TY - CONF A1 - Radtke, Martin A1 - de Oliveira Guilherme Buzanich, Ana A1 - Reinholz, Uwe A1 - Emmerling, Franziska T1 - Materials research with synchrotron radiation N2 - Synchrotron radiation sources with their unique properties in terms of intensity, polarization and adjustability offer a wide range of possibilities in materials research. A basic introduction about the creation and special properties of synchrotron radiation will be given. Examples of current work at BAMline, the high-energy measuring facility of the Federal Institute for Materials Research and Testing at the synchrotron BESSY, are used to illustrate the possibilities and limitations of existing measuring methods. It will be shown how the formation of corrosion layers can be tracked, how the abrasion of implants leads to the introduction of heavy metals into the surrounding bone matrix and how the detection of smallest impurities in gold is possible by optimizing the measuring conditions. Finally, an outlook at the hardware and software developments to be expected in the coming years is given. T2 - INCT-FNA Symposium 2019 CY - Niteroi, Brazil DA - 27.05.2019 KW - Synchrotron KW - XRF KW - XANES KW - EXAFS KW - TXRF KW - Color X-ray Camera PY - 2019 AN - OPUS4-48897 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fittschen, U. A1 - Hampel, S. A1 - Till, H. A1 - Gross, A. A1 - Kulow, Anicó A1 - de Oliveira Guilherme Buzanich, Ana A1 - Reinholz, Uwe A1 - Ingerle, D. A1 - Streli, C. A1 - Radtke, Martin T1 - Improving surface sensitive XRF using ink jet printing and information from the angle dependent signal N2 - Total Reflection X-ray Fluorescence (TXRF) is a small footprint, ressource efficient micro-analytical tool for trace elemental determination. However, depending on the matrix TXRF is also challenging in several ways: the preparation of a representative aliquot maybe difficult for slurries, shading effects and matrix effects may occur and the applicability of an IS maybe hampered by interferences (fitting may be impaired as well) or inhomogeneities. It is therefore crucial to understand and if applicable mitigate the influence of the before mentioned phenomena. We have used the small volume approach using pL droplets to study shading in TXRF previously.Using this approach thin specimens in a favorable geometry are prepared with a well defined morphology; this way minimizing matrix effects and shading. To be used as standard it is also necessary to determine the delivered elemental amounts. Here we will present on the performance of a commercial ink-jet printer cartridge to deliver defined volumes and elemental amounts. The microscopic specimens obtained have been successfully applied to determine relative sensitivities in TXRF and prepare references to study coded apertures in grazing incidence full field micro-XRF.The homogeneous lateral distribution of analyte and IS may be probed by micro-XRF, to obtain information on alikeness of analyte and IS. To study the alikeness of the in depth distribution (film-like or particle-like) angle scans can deliver valuable data. Here we present first results on angle scans using a prototype GIXRF set up and a commercial TXRF instrument. T2 - Denver X-Ray Conference CY - Online meeting DA - 03.08.2020 KW - TXRF KW - Coded Aperture PY - 2020 AN - OPUS4-51913 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Witte, Steffen A1 - Radtke, Martin A1 - de Oliveira Guilherme Buzanich, Ana A1 - Grunewald, Christian A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Emmerling, Franziska T1 - XAFS@BAMline N2 - X-ray Absorption fine structure spectroscopy (XAFS) is a frequently employed technique in order to investigate structural composition and Change of chemical compounds such as catalytic species or corrosion processes. These structural properties are essential (i) to understand underlying reaction mechanism and (ii) to further improve the design of materials. While XAFS measurements are usually performed with ionization Chambers or simple fluorescence detectors, we at BAMline specialize in measurements with innovative set-ups that meet Specialrequirements such as time resolution, (3D-) spatial Resolution or demanding sample environments. This contribution presents various available XAFS configurations with their corresponding applications. In particular, these comprise single -shot XAFS for time- resolved measurements, grazing-exit XAFS with energy and a spatially resolved detector for the characterization of thin films and an in situ grazing incidence Setup for the characterization of corrosion layers. Additionally,the possibility of analyzing Minute samples in total-reflection geometry is demonstrated. T2 - EXRS 2018 CY - Ljubljana, Slovenia DA - 24.06.2018 KW - XANES KW - XAFS KW - BAMline KW - Synchrotron KW - TXRF PY - 2018 AN - OPUS4-46361 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -