TY - CONF A1 - Holzweber, Markus A1 - Unger, Wolfgang A1 - Hutter, H. T1 - Sputtering of Liquid Surfaces -Emission of Molecular Secondary Ions from Ionic Liquids N2 - Static secondary ion mass spectrometry (SIMS) has become a major analytical technique for the analysis of solid surfaces. In the last years it has also been used for the analysis of liquid/frozen surfaces from ionic liquids1-5. However, the mechanism for the emission of secondary ions has not been investigated so far, especially for the state of the art liquid metal ion guns (LMIG), such as the Bi or the BiMn LMIGs. These sources are not only able to provide monoatomic primary ions, but also singly and doubly charged polyatomic primary ion cluster. This new development has led to the investigation of the primary ion particle to specific parameters in order to determine the capabilities of such LMIGs on different target samples. To further the principle understanding of secondary ion emission, a systematic study using Bi1-7+ and Bi1,3,5,7++ primary ions on ionic liquids with considerably different strength of inter-ionic interactions was performed. As model samples the ionic liquids 1-butyl-3-methylimidazolium acetate and 1-butyl-3-methylimidazolium hexafluorophosphate ([C4C1im][Ac] and [C4C1im][PF6]) were used. To compare spectra or the performance of primary ion particles on substances or substance classes, the SIMS data were evaluated by calculating secondary ion yields, static SIMS limit, disappearing cross section, ion formation efficiency and fragmentation. T2 - SIMS Europe CY - Münster, Germany DA - 2012-09-09 PY - 2012 AN - OPUS4-27165 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan A1 - Rackwitz, Vanessa A1 - Procop, M. T1 - Test Materials and Procedures for the day-by-day Performance Check of X-Ray Spectrometers attached to a SEM in Compliance with ISO 15632 T2 - 17. Arbeitstagung "Angewandte Oberflächenanalytik" AOFA CY - Soest, Germany DA - 2012-09-24 PY - 2012 AN - OPUS4-27149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Girard-Lauriault, P.-L. A1 - Unger, Wolfgang A1 - Dietrich, Paul A1 - Gross, Thomas T1 - Is Quantitative CD-XPS of Plasma Deposited Organic Coatings a Valid Analytical Procedure? T2 - 13th International Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2012-09-10 PY - 2012 AN - OPUS4-27144 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzweber, Markus A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Kollmer, F. T1 - BAM-L200: Anew type of refrence material for the determination of lateral resolution and the calibration of length scale T2 - Fachtagung Nano-Additive CY - Berlin, Germany DA - 2012-11-19 PY - 2012 AN - OPUS4-27182 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fischer, Tobias A1 - Hecht, Mandy A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Rurack, Knut T1 - Development of a dual XPS and Fluorescence Label for the Analysis of Surface Amino Groups T2 - ThGOT, 8. Thementage Grenz und Oberflächentechnik CY - Leipzig, Germany DA - 2012-09-04 PY - 2012 AN - OPUS4-26850 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Optimierung von Microarrays durch Anwendung physikalischer Methoden der chemischen Oberflächenanalytik T2 - Arbeitstreffen "Quantitative Analytik von (Protein-)Microarrays" CY - Potsdam, Germany DA - 2012-10-04 PY - 2012 AN - OPUS4-27145 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Referenzmaterialien für die Oberflächen- und Mikrobereichsanalytik: Stand und zukünftige Entwicklungen T2 - Festkolloquium 100 Jahre Referenzmaterialien der BAM 1912 - 2012 CY - Berlin, Germany DA - 2012-11-15 PY - 2012 AN - OPUS4-27141 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Zum Stand von Normung in der Oberflächenanalytik T2 - 17. Arbeitstreffen "Angewandte Oberflächenanalytik" AOFA CY - Soest, Germany DA - 2012-09-24 PY - 2012 AN - OPUS4-27150 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - X-ray Photoelectron Spectroscopy (XPS) T2 - Workshop: Instrumentierung für das Avogadro-Projekt CY - Berlin, Germany DA - 2012-08-03 PY - 2012 AN - OPUS4-27142 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kühn, Julius A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Gorgoi, M. A1 - Nörthemann, K. A1 - Moritz, W. T1 - Composition and Chemistry of Pd-Ni-Co thin film alloy studied by HAXPES T2 - DPG-Frühjahrstagung der Sektion Kondensierte Materie (SKM), DS 30: Thin Film Characterization: Structure Analysis and Composition II CY - Regensburg, Germany DA - 2013-03-10 PY - 2013 AN - OPUS4-28043 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -