TY - CONF A1 - Kianinejad, kaveh A1 - Fedelich, Bernard A1 - Darvishi Kamachali, Reza A1 - Schriever, Sina A1 - Manzoni, Anna Maria A1 - Agudo Jácome, Leonardo A1 - Megahed, Sandra A1 - Kamrani, Sepideh A1 - Saliwan-Neumann, Romeo T1 - Experimentally informed multiscale creep modelling of additive manufactured Ni-based superalloys N2 - Excellent creep resistance at elevated temperatures, i.e. T / T_m> 0.5, due to γ-γ’ microstructure is one of the main properties of nickel-based superalloys. Due to its great importance for industrial applications, a remarkable amount of research has been devoted to understanding the underlying deformation mechanism in a wide spectrum of temperature and loading conditions. Additive manufactured (AM) nickel-based superalloys while being governed by similar γ-γ’ microstructure, exhibit AM-process specific microstructural characteristics, such as columnar grains, strong crystallographic texture (typically <001> fiber texture parallel to build direction) and compositional inhomogeneity, which in turn leads to anisotropic creep response in both stationary and tertiary phases. Despite the deep insights achieved recently on the correlation between process parameters and the resulting microstructure, the anisotropic creep behavior and corresponding deformation mechanism of these materials are insufficiently understood so far. One reason for this is the lack of capable material models that can link the microstructure to the mechanical behavior. To overcome this challenge, a multiscale microstructure-based approach has been applied by coupling crystal plasticity (CP) and polycrystal model which enables the inclusion of different deformation mechanisms and microstructural characteristics such as crystallographic texture and grain morphology. The method has been applied to experimental data for AM-manufactured INCONEL-738LC (IN738). The effect of different slip systems, texture, and morphology on creep anisotropy at 850°C has been investigated. Results suggest a strong correlation between superlattice extrinsic stacking fault (SESF) and microtwinning and observed creep anisotropy. T2 - EUROMAT 23 CY - Frankfurt a. M., Germany DA - 04.09.2023 KW - IN738LC KW - Creep anisotropy KW - Crystal plasticity PY - 2023 AN - OPUS4-58263 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dudziak, Mateusz A1 - Topolniak, Ievgeniia A1 - Silbernagl, Dorothee A1 - Altmann, Korinna A1 - Sturm, Heinz T1 - Long-time behavior of surface properties of microstructures fabricated by multiphoton lithography N2 - The multiphoton lithography (MPL) technique represents the future of 3D microprinting, enabling the production of complex microscale objects with high precision. Although the MPL fabrication parameters are widely evaluated and discussed, not much attention has been given to the microscopic properties of 3D objects with respect to their surface properties and time-dependent stability. These properties are of crucial importance when it comes to the safe and durable use of these structures in biomedical applications. In this work, we investigate the surface properties of the MPL-produced SZ2080 polymeric microstructures with regard to the physical aging processes during the post-production stage. The influence of aging on the polymeric microstructures was investigated by means of Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS). As a result, a time-dependent change in Young’s Modulus, plastic deformation, and adhesion and their correlation to the development in chemical composition of the surface of MPL-microstructures are evaluated. The results presented here are valuable for the application of MPL-fabricated 3D objects in general, but especially in medical technology as they give detailed information of the physical and chemical time-dependent dynamic behavior of MPL-printed surfaces and thus their suitability and performance in biological systems. KW - Multiphoton lithography KW - Additive manufacturing KW - Microfabrication KW - SZ2080 negative photo-resist KW - Young´s modulus KW - Aging KW - Surface properties KW - X-ray photoelectron spectroscopy KW - Atomic force microscopy KW - Force-distance-curve PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-542166 DO - https://doi.org/10.3390/nano11123285 SN - 2079-4991 VL - 11 IS - 12 SP - 1 EP - 12 PB - MDPI CY - Basel AN - OPUS4-54216 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Raschpichler, C. A1 - Goroncy, C. A1 - Langer, B. A1 - Antonsson, E. A1 - Wassermann, B. A1 - Graf, C. A1 - Klack, Patrick A1 - Lischke, T. A1 - Rühl, E. T1 - Surface Properties and Porosity of Silica Particles Studied by Wide-Angle Soft X-ray Scattering N2 - Wide-angle soft X-ray scattering on free silica particles of different porosity prepared in a beam is reported. The explored q region is mostly dominated by features due to surface roughness and bulk porosity. A comprehensive experimental and theoretical analysis of silica particles of different porosity is presented for various incident photon energies. A correlation analysis, based on the theory of Porod, is used to test the validity of exact Mie theory in different pore density limits. The ability of the discrete dipole scattering model (DDSCAT) to resolve local effects, caused by various pore distributions, is discussed. Characteristic differences between the soft X-ray scattering patterns of the particle samples of different surface properties and porosity are detected. For all mentioned cases, it was confirmed that the effective radius concept of the Guinier model can be successfully extended to Mie theory and DDSCAT in describing the additive contributions of the primary particles, including a thin inhomogeneous solvent-rich surface shell and empty bulk pores. Close agreement, within ±15%, between the calculated and observed pore sizes and porosity values is reached. The influence of pores is alternatively described either in terms of secondary Mie scattering, which is modulated by the local internal electrical field within the particles, or by an independent Mie scattering process induced by the incident field on isolated pores. It is found that for the typical pore/particle size ratios the latter approach presents the best choice. KW - Wide-Angle Soft X‑ray Scattering KW - Silica KW - Porosity PY - 2020 DO - https://doi.org/10.1021/acs.jpcc.0c04308 SN - 1932-7447 SN - 1932-7455 VL - 124 SP - 16663 EP - 16674 AN - OPUS4-51089 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -