TY - CONF A1 - Hülagü, Deniz A1 - Tobias, Charlie A1 - Gojani, Ardian A1 - Rurack, Knut A1 - Hodoroaba, Vasile-Dan T1 - Analysis of the profile roughness of core-shell microparticles by electron microscopy N2 - A particle roughness analysis tool, based on electron microscopy (EM) images. The influence of various parameters on the calculated roughness was also investigated: the setting of the proper threshold, accelerating voltage, etc. The samples were gradually tilted to extend imaging information of more than only one projection. Furthermore, the measurement uncertainty of the profile roughness of particles associated to various orientations was estimated. T2 - Microscopy and Microanalysis 2021 CY - Online Meeting DA - 01.08.2021 KW - MamaLoCA KW - Particle characterization KW - Electron microscopy KW - Roughness KW - Core-shell particles KW - Image processing PY - 2021 AN - OPUS4-53069 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gojani, Ardian A1 - Tobias, Charlie A1 - Hülagü, Deniz A1 - Rurack, Knut A1 - Hodoroaba, Vasile-Dan T1 - Toward Determination of the Surface Roughness of Particles from a SEM Image N2 - Welcome to the poster Towards Determination of Surface Roughness from a SEM Image, a contribution from BAM in Berlin, Germany. This work is part of the MamaLoCA project, which aims to develop a biosensor for the detection of mycotoxins in cereals. Biosensors come in a great variety, one of which makes use of microscopic beads produced by homogenous coating of polystyrene microspheres. The beads are functionalized by decorating them with bioreceptors – in our case antibodies – which then specifically react with the analyte – in our case mycotoxins – and emit an electrical or optical signal. The functionalization of the beads depends on the surface roughness because this determines the amount and orientation of binders. In other words, the surface roughness affects the accessibility to the binding sites and influences device sensitivity, hence its quantitative determination is an important step in evaluating the quality of the biosensor in general. The presented solution to the problem of the estimation of surface roughness relies in the repetitive characteristics on the surface of the beads. A SEM image of the bead shows a raspberry like microparticle with a variation of grayscale values, which arise from the secondary electron yield. The principle of the measurement measures the variation of grayscale values along a circumference of a circle centred in the centre of the particle and with an arbitrary radius. The grayscale value variation along the given circumference gives the so-called z-modulation or the lateral profile. By performing Fast Fourier Transform on this profile we obtain the power spectrum as a function of the spatial frequencies through which the grayscales vary. The maximal value for spatial frequency then reveals the most common feature along one given circumference. Surface roughness then is the feature frequency in the spatial domain. This calculation is repeated for several concentric circles with different radii over the particle. The results for the same particle but recorded at two different accelerating voltages show that the applied method has a potential to reveal the roughness. Interpretation of results from an SE InLens SEM image obtained using 3 kV shows that surface roughness is about 21 nm, which is in a good agreement with an alternative method given in a different presentation. The results from the 10 kV are underestimated due to the loss of surface sensitivity on the SE InLens detection at high voltages. In conclusion, this method shows promise in determining quantitatively the surface roughness from a single SEM image and its validation is being sought using 3D SEM images and AFM methods. T2 - Microscopy and Microanalysis 2021 CY - Online Meeting DA - 01.08.2021 KW - MamaLoCA KW - Core-shell particles KW - Electron microscopy KW - Image processing KW - Particle characterisation KW - Roughness KW - Fast Fourier Transform PY - 2021 AN - OPUS4-53089 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hülagü, Deniz A1 - Tobias, Charlie A1 - Gojani, Ardian A1 - Rurack, Knut A1 - Hodoroaba, Vasile-Dan T1 - Analysis of the profile roughness of core-shell microparticles by electron microscopy JF - Microscopy and Microanalysis N2 - A particle roughness analysis tool, based on electron microscopy images (SEM and TEM). The influence of various parameters on the calculated roughness was also investigated: the setting of the proper threshold, accelerating voltage, etc. The samples were gradually tilted to extend imaging information of more than only one projection. Furthermore, the measurement uncertainty of the profile roughness of particles associated to various orientations was estimated. KW - Core-shell particles KW - Electron microscopy KW - Image processing KW - MamaLoCa KW - Particle Characterization KW - Roughness PY - 2021 DO - https://doi.org/10.1017/S1431927621007285 VL - 27 IS - Suppl. 1 SP - 2002 EP - 2004 PB - Cambridge University Press AN - OPUS4-53123 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gojani, Ardian A1 - Tobias, Charlie A1 - Hülagü, Deniz A1 - Rurack, Knut A1 - Hodoroaba, Vasile-Dan T1 - Toward determination of the surface roughness of particles from a SEM image JF - Microscopy and microanalysis N2 - In this communication, we address the issue of roughness measurement by investigating if the grayscale values from SEM images can be used for surface roughness determination of spherical particles. KW - MamaLoCA KW - Core-shell particles KW - Electron microscopy KW - Image processing KW - Particle characterisation KW - Roughness PY - 2021 DO - https://doi.org/10.1017/S1431927621011375 SN - 1431-9276 SN - 1435-8115 VL - 27 IS - Suplement S1 SP - 3302 EP - 3305 PB - Cambridge University Press CY - New York, NY AN - OPUS4-53283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hülagü, Deniz A1 - Tobias, Charlie A1 - Gojani, Ardian B. A1 - Rurack, Knut A1 - Hodoroaba, Vasile-Dan T1 - From 2D and Single Particle to 3D and Batch Analysis as a Routine Quality Check Procedure for the Morphological Characterization of Core-Shell Microparticles JF - Microscopy and Microanalysis N2 - CS particles show unique properties by merging individual characteristics of the core and the shell materials. An alteration particularly in their surface roughness affects the final performance of the particles in the targeted application. Quantitative evaluation of the roughness of CS microparticles is, however, a challenging task employing microscopic techniques being scarce and showing large differences in terms of methodology and results. In our previous work, we have reported a systematic study with a reliable analysis tool, which evaluates profile roughness quantitatively, for individual core-shell microparticles using electron microscopy (EM) images of both types, Scanning Electron Microscopy (SEM) and transmission mode SEM (or TSEM). The SEM images contain two-dimensional (2D) information, therefore, provide profile roughness data only from the projection in the horizontal plane (in other words, from the “belly”) of a spherical particle. The present study offers a practical procedure to give access to more information by tilting the sample holder and hence allowing images of a single particle to be recorded at different orientations under the same view angle. From the analysis of these images, extended information on surface roughness of the particle can be extracted. Thus, instead of obtaining 2D information from a single SEM image, three-dimensional (3D) information is obtained from 2D projections recorded at different particle orientations. T2 - Microscopy and Microanalysis 2022 CY - Oregon, Portland, USA DA - 31.07.2022 KW - Core-shell particles KW - Image processing KW - Roughness KW - Scanning electron microscopy KW - Tilting PY - 2022 DO - https://doi.org/10.1017/S1431927622002094 SN - 1431-9276 VL - 28 IS - S1 SP - 332 EP - 334 PB - Cambridge University Press AN - OPUS4-55373 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -