TY - CONF A1 - Unger, Wolfgang T1 - Acquiring and Documenting Reproducible Spectra, Depth Profiles and Images: XPS, AES and SIMS N2 - In this talk sample prep/handling, instrument calibration and data acquisition methods with examples from XPS, Auger and SIMS will be addressed in terms of their contributions to the reproducibility of data delivered by the methods. Active parties in the field are VAMAS TWA 2 “Surface chemical analysis” (http://www.vamas.org/twa2/index.html), ISO/TC 201 “Surface chemical analysis” (https://www.iso.org/committee/54618.html) and the Surface Analysis Working Group (SAWG) at the International Meter Convention (https://www.bipm.org/en/ committees/cc/wg/sawg.html). The tools to improve the reproducibility of spectra, depth profiles and images at these international platforms are inter-laboratory comparisons, validated SOPs, standards and certified reference materials (CRM) as well as uncertainty budgets and establishment of traceability chains. The last point is of specific importance because all the methods, XPS, Auger and SIMS, are not primary methods. To address quantitative XPS, AES and SIMS results of relevant inter-laboratory comparisons organized by SAWG considering measurands as alloy surface composition and thickness of thin films will be introduced. These comparisons delivered results which are viewed to be benchmarking, some of them resulted in ISO/TC 201 standards. For quantitative XPS and AES the principal outline of an uncertainty budget will be discussed together with the audience. Another issue of quantitative XPS which definitely needs consideration are valid methods for a determination of the transmission function of the instruments and even for the emission angle in the respective experiments. Concerning the field of depth profiling it has to be investigated together with the audience whether the ISO (or ASTM) standards we have are sufficient to guarantee comparable results. Having in mind the number of different sputter ion species available today and range of samples of interest (metals, semiconductors, organic films) this might be questionable. And, how do depth profiling by AR-XPS and variable excitation energy XPS compete here? For imaging surface chemical analysis, the characterization of the imaging system is an issue to be investigated. Here the determination of lateral resolution is a relevant topic. Finally, the future needs to develop metrology for new applications e.g., ambient-pressure XPS, bio samples, and core-shell nanoparticles, will be issues raised for a discussion with the audience. T2 - 17th Topical Conference on Quantitative Surface Analysis (QSA 17) CY - Long Beach, CA, USA DA - 21.10.2018 KW - Depth Profiles and Images KW - X-ray Photoelectron Spectroscopy (XPS) KW - Auger Electron Spectroscopy (AES) KW - SIMS KW - Reproducible Spectra PY - 2018 AN - OPUS4-46470 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Busch, I. A1 - Unger, Wolfgang A1 - Bütefisch, S. A1 - Lenck, O. A1 - Koenders, L. A1 - Weimann, T. A1 - Weinert, M. T1 - Analytical and topographical Reference Material for the Nanoscale N2 - Reliable standards are required to support research and development as well as end-user in application. Appropriate standards have to fulfill three requirements: small uncertainty, easy to use and low overall costs of application. For calibration of microscopes at nanoscale and/or element analysis special requirements for standards are given, which are challenging in manufacture. T2 - Workshop on Reference Nanomaterials CY - Berlin, Germany DA - 14.05.2018 KW - XPS KW - Imaging KW - Reference material KW - NoStep Standards PY - 2018 AN - OPUS4-45156 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Müller, Anja A1 - Heinrich, Thomas A1 - Kunz, Valentin A1 - Nymark, P. A1 - Radnik, Jörg T1 - Chemical characterization of nanoparticles by PCA-assisted ToF-SIMS: a) Core-shell character, b) transformation and c) grouping studies N2 - This talk was given within the scope of the SIMS-22 conference in October 2019 in Kyoto (Japan). It deals with the surface analytical investigation of nanoparticles by PCS-assisted ToF-SIMS. This technique is applicable to core-shell nanoparticles, in order to distinguish a complete encapsulation from an incomplete encapsulation of the core by the shell material. Furthermore, the depletion process of organic nanoparticle coatings caused by UV-weathering is investigated. Finally, the significance of grouping studies for nanomaterials research and risk assessment is demonstrated. T2 - The 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22) CY - Kyoto, Japan DA - 20.10.2019 KW - Nanoparticles KW - ToF-SIMS KW - Principal component analysis (PCA) PY - 2019 AN - OPUS4-50075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Ehlert, Christopher A1 - Donskyi, Ievgen A1 - Girard-Lauriault, P.-L. A1 - Lippitz, Andreas A1 - Illgen, Rene A1 - Haag, R. A1 - Adeli, M. T1 - Chemical modification of graphene and carbon nano tubes as viewed by xps and nexafs spectroscopies with dft spectra simulation N2 - Graphene is a two-dimensional carbon network with unique properties. However, its low solubility, poor reactivity and the limited accessibility of a well-defined basal plane are major challenges for applications. An ideal method to overcome these problems is the covalent attachment of functional molecules to its surface which enable further reactive modifications for specific applications. There are several technologies for surface functionalization of graphene and related CNT materials. To get control on the functionalization process and to optimize the performance of the modified surfaces analytical tools for surface chemical characterization are required. X-ray absorption (NEXAFS) and photoelectron spectroscopy (XPS) have been identified to be rather powerful here [1-3]. Specifically, NEXAFS spectroscopy underpinned by quantum chemical spectrum simulations [4] is unique in a way to address changes of aromaticity and defect formation at the graphene surface during functionalization. For relevant surface modification technologies, we present examples on how NEXAFS and XPS can do a good job. All presented modifications aim on the production of platforms for defined functional 2D nanomaterials, as for example multifunctional hybrid architectures. In detail, we investigated: • A wet chemical method for covalent functionalization of graphene sheets by a one-pot nitrene [2+1] cycloaddition reaction under mild conditions. Here a reaction between 2,4,6-trichloro-1,3,5-triazine and sodium azide with thermally reduced graphene oxide (TRGO) results in defined dichlorotriazine-functionalized graphene sheets. • Graphene and carbon nanotube functionalized by Vacuum-Ultraviolet (VUV) induced photochemical or r.f. cw low pressure plasma processes to introduce amino, hydroxy or brominated functionalities. To underpin finger-print information delivered by C K-edge NEXAFS we studied the effects of selected point and line defects as well as chemical modifications for a single graphene layer model by density functional theory based spectrum simulations. References [1] P.-L. Girard-Lauriault et al., Appl. Surf. Sci., 258 2012 8448-8454, DOI: 10.1016/j.apsusc.2012.03.012 [2] A. Lippitz et al., Surf. Sci., 611 2013 L1-L7, DOI: 10.1016/j.susc.2013.01.020 [3] A. Faghani et al., Angew. Chemie (International ed.), 56 2017 2675-2679, DOI:10.1002/anie.201612422 [4] C. Ehlert, et al., Phys.Chem.Chem.Phys., 16 2014 14083-14095, DOI: 10.1039/c4cp01106f T2 - AVS 65th INTERNATIONAL SYMPOSIUM CY - Long Beach, CA, USA DA - 21.10.2018 KW - Graphene KW - Plasma KW - Nitrene [2+1] cycloaddition KW - XPS KW - NEXAFS PY - 2018 AN - OPUS4-46468 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales Surface Analysis Working Group (SAWG) - Report for 17th Meeting (2018/19) N2 - The SAWG was established as an ad-hoc working group in 2003 before being established as a permanent working group. The first comparison was in 2007. Dr Unger recalled the terms of reference for the group, which paralleled those of the CCQM itself, with a focus on spatially resolved chemical surface analysis at the micro- and nano-scale. The group also had a remit to act as a forum for exchange of information on research and development of surface analysis, establish contact with relevant stakeholders and promote the development of SI traceable chemical surface measurements. The group currently had participants from 18 institutes, although five had not sent participants to recent meetings. Reporting progress on studies, Dr Unger said that P-190CCQM-K-157 (measurement of HfO2 in thin film) had been completed, and the subsequent K-157 approved is ongoing and that for CCQM-K153 (Measurement of Specific Adsorption of N2 and Kr on nonporous SiO2 at liquid nitrogen temperature by BET) was at the draft B was completed stageand distributed to CCQM WG chairpersons for approval. Dr Unger reported that CCQM-K-153 had covered measurement of specific absorption of nitrogen or krypton on nonporous silica at liquid nitrogen [ambient] temperature. This included an application of the BET method, a standard method for determination of surface area. This fitted into the ‘nonporous’ region of the SAWG measurement space, which included microporous, mesoporous and microporous regions. Of these regions, CCQM-K136 and CCQM-K153 demonstrated capability in meso- and microporous media respectively. CCQM-K153 involved two measurands; amount of absorbed gas at liquid nitrogen temperature, expressed as specific absorption, and the BET surface area. Specific absorption could in principle be traceable to the SI; BET was operationally defined. Five institutes participated. A detailed uncertainty budget was available for both measurands. Results had been excellent, with all laboratories agreeing well within their uncertainties and all in agreement with the reference value. Reporting on CCQM P190, Dr Unger described the study objective measurand (amount of substance of HfO2 in a thin film), samples and methods. After showing transmission electron microscope images obtained in the study, he briefly reviewed the conclusions. The study identified a need to handle carbon contamination, harmonise the XPS measurement protocol, determine emission angle and identify a consensus value for attenuation length. These conclusions had informed the design of the proposed ongoing K157 study approved at the 24th Meeting of te CCQM. The group planned a number of comparisons for the next three years: 2019: A pilot study on the amount of substance in a thin organic layer (previously approved). 2020: CCQMK-157, Measurement of the amount of substance of HfO2; A Key comparison on specific gas adsorption on microporous samples and a Pilot study on Homogeneous surface composition of an ionic liquid. 2021: A key comparison measuring the amount of substance in a thin organic layer. Dr Unger additionally described a recently proposed pilot study to examine chemical composition in a deep nanoscale layer. This was important for the electronics industry. Four participants had expressed interest. The measurand will be the amount of Ir(ppy)2(acac) in a thin organic layer within an organic layer stack on a silicon substrate. He also reported that SAWG had started work on characterisation of graphene material grown by chemical vapour decomposition (CVD). The work would examine coverage on the substrate, number of layers, level of disorder, uncertainty budgets associated with the measurement, and data analysis. A link to VAMAS Technical Work Area 41 “Graphene and Related 2D Materials“ would also be established. Looking forward, Dr Unger said the group had established a task group on application of Raman spectroscopy. This had important applications but was currently seen as qualitative. He presented the terms of reference for the task group for approval by the CCQM. Dr Unger reviewed the SAWG activities that have progressed the state of the art in measurement science. He listed the past and ongoing comparisons that had addressed new and challenging measurement problems, and drew attention to a number of key publications in surface analysis. He additionally described stakeholder engagement activities, including collaboration with VAMAS, input to ISO TC 201, contributions to Euramet projects, and contributions to two recent stakeholder workshops. T2 - 25th meeting of the Consultative Committee for Amount of Substance: Metrology in Chemistry and Biology (CCQM) CY - Paris, France DA - 11.04.2019 KW - Surface chemical analysis KW - Metrology KW - International Meter Convention PY - 2019 AN - OPUS4-48020 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales Surface Analysis Working Group (SAWG) - Report for 16th Meeting (2017/18) N2 - Following the 2017 meeting, progress with the Key Comparison CCQM-K153 related to the BET specific surface lead by UNIIM and the Pilot Study P-190 “Thickness Measurement of nm HfO2 Films” lead by KRISS will be discussed. The 16th meeting of SAWG will focus on •survey on CMC claims submitted with reference to K-129 and K-136. •the overall and SAWG specific aspects of the CCQM Strategy process, •a consideration of comparisons on convention methods as recommended by the CCQM Plenary Meeting 2017, •the 2019 CCQM Workshop and paper(s) for Metrologia’s Special Issue, •discussion of future comparisons. T2 - 24th meeting of the CCQM 2018 CY - Paris, France DA - 19.04.2018 KW - Surface chemical analysis KW - Metrology KW - Inter-laboratory comparisons PY - 2018 AN - OPUS4-44998 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kulka, M. W. A1 - Donskyi, Ievgen A1 - Wurzler, Nina A1 - Salz, D. A1 - Özcan Sandikcioglu, Özlem A1 - Unger, Wolfgang A1 - Haag, R. T1 - Mussel-Inspired Multivalent Linear Polyglycerol Coatings Outperform Monovalent Polyethylene Glycol Coatings in Antifouling Surface Properties N2 - Biofouling constitutes a major challenge in the application of biosensors and biomedical implants, as well as for (food) packaging and marine equipment. In this work, an antifouling surface coating based on the combination of mussel-inspired dendritic polyglycerol (MI-dPG) and an amine-functionalized block copolymer of linear polyglycerol (lPG−b−OA11, OA = oligo-amine) was developed. The coating was compared to a MI-dPG surface which was postfunctionalized with commercially available amine-terminated Polyethylene glycol (HO−PEG−NH2) of similar molecular weight. In the current work, These coatings were compared in their chemical stability, protein fouling characteristics, and cell fouling characteristics. The lPG−b−OA11-functionalized coating showed high chemical stability in both phosphate buffered saline (PBS) and sodium dodecyl sulfate (SDS) solutions and reduced the adhesion of fibrinogen from human plasma with 99% and the adhesion of human serum albumin with 96%, in comparison to the bare titanium dioxide substrate. Furthermore, the Proliferation of human umbilical vein endothelial cells (HUVECs) was reduced with 85% when the lPG−b−OA11 system was compared to bare titanium dioxide. Additionally, a reduction of 94% was observed when the lPG−b−OA11 system was compared to tissue culture polystyrene. KW - Antifouling surface coatings KW - Human umbilical cell adhesion KW - Linear polyglycerol KW - Polyethylene glycol KW - Mussel-inspired adhesives PY - 2019 U6 - https://doi.org/10.1021/acsabm.9b00786 VL - 2 IS - 12 SP - 5749 EP - 5759 PB - ACS AN - OPUS4-50342 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Rades, Steffi A1 - Natte, Kishore A1 - Unger, Wolfgang T1 - NanoValid D.5.47 Annex 1, Inter-laboratory comparison on measurand particle size/particle size distribution - Report of the results N2 - An inter-laboratory comparison on the particle size, expressed as mean diameter d, of nanoscaled SiO2 (#14 BAM Silica (see NanoValid DoW, D.5.41/5.42)) has been performed. The majority of participants used Dynamic Light Scattering (DLS). A few used Electron Microscopy as method. Following methods had been applied by only one partner, respectively: Small Angle X-ray Scattering, Analytical Ultracentrifugation, Atomic Force Microscopy and Atomizer with electric mobility spectrometer. KW - Nanoparticle size measurement KW - Silica nanoparticles KW - Inter-laboratory comparison KW - EU FP7 project NanoValid PY - 2019 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-488117 SP - 1 EP - 23 PB - Zenodo CY - Geneva AN - OPUS4-48811 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Rades, Steffi A1 - Natte, Kishore A1 - Unger, Wolfgang T1 - NanoValid D.5.47 Annex 2 Inter-laboratory comparison on measurand surface charge (Zeta Potential) of silica particles: Report of the results N2 - An inter-laboratory comparison on the surface charge, expressed as zeta potential ζ, of nanoscaled SiO2 has been performed using #14 BAM Silica (see D.5.41/5.42) nanoparticles. The comparability of results delivered by participants has been tested. The Task 5.4 of NanoValid is designed to test, compare and validate current methods to measure and characterize physicochemical properties of selected engineered nanoparticles. The measurand is Surface charge expressed as zeta-Potential. The measurements are to be accompanied by estimates of the uncertainties at a confidence level of 95%, deduced from the standard uncertainties. Therefore an uncertainty budget comprising statistical (Type A) and systematic (Type B) errors has to be established and delivered for the measurand. The protocol comprises two Annexes addressing the establishment of uncertainty budgets following GUM. The final goal of the comparison is to identify those methods of measurement which have potential as reference methods in pc characterization of nanoparticles for the determination of a given measurand. KW - Inter-laborator comparison KW - Surface charge KW - Zeta potential KW - Uncertainty budget KW - Silica nanoparticles KW - NanoValid PY - 2019 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-488483 SP - 1 EP - 10 PB - Zenodo CY - Geneva AN - OPUS4-48848 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Rades, Steffi A1 - Unger, Wolfgang T1 - NanoValid D.5.47 Annex 3 Inter-laboratory comparison on measurand specific surface area (BET) of nanoparticular Titania (#15 BAM Titania): Report of the results N2 - This Report describes an inter-laboratory comparison aiming on the establishment of the used method (BET) as a reference method. Another purpose was the certification of the porous reference material #15 BAM Titania as CRM BAM-P110 (cf. D 5.41/42). The certified values determined by nitrogen ad-sorption at 77.3 K according to the international standards ISO 15901-2 and ISO 9277 are summarized in the Table below. KW - Inter-laboratory comparison KW - Specific Surface Area (BET) KW - Nanoparticular TiO2 (Anatase) KW - EU FP7 project NanoValid PY - 2019 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-488491 SP - 1 EP - 22 PB - Zenodo CY - Geneva AN - OPUS4-48849 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kjaervik, Marit A1 - Schwibbert, Karin A1 - Dietrich, P. A1 - Thissen, A. A1 - Unger, Wolfgang T1 - Near-ambient pressure XPS of hydrated Escherichia coli samples with EnviroESCA N2 - This application note presents how EnviroESCA can be used to analyze E. coli biofilms on silicon under near ambient pressure conditions in various states of hydration. Such investigations of the outer bacterial cell surface in their hydrated state are essential for studying biological interfaces at work. KW - Biofilms KW - E. coli KW - NAP-XPS PY - 2018 UR - http://www.enviroai.com/uploads/1/0/2/8/102861712/nap_xps_of_escherichia_coli_samples.pdf IS - Application Note #000400 SP - 1 EP - 4 CY - Berlin, Germany AN - OPUS4-45720 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Kjaervik, Marit T1 - New work item proposal for a technical report for ISO/TC 201 WG 4 “Surface characterization of biomaterials”: Surface chemical analysis – Surface chemical analysis of cells and biofilms N2 - The proposed ISO Technical Report provides a description of a variety of physical methods of analytical chemistry by which bacteria and biofilms can be analysed. The state of the art, sample requirements and strengths associated with each method are identified. T2 - 27th Plenary Meeting of ISO/TC 201 CY - Cancun, Mexico DA - 2018-09-20 KW - Surface chemical analysis of biofilms KW - XPS KW - Fourier-Transform Infrared Spectroscopy KW - 3D nano SIMS KW - Raman-spectroscopy PY - 2018 AN - OPUS4-46214 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kjaervik, Marit A1 - Unger, Wolfgang T1 - New work item proposal for a technical report for ISO/TC 201 WG4 “Surface characterization of biomaterials”: Surface chemical analysis – Surface chemical analysis of cells and biofilms N2 - The proposed ISO Technical Report provides a description of a variety of physical methods of analytical chemistry by which bacteria and biofilms can be analysed. The state of the art, sample requirements and strengths associated with each method are identified. Presented at the DIN-meeting for NA 062-08-16 AA „Chemische Oberflächenanalyse und Rastersondenmikroskopie“ T2 - 18. Sitzung des DIN-meeting NA 062-08-16 AA "Chemische Oberflächenanalyse und Rastersondenmikroskopie“ CY - Berlin, Germany DA - 08.11.2018 KW - 3D nano SIMS KW - Fourier transform infrared spectroscopy KW - Raman-spectroscopy KW - Biofilms KW - XPS PY - 2018 AN - OPUS4-46548 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Streeck, C. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Beckhoff, B. T1 - Qualifying calibration samples for advanced thin film materials characterisation N2 - In this article the question of the certification of calibration samples for the characterisation of advanced thin film materials is addressed within the framework of reliable process control or quality management purposes. Reference measurement techniques can be used in order to address the gap in appropriate certified reference materials (CRMs) for thin film analyses. They allow for qualifying out-of-production samples originating from an operating production line as calibration samples. As a template for this procedure, CIGS [Cu(In,Ga)Se2] layers, that are absorber layers for high efficiency thin-film solar cells, have been used for establishing and validating reference-free X-ray fluorescence (XRF) analysis and Auger-electron spectroscopy (AES) as reference measurement techniques. The focus was on determining the average mole fractions in the CIGS layers obtaining results traceable to the SI unit system. Reference-free XRF is physically traceable and is based upon radiometrically calibrated instrumentation and knowledge of atomic fundamental data. Sputter-assisted AES can be established as a chemically traceable method after careful calibration using a certified reference material (CRM) based on a total number counting method. KW - CIGS KW - X-ray fluorescence (XRF) KW - Auger-electron spectroscopy (AES) PY - 2018 UR - https://www.spectroscopyeurope.com/article/qualifying-calibration-samples-advanced-thin-film-materials-characterisation VL - 30 IS - 1 SP - 11 EP - 14 PB - John Wiley & Sons Ltd CY - Chichester, West Sussex PO19 8SQ, UK AN - OPUS4-44260 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Potthoff, A. A1 - Unger, Wolfgang T1 - Report on SOP for dispersing nanomaterials in water and report on round robin test. N2 - This report describes a standard operation procedure for dispersion of nanomaterials in liquids prior to toxicological or ecotoxicological testing. Main factors, who determine the state of agglomeration and aggregation of ENMs after dispersion are specific energy input, particle concentration and fluid composition. The method was validated in two round robin tests, where two typical nanomaterials (a nanopowder and a nanodispersion) were investigated. One main result arising out of the data comparison was that only those participants, who were able to follow the instructions in the SOPs completely, received similar results regarding particle size and zeta potential. The SOP is easy to adapt for other types of nanomaterials. The results provide the standardization process and were presented at DIN working group. KW - Dispersion of nano materials KW - AEROSIL® OX50 KW - LEVASIL 50/50 PY - 2019 UR - http://publica.fraunhofer.de/documents/N-541033.html U6 - https://doi.org/10.24406/ikts-n-541033 SP - 1 EP - 24 AN - OPUS4-48022 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Dietrich, P. A1 - Beblo-Vranesevic, K. A1 - Kjærvik, Marit A1 - Unger, Wolfgang A1 - Schwibbert, Karin A1 - Hardie, K. A1 - Brown, J. T1 - XPS surface analysis of bacterial samples N2 - This application note presents how EnviroESCA can be used to analyze bacterial samples under near ambient pressure conditions in various states of hydration using different levels of humidity. Such investigations of bacterial cell wall surfaces in their hydrated state are essential for studying biological interfaces at work. The use of innovative near-ambient pressure (NAP-)XPS instrumentation allows the detailed analysis of irregularly-surfaced biofilms. NAP-XPS enables the surface analysis of bacterial samples in their natural hydrated state without complex sample preparation techniques such as freeze-drying or fast-freezing, which are needed for XPS analysis in ultrahigh vacuum. KW - Near ambient pressure XPS KW - Biofilms PY - 2018 UR - http://www.enviroai.com/uploads/1/0/2/8/102861712/xps_surface_analysis_of_bacillus_subtilis_biofilms_final.pdf IS - Application Note #000399 SP - 1 EP - 5 CY - Berlin AN - OPUS4-44588 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -