TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison Report ISO/TC 229 for ISO/TC 202 and vice-versa N2 - The liaison between the two ISO technical committees TC 229 Nanotechnologies and TC 202 Microbeam analysis, in both directions, is described in detail with highlight on the projects under developement since 2023 and which involve input/knowledge from ISO/TC 202. T2 - 31st Plenary Meeting of ISO/TC202 Microbeam Analysis CY - Tokio, Japan DA - 29.10.2024 KW - ISO TC 202 KW - ISO TC 229 KW - Standardisation KW - Nanotechnologies KW - Microbeam analysis PY - 2024 AN - OPUS4-61511 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA 37 - Quantitative Microstructural Analysis & Liaison with ISO/TC 202 Microbeam Analysis, Liaison with ISO N2 - The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects. Need of more promotion for the engagement of more participants from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. Further, a short overview of the VAMAS areas of activities is given where Germany is involved. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 46th Steering Committee Meeting CY - Online meeting DA - 08.09.2021 KW - VAMAS KW - Nanoparticles KW - Standardisation KW - Inter-laboratory comparison KW - ISO/TC 202 KW - ISO/TC 229 KW - ISO/TC 201 KW - Microstructure KW - EBSD PY - 2021 UR - http://www.vamas.org/twa/ AN - OPUS4-53237 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and chemical analysis of mesoporous mixed IrOx-TiOy thin films as electrode materials N2 - Porous films play an important role particularly in energy applications like photovoltaics, electrolysis or batteries. Thin film properties such as thickness, chemical composition, crystallinity of the framework, and porosity define the activity of the porous films. The accurate morpho-chemical characterisation of mesoporous thin films is a challenging analytical task which requires the consideration of new analytical approaches based on the combination of data of different methods able to address the structure and chemical composition at the nanoscale. In this contribution we characterise thin mesoporous iridium-titanium mixed oxide film properties by Electron Probe Microanalysis (EPMA) with Energy-Dispersive X-ray Spectroscopy (EDS) at an SEM applied in a dedicated “thin film analysis” approach (1). Thus, the film mass deposition, film thickness and the film density can be determined. Further, by dividing the measured film density to an assumed (theoretical) metal oxide framework (skeletal) density, the thin film porosity can be extracted, too. In order to assess the homogeneity of the thin film properties like the chemical composition, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Auger Electron Spectrometry are applied in the depth profiling mode, so that possible in-depth gradients are detected. Lateral inhomogeneities in the chemical composition and structure of the thin mesoporous films are also identified by applying the same methods in the line-scan or mapping mode, which can be further combined with in-depth sputtering for 3D information. The role of the spatial resolution of the analytical methods considered, which can go down well below 100 nm, will be highlighted. T2 - 2024 Spring Meeting of the European Materials Research Society (E-MRS) CY - Strasbourg, France DA - 27.05.2024 KW - Mesoporous KW - Thin films KW - Iridium oxide KW - Titanium oxide KW - Thin film analysis KW - Porosity KW - SIMS KW - Auger electron spectroscopy PY - 2024 AN - OPUS4-60185 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Report VAMAS/TWA 37 "Quantitative Microstructural Analysis" & Liaison with ISO/TC 202 "Microbeam Analysis" N2 - The progress in activities on Quantitative MicroStructural Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 Microbeam Analysis is presented and discussed with respect to the identification and launching corresponding VAMAS projects. The ongoing projects "Development of guidelines for reproducible TEM specimen preparation by FIB processing", "Measurement of dislocation density in metallic materials by Transmission Electron Microscope (TEM)", "Repeatability of high angular resolution electron backscatter diffraction (HR-EBSD) analysis for elastic strain measurements", and "Measurement of grain size and distribution of nanocrystalline nickel by using Transmission Kikuchi Diffraction (TKD) in SEM" are presented in detail. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 49th Steering Committee Meeting CY - Rio de Janeiro, Brazil DA - 23.09.2024 KW - VAMAS KW - Interlaboratory comparison KW - Microbeam Analysis KW - FIB KW - SEM KW - TEM KW - Sample preparation PY - 2024 UR - www.vamas.org/twa37/index.html AN - OPUS4-61388 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison between ISO/TC 202 Microbeam Analysis and VAMAS/TWA 37 Quantitative Microstructural Analysis N2 - The liaison between ISO/TC 202 Microbeam Analysis and VAMAS/TWA 37 Quantitative Microstructural Analysis and other TWAs since the last Annual Meeting of ISO/TC 202 is reported. The VAMAS/TWA 37 projects initiated in the last year and the new ones in the planing phase are highlighted with technical and organisational details. T2 - 31st Plenary Meeting of ISO/TC202 Microbeam Analysis CY - Tokio, Japan DA - 29.10.2024 KW - ISO TC 202 KW - Microbeam Analysis KW - Interlaboratory comparison KW - VAMAS KW - Standardisation PY - 2024 AN - OPUS4-61513 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Challenges in Correlative imaging of Advanced Materials N2 - Newly developed methodical approaches with an emphasis on correlative imaging analysis of morphology and chemistry of nanomaterials will be presented. Correlative imaging by high-resolution SEM with STEM-in-SEM as well as with EDS, and further with AFM, or with the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and as embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for the local surface chemistry will be highlighted. Examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy and the highest surface-sensitive methods XPS and ToF-SIMS as advanced surface characterization methods available in the Competence Centre nano@BAM will be showed. Particularly for the spatially resolved analysis of the chemistry of nanostructures, such in-depth and lateral gradients of chemistry within mesoporous thin layers, or the completeness of the shells of core-shell nanoparticles, the latter methods are inherent. Other dedicated developments like approaches for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM or the quantitative determination of the roughness of particle surface by high-resolution imaging with electron microscopy will be also presented. T2 - Workshop: Harmonisation & Standardisation of Test Methods for Nano- and Advanced Materials CY - Online meeting DA - 18.11.2024 KW - Imaging KW - Advanced materials KW - Correlative imaging KW - Nanomaterials KW - Electron microscopy KW - ToF-SIMS PY - 2024 UR - https://macrame-project.eu/macrame-meetings-workshops/2nd-joint-online-workshop-harmonisation-standardisation-of-test-methods-for-nano-and-advanced-materials/ AN - OPUS4-61858 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fagan, Jeffrey A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA Nanoparticle Populations Projects 15 and 16 N2 - The progress in the VAMAS Project #15 "Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of electron microscopy (SEM, TEM, STEM-in-SEM), atomic force microscopy (AFM) and small angle X-ray scattering (SAXS). - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. Further, the VAMAS/TWA 34 Project #16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration by electron microscopy (SEM, TEM) and atomic force microscopy (AFM) and two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 49th Steering Committee Meeting CY - Rio de Janeiro, Brazil DA - 23.09.2024 KW - VAMAS KW - Nanoparticles KW - Nanoparticle size and shape distribution KW - Particle number concentration KW - Interlaboratory comparison KW - Standardisation PY - 2024 UR - http://www.vamas.org/twa34/index.html AN - OPUS4-61422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fagan, J. A1 - Hodoroaba, Vasile-Dan T1 - VAMAS TWA 34 Nanoparticle Populations Combined Projects P15 and P16 N2 - The progress in the VAMAS Project #15 "Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points: - Determine and compare particle size and shape distribution by means of electron microscopy (SEM, TEM, STEM-in-SEM), atomic force microscopy (AFM) and small angle X-ray scattering (SAXS). - Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids. - Provide comparative validation of protocols for the techniques other than TEM. Further, the VAMAS/TWA 34 Project #16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration by electron microscopy (SEM, TEM) and atomic force microscopy (AFM) and two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. - Discussion of sample preparation issues - Publication of the results in 2026 T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting CY - London, United Kingdom DA - 14.09.2025 KW - VAMAS KW - Interlaboratory comparison KW - Particle size and shape distribution KW - Particle number concentration KW - Standardisation PY - 2025 UR - https://www.vamas.org/twa34/index.html AN - OPUS4-64234 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS Regional Report Advanced Materials Germany 2025 N2 - Regional standardisation activities and how VAMAS can help in any way to promote activities are reported. Activities related to organisational updates, government initiatives/priorities (especially related to Advanced Materials), details of any strategy documents publicly available, networks within Germany and how we engage are presented. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting CY - London, United Kingdom DA - 14.09.2025 KW - VAMAS KW - Interlaboratory comparison KW - Advanced materials KW - Standardisation PY - 2025 AN - OPUS4-64232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Heilmann, Maria A1 - Hodoroaba, Vasile-Dan T1 - Project 16 Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension N2 - The progress of the VAMAS Project 16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" in TWA 34 Nanoparticle Populations is presented. Follwowing points are discusssed: - Validate the performance of imaging methods to measure the relative number concentration • electron microscopy (SEM, TEM) and atomic force microscopy (AFM) • two modes of bimodal (30 and 60 nm) silica nanoparticles - Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes. T2 - VAMAS Regional Workshop 2023 - What can pre-normative research do for industry? CY - Online meeting DA - 24.01.2023 KW - Nanoparticles KW - VAMAS KW - Inter-laboratory comparison KW - SiO2 KW - Electron microscopy KW - AFM PY - 2023 UR - https://www.bam.de/Content/EN/Events/2023/2023-01-24-vamas-regional-workshop.html AN - OPUS4-57221 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Nanoparticle Populations N2 - Two new projects P15 Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension and P16 Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension have been started at VAMAS/TWA 34 under the lead of BAM. First results are presented and discussed. T2 - Versailles Project on Advanced Materials and Standards (VAMAS) 47th Steering Committee Meeting CY - Turin, Italy DA - 18.10.2022 KW - VAMAS KW - Nanoparticles KW - Inter-laboratory comparison KW - Particle size distribution KW - Nanoparticle concentration PY - 2022 AN - OPUS4-56196 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison of ISO/TC 202 Microbeam Analysis with VAMAS/TWA 37 Quantitative Microstructural Analysis N2 - The progress in activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the identification and launching corresponding VAMAS projects. The ongoing project "FIB sample processing for TEM" is presented in detail. T2 - 30th Meeting of ISO/TC 202 Microbeam Analysis CY - Berlin, Germany DA - 22.11.2023 KW - VAMAS KW - ISO/TC 202 KW - Microbeam Analysis KW - Standardisation KW - Electron microscopy KW - FIB PY - 2023 AN - OPUS4-58984 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Other than spherical/monodisperse Towards real world NPs as candidate reference materials for traceable size measurements N2 - By far most of the current nanoparticle (NP) research is dealing with (quasi-) spherical and/or monodisperse particles. However, many NPs used in industrial applications are rather aspherical and polydisperse. This inhomogeneity considerably hampers their characterization and, particularly, the accurate determination of the nanoparticle size. In order to overcome this problem and to promote the availability of standardized size measurement methods, it is crucial to develop and establish (candidate) reference materials with inhomogeneous size (distribution), aspherical shape as well as agglomerated or aggregated particles. Therefore, a new set of NPs including Au-, SiO2 , and TiO2-particles is investigated. The range of properties comprises polydisperse spherical, bimodal spherical, rod-like, acicular, bipyramidal, sheet-like as well as cubic NPs. With respect to a good traceability of the measurements, size and size distributions of the candidate reference materials are determined using microscopic methods like scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning electron microscopy in transmission mode (STEM-in-SEM), atomic force microscopy (AFM) as well as small angle X-ray scattering (SAXS) as an ensemble technique. The development of protocols for sample preparation is of particular importance to obtain a homogeneous dispersion of the NPs on a substrate. Further, approaches for signal modelling for all the methods above are being developed. The initiation of two VAMAS (www.vamas.org/twa34/index.html) inter-laboratory comparisons on bipyramidal titania and bimodal silica with different modal concentration ratios will be also highlighted. T2 - E-MRS Spring Meeting 2021 CY - Online meeting DA - 31.05.2021 KW - Nanoparticles KW - Particle size distribution KW - Imaging KW - Traceability KW - Reference material PY - 2021 AN - OPUS4-52764 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - EMPIR nPSize - Improved Traceability Chain of Nanoparticle Size Measurement; What nPSize can offer to CEN/TC 352? N2 - The main outcomes of the EMPIR project nPSize are presented and the suitability of the new capabilities (e.g. reference materials, measurement procedures, inter-laboratory comparisons) as pertinent contributions to normative projects within CEN/TC 352 Nanotechnologies are discussed. E.g. the first technical report of nPSize on full algorithm sequences for nanoparticle detection and size measurement as developed on both a physical basis (SEM, TSEM, AFM and SAXS) and by machine learning is put at disposal. T2 - 29th Meeting of CEN/TC 352 Nanotechnologies CY - Online meeting DA - 25.03.2021 KW - Nanoparticles KW - Electron microscopy KW - CEN/TC 352 Nanotechnologies KW - Particle size distribution KW - Modelling KW - Machine learning PY - 2021 AN - OPUS4-52464 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Report ISO/TC202/WG4 X-Ray Spectroscopy, Liaisons with VAMAS and ISO/TC229 Nanotechnologies N2 - The presentation is structured in the following three parts: i) Report of the Working Group 4 X-Ray Spectroscopy including the publication of ISO 15632:2021 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis, ii) Liaison activities between ISO/TC202 Microbeam Anaylsis and VAMAS/TWA34 Quantitative Microstructural Analysis, and iii) Liaison activities from ISO/TC202 Microbeam Analysis for ISO/TC229 Nanotechnologies. Most relevant projects are highlighted for information and further discussions. New initiatives and better promotion of strategic projects are addressed. T2 - Annual Meeting of ISO/TC 202 Microbeam Analysis CY - Online meeting DA - 25.10.2021 KW - Microbeam Analysis KW - VAMAS KW - ISO/TC 202 KW - ISO/TC 229 KW - electron microscopy KW - X-Ray Spectroscopy KW - EBSD KW - FIB PY - 2021 AN - OPUS4-53625 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - EMPIR nPSize - Improved Traceability Chain of Nanoparticle Size Measurement; nPSize offer after 2 Ys N2 - The main outcomes of the EMPIR project nPSize are presented and the suitability of the new capabilities (e.g. reference materials, measurement procedures, VAMAS inter-laboratory comparisons) to be standardized and implemented in accredited analytical laboratories is discussed. T2 - EMPIR nPSize Training Course "Metrology for Measurement of Nanoparticle Size by Electron Microscopy and Atomic Force Microscopy" CY - Online meeting DA - 27.10.2020 KW - Nanoparticles KW - Size KW - Shape KW - Traceability KW - EMPIR KW - Reference materials KW - VAMAS PY - 2020 AN - OPUS4-51477 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Characterization of the Surface Morphology and Chemistry within nano@BAM N2 - Both essential aspects of the surface of solid matter, its morphology and chemistry, are studied traditionally at BAM starting in the 60’s with different cyclical research focus areas, mostly related either to applicative research or method development. In the recent years, the focus has shifted almost exclusively to the nano-analytics of advanced materials such as complex nanoparticles, (ultra)thin films/coatings, nanocomposites, 2D materials, energy materials, etc. This is also the reason why BAM has established recently the new Competence Center nano@BAM (www.bam.de/Navigation/DE/Themen/Material/Nanotechnologie/sichere-nanomaterialien.html) with the five sub-fields nanoCharacterisation, nanoMaterial, nanoSafety, nanoData and nanoTechnology. The link to the BAM central guidelines to the safety in technology and chemistry is given by the development of reference products such as reference measurement procedures, reference (nano)materials, and newly reference data sets. Thus, an internationally well-networked group in surface analysis has been established @BAM, with regular contributions to integral analytical characterization with metrological and standardization background. Examples of newly developed methodical approaches will be given with an emphasis on correlative nano-analysis of morphology and chemistry of nanomaterials. Correlative imaging by STEM-in-SEM with high-resolution SEM and EDX, and further with AFM or the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for surface chemistry will be highlighted. The panoply of advanced surface characterization methods @BAM is completed by discussing examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy with the highest surface-sensitive methods X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Particularly for the analysis of the surface chemistry of nanostructures, such as the completeness of the shells of core-shell nanoparticles or in-depth and lateral gradients of chemistry within mesoporous thin layers, the latter methods are inherent. Other special developments like approaches for the quantitative determination of the roughness of particle surface by electron microscopy or for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM will be presented in conjunction with the corresponding advanced materials studied. Current research projects, promising ideas, including ongoing (pre-)standardization activities in the field of the challenging nano/surface analysis will be touched systematically, with the open goal of identifying future bilateral cooperation possibilities between EMPA and BAM. T2 - EMPA-Kolloquium CY - Online meeting DA - 01.12.2021 KW - Nanoparticles KW - Nano@BAM KW - Nanomaterials KW - Surface morphology and chemistry KW - Correlative analysis PY - 2021 AN - OPUS4-54039 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ongoing VAMAS interlaboratory comparisons on nanoparticles size and shape as pre standardisation projects for harmonized measurements N2 - Traceable morphological and chemical characterization of nanomaterials with respect to the various possible sizes, size distributions, shapes, and concentrations of real-world nanoparticles (NPs) is a challenging task. Particularly for the nonspherical, non-monodisperse nanoparticles – as typically for most of the commercial particles, including their strong tendency to agglomerate, there is a lack of standard operation procedures providing accurate nanoparticle characterisation. In the framework of the pre-standardisation framework of VAMAS (Versailles Project on Advanced Materials and Standards, www.vamas.org) two interlaboratory comparison (ILC) studies are being carried out under the Technical Working Area (TWA) 34 “Nanoparticle Populations”:i) Project #15 addresses the analysis of the size and shape distribution of TiO2 bipyramidal NPs by traceable imaging methods such as TEM, SEM, STEM-in-SEM, AFM as well as with SAXS as an ensemble method. This ILC is thought as the next level development of the case studies exemplified in the published ISO standards ISO 21363 and ISO 19749. It was agreed to complete the first ILC with the NPs already prepared according to the same procedure on a TEM grid, and, at a later stage, to carry out second ILCs with the same NPs distributed to the participants as liquid suspensions together with protocols for the uniform NP deposition on suited substrates - as developed and optimized within the European project nPSize. Once having good deposition protocols available, the door for automated image analysis gets opened. Corresponding image analysis protocols and reporting templates have been distributed to the ILC participants, too. ii) Project #16: two spherical SiO2 NP samples with bi-modal size distributions in two nominal relative number concentrations were prepared and distributed also as liquid suspensions accompanied by sample preparation, measurement, and image analysis protocols and reporting templates. Here, the NP concentration is the primary parameter to be measured. For the imaging methods it is targeted to measure the relative nanoparticle concentrations (relative populations of the two modes). The results of all the participating laboratories, in both ILCs, compiled in comparative representations will be shown and discussed for the first time. The reduction of the measurement uncertainties associated to the size, shape and number-concentration results induced by the significant improvement of the sample preparation on substrates (as single particles with a high-density coverage), combined with welldefined image analysis procedures will be highlighted. T2 - 2024 Spring Meeting of the European Materials Research Society (E-MRS) CY - Strasbourg, France DA - 27.05.2024 KW - VAMAS KW - Interlaboratory comparison KW - Electron microscopy KW - Particle size distribution KW - Article concentration PY - 2024 AN - OPUS4-60184 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Marcoulaki, E. A1 - van Duuren, B T1 - Testing and benchmarking nanosafety services N2 - One of the objectives of the EU Project EC4SafeNano (European Centre for Risk Management and Safe Innovation in Nanomaterials & Nanotechnologies) was to test and benchmark the services in order to check their relevance to address identified stakeholder needs, but also to evaluate the governance of the structure delivering the proposed services. The aim is to demonstrate the technical relevance of the services and the overall open structure organisation, including governance rules and operating procedures, by answering relevant identified questions (case studies) selected by a panel of stakeholders. Therefore, a significant part of the project will be devoted to this demonstration of the operational and functional basis of the organized network. T2 - Review Meeting EC4SafeNano CY - Brussels, Belgium DA - 16.01.2020 KW - Nanosafety KW - EC4SafeNano KW - Nanosafety services KW - EU KW - Case studies PY - 2020 AN - OPUS4-50273 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Standardized workflow for checking the performance of an EDS X-ray spectrometer at a Scanning Electron Microscope N2 - For test laboratories operating under accreditation schemes like ISO/IEC 17025 (ISO/IEC 17025), as the international reference for testing and calibration laboratories wanting to demonstrate their capacity to deliver reliable results, a periodical control of the critical instrumental parameters of an Energy-Dispersive X-ray Spectrometer (EDS) is required. This periodical check of an EDS is specified with exact procedures and materials in the ISO 15632:2021 ”Microbeam Analysis – Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis” (ISO 15632). The EDS check can be simplified to the acquisition of only one 10 kV spectrum from a dedicated test material, EDS-TM002, which is made available by BAM since 2009 (https://webshop.bam.de/webshop_en/). The optional BAM software “EDX spectrometer check” is destined to automatically evaluate this spectrum and determine the performance of the EDS in terms of energy resolution and calibration, as well as possible alteration of low-energy efficiency due to detector contamination. Nearly 200 laboratories have the EDS-TM and associated software package in use. Practical examples based on various types of artifacts occurred in the EDS spectra and a long-term (>10 years) meticulous observation of the own spectrometers will be discussed. Different types of EDS spectrometers are considered, e.g. Si(Li) and SDD, of various window types (AP, the recent one Si3N4 or even windowless), and with different front contact layers (Au and Ni) (Hodoroaba and Procop, 2014). Evaluation of other parameters or effects such as the deadtime at different count rates or pileup effects is also explained with examples. T2 - Workshop "Automated Mineralogy" @ GEOANALYSIS 2022 CY - Freiberg, Germany DA - 06.08.2022 KW - EDS KW - X-ray spectrometer KW - Performance check KW - Test material KW - Standardized check KW - EDS-TM002 PY - 2022 UR - https://geoanalysis2021.de/en/workshops/automated-mineralogy AN - OPUS4-55460 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -