TY - CONF A1 - Ermilova, Elena T1 - Ellipsometry as optical metrology method for analysis of reference materials for nanoelectronics N2 - Electrical properties of materials at the nanoscale can be characterized using scanning microwave microscopes (SMM) and conductive atomic force microscopes (C AFM). However, the measurement results are difficult to compare since different setups and different reference standards are used. The development of new “out-of-lab” reference standards can contribute to the traceability and reliability of these scanning probe microscopy methods (SPM) and facilitate their broader industrial application. In this study, we discuss the capability of optical methods such as ellipsometry for the characterization of existing and the development of new reference calibration samples for scanning microwave microscopy. Ellipsometry is a fast and non-destructive method, which enables very accurate determination of the layer thickness and the dielectric functions of the materials. Imaging ellipsometry is suitable for spatially resolved measurements when analyzing thin layers in microstructured samples. We show how the electrical resistivity of indium tin oxide (ITO) layers in newly designed resistive calibration samples can be obtained from spectroscopic ellipsometric measurements. The extension of the measurement range into the mid-infrared region was necessary when analyzing ITO layers with low conductivity. This parameter was obtained by fitting a Drude function describing the absorption of the free carriers. The impact of the coating process conditions on the layer properties is discussed. Imaging ellipsometry was applied for the characterisation of thin ITO and SiO2 layers in microstructured resistive and capacitance calibration kits. The uncertainties of determined layer thicknesses were specified according to standardized practice guides used in ellipsometry. We show how statistical fingerprint analysis of the measured ellipsometric transfer quantities can be used to validate the quality of potential reference materials for nano-electronics and to monitor the processing of structured samples. T2 - L. ALTECH 2024 - Analytical techniques for accurate nanoscale characterization of advanced materials CY - Strasbourg, France DA - 27.05.2024 KW - Ellipsometry KW - Reference materials KW - Transparent conductive Oxides KW - Scannig probe microscope KW - Metrology KW - Nanoelectronics PY - 2024 AN - OPUS4-60268 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - EMPIR nPSize - Improved Traceability Chain of Nanoparticle Size Measurement; nPSize offer after 2 Ys N2 - The main outcomes of the EMPIR project nPSize are presented and the suitability of the new capabilities (e.g. reference materials, measurement procedures, VAMAS inter-laboratory comparisons) to be standardized and implemented in accredited analytical laboratories is discussed. T2 - EMPIR nPSize Training Course "Metrology for Measurement of Nanoparticle Size by Electron Microscopy and Atomic Force Microscopy" CY - Online meeting DA - 27.10.2020 KW - Nanoparticles KW - Size KW - Shape KW - Traceability KW - EMPIR KW - Reference materials KW - VAMAS PY - 2020 AN - OPUS4-51477 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - Gold nanocubes with monodispersed size distribution (SEM SE) N2 - Gold nanocubes with a monodispersed size distribution (edge = 55 nm) deposited on a silicon wafer. These tiny uniform cubes were produced as reference nanoparticles in the frame of the European project nPSize - Improved traceability chain of nanoparticle size measurements. SEM Image acquired at 10 kV with an in-lens secondary electron detector. Image colored in ImageJ using LUT “Orange hot.” Published in Microscopy and Microanalysis 25(S2) (2019) 2328. KW - Nanoparticles KW - Nanocubes KW - Electron microscopy KW - Reference materials PY - 2020 DO - https://doi.org/10.1017/S1551929520001157 VL - 28 IS - 4 SP - 12 EP - 12 PB - Cambridge University Press CY - Cambridge, UK AN - OPUS4-51352 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Competence Center nano@BAM Welcomes ISO/TC 229 Meeting in Berlin N2 - The Competence Center nano@BAM is presented. Examples directly related to the activities of the ISO Technical Committee TC 229 Nanotechnologies as well as BAM projects on nano reference measurement procedures, nano reference materials and nano reference data sets are showed. T2 - The 32nd ISO/TC 229 IEC/TC 113 JWG2 General Meeting CY - Berlin, Germany DA - 06.11.2023 KW - ISO/TC 229 Nanotechnologies KW - Nanoparticles KW - Nano@BAM KW - Reference materials KW - Reference data KW - Reference procedures PY - 2023 AN - OPUS4-58814 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan T1 - 2020 Microscopy Today Micrograph Awards N2 - Gold nanocubes with a monodispersed size distribution (edge = 55 nm) deposited on a silicon wafer. These tiny uniform cubes were produced as reference nanoparticles within the EMPIR project nPSize - Improved traceability chain of nanoparticle size measurements. SEM image acquired at 10 kV with an in-lens secondary electron detector. Image colored in ImageJ using LUT “Orange hot.” Published in Microscopy and Microanalysis 25(S2) (2019) 2328. KW - Nanoparticles KW - Au-nanocubes KW - Reference materials KW - Electron microscopy PY - 2020 DO - https://doi.org/10.1017/S1551929520001339 VL - 28 IS - 5 SP - 14 EP - 15 PB - Cambridge University Press CY - Cambridge, UK AN - OPUS4-51357 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul T1 - Correlative analysis with electron microscopy applied in different operating modes (SEM, STEM-in-SEM and TEM) for the accurate morphological characterisation of non-spherical fine nanoparticles N2 - Electron microscopy applied in different operating modes, e.g., SEM, TEM or STEM-in-SEM, is the gold standard method to investigate the exact size and shape of individual nanoparticles. However, when fine nanoparticles with a non-monodisperse size distribution and non-spherical shapes are analysed, achieving an accurate result is challenging. Deviations in size measurements of more than 10% may occur. Understanding of the contrasts and sensitivities characteristic to the individual operating modes of an electron microscope is key in interpreting and evaluating quantitatively the measurement uncertainties needed for an eventual certification of specific nanoparticles via traceable results. Further, beyond the pure measurement, the other components in the analysis workflow with significant impact on the overall measurement uncertainties are the sample preparation and the image segmentation. In the present study the same areas of selected iron oxide fine nanoparticles (<25 nm) as reference nanomaterial (candidate) prepared on substrate for electron microscopy imaging are analysed correlatively with SEM, STEM-in-SEM and TEM with respect to their size and shape distribution. Individual significant measurement uncertainties are discussed, e.g., the sensitivity of secondary electron detectors of InLens-type to the surface morphology, particularly to the presence of an ultrathin organic coating or signal saturation effects on the particle edges, to electron beam exposure, to surface contamination, or the selection of the threshold for image segmentation. Another goal of this study is to establish a basis of analysis conditions which shall guarantee accurate results when both manual and particularly (semi-)automated segmentation approaches are applied. Advantages as well as limitations of the use of different electron microscopy operating modes, applied individually and correlatively, are highlighted. T2 - E-MRS 2024 Spring Meeting CY - Strasbourg, France DA - 27.05.2024 KW - Nanoparticles KW - Electron Microscopy KW - Metrology KW - Imaging KW - Reference materials PY - 2024 AN - OPUS4-60436 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul A1 - Hodoroaba, Vasile-Dan T1 - Understanding Correlative Electron Microscopy Imaging with SEM, STEM in SEM and TEM for the Accurate Characterization of Size and Shape of FeOx Nanoparticles N2 - The recently certified reference material (CRM) BAM-N012 as cubical iron oxide FeOx nanoparticles (NPs) of 8 nm area equivalent square edge length (ESL) and the RM candidate BAM-N013 as nearly spherical NPs of 22 nm size were analyzed in detail by electron microscopy (EM). For the metrological characterization with SEM, STEM in SEM and TEM, the understanding of the imaging contrasts and sensitivities, and the correct interpretation of the (art)effects which are inherent to each detection mode is necessary. The same sample areas with NPs deposited on a TEM grid were analyzed by two SEM acquisition modes, i. e. SE InLens and STEM in SEM using a dedicated transmission sample holder, and further, correlatively, analyzed with TEM. With increasing kV, SE InLens shows increasing particle size (unless overcharging at the particle boundaries is filtered), as a known effect. For STEM-in-SEM the particle size decreases significantly and individual particles are identified easier (at 2 kV only a few single particles can be detected automatically). ❑ Documentation of the sample preparation and measurement conditions (including optimization process) is important for reproducibility. ❑ Plasma cleaning, analysis in the transmission mode at SEM is recommended for FeOx NPs. ❑ Selection of the threshold algorithm can significantly alter the reported ECD. T2 - Microscopy and Microanalysis 2024 CY - Cleveland, OH, USA DA - 28.07.2024 KW - Nanoparticles KW - Electron microscopy KW - Iron oxide KW - Reference materials KW - Correlative microscopy KW - Size and shape distribution PY - 2024 AN - OPUS4-60806 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul T1 - Understanding Correlative Electron Microscopy Imaging with SEM, STEM-in-SEM and TEM for the Accurate Characterization of Size and Shape of FeOx Nanoparticles N2 - The recently certified reference material (CRM) BAM-N012 as cubical iron oxide FeOx nanoparticles (NPs) of 8 nm area equivalent square edge length (ESL) and the RM candidate BAM-N013 as nearly spherical NPs of 22 nm size were analyzed in detail by electron microscopy (EM). For the metrological characterization with SEM, STEM in SEM and TEM, the understanding of the imaging contrasts and sensitivities, and the correct interpretation of the (art)effects which are inherent to each detection mode is necessary. The same sample areas with NPs deposited on a TEM grid were analyzed by two SEM acquisition modes, i. e. SE InLens and STEM in SEM using a dedicated transmission sample holder, and further, correlatively, analyzed with TEM. With increasing kV, SE InLens shows increasing particle size (unless overcharging at the particle boundaries is filtered), as a known effect. For STEM-in-SEM the particle size decreases significantly and individual particles are identified easier (at 2 kV only a few single particles can be detected automatically). ❑ Documentation of the sample preparation and measurement conditions (including optimization process) is important for reproducibility. ❑ Plasma cleaning, analysis in the transmission mode at SEM is recommended for FeOx NPs. ❑ Selection of the threshold algorithm can significantly alter the reported ECD. T2 - SALSA Make and Measure 2024: Interfaces CY - Berlin, Germany DA - 11.09.2024 KW - Correlative microscopy KW - Electron microscopy KW - Iron oxide KW - Nanoparticles KW - Reference materials KW - Size and shape distribution PY - 2024 AN - OPUS4-62347 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul T1 - Understanding Correlative Electron Microscopy Imaging with SEM, STEM in SEM and TEM for the Accurate Characterization of Size and Shape of FeOx Nanoparticles N2 - The recently certified reference material (CRM) BAM-N012 as cubical iron oxide FeOx nanoparticles (NPs) of 8 nm area equivalent square edge length (ESL) and the RM candidate BAM-N013 as nearly spherical NPs of 22 nm size were analyzed in detail by electron microscopy (EM). For the metrological characterization with SEM, STEM in SEM and TEM, the understanding of the imaging contrasts and sensitivities, and the correct interpretation of the (art)effects which are inherent to each detection mode is necessary. The same sample areas with NPs deposited on a TEM grid were analyzed by two SEM acquisition modes, i. e. SE InLens and STEM in SEM using a dedicated transmission sample holder, and further, correlatively, analyzed with TEM. With increasing kV, SE InLens shows increasing particle size (unless overcharging at the particle boundaries is filtered), as a known effect. For STEM-in-SEM the particle size decreases significantly and individual particles are identified easier (at 2 kV only a few single particles can be detected automatically). ❑ Documentation of the sample preparation and measurement conditions (including optimization process) is important for reproducibility. ❑ Plasma cleaning, analysis in the transmission mode at SEM is recommended for FeOx NPs. ❑ Selection of the threshold algorithm can significantly alter the reported ECD T2 - 2. Treffen des DGE-Arbeitskreises SEM CY - Stuttgart, Germany DA - 26.09.2024 KW - Correlative microscopy KW - Electron microscopy KW - Iron oxide KW - Nanoparticles KW - Reference materials KW - Size and shape distribution PY - 2024 AN - OPUS4-62349 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Giovannozzi, A T1 - Standardization and Harmonization Effort on Microplastics Analysis by Spectroscopic Methods N2 - This talk presents the EU funded project PlasticTrace. It shows the challenges in micro- and nanoplastic reference materials and gives some solutions regarding spectroscipc methods such as Raman or IR microscopy to determine the particle numbers. Materials are prepared by cryo milling to get some powder that is later pressed into tablets. The polymer type used is PET, because that is highly important for drinking water directive of EU commission. T2 - International Conference on Raman Spectroscopy (ICORS) CY - Roma, Italy DA - 28.07.2024 KW - Microplastics KW - Reference materials KW - Polymer 3R PY - 2024 AN - OPUS4-60881 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pellegrino, Francesco A1 - Ortel, Erik A1 - Mielke, Johannes A1 - Schmidt, R. A1 - Maurino, V. A1 - Hodoroaba, Vasile-Dan T1 - Customizing New Titanium Dioxide Nanoparticles with Controlled Particle Size and Shape Distribution: A Feasibility Study Toward Reference Materials for Quality Assurance of Nonspherical Nanoparticle Characterization N2 - An overview is given on the synthesis of TiO2 nanoparticles with well-defined nonspherical shapes (platelet like, bipyramidal, and elongated), with the focus on controlled, reproducible synthesis, as a key requirement for the production of reference materials with homogeneous and stable properties. Particularly with regard to the nanoparticle shapes, there is a high need of certified materials, solely one material of this type being commercially available since a few months (elongated TiO2). Further, measurement approaches with electron microscopy as the golden method to tackle the nanoparticle shape are developed to determine accurately the size and shape distribution for such nonspherical particles. A prerequisite for accurate and easy (i.e., automated) image analysis is the sample preparation, which ideally must ensure a deposition of the nanoparticles from liquid suspension onto a substrate such that the particles do not overlap, are solvent-free, and have a high deposition density. Challenges in the Synthesis of perfectly monodispersed and solvent-free TiO2 nanoparticles of platelet and acicular shapes are highlighted as well as successful measurement approaches on how to extract from 2D projection electron micrographs the most accurate spatial information, that is, true 3D size, for example, of the bipyramidal nanoparticles with different geometrical orientations on a substrate. KW - Nanoparticles KW - Titanium dioxide KW - Reference materials KW - Standardisation KW - Particle size and shape distribution PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-538849 DO - https://doi.org/10.1002/adem.202101347 VL - 24 IS - 6 SP - 1 EP - 10 PB - Wiley-VCH AN - OPUS4-53884 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Bartczak, D. A1 - Hodoroaba, Vasile-Dan T1 - Report on the development and validation of the reference material candidates with non-spherical shape, non-monodisperse size distributions and accurate nanoparticle concentrations N2 - One aim of the EMPIR nPSize project 17NRM04 was to develop and validate three classes of candidate reference (test) materials (RTMs), with i) well-defined non-spherical shape, ii) relatively high polydispersity index, and iii) accurate particle concentrations. To fulfil the requirements of the project, 11 different types of materials were prepared. Following the initial assessment of the materials suitability, nPSize5_PT_UNITO, nPSize6_AC_UNITO and nPSize7_GN_CEA materials were found unsuitable for the project, due to various reasons. PT material was deemed unsuitable due to its predominantly agglomerated nature. AC material contained relatively high amount of impurities (other particle forms). GN material was found too heterogeneous in both the length and width for the purpose of the project. The remaining 8 candidate RTMs were assessed for their homogeneity and stability and used for successful delivery of the associated activities within the nPSize project. KW - Nanoparticles KW - Particle size distribution KW - Reference materials KW - Non-spherical shape KW - EMPIR nPSize KW - Electron microscopy KW - AFM KW - SAXS PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-556015 DO - https://doi.org/10.5281/zenodo.7016466 SP - 1 EP - 22 PB - Zenodo CY - Geneva AN - OPUS4-55601 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mrkwitschka, Paul A1 - Abram, Sarah-Luise A1 - Rühle, Bastian A1 - Hodoroaba, Vasile-Dan T1 - Understanding Correlative Electron Microscopy Imaging with SEM, STEM-in-SEM and TEM for the Accurate Characterization of Size and Shape of Iron Oxide Nanoparticles N2 - The recently certified reference material (CRM) BAM-N012 as cubical iron oxide FeOx nanoparticles (NPs) of 8 nm area equivalent square edge length (ESL) and the RM candidate BAM-N013 as nearly spherical NPs of 22 nm size were analyzed in detail by electron microscopy (EM). For the metrological characterization with SEM, STEM in SEM and TEM, the understanding of the imaging contrasts and sensitivities, and the correct interpretation of the (art)effects which are inherent to each detection mode is necessary. The same sample areas with NPs deposited on a TEM grid were analyzed by two SEM acquisition modes, i. e. SE InLens and STEM in SEM using a dedicated transmission sample holder, and further, correlatively, analyzed with TEM. With increasing kV, SE InLens shows increasing particle size (unless overcharging at the particle boundaries is filtered), as a known effect. For STEM-in-SEM the particle size decreases significantly and individual particles are identified easier (at 2 kV only a few single particles can be detected automatically). ❑ Documentation of the sample preparation and measurement conditions (including optimization process) is important for reproducibility. ❑ Plasma cleaning, analysis in the transmission mode at SEM is recommended for FeOx NPs. ❑ Selection of the threshold algorithm can significantly alter the reported ECD. KW - Nanoparticles KW - Iron oxide KW - Electron microscopy KW - Reference materials KW - Particle size distribution KW - Imaging PY - 2024 DO - https://doi.org/10.1093/mam/ozae044.339 VL - 30 IS - Supplement_1 SP - 710 EP - 711 PB - Oxford University Press (OUP) AN - OPUS4-61007 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - The SMURFnano project - standardized measurements of surface functionalities on nanoparticles N2 - Engineered nanoparticles (NPs) with various chemical compositions and surface functionalities are routinely fabricated for industrial applications such as medical diagnostics, drug delivery, sensing, catalysis, energy conversion and storage, optoelectronics, and information storage. NP function, interaction with biological species, and environmental fate are largely determined by surface functionalities. Reliable, reproducible, and standardized surface characterization methods are therefore vital for quality control of NPs, and mandatory to meet increasing concerns regarding their safety. Also, industry, international standardization organizations, regulatory agencies, and policymakers need validated and standardized measurement methods and reference materials. However, methodologies for determining NP surface properties, including the amount, chemical composition, and homogeneity of surface functionalities and coatings are largely non-standardized. Suitable methods for determining surface functionalities on ligand-stabilized core and core/shell NPs include advanced techniques such as traceable quantitative nuclear magnetic resonance (qNMR) as well as X-ray electron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS), and simpler optical and electrochemical methods. The latter less costly methods are often used by SMEs, e.g., for quality control. To validate methods, establish measurement uncertainties, test reference materials, and produce reference data, international interlaboratory comparisons (ILC) on NP surface functionalization measurements are required and well characterized test and reference nanomaterials providing benchmark values.[1] These needs are addressed by the recently started European metrology project SMURFnano involving 12 partners from different National Metrology Institutes, designated institutes, and research institutes, two university groups as well as one large company and one SME producing NPs. This project as well as first results derived from the development of test and reference materials with a well characterized surface chemistry and ongoing interlaboratory comparisons will be presented. T2 - eMRS CY - Strasbourg, France DA - 27.05.2025 KW - Quality assurance KW - Reference analysis KW - Standardization KW - Metrology KW - Reference products KW - Reference materials KW - Mission KW - Surface chemistry KW - Nano KW - Particle KW - qNMR KW - XPS KW - Fluorescence KW - Optical assays KW - Interlaboratory comparison KW - Uncertainty PY - 2025 AN - OPUS4-63243 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ciornii, Dmitri T1 - Validation of microplastics detection methods and proficiency testing: Suitable microplastic reference materials for interlaboratory comparison N2 - Since microplastics (MPs) can be found everywhere and are becoming a problem of high concern, it is necessary to understand their physico-chemical properties. To obtain reliable analytical data a set of validated methods for sampling, sample preparation, detection, and data evaluation are needed. To meet these needs an interlaboratory comparison (ILC) with 84 participants worldwide has been organized under the international pre-standardisation platform VAMAS (www.vamas.org/twa45/) as Project 2 “Development of standardized methodologies for characterisation of microplastics with microscopy and spectroscopy methods” within the Technical Working Area TWA 45 “Micro and Nano Plastics in the Environment”. In this ILC thermo-analytical methods (Py-GC/MS and TED-GC/MS) and vibrational methods (µ-Raman and µ-FTIR) have been tested and compared by providing a set of microplastic representative test materials and measurement protocols developed at BAM. The defined measurands were: particle number concentration, particle size distribution (PSD), and polymer identity and mass content. To increase the statistical quality, 6 samples were shipped together with blank samples. Hence, the ILC provides information on precision and accuracy of the results obtained with different methods as well as strengths and limitations of the proposed protocols. T2 - SETAC 34th Meeting CY - Seville, Spain DA - 05.05.2024 KW - ILC KW - Microplastic KW - Method validation KW - Stakeholder KW - Reference materials KW - Polyethylene KW - Polyethylene Terephtalate PY - 2024 AN - OPUS4-60039 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Micro and Nano Plastics in the Environment N2 - The VAMAS/TWA 45 Project 2 “Development of standardized methodologies for characterisation of microplastics with microscopy and spectroscopy methods” involving 85 participants around the world is primarily discussed with respect to the results received and a first data evaluation. Status of the Project "Guidelines for defining reference materials for plastic degradation in marine environment" is reported and two new project proposals are presented: "Development of standardized methodologies for characterisation of nanoplastics (starting soon, BAM as leader?) and "Development of analytical protocols for the identification and quantification of microplastics of fibrous shape (still in negotiation)". T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 48th Steering Committee Meeting CY - New Delhi, India DA - 09.10.2023 KW - Microplastics KW - Nanoplastics KW - Interlaboratory comparison KW - VAMAS KW - Reference materials KW - ISO PY - 2023 UR - https://www.nplindia.org/index.php/amcsnzt_2023/ AN - OPUS4-58539 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Putzu, Mara A1 - Wiesner, Yosri A1 - Weimann, Christiane A1 - Hodoroaba, Vasile-Dan A1 - Muniategui Lorenzo, Soledad A1 - Fernández-Gonzáles, Verónica A1 - Booth, Andy M. A1 - Igartua, Amaia A1 - Benismail, Nizar A1 - Coïc, Laureen A1 - Chivas-Joly, Carine A1 - Fenoglio, Ivana A1 - Rossi, Andrea Mario A1 - Giovannozzi, Andrea Mario A1 - Altmann, Korinna T1 - Optimization of tablet processing as a reference material for microplastic detection methods N2 - Reference materials (RMs) are essential and highly demanded tools for the development and validation of methods for microplastic (MP) quantification in complex matrices, to ensure comparable and harmonized approaches aligned with EU commission criteria for monitoring MPs (e.g., Drinking Water Directive and Urban Wastewater Treatment Directive). This study investigates different approaches for optimizing the production of polypropylene (PP) RMs in the form of water-soluble tablets, which were carefully evaluated for their homogeneity and stability according to ISO Guide 30, ISO 33401, and ISO 33405. PP particles (1–100 μm) were produced by cryomilling and embedded in a lactose/PEG matrix, then pressed into tablets (18 µg theoretical PP mass). The production process was optimized by varying (i) the size distribution of the matrix components and (ii) the mixer instrument. The materials obtained were characterized by thermogravimetric analysis to assess the homogeneity distribution of MPs with respect to PP mass in the individual tablets and their stability over a 4-month period. The most promising approach, with a homogenous mass of 19 μg (standard deviation of 4 μg), relative standard deviation of 19%, was further investigated for homogeneity by comparison with thermo-analytical mass determination methods, such as TED-GC/MS (thermal extraction desorption-gas chromatography/mass spectrometry) and Py-GC/MS (pyrolysis-gas chromatography-mass spectrometry), and for number-based characterization using micro-Raman spectroscopy. Material characterization was also examined using laser diffraction, scanning electron microscopy, and ATR-FTIR. Based on the results, the optimized processing protocol yields a PP RM suitable for quality control and method performance studies supporting standardization. KW - Microplastics KW - TED-GC/MS KW - Reference materials KW - Polypropylene PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-653290 DO - https://doi.org/10.1007/s00216-025-06271-7 SN - 1618-2642 SP - 1 EP - 14 PB - Springer Science and Business Media LLC AN - OPUS4-65329 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wimmer, L A1 - Hoang, M V N A1 - Schwarzinger, J A1 - Jovanovic, V A1 - Adelkovic, B A1 - Velickovic, T C A1 - Meisel, T C A1 - Waniek, T A1 - Weimann, Christiane A1 - Altmann, Korinna A1 - Dailey, L A T1 - A quality-by-design inspired approach to develop PET and PP nanoplastic test materials for use in in vitro and in vivo biological assays N2 - Micro- and nanoplastics have become environmental pollutants of concern, receiving increased attention from consumers, scientists, and policymakers. The lack of knowledge about possible impacts on wildlife and human health requires further research, for which well-characterized testmaterials are needed. A quality-bydesign (QbD) driven approachwas used to produce sterile, endotoxinmonitored nanoplastics of polyethylene terephthalate (PET) and polypropylene (PP) with a size fraction of >90% below 1 μm and high yield of >90%. Glycerol was used as a versatile and biocompatible liquid storage medium which requires no further exogenous dispersing agent andmaintained colloidal stability, sterility (0 CFU mL−1), and low endotoxin levels (<0.1 EU mL−1) for more than one year of storage at room temperature. Further, the glycerol vehicle showed no biological effect on the tested human bronchial cell line Calu-3 up to 0.8% (w/v). Given the concentration of 40 mg g−1 nanoplastics in the glycerol stock, this corresponds to a nanoplastic concentration of 320 μg mL−1. The surfactant-free nanoplastics are dispersible in bio-relevant media from the glycerol stock without changing size characteristics and are suitable for in vitro and in vivo research. KW - Microplastics KW - Reference materials KW - Nanoplastics KW - Polymer 3R KW - Glycerol PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-629934 DO - https://doi.org/10.1039/D4EN01186D SN - 2051-8161 VL - 12 IS - 5 SP - 2667 EP - 2686 PB - Royal Society of Chemistry CY - Cambridge AN - OPUS4-62993 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Altmann, Korinna T1 - Update from ISO/TC 61/SC14/WG4 N2 - This talk is an update from ISO/TC 61/SC14/WG4. It describes the production of microplastic test material for the use in an interlaboratory comparison. IWe report the first results of an ILC on microplastic detection methods organized under the pre-stantdardisation plattform of VAMAS (www.vamas.org/twa45/) as Project 2 “Development of standardized methodologies for characterisation of microplastics with microscopy and spectroscopy methods”, within the Technical Working Area TWA 45 “Micro and Nano Plastics in the Environment”. The ILC has gathered 84 participants all over the world representing all continents. Reference materials were developed by BAM to test the main methods for MPs detection as addressed in ISO/TR 21960:2020: thermo-analytical methods (Py-GC/MS and TED-GC/MS) and vibrational methods (µ-IR and µ-Raman). As far as the mass fraction is concerned, accurate results with quite a good precision were achieved with the thermo-analytical methods. Number-based results are not adressed here. T2 - ISO/TC 147/SC 2/JWG CY - Online meeting DA - 03.06.2025 KW - Microplastics KW - ILC KW - Reference materials PY - 2025 AN - OPUS4-63340 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ciornii, Dmitri A1 - Hodoroaba, Vasile-Dan A1 - Wachtendorf, Volker A1 - Fengler, Petra A1 - Altmann, Korinna T1 - Interlaboratory Comparison Reveals State of the Art in Microplastic Detection and Quantification Methods N2 - In this study, we investigate the current accuracy of widely used microplastic (MP) detection methods through an interlaboratory comparison (ILC) involving ISO-approved techniques. The ILC was organized under the prestandardization platform of VAMAS (Versailles Project on Advanced Materials and Standards) and gathered a large number (84) of analytical laboratories across the globe. The aim of this ILC was (i) to test and to compare two thermo-analytical and three spectroscopical methods with respect to their suitability to identify and quantify microplastics in a water-soluble matrix and (ii) to test the suitability of the microplastic test materials to be used in ILCs. Two reference materials (RMs), polyethylene terephthalate (PET) and polyethylene (PE) as powders with rough size ranges between 10 and 200 μm, were used to press tablets for the ILC. The following parameters had to be assessed: polymer identity, mass fraction, particle number concentration, and particle size distribution. The reproducibility, SR, in thermo-analytical experiments ranged from 62%−117% (for PE) and 45.9%−62% (for PET). In spectroscopical experiments, the SR varied between 121% and 129% (for PE) and 64% and 70% (for PET). Tablet dissolution turned out to be a very challenging step and should be optimized. Based on the knowledge gained, development of guidance for improved tablet filtration is in progress. Further, in this study, we discuss the main sources of uncertainties that need to be considered and minimized for preparation of standardized protocols for future measurements with higher accuracy. KW - Microplastics KW - Interlaboratory comparison KW - PlasticsFatE KW - PET KW - PE KW - Reference materials KW - VAMAS KW - Thermo-analytical methods KW - Spectroscopical methods PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-630462 DO - https://doi.org/10.1021/acs.analchem.4c05403 SN - 1520-6882 VL - 97 SP - 8719 EP - 8728 PB - ACS Publications AN - OPUS4-63046 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -