TY - CONF A1 - Abad Andrade, Carlos Enrique T1 - The use of reference materials to improve the calibration strategy in glow discharge optical emission spectroscopy with machine learning N2 - Glow discharge optical emission spectroscopy (GD-OES) is a technique for the analysis of solids such as metals, semiconductors, and ceramics. A low-pressure glow discharge plasma is applied in this system, which ‘sputters’ and promotes the sample atoms to a higher energy state. When the atoms return to their ground state, they emit light with characteristic wavelengths, which a spectrometer can detect. Thus, GD-OES combines the advantages of ICP-OES with solid sampling techniques, which enables it to determine the bulk elemental composition and depth profiles. However, direct solid sampling methods such as glow-discharge spectroscopy require reference materials for calibration due to the strong matrix effect. Reference materials are essential when the accuracy and reliability of measurement results need to be guaranteed to generate confidence in the analysis. These materials are frequently used to determine measurement uncertainty, validate methods, suitability testing, and quality assurance. In addition, they guarantee that measurement results can be compared to recognized reference values. Unfortunately, the availability of certified reference materials suited to calibrate all elements in different matrix materials is limited. Therefore various calibration strategies and the preparation of traceable matrix-matched calibration standards will be discussed. Machine learning is an essential component of the growing field of data science. Through statistical methods, algorithms are trained to make classifications or predictions, uncovering key insights within data mining projects. Therefore, it was tried in our work to combine GD-OES with machine learning strategies to establish a new and robust calibration model, which can be used to identify the elemental composition and concentration of metals from a single spectrum. For this purpose, copper reference materials from different manufacturers, which contain various impurity elements, were investigated using GD-OES. The obtained spectra information are evaluated with different algorithms (e.g., gradient boosting and artificial neural networks), and the results are compared and discussed in detail. T2 - Winter Conference on Plasma Chemistry 2022 CY - Tucson, AZ, USA DA - 17.01.2022 KW - GDOES KW - Machine learning KW - Reference materials KW - Calibration KW - Cooper PY - 2022 AN - OPUS4-56497 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - How to get it right with photoluminescence measurements in the UV/VIS/NIR N2 - Optical measurements of transparent solutions of organic dyes and semiconductor quantum dots and scattering materials such as luminescent nanocomposites and microparticles and phosphors dispersed in liquid and solid matrices play an important role in energy conversion, solid-state lighting, medical diagnostics, and security barcoding. A key performance parameter is the photoluminescence quantum yield QY, i.e., the number of emitted per number of absorbed photons. QY of transparent luminophore solutions can be obtained relative to a fluorescence QY standard of known QY. Such relative QY measurements require a calibrated spectrofluorometer. Here, we address typical sources of uncertainty for luminescence measurements and relative and absolute QY measurements from the instrument and material side and provide recommendations to circumvent or at least minimize them for transparent and scattering samples in the UV/vis/NIR/SWIR. T2 - Workshop "Photoluminescence Spectroscopy and its application in Materials Research" CY - Vienna, Austria DA - 19.02.2026 KW - Quality assurance KW - Reference material KW - Fluorescence KW - Dye KW - Traceability KW - Metrology KW - Calibration KW - Reference data KW - Reference product KW - Digital certificate KW - NIR KW - Instrument performance validation PY - 2026 AN - OPUS4-65575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -