TY - CONF A1 - Heinrich, Thomas A1 - Traulsen, Christoph A1 - Holzweber, Markus A1 - Richter, S. A1 - Kastner, S. K. A1 - Unger, Wolfgang A1 - Schalley, C. A. T1 - Coupled molecular switching processes in ordered mono- and multilayers of stimuli-responsive rotaxanes on gold surfaces N2 - Interfaces provide the structural basis for function as, for example, encountered in nature in the membrane-embedded photosystem or in technology in solar cells. Synthetic functional multilayers of molecules cooperating in a coupled manner can be fabricated on surfaces through layer-by-layer self-assembly. Ordered arrays of stimuli-responsive rotaxanes undergoing well-controlled axle shuttling are excellent candidates for coupled mechanical motion. Such stimuli-responsive surfaces may help integrating synthetic molecular machines in larger systems exhibiting even macroscopic effects or generating mechanical work from chemical energy through cooperative action. The present work demonstrates the successful deposition of ordered mono- and multilayers of chemically switchable rotaxanes on gold surfaces. For the first time, rotaxane mono- and multilayers are shown to reversibly switch in a coupled manner between two ordered states as revealed by linear dichroism effects in angle-resolved NEXAFS spectra. Such a concerted switching process is observed only when the surfaces are well packed, while less densely packed surfaces lacking lateral order do not exhibit such effects. T2 - SupraChem 2015 CY - Berlin, Germany DA - 22.02.2015 KW - NEXAFS KW - Rotaxanes KW - Molecular machines KW - XPS KW - ToF-SIMS KW - AFM PY - 2015 AN - OPUS4-42800 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Kühn, Julius A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Characterization of Pd-Ni-Co Alloy Thin Films by ED-EPMA and Data Reduction by the STRATAGEM Software T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23779 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Girard-Lauriault, Pierre-Luc A1 - Illgen, René A1 - Ruiz, J.-C. A1 - Wertheimer, M. R. A1 - Unger, Wolfgang T1 - Functionalization of graphite and carbon nanotube surfaces by vacuum-ultraviolet induced photochemical processes T2 - ECASIA '11 - 14th European Conference on Applications of surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24203 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Richter, S. A1 - Poppenberg, J. A1 - Darlatt, Erik A1 - Traulsen, C. H.-H. A1 - Tatzke, M. A1 - Dzyuba, E. V. A1 - Sattler, D. A1 - Unger, Wolfgang A1 - Schalley, C. A. T1 - Metal Coordinated Layer-by-Layer Self-Assembly of Macrocycles and Rotaxanes on Gold Surfaces T2 - Supramolecules & Assemblies, Chemistry Properties and Organization at Multiple Scales CY - Lucca, Italy DA - 2011-06-19 PY - 2011 AN - OPUS4-23970 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Lippitz, Andreas A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - A HAXPES Study of a Ternary Palladium Alloy Metal-Electrolyte-Insulator-Semiconductor System T2 - HAXPES 2011 - 4th International Workshop on Hard-X-ray Photoelectron Spectroscopy CY - Hamburg, Germany DA - 2011-09-14 PY - 2011 AN - OPUS4-24350 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias A1 - Unger, Wolfgang T1 - A Test Material and quick Procedure for Checking the Performance of X-Ray Spectrometers attached to a SEM T2 - ECASIA '11 14th European Conference on Application of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Kollmer, F. T1 - BAM-L200: A new type of reference material for the determination of lateral resolution and the calibration of length scale T2 - 18th International Conference on Secondary Ion Mass Spectrometry CY - Riva del Garda, Italy DA - 2011-09-18 PY - 2011 AN - OPUS4-24441 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - Degradation of organic surfaces during XPS analysis: Case study and proposal of a routine method to describe the photon flux T2 - ECASIA '11 - 14th European Conference on Applications of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24237 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Kühn, Julius A1 - Unger, Wolfgang A1 - Linke, S. A1 - Moritz, W. T1 - Catalytic Properties of Pd-Ni-Co Alloy Thin Films used as Active Layer of a Hydrogen Sensor T2 - ECASIS 2011 - 14th Conference on Applications of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24351 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Darlatt, Erik A1 - Min, Hyegeun A1 - Poppenberg, J. A1 - Richter, S. A1 - Traulsen, C. H.-H. A1 - Schalley, C. A. A1 - Unger, Wolfgang T1 - ToF-SIMS study of the palladium(II) coordination on a pyridyl terminated self assembled monolayer T2 - SIMS XVIII CY - Riva del Garda, Italy DA - 2011-09-18 PY - 2011 AN - OPUS4-24197 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Kim, K. Y. A1 - Unger, Wolfgang T1 - ED-EPMA Measurements of elemental Composition and Thickness of Fe-Ni Alloy Films T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23774 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Comparison of methods for the determination of lateral resolution in imaging surface analysis T2 - 14th International Conference on Applications of Surface and Interface Analysis (ECASIA 11) CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24443 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Girard-Lauriault, Pierre-Luc A1 - Dietrich, Paul A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - Quantitative Chemical Determination of Organic Layers using CDXPS: A Valid Experimental Procedure? T2 - Research Seminar INP Greifswald e. V. CY - Greifswald, Germany DA - 2011-05-26 PY - 2011 AN - OPUS4-23967 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Straub, Franka A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Böllinghaus, Thomas T1 - Detection of Hydrogen in highly alloyed stainless steel microstructures by TOF-SIMS T2 - ECASIA '11 - 14th European Conference on Applications of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24205 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Girard-Lauriault, Pierre-Luc A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Min, Hyegeun A1 - Wirth, Thomas A1 - Castelli, R. A1 - Seeberger, P. H. A1 - Unger, Wolfgang T1 - Surface chemical characterization of carbohydrate films on gold T2 - ECASIA '11 CY - Cardiff, Wales DA - 2011-09-09 PY - 2011 AN - OPUS4-24239 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Entwicklung einer normativen analytischen Infrastruktur für die Qualitätssicherung von Mikroarrays T2 - 3. Berlin-Brandenburger Technologieforum In Vitro-Diagnostik und Bioanalytik CY - Potsdam, Germany DA - 2011-06-09 PY - 2011 AN - OPUS4-23965 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Darlatt, Erik A1 - Poppenberg, J. A1 - Richter, S. A1 - Traulsen, C. H.-H. A1 - Schalley, C. A. A1 - Unger, Wolfgang T1 - Buried interface characterization for a click chemistry- derivatized self assembled monolayer on gold T2 - HAXPES 2011 CY - Hamburg, Germany DA - 2011-09-14 PY - 2011 AN - OPUS4-24198 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Illgen, René A1 - Huber, Alexandra A1 - Hanelt, Sven A1 - Jäger, Christian A1 - Unger, Wolfgang A1 - Meyer-Plath, Asmus T1 - Comparison of XPS and solid-state 19F-NMR measurements of derivatized oxidized MWCNTs T2 - Berliner Chemie Symposium, HU Berlin CY - Berlin, Germany DA - 2011-04-07 PY - 2011 AN - OPUS4-23799 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Darlatt, Erik A1 - Poppenberg, J. A1 - Richter, S. A1 - Traulsen, C. H.-H. A1 - Schalley, C. A. A1 - Unger, Wolfgang T1 - Introduction of bulky donor head groups on a self assembled monolayer on gold exploiting click chemistry T2 - ECASIA 2011 CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24201 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Marinenko, R. A1 - Small, J. A1 - Unger, Wolfgang T1 - EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study T2 - Microscopy and Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Funk, Christian A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Weigel, W. T1 - Epoxy-functionalized Surfaces: Surface chemical analysis and fluorescence labeling of surface species T2 - ECASIA '11 CY - Cardiff, Wales DA - 2011-09-09 PY - 2011 AN - OPUS4-24242 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Gross, Thomas A1 - Castelli, R. A1 - Wirth, Thomas A1 - Seeberger, P. H. A1 - Unger, Wolfgang T1 - Surface chemical Analysis of Microarrays: Problems and Perspectives T2 - ECASIA'11 CY - Cardiff, Wales DA - 2011-09-09 PY - 2011 AN - OPUS4-24243 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Gross, Thomas A1 - Horlacher, T. A1 - Girard-Lauriault, Pierre-Luc A1 - Lippitz, Andreas A1 - Min, Hyegeun A1 - Wirth, Thomas A1 - Castelli, R. A1 - Seeberger, P.H. A1 - Unger, Wolfgang T1 - Surface analytical investigations (XPS, NEXAFS and ToF-SIMS) of carbohydrate-functionalized surfaces T2 - SIMS XVIII, 18th International Conference on Secondary Ion Mass Spectrometry CY - Trento, Italy DA - 2011-09-18 PY - 2011 AN - OPUS4-24445 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Poppenberg, J. A1 - Richter, S. A1 - Traulsen, C. H.-H. A1 - Darlatt, Erik A1 - Unger, Wolfgang A1 - Schalley, C. A. T1 - Controlled Preparation of a Pyridyl-Terminated SAM on Gold - a Promising Platform for Layer-by-Layer Self-Assembly through Metal Coordination T2 - Supramolecules & Assemblies, Chemistry Properties and Organization at Multiple Scales CY - Lucca, Italy DA - 2011-06-19 PY - 2011 AN - OPUS4-23969 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Darlatt, Erik A1 - Traulsen, C. H.-H. A1 - Poppenberg, J. A1 - Richter, S. A1 - Schalley, C. A. A1 - Unger, Wolfgang T1 - The Coordination of Palladium(II)-ions changes the preferential orientation of pyridyl terminated self-assembled monolayer molecules - A NEXAFS study T2 - Joint BER II and BESSY II User Meeting 2011 CY - Berlin, Germany DA - 2011-12-01 PY - 2011 AN - OPUS4-24984 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Aminated functional organic surfaces as viewed by XPS, X-ray absorption spectroscopy and ToF-SIMS T2 - 14th European Conference on Applications of Surface and Interface Analysis (ECASIA 11) CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24477 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Darlatt, Erik A1 - Traulsen, C. H.-H. A1 - Poppenberg, J. A1 - Richter, S. A1 - Schalley, C. A. A1 - Unger, Wolfgang T1 - Evidence of click, coordination and side reactions on a self-assenbled monolayer by synchrotron radiation based XPS and NEXAFS T2 - 2. Berliner Chemie Symposium CY - Berlin, Germany DA - 2012-04-03 PY - 2012 AN - OPUS4-25679 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Gross, Thomas A1 - Castelli, R. A1 - Wirth, Thomas A1 - Seeberger, P. H. A1 - Unger, Wolfgang T1 - Microarrays - Surface Chemical Characterization T2 - Functional Genomics and Proteomics - Applications, Molecular Diagnostics & Next Generation Sequencing CY - Frankfurt am Main, Germany DA - 2012-02-02 PY - 2012 AN - OPUS4-25529 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Gorgoi, M. A1 - Like, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Chemical Depth Profiles of Ternary Pd Alloys by HAXPES and First Spectra Simulations T2 - HZB User Metting 2011 CY - Berlin, Germany DA - 2011-12-01 PY - 2011 AN - OPUS4-25060 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Streeck, C. A1 - Nutsch, A. A1 - Dietrich, P. A1 - Fischer, Tobias A1 - Grötzsch, D. A1 - Nietzold, Carolin A1 - Malzer, W. A1 - Rurack, Knut A1 - Beckhoff, B. A1 - Unger, Wolfgang T1 - Characterization of bio-molecular surfaces and liquids by means of reference-free X-ray spectrometry N2 - An increasing field of application for X-ray spectrometry and related analysis techniques is the investigation of tailor made functional surfaces modified by organic molecules. For a detailed understanding and further development of such functionalized surfaces, a quantitative determination of the surface density of molecular species or even specific functional groups is required. By means of reference-free X-Ray Fluorescence (XRF) spectrometry such customized surfaces can be analyzed quantitatively, when using specific marker elements. A chemical analysis of molecular bonds can be accomplished by X-Ray Absorption Spectroscopy in the Near-Edge region (NEXAFS). Especially in the soft X-ray range an access to relevant light elements like carbon C, nitrogen N and oxygen O is possible. Especially, the characterization of liquids and solid-liquid interfaces aiming at the determination of bio-molecular moieties (functional groups) is of great interest. The characterization of such systems requires the analysis of bio-molecules in their liquid environment. For the understanding of (biomolecular) reactions and binding processes the verification and quantification of biomolecule immobilization is essential. However, the analysis in the soft-X-ray range involves a higher experimental effort. In this contribution various successful applications of the characterizations of organofunctionalized surfaces, solid-liquid interfaces and liquids containing bio-molecular species by means of reference-free X-ray spectrometry will be presented. The experiments were performed at the plane-grating monochromator beamline (PGM-U49) in the soft X-ray range at the synchrotron radiation facility BESSY II. Using calibrated instrumentation and a quantification approach based on atomic fundamental parameters a quantitative access without any calibration sample or reference material is possible. In a complementary analysis by X-Ray Photoelectron Spectroscopy (XPS) and fluorescence measurements based on laserexcitation in the optical light spectrum the functional-group density of silane monolayers were determined. Here, the nitrogen atoms of the head-group of the label molecule employed could be used as specific marker for the reference-free quantitative XRF analysis and is used for traceable calibration of XPS and fluorescence spectroscopy. Furthermore, a novel UHV-compatible liquid-cell developed to investigate liquids and solidliquid interfaces will be presented. Protein attachment at the solid-liquid interface was investigated by detection of the characteristic N1s→π*(O=C-N) amide bond resonance in the N K-edge NEXAFS by using ultra-thin epoxy-functionalized SiC-windows. T2 - European Conference on X-Ray Spectrometry (EXRS) CY - Gothenburg, Sweden DA - 19.06.2016 KW - Bio-molecular surfaces KW - NEXAFS KW - XPS KW - XRS PY - 2016 AN - OPUS4-36965 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Streeck, C. A1 - Dietrich, Paul A1 - Fischer, Tobias A1 - Rurack, Knut A1 - Unger, Wolfgang A1 - Beckhoff, B. T1 - Characterization of bio-molecular nano-layers by means of reference-free X-ray Spectrometry N2 - Characterization of bio-molecular nano-layers by means of reference-free X-ray Spectrometry An increasing field of application, e.g. in biotechnology is the dedicated adjustment of surface properties by functionalization with organic molecules. For a detailed understanding and further development of such nano-layers, a quantitative determination of the surface density of molecular species is required. By means of reference-free X-Ray Fluorescence (XRF) spectrometry such surfaces can be analyzed quantitatively by detecting specific marker elements. Using calibrated instrumentation and a quantification approach based on atomic fundamental parameters a SI-traceable quantitative analysis without any calibration sample or reference material is possible. A chemical analysis of molecular bonds can be accomplished by X-Ray Absorption Spectroscopy in the Near-Edge region (NEXAFS). Especially in the soft X-ray range an access to relevant light elements like Carbon C, Nitrogen N and Oxygen is possible. Here, aminated surfaces with varying densities of amino groups prepared from binary mixtures of silanes were investigated. In a complementary analysis by X-Ray Photoelectron Spectroscopy (XPS) and Fluorescence measurements based on laser-excitation in the optical light spectrum the functional-group density of silane monolayers were determined. The nitrogen atom in the head-group of the silane-molecule could be used as specific marker for the reference-free quantitative XRF analysis and were used for traceable calibration of XPS and Fluorescence Spectroscopy. T2 - EMRS Spring Meeting 2017, ALTECH 2017, Symposium S, Analytical techniques for precise characterization of nano materials CY - Strasbourg, France DA - 22.05.2017 KW - XPS KW - XRF KW - Amino silane film KW - Traceability PY - 2017 AN - OPUS4-43374 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Streeck, C. A1 - Beckhoff, B. A1 - Unger, Wolfgang T1 - Quantitative XRF analysis of industrial thin film samples by calibration using thin film RMs N2 - X-ray fluorescence (XRF) analysis is a well suited methodology for thin film analysis. With XRF the mass deposition of elements can be non-destructively determined. By knowledge of the density of the thin film as well the thickness can be given. In the field of industrial thin film manufacturing various material systems and layer structures are used. the analysis relies on well-known calibration samples or even reference materials to determine absolute analytical results from the measurement values recorded. Within this concept of chemical traceability the calibration sample has to be as similar as possible to the industrial thin film sample with respect to the spatial distribution of elemental composition in order to minimize matrix effects or analysis related uncertainties. The procurement of such certified similar calibration samples or reference materials including their required traceability is a challenge due to limited number of available calibration samples or reference materials, in particular at the nanoscale. There are only few providers of calibration standards for layer or coating thicknesses which are suitable for XRF analysis. The limited number of available certified reference materials (CRMs) for XRF thin film analysis and in parallel the growing market of novel thin film materials induces a growing gap of required calibration samples for XRF analysis. The exploitation of process-near samples benefits from a leverage effect: on one hand reference materials are needed for calibration and alignment procedures for X-ray fluorescence devices. They are customized for the special need of the end-user, e.g. a company producing thin film solar cells. On the other hand the market for EDXRF devices develops positively by providing novel thin film calibration samples for industry and end user-related production processes or application. Two aspects are hereby being addressed; the improvement of product quality which in certain sectors like aerospace and automotive industry directly translates to product safety as well as the expansion of the sales potential of EDXRF measuring devices. T2 - Annual Meeting ISO TC 201 SC10 CY - Brescia, Italy DA - 17.09.2017 KW - XRF KW - Calibration KW - Traceability PY - 2017 AN - OPUS4-43375 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Streeck, C. A1 - Grötzsch, D. A1 - Witte, K. A1 - Dietrich, Paul A1 - Malzer, W. A1 - Nutsch, A. A1 - Stiel, H. A1 - Unger, Wolfgang A1 - Kanngießer, B. A1 - Beckhoff, B. T1 - A liquid cell for the analysis of biomolecules (e.g. proteins, chlorophyll) using soft X-ray excitation N2 - For versatile applications, including vacuum instrumentation, a liquid cell was developed. Using ultra-thin windows, this cell enables X-ray Absorption spectrometry in the soft X-ray range which is in particular interesting for the analysis of organic molecules in liquids or at the solid-liquid interface. NEXAFS of a protein at N K-edge and of chlorophyll a at Mg K-edge is demonstrated. T2 - 8th Jouint BER II and BESSY II User Meeting CY - Berlin, Germany DA - 7.12.2016 KW - XAS KW - NEXAFS KW - Liquid cell KW - Chlorophyll PY - 2016 AN - OPUS4-38711 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Streeck, C. A1 - Nutsch, A. A1 - Beckhoff, B. A1 - Rurack, Knut A1 - Fischer, Tobias A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Reference-free quantification of functional groups on surfaces for bioanalytical applications by total reflection X-ray fluorescence analysis N2 - For the development of biosensors or microarrays in biotechnology functionalized surfaces e.g. aminated glass surfaces can be used. Knowledge of the quantity of primary reactive groups on such surfaces is indispensable for a defined secondary modification with commonly biochemical entities, eventually resulting in more reliably tailored surfaces with better controlled properties. Here, we investigated aminated glass surfaces with varying densities of amino groups prepared from binary mixtures of silanes. Subsequent labeling of the amino groups with a fluorophore containing a high number of fluorine atoms allows complementary quantification of the organic groups by optical fluorescence spectroscopy, X-ray Photoelectron Spectroscopy (XPS) and traceable Total-Reflection X-ray Fluorescence analysis (TXRF). Reference-free TXRF with soft X-ray excitation determines the mass deposition of elements such as carbon, nitrogen and fluorine, yielding the areal density of primary functional groups on the surface. The TXRF-measurements were performed at the PTB beamline for undulator radiation at the electron storage ring BESSY II which provides monochromatic soft X-rays with high spectral purity and photon flux. This approach allows the calibration of optical fluorescence spectroscopy and XPS to deliver traceable quantitative data. T2 - European Conference on X-Ray Spectrometry (EXRS-2014) CY - Bologna, Italien DA - 2014-06-15 PY - 2014 AN - OPUS4-34664 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Held, Felix A1 - Robens-Radermacher, Annika A1 - Unger, Jörg F. A1 - Reese, Stefanie T1 - Efficient model updating in structural analysis using proper generalized decomposition N2 - The proper generalized decomposition is combined with a Bayesian model updating to identify unknown material parameters for mechanical structures. A convergence analysis for the Bayesian updating procedure is finally presented. T2 - ECCOMAS YIC 2019 5th Young Investigators Conference CY - Krakau, Poland DA - 01.09.2019 KW - Efficient model updating KW - Structural analysis PY - 2019 AN - OPUS4-48902 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kjaervik, Marit A1 - Seim, C. A1 - Streeck, C. A1 - Wansleben, M. A1 - Hornemann, A. A1 - Schwibbert, Karin A1 - Unger, Wolfgang A1 - Vorng, J. L. A1 - Kästner, B. A1 - Dietrich, P. A1 - Thissen, A. A1 - Beckhoff, B. T1 - EMPIR project Metrology vs. Bad Bugs aims to provide urgently needed metrology to quantitatively measure localization and penetration of antibiotics and biocides in bacteria and biofilms N2 - An overview of ongoing reference-free X-ray spectrometry, near-ambient pressure X-ray photoelectron spectroscopy and Fourier-Transform infrared micro-spectroscopy studies on the penetration of biocides/antibiotics into bacteria and biofilms is given. T2 - Ninth Joint BER II and BESSY II User Meeting CY - Berlin, Germany DA - 13.12.2017 KW - Biofilms KW - Alginate KW - XRF KW - FTIR KW - NAP-XPS PY - 2017 AN - OPUS4-43465 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Streeck, C. A1 - Nutsch, A. A1 - Weser, J. A1 - Fischer, Tobias A1 - Dietrich, Paul A1 - Rurack, Knut A1 - Unger, Wolfgang A1 - Beckhoff, B. T1 - Reference-free total reflection X-ray fluorescence analysis for quantification of functional groups on surfaces for bioanalytical applications T2 - 6th Joint BER II and BESSY II User Meeting of HZB CY - Berlin, Germany DA - 2014-12-04 PY - 2014 AN - OPUS4-32390 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Lippitz, Andreas A1 - Schulze, Rolf-Dieter A1 - Unger, Wolfgang T1 - Characteriazation of Plasma-deposited Ethylene, Ally-alcohol and Ethylene-Ally-alcohol copolymer Films by Time-of-Flight Static Secondary lon Mass Spectrometry (TOF-SIMS) T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5025 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzlechner, Gerald A1 - Hussels, M. A1 - Reihardt, P. A1 - Jungnickel, H. A1 - Kummrow, A. A1 - Neukammer, J. A1 - Unger, Wolfgang T1 - Metrology for monitoring infectious diseases: flow cytometer, XPS and TOF-SIMS characterization of DNA adhesion losses on micro fluidic PCR devices T2 - Angewandte Oberflächen Analytik Tagung, AOFA 18 CY - Kaiserslautern, Germany DA - 2014-09-29 PY - 2014 AN - OPUS4-31684 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Titscher, Thomas A1 - Unger, Jörg F. A1 - Oliver, Javier T1 - High-order cycle jump integration of a concrete fatigue damage model N2 - Fatigue models that accurately resolve the complex three-dimensional failure mechanisms of concrete are numerically expensive. Especially the calibration of fatigue parameters to existing Wöhler lines requires solving for thousands or millions of cycles and a naive cycle-by-cycle integration is not feasible. The proposed adaptive cycle jump methods provide a remedy to this challenge. They greatly reduce the numerical effort of fatigue simulations and provide the basis for a development of those models. T2 - 8th GACM Colloquium on Computational Mechanics CY - Kassel, Germany DA - 28.08.2019 KW - Time scale separation KW - Cycle jump KW - Fatigue damage PY - 2019 AN - OPUS4-52191 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kindrachuk, Vitaliy A1 - Unger, Jörg F. T1 - A Multi-scale temporal integration scheme for viscoplatic solids subjected to fatigue deterioration N2 - Using a continuum mechanics framework for lifetime prediction requires numerical integration of evolving damage until the onset of failure. The primary challenge for the simulation of structural fatigue failure is caused by the enormous computational costs due to cycle by cycle temporal integration throughout the whole loading history, which is in the order of 10^3 - 10^7 cycles. As a consequence, most approaches circumvent this problem and use an empirical method such as Wöhler curves. They are well suited for approximation of the lifetime, but they are not capable to capture a realistic degradation of the material with a redistribution of the stresses. The main objective of the paper is to provide a technique for the long time response of a finite element (FE) model while reducing computational costs. A multi-scale temporal integration scheme is proposed, which adapts the conventional FE method for realistic modeling of deterioration in a structure subjected to cyclic loading. For a particular case of two-scale temporal homogenization, the displacement field is assumed to satisfy scale separation: a short time scale arises from the oscillatory loading and a long time scale is due to the slow response relating to yielding and damage evolution. The original boundary value Problem (BVP) is approximated by the time-Independent BVPs on the short time scale. Alternation of the displacement field on the long time scale is correlated with the damage evolution by means of the adaptive cycle jump method. The significant acceleration of FE simulations is demonstrated for a constitutive damage model where the progressive damage accumulation under fatigue loading is driven by viscoplastic deformation. T2 - ECCOMAS 2016 CY - Crete, Greece DA - June 5th KW - Fatigue PY - 2016 AN - OPUS4-38654 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Röhsler, Andreas A1 - Sobol, Oded A1 - Nolze, Gert A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Analysis of deuterium in austenitic stainless steel AISI 304L by Time-of-Flight Secondary Ion Mass Spectrometry N2 - Due to their excellent combination of ductility, strength and corrosive resistance, austenitic stainless steels (ASS) are widely used in many industrial applications. Thus, these steel grades can be found as structural components in the (petro-)chemical industry, in offshore applications and more recent for storage and transport of hydrogen fuel. Steels employed for these applications are exposed to aggressive environments and hydrogen containing media. The ingress and accumulation of hydrogen into the microstructure is commonly observed during service leading to a phenomenon called “hydrogen embrittlement”. A loss in ductility and strength, the formation of cracks and phase transformations are typical features of this hydrogen-induced degradation of mechanical properties. Although, great efforts are made to understanding hydrogen embrittlement, there is an ongoing debate of the underlying mechanisms. This knowledge is crucial for the safe use and durability of components on the one side and the development of new materials on the other. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was proven to be a powerful tool for depicting the distribution of the hydrogen isotope deuterium in the microstructure of austenitic and duplex steels. The combination with imaging techniques such as electron backscatter diffraction (EBSD) and scanning electron microscopy (SEM), delivering structural and morphological information, creates a comprehensive picture of the hydrogen/deuterium-induced effects in the materials. All the gathered data is treated with principal component analysis (PCA) and data fusion to enhance the depth of information. The mobility of hydrogen and deuterium in a steel microstructure is affected by external mechanical stress. To investigate the behaviour of deuterium in a strained microstructure, a new in situ experimental approach was developed. This gives the possibility of analysing samples in the SIMS instrument simultaneously to four-point-bending-tests. Specimens made from ASS AISI 304L were electrochemically charged with deuterium instead of hydrogen. This necessity stems from the difficulty to separate between artificially charged hydrogen and hydrogen existing in the pristine material or adsorbed from the rest gas in the analysis chamber. Nonetheless, similar diffusion, permeation and solubility data allow to draw qualitative conclusions from the experiments, which are relevant for the application addressed. T2 - SIMS Europe 2018 CY - Münster, Germany DA - 16.09.2018 KW - Hydrogen KW - Deuterium KW - Austenitic stainless steel KW - SIMS PY - 2018 AN - OPUS4-46029 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Jörg F. A1 - Kindrachuk, Vitaliy A1 - Titscher, Thomas A1 - Hirthammer, Volker T1 - A continuum damage model for the simulation of concrete under cyclic loading N2 - Lifetime aspects including fatigue failure of concrete structures were traditionally only of minor importance. Because of the growing interest in maxing out the capacities of concrete, its fatigue failure under compression has become an issue. A variety of interacting phenomena such as e.g. loss of prestress, degradation due to chemical reactions or creep and shrinkage influence the fatigue resistance. Failure due to cyclic loads is generally not instantaneous, but characterized by a steady damage accumulation. Therefore, a reliable numerical model to predict the performance of concrete over its lifetime is required, which accurately captures order effects and full three-dimensional stress states. Many constitutive models for concrete are currently available, which are applicable for specific loading regimes, different time scales and different resolution scales. However, a key limitation of those models is that they generally do not address issues related to fatigue on a structural level. Very few models can be found in the literature that reproduce deterioration of concrete under repeated loading-unloading cycles. This is due to the computational effort necessary to explicitly resolve every cycle which exceeds the currently available computational resources. The limitation can only be overcome by the application of multiscale methods in time. The objective of the paper is the development of numerical methods for the simulation of concrete under fatigue loading using temporal multiscale methods. First, a continuum damage model for concrete is developed with a focus on fatigue under compressive stresses. This includes the possibility to model stress redistributions and capture size effects. In contrast to cycle based approaches, where damage is accumulated based on the number of full stress cycles, a strain based approach is developed that can capture cyclic degradation under variable loading cycles including different amplitudes and loading frequencies. The model is designed to represent failure under static loading as a particular case of fatigue failure after a single loading cycle. As a consequence, most of the material parameters can be deduced from static tests. Only a limit set of additional constitutive parameters is required to accurately describe the evolution under fatigue loading. Another advantage of the proposed model is the possibility to directly incorporate other multi-physics effects such as creep and shrinkage or thermal loading on the constitutive level. Second, a multiscale approach in time is presented to enable structural computations of fatigue failure with a reduced computational effort. The damage rate within the short time scale corresponding to a single cycle is computed based on a Fourier based approach. This evolution equation is then solved on the long time scale using different implicit and explicit time integration schemes. Their performance and some limitations for specific loading regimes is discussed. Finally, the developed methods will be validated and compared to experimental data. T2 - Conference on Computational Modelling of concrete and concrete structures (EURO_C 2018') CY - Bad Hofgastein, Austria DA - 26.02.2018 KW - Fatigue KW - Concrete KW - Damage PY - 2018 AN - OPUS4-48001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Madkour, Sherif A1 - Lippitz, Andreas A1 - Schönhals, Andreas A1 - Unger, Wolfgang T1 - Anomalous surface composition in thin films of a poly(vinyl methyl ether) / polystyrene blend N2 - Highly surface-sensitive X-ray photoelectron spectroscopy at HE-SGM beamline revealed in the outermost region (< 2nm) of thin films (15 -65 nm) of PVME/PS blends a relative high amount of PS, whereas in slightly deeper regions PVME was enriched. Such enrichment of PVME in the whole near-surface region was proposed in former investigations based on conventional XPS studies. T2 - Bessy User Meeting 2017 CY - Berlin, Germany DA - 13.12.2017 KW - Energy resolved XPS KW - Depth profiling KW - Thin films KW - Polymer blends PY - 2017 AN - OPUS4-43443 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heinrich, Thomas A1 - Schneider, Markus A1 - Schäpe, Kaija A1 - Unger, Wolfgang A1 - Stockmann, Jörg M. T1 - Classification of engineered Titania nanomaterials via surface analysis using principal component analysis (PCA) assisted Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) N2 - Due to the growing number of engineered nanomaterials (NM) the need for a reliable risk assessment for these materials is today bigger than ever before. Especially the nanomaterial’s surface or shell directly interacts with its environment and therefore is a crucial factor for NM’ toxicity or functionality. Especially, titania is one of the NM with the greatest technological importance. It is used for a large number of applications and can be found in food, cosmetics, glasses, mirrors, paints to mention only a few. In 2012, experts estimate[d] the annual European nano-titania production or utilization at an amount of more than 10,000 t. Great progress has been achieved in the area of NM investigation and characterization during the past decade. A variety of publications provide information about technological innovation as well as hazard potential, which means the potential risk on human health and ecosystems. However, enhanced data harmonization and well-defined standards for nanomaterial analysis, could significantly improve the reliability of such studies which often suffers from varying methods, parameters and sample preparations. To develop a suitable approach for the NM’s risk assessment, the ACEnano project aims at establishing a toolbox of verified methods. The size of this well-structured European project allows to handle even those big challenges like data harmonization and standardization. Due to its powerful combination of superior surface sensitivity and lateral resolution down to the Nano regime, ToF-SIMS could become one of these toolbox methods. Supported by multivariate data analysis such as principal component analysis (PCA), the method can be used for sub-classification of nanomaterial families using slight differences in surface chemistry. Here, we show a PCA supported classification of titania nanoparticles from various sources (NIST, JRC, BAM) with ToF-SIMS. Parameters like size, shell, pre-preparation and crystal system cause variance in the data and allow us to distinguish the species from each other. Moreover, this variance in the data also occurs and can be used for investigation when we compare our measurements of particle ensembles with those of grown titania films. The carefully selected and refined peaks allow a reasonable particle categorization and further a reliable allocation of blank feeds, which introduces a promising approach for NM characterization in the context of NM risk assessment. T2 - SIMS-Europe CY - Münster, Germany DA - 16.09.2018 KW - Nanoparticles KW - ToF-SIMS KW - XPS KW - PCA KW - Titania PY - 2018 AN - OPUS4-46250 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sobol, Oded A1 - Straub, Franka A1 - Nolze, Gert A1 - Wirth, Thomas A1 - Boellinghaus, Thomas A1 - Unger, Wolfgang T1 - Observations of the deuterium distribution and the structural changes in standard and lean duplex stainless steels by ToF-SIMS and EBSD N2 - The use of duplex stainless steels (DSS) in energy related applications is well known. Nowadays, DSSs become more favorable than austenitic steels due to the outstanding mechanical properties, the good corrosion resistance and the lower nickel content.However, the use of the duplex grade in acidic environments such as seawater can lead to a severe degradation in the structural integrity of the steel by hydrogen-induced/assisted cracking mechanisms, which can eventually result in premature failure. Hydrogen assisted degradation and cracking of steels remains unclear even though this topic is intensively studied for more than a century. The main gap lies in the validation of the proposed theoretical models at the sub-micron scale. Industrial and the research communities define a need for an accurate method by which it is possible to image the distribution of hydrogen in the microstructure. Among the very few available methods nowadays, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) provides precise mapping of hydrogen in the microstructure. Moreover, the powerful combination of ToF-SIMS with multivariate data analysis (MVA), electron backscattered diffraction (EBSD) for providing a the structural information and the use of data fusion techniques can contribute to a better understanding of the hydrogen induced degradation processes in the material. In the present work two types of duplex grades were chosen as a case study (standard and lean DSS). The duplex class, consist of equivalent amounts of ferrite and austenite, was investigated by ToF-SIMS and EBSD during and after electrochemical deuterium charging in order to simulate the service of a component in acidic environments. Deuterium is known to act on the steel similarly to hydrogen and therefore was used as a tracer for hydrogen. The results show that the ferrite was affected almost identical in both steels whereas in the austenitic phase significant differences were observed in the lean duplex in comparison to the standard duplex. The advantage of the combined techniques is reflected by the ability to correlate the hydrogen distribution in the microstructure to the resulted structural changes. T2 - 21st International Conference on Secondary Ion Mass Spectrometry - SIMS21 CY - Krakow, Poland DA - 10.09.2017 KW - ToF-SIMS KW - Duplex-steel KW - EBSD KW - Data-fusion PY - 2017 UR - http://sims.confer.uj.edu.pl/boa_oral.php?id=23 AN - OPUS4-42864 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kjaervik, Marit A1 - Dietrich, P. A1 - Thissen, A. A1 - Schwibbert, Karin A1 - Unger, Wolfgang T1 - Depth-dependent analysis of model biofilms by combining laboratory- and synchrotron-based X-ray photoelectron spectroscopy N2 - Synchrotron XPS in the soft-X-ray regime is suitable for the detection of light elements commonly found in biological samples. Various model systems of biofilms have been developed and characterised at synchrotron- and lab-based facilities. By obtaining the chemical composition at various information depths, the vertical distribution of iodine in an artificial biofilm have been determined. T2 - Tenth Joint BER II and BESSY II User Meeting CY - Berlin, Germany DA - 05.12.2018 KW - Biofilms KW - HAXPES KW - XPS KW - Iodine KW - Synchrotron-XPS PY - 2018 AN - OPUS4-46929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Reiners, Georg T1 - Ringversuche in der Nanoanalytik T2 - NanoDE - Innovation durch Nanotechnologie CY - Bonn, Germany DA - 2002-05-06 PY - 2002 AN - OPUS4-1735 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profiling of electrically non-conductive layered samples by RF-GDOES, HFM plasma SNMS and ToF-SIMS T2 - AOFA 11 (Angewandte Oberflächenanalytik) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 SP - 1 Seite AN - OPUS4-982 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Unger, Wolfgang T1 - Analytik neuer Kohlenstoffmaterialien - DLS Filme T2 - Abschlusskolloquium zum Ma Tech-Projekt 03N8627C, IWS Dresden CY - Dresden, Germany DA - 2003-02-12 PY - 2003 AN - OPUS4-4372 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Treu, Dieter A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Schulz, H. T1 - Analysis of carbon materials and plasma polymers by x-ray photoelectron spectroscopy and x-ray absorption spectroscopy (XPS, XAS) T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4373 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Paatsch, Wolfgang A1 - Kaiander, I. A1 - Sellin, R. T1 - A new type of certified reference material for the analysis of surface structures in the nanometre range T2 - Eurointerfinish 2003 - Nanotechnology and coatings for novel applications CY - Praglia, Italy DA - 2003-10-23 PY - 2003 AN - OPUS4-4383 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Kühn, Gerhard A1 - Mix, Renate A1 - Koprinarov, Ivaylo T1 - Vergleich plasmaschemische Methoden zur Funktionalisierung von Polymeroberflächen T2 - X. Erfahrungsaustausch zu "Oberflächentechnologie mit Plasmaprozessen" CY - Klingenthal, Germany DA - 2003-03-18 PY - 2003 AN - OPUS4-4203 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray photoelectroscopy and X-ray absorption spectroscopy in interface analysis of metallized polymers T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Charakterisierung von Siliziumoxidschichten auf Silizium mit ESCA: Ein Beitrag zur Präszisionsbestimmung der Avogadro-Konstanten T2 - EMASS 2000 CY - Berlin, Germany DA - 2000-11-10 PY - 2000 AN - OPUS4-3446 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - A reference material for calibration and testing of instruments with nanometric lateral resolution T2 - SIMS Europe 2002 CY - Münster, Germany DA - 2002-09-15 PY - 2002 AN - OPUS4-3225 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas T1 - XPS/ESCA: Ringversuchserebnisse T2 - Seminar Oberflächenanalytik: Technische Aspekte der Akkreditierung nach ISO/IEC 17025, SOFA' 03 CY - Berlin, Germany DA - 2003-01-24 PY - 2003 AN - OPUS4-4395 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - Practical Surface Analysis PSA-04 & 5th Korea-Japan International Symposium on Surface Analysis - KJISSA CY - Jeju, South Korea DA - 2004-10-04 PY - 2004 AN - OPUS4-4598 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Retzko, Iris A1 - Schulze, Rolf-Dieter A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive depth profilino and semiquantitative determination of unsaturated carbon species in pulse plasma deposited organic films T2 - ECASIA `03 CY - Berlin, Germany DA - 2003-10-06 PY - 2003 AN - OPUS4-4672 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films prepared from Organic Molecules: Characterization by Surface Analytical Tools T2 - KRISS Meeting - NanoSurface Group CY - Daejeon, South Korea DA - 2004-10-11 PY - 2004 AN - OPUS4-4600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Oran, Umut A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Unveren, E. T1 - A comparison study between Time-of-Flight Static Secondary lon Mass Spectrometry (TOF-SSIMS) and X-Ray Photoelectron Spectroscopy (XPS) in terms of Poly-dimethyl-siloxane (PDMS) contemination of Polystyrene (PS) samples T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5024 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Retzko, Iris A1 - Treu, Dieter A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destruktive depth profiling and semi-quantitative determination of unsaturated carbon species in pulse plasma deposited organic films T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5043 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absoption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3. BAMline Seminar, BESSY CY - Berlin, Germany DA - 2004-11-29 PY - 2004 AN - OPUS4-5018 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Koprinarov, Ivaylo A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Chromium-evaporated Polymers and Organic Films Investigated by X-ray Absorption Spectroscopy (XAS) and X-ray Photoelectron Spectroscopy (XPS) T2 - IPCM´99: 6th conference on interfacial phenomena in composite materials CY - Berlin, Germany DA - 1999-09-08 PY - 1999 AN - OPUS4-6076 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - EMASS1999 CY - Neuhausen am Rheinfall, Switzerland DA - 1999-10-25 PY - 1999 AN - OPUS4-6052 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Brita A1 - Jancke, Harald A1 - Müller, Bernd R. A1 - Müller, Ralf A1 - Unger, Wolfgang A1 - Reinsch, Stefan A1 - Nofz, Marianne T1 - Strukturbildungsprozesse in Solen und Gelen T2 - XXV. Tagung des Arbeitskreises "Nichtkristalline und partiellkristalline Strukturen" der Deutschen Gesellschaft für Kristallographie CY - Wolfersdorf, Germany DA - 2004-09-27 PY - 2004 AN - OPUS4-5619 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Tailor-made functionalized polymer coatings generated by pulsed r. f. plasma T2 - 6th International Conference on Adhesion and Surface Analysis CY - Loughborough, England DA - 2000-04-18 PY - 2000 AN - OPUS4-6092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - FDS/NEMA Workshop und Präsentation: Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie CY - Bergisch Gladbach, Germany DA - 2000-05-11 PY - 2000 AN - OPUS4-6093 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Hutton, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - ESCA of activated powder Cr2O3 catalysts T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5045 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E.B.M. A1 - Unger, Wolfgang A1 - Wetzig, K. T1 - Emission spectrum of copper in an argon glow discharge containing hydrogen T2 - ECASIA´99 CY - Seville, Spain DA - 1999-10-04 PY - 1999 AN - OPUS4-6080 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Böse, Olaf A1 - Lippitz, Andreas A1 - Fritz, Thomas A1 - Gelius, U. T1 - VAMA TMA2 Project A2, Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples: Report on an inter-laboratory comparison T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik (AOFA 11) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6116 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy and X-ray Absorption Spectroscopy in Interface Analysis of Metallized Polymers T2 - Materials Week 2000 CY - Munich, Germany DA - 2000-09-28 PY - 2000 AN - OPUS4-6117 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Retzko, Iris A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Ein neues Polymerisationsverfahren T2 - Berliner Polymertage 2000 (Humboldt Universität zu Berlin) CY - Berlin, Germany DA - 2000-10-11 PY - 2000 AN - OPUS4-6119 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Koprinarov, Ivaylo A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Chromium-evaporated Polymers and Organic Films Investigated by X-ray Absorption Spectroscopy (XAS) and X-ray Photoelectron Spectroscopy (XPS) T2 - BESSY Nutzertreffen CY - Berlin, Germany DA - 1999-12-09 PY - 1999 AN - OPUS4-6131 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - FDS/NEMA Workshop und Präsentation: Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie CY - Chemnitz, Germany DA - 2000-07-08 PY - 2000 AN - OPUS4-6094 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Assessment of SIMS as an analytical tool in nanotechnology T2 - SIMS Europe 2000 CY - Münster, Germany DA - 2000-09-18 PY - 2000 AN - OPUS4-6114 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profile measurements of electrically non-conductive layered samples by RF-GDOES, HFM plasma SNMS and TOF-SIMS T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11 CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, B. A1 - Schiel, D. A1 - Danzebrink, H. A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Müller, J.-P. T1 - Physical and Chemical Characterization of thermal and native Siliconoxide layers on Silicon T2 - Symposium "Reference Materials for Technologies in the New Millenium" CY - Berlin, Germany DA - 2000-05-22 PY - 2000 AN - OPUS4-6136 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. A1 - Unger, Wolfgang A1 - Reiners, Georg A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Glow discharge optical emission spectrometry (GD-OES) on samples containing hydrogen T2 - European Winter Conference on Plasma Spectrochemistry CY - Lillehammer, Norway DA - 2001-02-02 PY - 2001 AN - OPUS4-6147 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Unger, Wolfgang A1 - Wetzig, K. T1 - The effect of hydrogen on analytical lines in glow discharge optical emission spectrometry T2 - 10th Biennal National Atomic Spectrometry Symposium, Sheffield University CY - Sheffield, England DA - 2000-07-17 PY - 2000 AN - OPUS4-6137 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. A1 - Unger, Wolfgang A1 - Reiners, Georg A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Glow discharge optical emission spectrometry (GD-OES) on samples containing hydrogen T2 - Kolloquium zur Einweihung des neuen Wasserstofflabors der BAM, CY - Berlin, Germany DA - 2001-10-18 PY - 2001 AN - OPUS4-6148 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - TIME-OF-FLIGHT SIMS AND XPS CHARACTERIZATION OF METAL DOPED POLYMERS T2 - 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics CY - Nara, Japan DA - 2001-11-11 PY - 2001 AN - OPUS4-6149 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Treu, Dieter A1 - Unger, Wolfgang T1 - Verfahren zur Bestimmung des Gehaltes and organischen Siliziumverbindungen auf der Oberfläche von Elastomerformteilen T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11 CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6139 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Elektronenspektroskopien in der chemischen Oberflächenanalytik T2 - DGM Fortbildungsseminar "Schicht- und Oberflächenanalytik" CY - Kaiserslautern, Germany DA - 2001-05-28 PY - 2001 AN - OPUS4-6152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methods and Applications of Surface and Thin Film Analysis - BAM Laboratory VIII.23 T2 - Colloquium at Mechanical Engineering Laboratory (MEL) CY - Tsukuba, Japan DA - 2001-03-13 PY - 2001 AN - OPUS4-6151 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3rd International Symposium on Practical Surface Analysis and 5th Korea-Japan International Symposium on Surface Analysis (PSA-04) CY - Jeju, South Korea DA - 2004-09-26 PY - 2004 AN - OPUS4-6447 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Schulze, Rolf-Dieter A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - X-ray Absorption and Photoelectron Spectroscopy on Plasma-polymerized Films Prepared from Organic Molecules (Ethylene, Allyl alcohol, Styrene) T2 - 9th Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-6449 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Brita A1 - Jancke, Harald A1 - Müller, Bernd R. A1 - Unger, Wolfgang A1 - Reinsch, Stefan A1 - Nofz, Marianne T1 - Strukturbildungsprozesse in Gelglässern T2 - XXV. Tagung des Arbeitskreises "Nichtkristalline und partiellkristalline Strukturen" der Deutschen Gesellschaft für Kristallographie CY - Wolfersdorf, Germany DA - 2004-09-27 PY - 2004 AN - OPUS4-6241 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Kaiander, I. A1 - Sellin, R.L. A1 - Bimberg, D. T1 - Testing the lateral resolution in the nanometre range with a new type of certified reference material T2 - NanoScale 2004 CY - Braunschweig, Germany DA - 2004-03-25 PY - 2004 AN - OPUS4-6429 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Retzko, Iris A1 - Schulze, Rolf-Dieter A1 - Lippitz, Andreas A1 - Wirth, Thomas A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - Study of effects of plasma parameters by characterization of pulse plasma deposited organic films T2 - 22nd BESSY Users' Meeting CY - Berlin, Germany DA - 2003-12-04 PY - 2003 AN - OPUS4-6445 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Retzko, Iris A1 - Lippitz, Andreas A1 - Friedrich, Jörg F. T1 - Unsaturated carbon species at polymer surfaces: The potential of X-ray absorption spectroscopy T2 - ECASIA 2001 CY - Avignon, France DA - 2001-09-30 PY - 2001 AN - OPUS4-6165 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ramm, M. A1 - Ata, M. A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - PLASMA-POLYMERIZED C60 FILMS T2 - International Conference on Materials for Advanced Technologies CY - Singapore DA - 2001-07-01 PY - 2001 AN - OPUS4-6210 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - OH group density at polymer surfaces T2 - CCQM Surface Analysis Working Group Meeting for 2004, BIPM CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-6427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Retzko, Iris A1 - Matsubayashi, N. T1 - Pulsed R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Characterization by XAS, XPS und ToF-SIMS T2 - 12. Bundesdeutsche Fachtagung Plasmatechnologie der Deutschen Gesellschaft für Plasmatechnologie CY - Braunschweig, Germany DA - 2005-03-21 PY - 2005 AN - OPUS4-7293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Schmidt, M. T1 - Messung der Hydrophilie von mikroskopischen Bereichen an mikrofluidischen Bauteilen T2 - Status Seminar: Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen (DFG-SPP 1159) CY - Freiburg, Germany DA - 2005-02-28 PY - 2005 AN - OPUS4-7136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface and Micro/Nano Analysis Activities at the Federal Institute for Materials Research and Testing (BAM) T2 - Seminar: MolecularSciences Laboratory, Interfacial and Nano Science Facility, Pacific North West National Laboratory CY - Richland, WA, USA DA - 2005-04-07 PY - 2005 AN - OPUS4-7358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Procop, Mathias T1 - Pilot study on standard-free quantification in EPMA: Status report 2005 T2 - Meeting of the Surface Analytical Working Group @ CCQM CY - Sèvres, France DA - 2005-04-13 PY - 2005 AN - OPUS4-7359 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Westermann, J. A1 - Roll, U. A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Development and Characterisation of Reference Materials for Nanotechnology: High Lateral Resolution Auger Electron Spectroscopy on Semiconductor Heterostructures T2 - 23rd European Conference on Surface Science ECOSS 23 CY - Berlin, Germany DA - 2005-09-04 PY - 2005 AN - OPUS4-10833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas T1 - (Pulsed) R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Chemical Characterization by XAS, XPS and ToF-SIMS T2 - Seminar: Dept. of Engineering Physics, Ecole Polytechnique CY - Montreal, Canada DA - 2005-08-15 PY - 2005 AN - OPUS4-10821 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - A new nanoscaled strip-pattern for the determination of lateral resolution in surface analysis T2 - 11th European Conference on Applications of Surface and Interface Analysis ECASIA`05 CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-10861 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -