TY - CONF A1 - Schade, U. A1 - Puskar, L. A1 - Ritter, E. A1 - Beckmann, Jörg T1 - Etalon effects in THz film measurements N2 - Etalon effects in THz transmittance spectra, either taken in time- domain or frequency-domain, often hamper or even hinder the interpretation of film properties. In this paper we discuss the transferability and applicability of spectroscopic methods typically employed in the near and mid infrared spectral range to eliminate the fringes in the transmittance spectra in the THz spectral range. T2 - 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) CY - Buffalo, NY, USA DA - 08.11.2020 KW - THz radiation KW - Total transmittance reflection technique KW - Etalon effects PY - 2020 SN - 978-1-7281-6620-9 DO - https://doi.org/10.1109/IRMMW-THz46771.2020.9370451 SN - 2162-2035 SN - 2162-2027 SP - 1 PB - IEEE CY - Buffalo, NY AN - OPUS4-56943 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schade, U. A1 - Puskar, L. A1 - Golnak, R. A1 - Veber, A. A1 - Beckmann, Jörg T1 - Infrared Attenuate Total Reflection Cell with a Functionalized Surface N2 - ATR cell utilizing chips from silicon wafers is discussed. The cell can be used for wet-chemical analysis on functionalized surfaces. Here, silicon chips are exemplarily "functionalized" by silica layers to provide a hydrophilic or hydrophobic ATR surface in-situ. T2 - 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) CY - Montreal, Quebec, Canada DA - 17.09.2023 KW - THz radiation KW - ATR KW - FTIR PY - 2023 DO - https://doi.org/10.1109/IRMMW-THz57677.2023.10298918 SP - 1 PB - IEEE CY - New York, NY AN - OPUS4-59326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -