoelectron spectroscopy at HE-SGM beamline revealed in the outermost region (< 2nm) of thin films (15 -65 nm) of PVME/PS blends a relative high amount of PS, whereas in slightly deeper regions PVME was enriched. Such enrichment of PVME in the whole near-surface region was proposed in former investigations based on conventional XPS studies. T2 - Bessy User Meeting 2017 CY - Berlin, Germany DA - 13.12.2017 KW - Energy resolved XPS KW - Depth profiling KW - Thin films KW - Polymer blends PY - 2017 AN - OPUS4-43443 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heinrich, Thomas A1 - Schneider, Markus A1 - Schäpe, Kaija A1 - Unger, Wolfgang A1 - Stockmann, Jörg M. T1 - Classification of engineered Titania nanomaterials via surface analysis using principal component analysis (PCA) assisted Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) N2 - Due to the growing number of engineered nanomaterials (NM) the need for a reliable risk assessment for these materials is today bigger than ever before. Especially the nanomaterial’s surface or shell directly interacts with its environment and therefore is a crucial factor for NM’ toxicity or functionality. Especially, titania is one of the NM with the greatest technological importance. It is used for a large number of applications and can be found in food, cosmetics, glasses, mirrors, paints to mention only a few. In 2012, experts estimate[d] the annual European nano-titania production or utilization at an amount of more than 10,000 t. Great progress has been achieved in the area of NM investigation and characterization during the past decade. A variety of publications provide information about technological innovation as well as hazard potential, which means the potential risk on human health and ecosystems. However, enhanced data harmonization and well-defined standards for nanomaterial analysis, could significantly improve the reliability of such studies which often suffers from varying methods, parameters and sample preparations. To develop a suitable approach for the NM’s risk assessment, the ACEnano project aims at establishing a toolbox of verified methods. The size of this well-structured European project allows to handle even those big challenges like data harmonization and standardization. Due to its powerful combination of superior surface sensitivity and lateral resolution down to the Nano regime, ToF-SIMS could become one of these toolbox methods. Supported by multivariate data analysis such as principal component analysis (PCA), the method can be used for sub-classification of nanomaterial families using slight differences in surface chemistry. Here, we show a PCA supported classification of titania nanoparticles from various sources (NIST, JRC, BAM) with ToF-SIMS. Parameters like size, shell, pre-preparation and crystal system cause variance in the data and allow us to distinguish the species from each other. Moreover, this variance in the data also occurs and can be used for investigation when we compare our measurements of particle ensembles with those of grown titania films. The carefully selected and refined peaks allow a reasonable particle categorization and further a reliable allocation of blank feeds, which introduces a promising approach for NM characterization in the context of NM risk assessment. T2 - SIMS-Europe CY - Münster, Germany DA - 16.09.2018 KW - Nanoparticles KW - ToF-SIMS KW - XPS KW - PCA KW - Titania PY - 2018 AN - OPUS4-46250 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sobol, Oded A1 - Straub, Franka A1 - Nolze, Gert A1 - Wirth, Thomas A1 - Boellinghaus, Thomas A1 - Unger, Wolfgang T1 - Observations of the deuterium distribution and the structural changes in standard and lean duplex stainless steels by ToF-SIMS and EBSD N2 - The use of duplex stainless steels (DSS) in energy related applications is well known. Nowadays, DSSs become more favorable than austenitic steels due to the outstanding mechanical properties, the good corrosion resistance and the lower nickel content.However, the use of the duplex grade in acidic environments such as seawater can lead to a severe degradation in the structural integrity of the steel by hydrogen-induced/assisted cracking mechanisms, which can eventually result in premature failure. Hydrogen assisted degradation and cracking of steels remains unclear even though this topic is intensively studied for more than a century. The main gap lies in the validation of the proposed theoretical models at the sub-micron scale. Industrial and the research communities define a need for an accurate method by which it is possible to image the distribution of hydrogen in the microstructure. Among the very few available methods nowadays, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) provides precise mapping of hydrogen in the microstructure. Moreover, the powerful combination of ToF-SIMS with multivariate data analysis (MVA), electron backscattered diffraction (EBSD) for providing a the structural information and the use of data fusion techniques can contribute to a better understanding of the hydrogen induced degradation processes in the material. In the present work two types of duplex grades were chosen as a case study (standard and lean DSS). The duplex class, consist of equivalent amounts of ferrite and austenite, was investigated by ToF-SIMS and EBSD during and after electrochemical deuterium charging in order to simulate the service of a component in acidic environments. Deuterium is known to act on the steel similarly to hydrogen and therefore was used as a tracer for hydrogen. The results show that the ferrite was affected almost identical in both steels whereas in the austenitic phase significant differences were observed in the lean duplex in comparison to the standard duplex. The advantage of the combined techniques is reflected by the ability to correlate the hydrogen distribution in the microstructure to the resulted structural changes. T2 - 21st International Conference on Secondary Ion Mass Spectrometry - SIMS21 CY - Krakow, Poland DA - 10.09.2017 KW - ToF-SIMS KW - Duplex-steel KW - EBSD KW - Data-fusion PY - 2017 UR - http://sims.confer.uj.edu.pl/boa_oral.php?id=23 AN - OPUS4-42864 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kjaervik, Marit A1 - Dietrich, P. A1 - Thissen, A. A1 - Schwibbert, Karin A1 - Unger, Wolfgang T1 - Depth-dependent analysis of model biofilms by combining laboratory- and synchrotron-based X-ray photoelectron spectroscopy N2 - Synchrotron XPS in the soft-X-ray regime is suitable for the detection of light elements commonly found in biological samples. Various model systems of biofilms have been developed and characterised at synchrotron- and lab-based facilities. By obtaining the chemical composition at various information depths, the vertical distribution of iodine in an artificial biofilm have been determined. T2 - Tenth Joint BER II and BESSY II User Meeting CY - Berlin, Germany DA - 05.12.2018 KW - Biofilms KW - HAXPES KW - XPS KW - Iodine KW - Synchrotron-XPS PY - 2018 AN - OPUS4-46929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Reiners, Georg T1 - Ringversuche in der Nanoanalytik T2 - NanoDE - Innovation durch Nanotechnologie CY - Bonn, Germany DA - 2002-05-06 PY - 2002 AN - OPUS4-1735 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profiling of electrically non-conductive layered samples by RF-GDOES, HFM plasma SNMS and ToF-SIMS T2 - AOFA 11 (Angewandte Oberflächenanalytik) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 SP - 1 Seite AN - OPUS4-982 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Unger, Wolfgang T1 - Analytik neuer Kohlenstoffmaterialien - DLS Filme T2 - Abschlusskolloquium zum Ma Tech-Projekt 03N8627C, IWS Dresden CY - Dresden, Germany DA - 2003-02-12 PY - 2003 AN - OPUS4-4372 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Treu, Dieter A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Schulz, H. T1 - Analysis of carbon materials and plasma polymers by x-ray photoelectron spectroscopy and x-ray absorption spectroscopy (XPS, XAS) T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4373 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Paatsch, Wolfgang A1 - Kaiander, I. A1 - Sellin, R. T1 - A new type of certified reference material for the analysis of surface structures in the nanometre range T2 - Eurointerfinish 2003 - Nanotechnology and coatings for novel applications CY - Praglia, Italy DA - 2003-10-23 PY - 2003 AN - OPUS4-4383 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Kühn, Gerhard A1 - Mix, Renate A1 - Koprinarov, Ivaylo T1 - Vergleich plasmaschemische Methoden zur Funktionalisierung von Polymeroberflächen T2 - X. Erfahrungsaustausch zu "Oberflächentechnologie mit Plasmaprozessen" CY - Klingenthal, Germany DA - 2003-03-18 PY - 2003 AN - OPUS4-4203 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray photoelectroscopy and X-ray absorption spectroscopy in interface analysis of metallized polymers T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Charakterisierung von Siliziumoxidschichten auf Silizium mit ESCA: Ein Beitrag zur Präszisionsbestimmung der Avogadro-Konstanten T2 - EMASS 2000 CY - Berlin, Germany DA - 2000-11-10 PY - 2000 AN - OPUS4-3446 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - A reference material for calibration and testing of instruments with nanometric lateral resolution T2 - SIMS Europe 2002 CY - Münster, Germany DA - 2002-09-15 PY - 2002 AN - OPUS4-3225 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas T1 - XPS/ESCA: Ringversuchserebnisse T2 - Seminar Oberflächenanalytik: Technische Aspekte der Akkreditierung nach ISO/IEC 17025, SOFA' 03 CY - Berlin, Germany DA - 2003-01-24 PY - 2003 AN - OPUS4-4395 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - Practical Surface Analysis PSA-04 & 5th Korea-Japan International Symposium on Surface Analysis - KJISSA CY - Jeju, South Korea DA - 2004-10-04 PY - 2004 AN - OPUS4-4598 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Retzko, Iris A1 - Schulze, Rolf-Dieter A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive depth profilino and semiquantitative determination of unsaturated carbon species in pulse plasma deposited organic films T2 - ECASIA `03 CY - Berlin, Germany DA - 2003-10-06 PY - 2003 AN - OPUS4-4672 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films prepared from Organic Molecules: Characterization by Surface Analytical Tools T2 - KRISS Meeting - NanoSurface Group CY - Daejeon, South Korea DA - 2004-10-11 PY - 2004 AN - OPUS4-4600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Unveren, E. T1 - A comparison study between Time-of-Flight Static Secondary lon Mass Spectrometry (TOF-SSIMS) and X-Ray Photoelectron Spectroscopy (XPS) in terms of Poly-dimethyl-siloxane (PDMS) contemination of Polystyrene (PS) samples T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5024 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Retzko, Iris A1 - Treu, Dieter A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destruktive depth profiling and semi-quantitative determination of unsaturated carbon species in pulse plasma deposited organic films T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5043 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absoption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3. BAMline Seminar, BESSY CY - Berlin, Germany DA - 2004-11-29 PY - 2004 AN - OPUS4-5018 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Koprinarov, Ivaylo A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Chromium-evaporated Polymers and Organic Films Investigated by X-ray Absorption Spectroscopy (XAS) and X-ray Photoelectron Spectroscopy (XPS) T2 - IPCM´99: 6th conference on interfacial phenomena in composite materials CY - Berlin, Germany DA - 1999-09-08 PY - 1999 AN - OPUS4-6076 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - EMASS1999 CY - Neuhausen am Rheinfall, Switzerland DA - 1999-10-25 PY - 1999 AN - OPUS4-6052 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Brita A1 - Jancke, Harald A1 - Müller, Bernd R. A1 - Müller, Ralf A1 - Unger, Wolfgang A1 - Reinsch, Stefan A1 - Nofz, Marianne T1 - Strukturbildungsprozesse in Solen und Gelen T2 - XXV. Tagung des Arbeitskreises "Nichtkristalline und partiellkristalline Strukturen" der Deutschen Gesellschaft für Kristallographie CY - Wolfersdorf, Germany DA - 2004-09-27 PY - 2004 AN - OPUS4-5619 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Tailor-made functionalized polymer coatings generated by pulsed r. f. plasma T2 - 6th International Conference on Adhesion and Surface Analysis CY - Loughborough, England DA - 2000-04-18 PY - 2000 AN - OPUS4-6092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - FDS/NEMA Workshop und Präsentation: Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie CY - Bergisch Gladbach, Germany DA - 2000-05-11 PY - 2000 AN - OPUS4-6093 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Hutton, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - ESCA of activated powder Cr2O3 catalysts T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5045 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E.B.M. A1 - Unger, Wolfgang A1 - Wetzig, K. T1 - Emission spectrum of copper in an argon glow discharge containing hydrogen T2 - ECASIA´99 CY - Seville, Spain DA - 1999-10-04 PY - 1999 AN - OPUS4-6080 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Böse, Olaf A1 - Lippitz, Andreas A1 - Fritz, Thomas A1 - Gelius, U. T1 - VAMA TMA2 Project A2, Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples: Report on an inter-laboratory comparison T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik (AOFA 11) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6116 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy and X-ray Absorption Spectroscopy in Interface Analysis of Metallized Polymers T2 - Materials Week 2000 CY - Munich, Germany DA - 2000-09-28 PY - 2000 AN - OPUS4-6117 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Retzko, Iris A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Ein neues Polymerisationsverfahren T2 - Berliner Polymertage 2000 (Humboldt Universität zu Berlin) CY - Berlin, Germany DA - 2000-10-11 PY - 2000 AN - OPUS4-6119 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Koprinarov, Ivaylo A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Chromium-evaporated Polymers and Organic Films Investigated by X-ray Absorption Spectroscopy (XAS) and X-ray Photoelectron Spectroscopy (XPS) T2 - BESSY Nutzertreffen CY - Berlin, Germany DA - 1999-12-09 PY - 1999 AN - OPUS4-6131 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - FDS/NEMA Workshop und Präsentation: Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie CY - Chemnitz, Germany DA - 2000-07-08 PY - 2000 AN - OPUS4-6094 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Assessment of SIMS as an analytical tool in nanotechnology T2 - SIMS Europe 2000 CY - Münster, Germany DA - 2000-09-18 PY - 2000 AN - OPUS4-6114 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profile measurements of electrically non-conductive layered samples by RF-GDOES, HFM plasma SNMS and TOF-SIMS T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11 CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, B. A1 - Schiel, D. A1 - Danzebrink, H. A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Müller, J.-P. T1 - Physical and Chemical Characterization of thermal and native Siliconoxide layers on Silicon T2 - Symposium "Reference Materials for Technologies in the New Millenium" CY - Berlin, Germany DA - 2000-05-22 PY - 2000 AN - OPUS4-6136 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. A1 - Unger, Wolfgang A1 - Reiners, Georg A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Glow discharge optical emission spectrometry (GD-OES) on samples containing hydrogen T2 - European Winter Conference on Plasma Spectrochemistry CY - Lillehammer, Norway DA - 2001-02-02 PY - 2001 AN - OPUS4-6147 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Unger, Wolfgang A1 - Wetzig, K. T1 - The effect of hydrogen on analytical lines in glow discharge optical emission spectrometry T2 - 10th Biennal National Atomic Spectrometry Symposium, Sheffield University CY - Sheffield, England DA - 2000-07-17 PY - 2000 AN - OPUS4-6137 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. A1 - Unger, Wolfgang A1 - Reiners, Georg A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Glow discharge optical emission spectrometry (GD-OES) on samples containing hydrogen T2 - Kolloquium zur Einweihung des neuen Wasserstofflabors der BAM, CY - Berlin, Germany DA - 2001-10-18 PY - 2001 AN - OPUS4-6148 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - TIME-OF-FLIGHT SIMS AND XPS CHARACTERIZATION OF METAL DOPED POLYMERS T2 - 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics CY - Nara, Japan DA - 2001-11-11 PY - 2001 AN - OPUS4-6149 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Treu, Dieter A1 - Unger, Wolfgang T1 - Verfahren zur Bestimmung des Gehaltes and organischen Siliziumverbindungen auf der Oberfläche von Elastomerformteilen T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11 CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6139 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Elektronenspektroskopien in der chemischen Oberflächenanalytik T2 - DGM Fortbildungsseminar "Schicht- und Oberflächenanalytik" CY - Kaiserslautern, Germany DA - 2001-05-28 PY - 2001 AN - OPUS4-6152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methods and Applications of Surface and Thin Film Analysis - BAM Laboratory VIII.23 T2 - Colloquium at Mechanical Engineering Laboratory (MEL) CY - Tsukuba, Japan DA - 2001-03-13 PY - 2001 AN - OPUS4-6151 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3rd International Symposium on Practical Surface Analysis and 5th Korea-Japan International Symposium on Surface Analysis (PSA-04) CY - Jeju, South Korea DA - 2004-09-26 PY - 2004 AN - OPUS4-6447 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Schulze, Rolf-Dieter A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - X-ray Absorption and Photoelectron Spectroscopy on Plasma-polymerized Films Prepared from Organic Molecules (Ethylene, Allyl alcohol, Styrene) T2 - 9th Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-6449 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Brita A1 - Jancke, Harald A1 - Müller, Bernd R. A1 - Unger, Wolfgang A1 - Reinsch, Stefan A1 - Nofz, Marianne T1 - Strukturbildungsprozesse in Gelglässern T2 - XXV. Tagung des Arbeitskreises "Nichtkristalline und partiellkristalline Strukturen" der Deutschen Gesellschaft für Kristallographie CY - Wolfersdorf, Germany DA - 2004-09-27 PY - 2004 AN - OPUS4-6241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Kaiander, I. A1 - Sellin, R.L. A1 - Bimberg, D. T1 - Testing the lateral resolution in the nanometre range with a new type of certified reference material T2 - NanoScale 2004 CY - Braunschweig, Germany DA - 2004-03-25 PY - 2004 AN - OPUS4-6429 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Retzko, Iris A1 - Schulze, Rolf-Dieter A1 - Lippitz, Andreas A1 - Wirth, Thomas A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - Study of effects of plasma parameters by characterization of pulse plasma deposited organic films T2 - 22nd BESSY Users' Meeting CY - Berlin, Germany DA - 2003-12-04 PY - 2003 AN - OPUS4-6445 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Retzko, Iris A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Unsaturated carbon species at polymer surfaces: The potential of X-ray absorption spectroscopy T2 - ECASIA 2001 CY - Avignon, France DA - 2001-09-30 PY - 2001 AN - OPUS4-6165 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ramm, M. A1 - Ata, M. A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - PLASMA-POLYMERIZED C60 FILMS T2 - International Conference on Materials for Advanced Technologies CY - Singapore DA - 2001-07-01 PY - 2001 AN - OPUS4-6210 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - OH group density at polymer surfaces T2 - CCQM Surface Analysis Working Group Meeting for 2004, BIPM CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-6427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Characterization by XAS, XPS und ToF-SIMS T2 - 12. Bundesdeutsche Fachtagung Plasmatechnologie der Deutschen Gesellschaft für Plasmatechnologie CY - Braunschweig, Germany DA - 2005-03-21 PY - 2005 AN - OPUS4-7293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Schmidt, M. T1 - Messung der Hydrophilie von mikroskopischen Bereichen an mikrofluidischen Bauteilen T2 - Status Seminar: Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen (DFG-SPP 1159) CY - Freiburg, Germany DA - 2005-02-28 PY - 2005 AN - OPUS4-7136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface and Micro/Nano Analysis Activities at the Federal Institute for Materials Research and Testing (BAM) T2 - Seminar: MolecularSciences Laboratory, Interfacial and Nano Science Facility, Pacific North West National Laboratory CY - Richland, WA, USA DA - 2005-04-07 PY - 2005 AN - OPUS4-7358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Procop, Mathias T1 - Pilot study on standard-free quantification in EPMA: Status report 2005 T2 - Meeting of the Surface Analytical Working Group @ CCQM CY - Sèvres, France DA - 2005-04-13 PY - 2005 AN - OPUS4-7359 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Westermann, J. A1 - Roll, U. A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Development and Characterisation of Reference Materials for Nanotechnology: High Lateral Resolution Auger Electron Spectroscopy on Semiconductor Heterostructures T2 - 23rd European Conference on Surface Science ECOSS 23 CY - Berlin, Germany DA - 2005-09-04 PY - 2005 AN - OPUS4-10833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas T1 - (Pulsed) R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Chemical Characterization by XAS, XPS and ToF-SIMS T2 - Seminar: Dept. of Engineering Physics, Ecole Polytechnique CY - Montreal, Canada DA - 2005-08-15 PY - 2005 AN - OPUS4-10821 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - A new nanoscaled strip-pattern for the determination of lateral resolution in surface analysis T2 - 11th European Conference on Applications of Surface and Interface Analysis ECASIA`05 CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-10861 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas T1 - The lateral resolution of ToF-SIMS analysed by means of an advanced nanoscale strip-pattern T2 - 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) CY - Manchester, England DA - 2005-09-12 PY - 2005 AN - OPUS4-10872 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Matsubayashi, N. T1 - R.F. Plasma-polymerized Polymer Films: Comprehensive Surface and in Depth Chemical Characterization by XAS, XPS and ToF-SIMS T2 - 11th Eurpean Conference on Applications of Surface and Interface Analysis, ECASIA`05 CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-11283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias T1 - New Work Item (Technical Report): Surface chemical analysis - General procedures - Guide for the determination of lateral resolution of imaging instruments in the nanometre range T2 - ISO/TC201 14th Plenary and SC Meetings, Hotel Budapest CY - Budapest, Hungary DA - 2005-09-22 PY - 2005 AN - OPUS4-11219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Friedrich, Jörg F. T1 - TOF-SIMS analysis of plasma chemically deposited co-polymer films T2 - 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) CY - Manchester, England DA - 2005-09-12 PY - 2005 AN - OPUS4-11279 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - Project A8: New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range T2 - VAMAS TWA 2 Meeting CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-11218 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas T1 - Project A8: New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range T2 - VAMAS Technical Working Area 2 on Surface Chemical Analysis, Meeting of National Representatives, Project Leaders and Observers CY - Morgan Hill, CA, USA DA - 2006-11-12 PY - 2006 AN - OPUS4-14223 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Meyer-Plath, Asmus A1 - Lippitz, Andreas A1 - Swaraj, Sufal A1 - Oran, Umut T1 - Surface chemical characterization of plasma-polymerized organic films: State-of-the-art and shortcomings T2 - 10th International Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2006-09-10 PY - 2006 AN - OPUS4-13062 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range (VAMAS Projekt A8) T2 - VAMAS TWA 2 "Surface Chemical Analysis" Meeting 2007 CY - Brussels, Belgium DA - 2007-09-09 PY - 2007 AN - OPUS4-15879 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Results of a german survey on topics of interest in surface chemical analysis of organic surfaces in 2006: topics and priorities T2 - ISO/TC201 15th Plenary and SC Meetings (Morgan Hill Meeting) CY - Morgan Hill, CA, USA DA - 2006-11-09 PY - 2006 AN - OPUS4-14232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: certified reference materials and R&D on plasma polymerization of organics T2 - Seminar, National ESCA and Surface Analysis Center for Biomedical Problems (NESCA/BIO), University of Washington CY - Seattle, WA, USA DA - 2006-06-29 PY - 2006 AN - OPUS4-12506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Jagst, Eda A1 - Lippitz, Andreas A1 - Treu, Dieter T1 - Amino group determination on 4,4'-Methylenebis(2,6-diethylaniline) film surfaces by XPS and NEXAFS applying derivatization reactions T2 - ECASIA'07 CY - Brussels, Belgium DA - 2007-09-10 PY - 2007 AN - OPUS4-15843 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - CRG Evaluation of the Bending Magnet Beamline HE-SGM: Future scientific program T2 - CRG Evaluation of the BM Beamline HE-SGM CY - Berlin, Germany DA - 2007-03-20 PY - 2007 AN - OPUS4-14649 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias T1 - Neuartig räumlich strukturierte Testproben für die Bestimmung der Abbildungsqualität und die Kalibrierung der Längenskala in der Rastersondenmikroskopie T2 - 2. Statuskolloquium des DFG SPP 1159 "Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen" CY - Jena, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12451 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Unger, Wolfgang A1 - Schmidt, M. T1 - Measurement of the hydrophilic character of microscopic areas at microfluide components T2 - 2. Statuskolloquium des DFG SPP 1159 "Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen" CY - Jena, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12431 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Lippitz, Andreas T1 - Ageing studies of plasma deposited organic films by surface chemical analysis (ESCA, ToF-SIMS, XAS) T2 - International Conference on Processing & Manufacturing of Advanced Materials CY - Vancouver, Canada DA - 2006-07-04 PY - 2006 AN - OPUS4-12251 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: Development of certified reference materials and surface characterisation of plasma polymerized thin films T2 - Seminar im Lab. of Physical-Chemistry of Surfaces (CNRS-ENSCP), Ecole Nationale Superieure de Chemie de Paris CY - Paris, France DA - 2006-04-04 PY - 2006 AN - OPUS4-12286 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Controlled deposition from the gaseous phase: application of micro-surface analysis T2 - Marie Curie Actions: MINDE Micro and Nano Deposition (Course) European Academy of Surface Technology (EAST) CY - Schwäbisch Gmünd, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Determination of modulation transfer function by imaging of square-wave gratings with different periods in the nanometre range T2 - NanoScale 2006 CY - Bern, Switzerland DA - 2006-04-24 PY - 2006 AN - OPUS4-12287 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Friedrich, Jörg F. A1 - Mix, Renate T1 - Charakterisierung von Plasmapolymeren: "Viel hilft viel!" T2 - AK Plasma, Frühjahrstreffen 2006 CY - Berlin, Germany DA - 2006-05-30 PY - 2006 AN - OPUS4-12497 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - CCQM surface analysis working group (SAWG): introduction for WG meeting 2006 & summary 2006 and next steps T2 - CCQM Surface Analysis Working Group Meeting 2006 CY - Sèvres, France DA - 2006-04-05 PY - 2006 AN - OPUS4-12289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Analysis Working Group (SAWG) Report for 2005/06 T2 - CCQM Plenary Meeting 2006, BIPM CY - Sèvres, France DA - 2006-04-06 PY - 2006 AN - OPUS4-12285 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Procop, Mathias A1 - Unger, Wolfgang T1 - Standard-free quantification in EPMA T2 - CCQM Surface Analysis Working Group Meeting 2006 CY - Sèvres, France DA - 2006-04-05 PY - 2006 AN - OPUS4-12306 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Girard-Lauriault, P.-L. A1 - Truica-Marasescu, F. A1 - Lerouge, S. A1 - Mwale, F. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Desjardins, P. A1 - Wertheimer, M. R. T1 - Nitrogen-rich plasma polymers ("PPE:N") for biomedical applications: comparison of films deposited in atmospheric- and low-pressure plasmas T2 - International Symposium on Polymeric Materials for Regenerative Medicine - PMRM 2007 CY - Montreal, Canada DA - 2007-04-02 PY - 2007 AN - OPUS4-14614 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Wertheimer, M. R. A1 - Girard-Lauriault, P.-L. A1 - Truica-Marasescu, F. A1 - Lerouge, S. A1 - Mwale, F. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Desjardins, P. T1 - Nitrogen-rich Plasma Polymers ("PPE:N") for Bio-medical Applications in Orthopaedic and Vascular Therapies T2 - International Conference on Plasma Medicine (ICPM) - I CY - Corpus Christi, TX, USA DA - 2007-10-15 PY - 2007 AN - OPUS4-15697 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Procop, Mathias A1 - Hodoroaba, Vasile-Dan T1 - BAM Reference materials for surface and nano analysis: status and projects T2 - 4th International Symposium on Practical Surface Analysis (PSA-07) and 6th Korea-Japan International Symposium on Surface Analysis CY - Kanazawa, Japan DA - 2007-11-25 PY - 2007 AN - OPUS4-16384 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Baytekin, H. Tarik A1 - Schmidt, M. T1 - Investigation of wettability of surface modified polymer wafers used in micro fluidic device fabrication T2 - 4th International Symposium on Practical Surface Analysis (PSA-07) and 6th Korea-Japan International Symposium on Surface Analysis CY - Kanazawa, Japan DA - 2007-11-25 PY - 2007 AN - OPUS4-16381 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Die AG Schicht- und Oberflächenanalytik der BAM: Methodische Mögllichkeiten und ausgewählte Forschungsergebnisse T2 - Workshop Electronic materials and processes for organic FETs BASF Polymer Physics, Rheology and Materials Properties CY - Ludwigshafen am Rhein, Germany DA - 2007-10-31 PY - 2007 AN - OPUS4-16167 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Graf, Nora A1 - Dietrich, Paul A1 - Weigel, W. A1 - Lippitz, Andreas A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Surface analytical measurements (XPS, ToF-SIMS, NEXAFS) of organosilane functionalized substrates to be used as microarray platforms T2 - 11th Status Seminar "Chip Technologies" (Dechema) CY - Frankfurt am Main, Germany DA - 2009-03-05 PY - 2009 AN - OPUS4-19028 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Moritz, W. A1 - Tausche, A. A1 - Cherkaschinin, G. A1 - Molajew, R. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Linke, S. T1 - Catalytic Properties of Ternary Alloys Continuous Gradient - High Throughput Screening Macroscope - CG-HTSM T2 - 216th Electrochemical Society (ECS) Meeting CY - Vienna, Austria DA - 2009-10-04 PY - 2009 AN - OPUS4-19528 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nietzold, Carolin A1 - Dietrich, Paul A1 - Holzweber, Markus A1 - Lippitz, Andreas A1 - Panne, Ulrich A1 - Unger, Wolfgang A1 - Ivanov-Pankov, S. A1 - Weigel, W. T1 - XPS studies of epoxy surfaces used for potential carbohydrate reference arrays T2 - JCF spring, symposium CY - Jena, Germany DA - 2014-03-26 PY - 2014 AN - OPUS4-30589 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Wasserroth, S. A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Gorgoi, M. A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Chemical Depth Profiles of Ternary Pd Alloys by HAXPES and First Spectra Simulations T2 - 76. Jahrestagung der DPG und DPG-Frühjahrstagung, DS 18: Thins film characterization: structure analysis and composition (Spectroscopy) CY - Berlin, Germany DA - 2012-03-25 PY - 2012 AN - OPUS4-25691 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Girard-Lauriault, P.-L. A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Min, H. A1 - Wirth, Thomas A1 - Castelli, R. A1 - Seeberger, P. H. A1 - Unger, Wolfgang T1 - Carbohydrate-functionalized surfaces: Analysis by a multi-method approach T2 - 6. Senftenberger Innovationsforum: Multiparameteranalytik mit zellulären Assays CY - Senftenberg, Germany DA - 2012-03-16 PY - 2012 AN - OPUS4-25683 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - How successful is surface chemical analysis in the characterization of (model) diagnostic devices exploiting probe-target interaction? T2 - 65th IUVSTA Workshop "Measuring molecular adsorption at the solid liquid interface" CY - Peckforton, England DA - 2012-05-14 PY - 2012 AN - OPUS4-25968 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Wasserroth, S. A1 - Wirth, Thomas A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - A comprehensive Auger electron spectroscopy study on a PdxNiyCo1-x-y-/LaF3/SiO2/Si multi-layer system for H2 detection T2 - 2. Berliner Chemie Symposium CY - Berlin, Germany DA - 2012-04-03 PY - 2012 AN - OPUS4-25687 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Funk, Ch. A1 - Gross, Thomas A1 - Weigel, W. A1 - Unger, Wolfgang T1 - Epoxy-functionalized Surfaces: Surface chemical analysis and fluorescence labeling of surface species T2 - 6. Senftenberger Innovationsforum: Multiparameteranalytik mit zellulären Assays CY - Senftenberg, Germany DA - 2012-03-16 PY - 2012 AN - OPUS4-25684 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Wasserroth, S. A1 - Wirth, Thomas A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Hight-throughtput surface analysis of catalyst libraries based on ternary Pd thin film alloys T2 - PHI European Users Meeting 2012 CY - Eibelstadt, Germany DA - 2012-04-18 PY - 2012 AN - OPUS4-25869 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Analytik an Microarrays mittels physikalischer Methoden der chemischen Oberflächenanalytik T2 - Workshop "Funktionalisierung von Oberflächen für bioananlytische Anwendungen" CY - Berlin, Germany DA - 2012-07-24 PY - 2012 AN - OPUS4-26185 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology in Surface and Micro/Nano Analysis T2 - CCQM Plenary Meeting 2012 CY - Paris, France DA - 2012-04-19 PY - 2012 AN - OPUS4-25967 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Neukammer, J. A1 - Kummrow, A. A1 - Foy, C. A1 - Huggett, J. A1 - Parkes, H. A1 - Zel, J. A1 - Milavec, M. A1 - Simonet, J. A1 - Schimmel, H. A1 - Grunert, H.-P. A1 - Zeichhardt, H. A1 - Akgöz, M. A1 - Honeyborne, I. A1 - McHugh, T. T1 - Metrology for Monitoring Infectious Diseases, Antimicrobial Resistance, and Harmful Micro-Organisms T2 - 30th IFBLS World Congress (International Federation of Biomedical Laboratory Science) CY - Berlin, Germany DA - 2012-08-18 PY - 2012 AN - OPUS4-26555 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Jörg F. T1 - Multiscale simulation of localization phenomena using XFEM² T2 - ECCOMAS 2012 CY - Vienna, Austria DA - 2012-09-10 PY - 2012 AN - OPUS4-26532 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -