TY - CONF A1 - Zscherpel, Uwe A1 - Nazarzadehmoafi, Maryam A1 - Yuan, Mingshuan A1 - Waske, Anja T1 - X-ray back scatter techniques for additive manufacturing N2 - X-ray back scatter imaging is rarely applied compared to classical X-ray projection imaging. More than 20 years ago the company Philips developed “COMSCAN”, a first application case for aircraft industry, which allowed even a depth resolution using back scatter imaging. The company AS&E in Boston offers back scatter imaging solutions for the security market. The principle is to scan the object with a highly collimated X-ray needle beam from one side only and to detect the backscattered radiation by a large area detector side by side with the collimation wheel. A new prototype is investigated at BAM for application and optimization in non-destructive testing. As modern industrial application field in-situ inspection in additive manufacturing is targeted. The accessibility of the printed part during the production process is very limited. This prevent the application of a two sided X-ray inspection or Computed Tomography, were an rotation of the object is required to acquire projections from 360 degrees. An important advantage for the X-ray back scatter technique are also the materials used in additive manufacturing (polymers, ceramics, light metals like Aluminum or Titanium). These materials with lower density and lower Z values give better scatter signals than metals with higher densities and Z values. The back scatter intensity decreases with increasing density and Z value of the material. But the requirements on spatial resolution and contrast sensitivity are more stringent for non-destructive testing of additive manufactured parts compared to the security area. In NDT sizes of indications smaller than 1 mm have to be detected clearly. The investigation of these limits on a state-of-the-art prototype for X-ray back scattering using rotating collimated X-ray needle beams is a part of the BAM project “ProMoAM”. The contribution shows first results of the optimization for NDT and the achieved application limits for several example cases. T2 - International Symposium on Nondestructive Characterization of Materials CY - Portoroz, Slovenia DA - 17.09.2019 KW - Non-destructive testing KW - X-ray back scattering KW - Additive Manufacturing PY - 2019 AN - OPUS4-50523 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe T1 - X-ray back scatter techniques for additive manufacturing N2 - X-ray back scatter imaging is rarely applied compared to classical X-ray projection imaging. 20 years ago the company Philips developed “COMSCAN”, a first application case in the aircraft industry, which allowed even a depth resolution using back scatter imaging. The company AS&E in Boston offers back scatter imaging solutions for the security market. Their principle is to scan the object with a highly collimated X-ray needle beam from one side only and detect the backscattered radiation by a large area detector side by side with the collimation wheel. A new prototype is investigated at BAM for application and optimization in non-destructive testing. As modern industrial application field in-situ testing in additive manufacturing is targeted. The accessibility of the printed part during the production process is very limited. This prevent the application of a two sided X-ray inspection or Computed Tomography, were an rotation of the object is required to acquire projections from 360 degrees. An important advantage for the X-ray back scatter technique are also the materials used in additive manufacturing (polymers, ceramics, light metals like Aluminum or Titanium). These materials with lower density and lower Z values give better scatter signals than metals with higher densities and Z values. The back scatter intensity decreases with increasing density and Z value of the material. But the requirements on spatial resolution and contrast sensitivity are more stringent for non-destructive testing of additive manufactured parts compared to the security area. In NDT sizes of indications smaller than 1 mm have to be detected clearly. The investigation of these limits on a stateof-the-art prototype for X-ray back scattering using rotating collimated X-ray needle beams is a part of the BAM project “ProMoAM”. The contribution shows first results of the optimization for NDT and the achieved application limits for several example cases. T2 - International symposium on digital industrial radiology and computed tomography DIR2019 CY - Fürth, Germany DA - 02.07.2019 KW - Radiographic testing KW - X-ray back scattering KW - Additive manufacturing PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-505317 UR - https://www.ndt.net/search/docs.php3?id=24760 AN - OPUS4-50531 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Zscherpel, Uwe A1 - Nazarzadehmoafi, Maryam A1 - Yuan, Mingchuan A1 - Waske, Anja T1 - X-ray back scatter techniques for additive manufacturing N2 - X-ray back scatter imaging is rarely applied compared to classical X-ray projection imaging. 20 years ago the company Philips developed “COMSCAN”, a first application case in the aircraft industry, which allowed even a depth resolution using back scatter imaging. The company AS&E in Boston offers back scatter imaging solutions for the security market. Their principle is to scan the object with a highly collimated X-ray needle beam from one side only and detect the backscattered radiation by a large area detector side by side with the collimation wheel. A new prototype is investigated at BAM for application and optimization in non-destructive testing. As modern industrial application field in-situ testing in additive manufacturing is targeted. The accessibility of the printed part during the production process is very limited. This prevent the application of a two sided X-ray inspection or Computed Tomography, were an rotation of the object is required to acquire projections from 360 degrees. An important advantage for the X-ray back scatter technique are also the materials used in additive manufacturing (polymers, ceramics, light metals like Aluminum or Titanium). These materials with lower density and lower Z values give better scatter signals than metals with higher densities and Z values. The back scatter intensity decreases with increasing density and Z value of the material. But the requirements on spatial resolution and contrast sensitivity are more stringent for non-destructive testing of additive manufactured parts compared to the security area. In NDT sizes of indications smaller than 1 mm have to be detected clearly. The investigation of these limits on a stateof-the-art prototype for X-ray back scattering using rotating collimated X-ray needle beams is a part of the BAM project “ProMoAM”. The contribution shows first results of the optimization for NDT and the achieved application limits for several example cases. T2 - 72. annual assembly of the international institute of welding 2019 CY - Bratislava, Slovakia DA - 07.07.2019 KW - Nondestructive tesing KW - X-ray back scattering KW - Additive manufacturing PY - 2019 AN - OPUS4-50534 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Evsevleev, Sergei A1 - Mishurova, Tatiana A1 - Khrapov, D. A1 - Paveleva, A. A1 - Meinel, Dietmar A1 - Surmenev, R. A1 - Surmeneva, M. A1 - Koptyug, A. A1 - Bruno, Giovanni T1 - X-ray Computed Tomography Procedures to Quantitatively Characterize the Morphological Features of Triply Periodic Minimal Surface Structures N2 - Additively manufactured (AM) metallic sheet-based Triply Periodic Minimal Surface Structures (TPMSS) meet several requirements in both bio-medical and engineering fields: Tunable mechanical properties, low sensitivity to manufacturing defects, mechanical stability, and high energy absorption. However, they also present some challenges related to quality control, which can prevent their successful application. In fact, the optimization of the AM process is impossible without considering structural characteristics as manufacturing accuracy, internal defects, as well as surface topography and roughness. In this study, the quantitative non-destructive analysis of TPMSS manufactured from Ti-6Al-4V alloy by electron beam melting was performed by means of X-ray computed tomography (XCT). Several advanced image analysis workflows are presented to evaluate the effect of build orientation on wall thicknesses distribution, wall degradation, and surface roughness reduction due to the chemical etching of TPMSS. It is shown that the manufacturing accuracy differs for the structural elements printed parallel and orthogonal to the manufactured layers. Different strategies for chemical etching show different powder removal capabilities and both lead to the loss of material and hence the gradient of the wall thickness. This affects the mechanical performance under compression by reduction of the yield stress. The positive effect of the chemical etching is the reduction of the surface roughness, which can potentially improve the fatigue properties of the components. Finally, XCT was used to correlate the amount of retained powder with the pore size of the functionally graded TPMSS, which can further improve the manufacturing process. KW - Metamaterials KW - Functionally graded porous structure KW - Triply periodic minimal surface structures KW - Roughness analysis KW - Powder removal KW - Deep learning segmentation PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-528142 DO - https://doi.org/10.3390/ma14113002 VL - 14 IS - 11 SP - 3002 PB - MDPI AN - OPUS4-52814 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Cohen, Zina A1 - Schlanger, J. A1 - Rabin, Ira T1 - X-Ray Fluorescence Analysis of black Medieval Inks: Characterization and Interpretation. Case Study of an 11th century Egyptian Corpus N2 - This study focuses on the analysis of a corpus of manuscripts found in Fustat (medieval Cairo, Egypt) in the biggest medieval “archive” found until now: the Cairo Geniza. The giant collection of mostly Jewish documents has been attracting scholars’ attention a lot but so far, the material aspects of these documents seem to have been mainly neglected. Application of scientific methods of analysis, especially X-Ray fluorescence characterization, contributes to our understanding of the materials used for production of manuscripts during the Middle ages. Our corpus of the 11th century manuscripts comprises manuscripts written by scribes belonging to three Jewish communities that co-existed in Cairo during this period: the Karaites, the so-called Jerusalemites (or Palestinian) and the so-called Babylonians (or Iraqi), three different communities with different traditions and different leaders. The differences manifest themselves also in the paleographical properties of the manuscripts produced within each community. Can we extend the differences detected by the paleographical analysis to differences in composition of the writing materials and especially the composition of the inks? Or can we relate the differences in the composition to the manuscript type (legal, private...), or to another criterion. In this presentation, we offer answers to some of the questions using statistical analysis of the measurements results. T2 - Konferenz Natural Sciences and Technology in Manuscript Analysis CY - Hamburg, Germany DA - 13.06.2018 KW - Ink KW - Manuscript KW - XRF analysis PY - 2018 AN - OPUS4-46044 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kulow, Anicó A1 - Reinholz, Uwe A1 - de Oliveira Guilherme Buzanich, Ana A1 - Emmerling, Franziska A1 - Streli, C. A1 - Radtke, Martin T1 - X-ray fluorescence imaging with coded apertures N2 - Our aim is to develop a new simple and inexpensive method for full field X-ray fluorescence imaging . We combine an energy dispersive array detector with a coded aperture to obtain high resolution images . To obtain the information from the recorded image a reconstruction step is necessary . The reconstruction methods we have developed , were tested on simulated data and then applied to experimental data . The first tests were carried out at the BAM line @ BESSY II. This method enables the simultaneous detection of multiple elements , which is important e.g. in the field of catalysis. T2 - Adlershofer Forschungsforum CY - Berlin, Germany DA - 11.11.2019 KW - X-ray KW - Fluorescence KW - Imaging KW - Spectroscopy KW - Coded aperture PY - 2019 AN - OPUS4-49695 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kulow, Anicó A1 - Radtke, Martin A1 - de Oliveira Guilherme Buzanich, Ana A1 - Streli, C. T1 - X-ray fluorescence imaging with coded apertures N2 - Our aim is to develop a new method for full field X ray fluorescence imaging at the BAM line @ BESSY II. We will combine an energydispersive array detector for X rays with a coded aperture to get high resolution images . In coded aperture imaging , an object is projected through a mask , producing many overlapping images on the detector . The first part of the project is to perform raytracing simulations to get realistic data and to develop a reconstruction method that allows to get the Information about the investigated object out of the projected image . T2 - Symposium "IRIS 2019" CY - Berlin, Germany DA - 24.10.2019 KW - X-ray spectroscopy KW - X-ray fluorescence KW - Imaging KW - Coded Apertures PY - 2019 AN - OPUS4-49434 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kulow, Anicó A1 - Reinholz, Uwe A1 - de Oliveira Guilherme Buzanich, Ana A1 - Emmerling, Franziska A1 - Streli, C. A1 - Radtke, Martin T1 - X-ray fluorescence imaging with coded apertures N2 - We developed a new method for full field X-ray fluorescence imaging at the BAMline @ BESSY II. We combined an energy dispersive array detector for X-rays with a coded aperture to get high resolution images. In coded aperture imaging, an object is projected through a mask, producing many overlapping images on the detector. To get the information about the investigated object out of the projected image, a decoding step is necessary. The first part of our project was to develop the decoding algorithms. We tested the reported reconstruction with an antimask and compared the results with the performance of self-written reconstruction programs based on an iterative and a genetic algorithm. First tests were performed with raytracing simulations. The next step was the collection of experimental data at the BAMline @ BESSY II (HZB). A test objects could be successfully reconstructed with our newly developed algorithm. T2 - PRORA 2019 CY - Berlin, Germany DA - 28.11.2019 KW - X-ray KW - Imaging KW - Fluorescence KW - Coded apertures PY - 2019 AN - OPUS4-49963 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radtke, Martin T1 - X-Ray fluorescence with synchrotron radiation basics and applications N2 - In this talk, the features of X-ray fluorescence analysis with synchrotron radiation will be presented. First, the basics of the origin of synchrotron radiation and X-ray fluorescence analysis and the experimental setup will be discussed. Then, examples of trace element detection, micrometer resolution, and application of the X-ray color camera will be shown. T2 - HZB Photon school 2020 CY - Berlin, Germany DA - 09.03.2020 KW - Synchrotron KW - BAMline KW - XRF KW - Machine learning PY - 2020 AN - OPUS4-51894 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Pauw, Brian Richard T1 - X-ray generation N2 - This talk was recorded during the 2020 Better with Scattering workshop held at BAM in Berlin. This educational talk explains the various ways in which X-rays can be generated in the lab as well as at the synchrotron, with benefits and drawbacks for all. T2 - Better with Scattering workshop 2020 CY - BAM, Berlin, Germany DA - 16.03.2020 KW - Small angle scattering KW - X-ray instrumentation KW - X-ray generation PY - 2020 UR - https://www.youtube.com/watch?v=Hze3PvcK7es AN - OPUS4-51016 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silva, W. A1 - Lopes, R. A1 - Zscherpel, Uwe A1 - Meinel, Dietmar A1 - Ewert, Uwe T1 - X-ray imaging techniques for inspection of composite pipelines N2 - The literature has shown that the application of laminography provides advantages as 3D radiographic imaging with depth information for in house and mobile testing. This permits to distinguish between overlapping indications, measure the extension along radiation direction and classify indications as surface open or subsurface ones as required in critical engineering assessment. This work provides a comparative study and measurements of the three techniques Digital Radiography (DR) with Digital Detector Arrays (DDA), Coplanar Translational Laminography (CTL) and Computed Tomography (CT), applied for composite pipeline inspection. It is demonstrated that CTL and CT provide advantages for the evaluation of pipe-to-pipe connections and the evaluation of adhesive applications. They show indications of discontinuities with higher contrast sensitivity than radiography. Beyond it, two specimen, namely Phantom 1 and Phantom 2, were developed and manufactured by additive manufacturing to analyze the preferential detection sensitivity and the direction of features and depth information for laminographic measurements. Another goal was to show the laminographic capabilities to distinguish between overlapping discontinuities. CTL is especially suitable for mobile inspection. Special glass fiber reinforced polymer samples (GRP) were manufactured for further analysis and comparisons between the abovementioned techniques. Finally, Phantoms 1 and 2 show the capability of laminography to detect overlapping indications and also show that discontinuities oriented perpendicular to the scan direction have the highest contrast sensitivity for laminographic measurements. KW - Digital Radiography KW - Laminography KW - Computed Tomography KW - Composite Pipes KW - Image Quality PY - 2021 DO - https://doi.org/10.1016/j.micron.2021.103033 SN - 0968-4328 VL - 145 SP - 103033 PB - Elsevier Ltd. AN - OPUS4-52415 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kulow, Anicó T1 - X-ray imaging with coded apertures N2 - Coded aperture imaging systems are in use in astrophysics since the 1960's. We want to adapt this technique for full field x-ray fluorescence imaging in combination with a color-x-ray-camera. T2 - Seminar des Atominstituts der TU Wien CY - Vienna, Austria DA - 14.05.2019 KW - Reconstruction KW - X-ray spectroscopy KW - X-ray fluorescence KW - Spectroscopy KW - Imaging KW - Coded apertures PY - 2019 AN - OPUS4-47997 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Waske, Anja A1 - Funk, Alexander A1 - Jaenisch, Gerd-Rüdiger A1 - Zscherpel, Uwe A1 - Moosavi, Robabeh A1 - Grunwald, Marcel A1 - Hohendorf, Stefan A1 - Onel, Yener A1 - Redmer, Bernhard T1 - X-ray Non-destructive testing of materials and composites N2 - Functional materials for energy conversion are important technology drivers needed for the implementation of low carbon energy. Therefore, researchers commonly focus on improving the intrinsic properties of a functional material. However, for applications, the extrinsic properties are at least as important as the intrinsic ones. Consequently, it is important to investigate and understand the external and internal structure of semi-finished products and especially defect dependent properties. The extrinsic properties may change during application and the life cycle of the material as well as through processing and molding steps. Our studies show how X-ray tomographic (XCT) investigations can contribute to structure investigations in composites and massive samples using the example of magnetic materials for energy conversion. T2 - Ruhr Universität Bochum - Seminar materials science and technology CY - Online meeting DA - 12.11.2020 KW - X-ray imaging KW - Non-destructuve testing KW - Functional materials PY - 2020 AN - OPUS4-51905 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Radnik, Jörg ED - Wandelt, K. T1 - X-ray photoelectron spectroscopy for investigation of heterogeneous catalytic process N2 - Heterogeneous catalysis is a key technology in modern industrial societies. The main steps of a catalytic process take place at the surfaces of complex materials. For the investigations of these surfaces X-ray photoelectron spectroscopy is widely used and fits ideally. At some suitable examples, it will be explained how XPS can help to understand such catalysts better. The focus is on selective oxidation catalysts, one of the main challenges of present research. Here it will illustrate, how changes in the near surface region influence the catalyst performance and, herewith the different stages (activation, maximum performance and deactivation) in the life of catalysts. Additionally, it will be stressed out how important information at different depth regions (surface, near-surface region, bulk) can be useful for comprehensive understanding of the material. Another important subject is nanostructured catalysts with molecular sieves as supports or defined complexes as precursors. Finally, the combination of XPS with other methods used in the analysis of catalysts, e.g. electron microscopy, X-ray absorption spectroscopy and low energy ion scattering will be discussed. KW - X-ray photoelectron spectroscopy KW - Depth information KW - Heterogeneous catalysis KW - Structure-properties relationships PY - 2018 SN - 978-0-12-809739-7 VL - 1 SP - 607 EP - 614 PB - Elsevier AN - OPUS4-44876 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Serrano, Itziar A1 - Müller, Bernd A1 - Kupsch, Andreas A1 - Bruno, Giovanni A1 - Laquai, Rene' T1 - X-ray refractio techniques non-destructively quantify and classify defects in am materials N2 - X-ray refraction is analogous to visible light deflection by matter; it occurs at boundaries between different media. The main difference between visible light and X-rays is that in the latter case deflection angles are very small, from a few seconds to a few minutes of arc (i.e., the refraction index n is near to 1). Importantly, deflection of X-rays is also sensitive to the orientation of the object boundaries. These features make X-ray refraction techniques extremely suitable to a) detect defects such as pores and microcracks and quantify their densities in bulk (not too heavy) materials, and b) evaluate porosity and particle properties such as orientation, size, and spatial distribution (by mapping). While X-ray refraction techniques cannot in general image single defects, they can detect objects with size above a few wavelengths of the radiation. Such techniques, especially at the Synchrotron BESSY II, Berlin, Germany, can be used in-situ, i.e. when the specimen is subjected to temperatures or external loads. The use of X-ray refraction analysis yields quantitative information, which can be directly input in kinetics, mechanical and damage models. We hereby show the application of non-destructive X-ray refraction radiography (SXRR, 2D mapping also called topography) to problems in additive manufacturing: 1) Porosity analysis in PBF-LM-Ti64. Through the use of SXRR, we could not only map the (very sparse) porosity distribution between the layers and quantify it, but also classify, and thereby separate, the filled porosity (unmolten powder) from the keyhole and gas pores (Figure 1). 2) In-situ heat treatment of laser powder bed fusion PBF-LM-AlSi10Mg to monitor microstructure and porosity evolution as a function of temperature (Figure 2). By means of SXRR we indirectly observed the initial eutectic Si network break down into larger particles as a function of increasing temperature. We also could detect the thermally induced porosity (TIP). Such changes in the Si-phase morphology upon heating is currently only possible using scanning electron microscopy, but with a much smaller field-of-view. SXRR also allows observing the growth of some individual pores, usually studied via X-ray computed tomography, but again on much smaller fields-of-view. Our results show the great potential of in-situ SXRR as a tool to gain in-depth knowledge of the defect distribution and the susceptibility of any material to thermally induced damage and/or microstructure evolution over statistically relevant volumes. T2 - AAMS 2023 CY - Madrid, Spain DA - 27.09.2023 KW - X-ray Refaction radiography KW - Defects KW - Large Scale Facilities KW - Computed tomography PY - 2023 AN - OPUS4-58508 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Müller, Bernd R. A1 - Kasperovich, G. A1 - Haubrich, J. A1 - Requena, G. A1 - Bruno, Giovanni T1 - X-ray refraction distinguishes unprocessed powder from empty pores in selective laser melting Ti-6Al-4V N2 - For the first time, X-ray refraction techniques are proven for the identification of void formation in Ti-6Al-4V parts produced by selective laser melting. The topology and volume fraction of pores are measured in samples produced with different laser energy density. Unique X-ray refraction methods identify different kinds of defects, characteristic to the regions below and above the Optimum laser energy density, namely unprocessed powder (unmolten powder particles, balling effect, and Fusion defects) from empty keyhole pores. Furthermore, it is possible to detect small inhomogeneities (voids or cracks) with sizes below the spatial resolution of optical microscopy and X-ray computed tomography. KW - Additive manufacturing KW - X-ray refraction KW - Microscopy KW - X-ray computed tomography KW - Porosity PY - 2018 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-434041 DO - https://doi.org/10.1080/21663831.2017.1409288 SN - 2166-3831 VL - 6 IS - 2 SP - 130 EP - 135 PB - Taylor & Francis Group CY - London, UK AN - OPUS4-43404 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Pauw, Brian Richard A1 - Smales, Glen Jacob T1 - X-ray Scattering USAXS/SAXS/WAXS (/XRD/PDF) N2 - A ten minute introduction to the technique of X-ray scattering. This talk discusses the foundation and the resulting morphological parameters that can be obtained from the technique. The talk is prepared for discussion within the framework of the OECD REACH guideline for nanomaterials. T2 - Digitaler Info-Tag "Nano or not Nano" CY - Berlin, Germany DA - 16.02.2023 KW - X-ray scattering KW - BAM Academy KW - SAXS KW - XRD KW - WAXS KW - Nanomaterial KW - REACH KW - OECD KW - Guideline PY - 2023 AN - OPUS4-57013 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Smales, Glen Jacob A1 - Hahn, Marc Benjamin A1 - Hallier, Dorothea C. A1 - Seitz, H. T1 - X-ray scattering datasets and simulations associated with the publication "Bio-SAXS of single-stranded DNA-binding proteins: Radiation protection by the compatible solute ectoine" N2 - This dataset contains the processed and analysed small-angle X-ray scattering data associated with all samples from the publications "Bio-SAXS of Single-Stranded DNA-Binding Proteins: Radiation Protection by the Compatible Solute Ectoine" (https://doi.org/10.1039/D2CP05053F). Files associated with McSAS3 analyses are included, alongside the relevant SAXS data, with datasets labelled in accordance to the protein (G5P), its concentration (1, 2 or 4 mg/mL), and if Ectoine is present (Ect) or absent (Pure). PEPSIsaxs simulations of the GVP monomer (PDB structure: 1GV5 ) and dimer are also included. TOPAS-bioSAXS-dosimetry extension for TOPAS-nBio based particle scattering simulations can be obtained from https://github.com/MarcBHahn/TOPAS-bioSAXS-dosimetry which is further described in https://doi.org/10.26272/opus4-55751. This work was funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under grant number 442240902 (HA 8528/2-1 and SE 2999/2-1). We acknowledge Diamond Light Source for time on Beamline B21 under Proposal SM29806. This work has been supported by iNEXT-Discovery, grant number 871037, funded by the Horizon 2020 program of the European Commission. KW - SAXS KW - Radiation protection KW - Microdosimetry KW - G5P KW - Ectoine KW - DNA-Binding protein PY - 2023 DO - https://doi.org/10.5281/zenodo.7515394 PB - Zenodo CY - Geneva AN - OPUS4-56811 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Smales, Glen Jacob A1 - Pauw, Brian Richard A1 - Kolmangadi, Mohamed Aejaz T1 - X-ray scattering datasets associated with the publication "Molecular Dynamics of Janus Polynorbornenes: Glass Transitions and Nanophase Separation" N2 - X-ray scattering datasets for samples described in the 2020 publication "Molecular Dynamics of Janus Polynorbornenes: Glass Transitions and Nanophase Separation". This dataset includes both raw and processed X-ray scattering data for samples PTCHSiO-Pr, Bu, Hx, Oc and De, alongside background measurements files (BKG). This data was collected using the MOUSE project (instrument and methodology). KW - X-ray scattering KW - SAXS KW - MOUSE KW - Alkyls KW - Polymers PY - 2023 DO - https://doi.org/10.5281/zenodo.7614835 PB - Zenodo CY - Geneva AN - OPUS4-56971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Smales, Glen Jacob A1 - Pauw, Brian Richard A1 - Kolmangadi, Mohamed Aejaz T1 - X-ray scattering datasets associated with the publication "Molecular Mobility of Polynorbornenes with Trimethylsiloxysilyl side groups: Influence of the Polymerization Mechanism" N2 - X-ray scattering datasets for samples described in the 2022 publication "Molecular Mobility of Polynorbornenes with Trimethylsiloxysilyl side groups: Influence of the Polymerization Mechanism". This dataset includes both raw and processed X-ray scattering data for samples APTCN and MPTCN, alongside background measurements files (BKG). KW - X-ray scattering KW - SAXS KW - MOUSE KW - Membrane polymers KW - Microporous polymers PY - 2023 DO - https://doi.org/10.5281/zenodo.7621204 PB - Zenodo CY - Geneva AN - OPUS4-56972 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -