TY - JOUR A1 - Rühle, Bastian A1 - Krumrey, Julian Frederic A1 - Hodoroaba, Vasile-Dan T1 - Workflow towards automated segmentation of agglomerated, non‑spherical particles from electron microscopy images using artificial neural networks N2 - We present a workflow for obtaining fully trained artificial neural networks that can perform automatic particle segmentations of agglomerated, non-spherical nanoparticles from scanning electron microscopy images “from scratch”, without the need for large training data sets of manually annotated images. The whole process only requires about 15 minutes of hands-on time by a user and can typically be finished within less than 12 hours when training on a single graphics card (GPU). After training, SEM image analysis can be carried out by the artificial neural network within seconds. This is achieved by using unsupervised learning for most of the training dataset generation, making heavy use of generative adversarial networks and especially unpaired image-to-image translation via cycle-consistent adversarial networks. We compare the segmentation masks obtained with our suggested workflow qualitatively and quantitatively to state-of-the-art methods using various metrics. Finally, we used the segmentation masks for automatically extracting particle size distributions from the SEM images of TiO2 particles, which were in excellent agreement with particle size distributions obtained manually but could be obtained in a fraction of the time. KW - Electron microscopy KW - Neural networks KW - Artificial intelligence KW - Image segmentation KW - Automated image analysis PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-522454 DO - https://doi.org/10.1038/s41598-021-84287-6 VL - 11 IS - 1 SP - 4942 PB - Springer Nature AN - OPUS4-52245 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hahn, Marc Benjamin A1 - Dietrich, P. M. A1 - Radnik, Jörg T1 - In situ monitoring of the influence of water on DNA radiation damage by near-ambient pressure X-ray photoelectron spectroscopy N2 - Ionizing radiation damage to DNA plays a fundamental role in cancer therapy. X-ray photoelectron-spectroscopy (XPS) allows simultaneous irradiation and damage monitoring. Although water radiolysis is essential for radiation damage, all previous XPS studies were performed in vacuum. Here we present near-ambient-pressure XPS xperiments to directly measure DNA damage under water atmosphere. They permit in-situ monitoring of the effects of radicals on fully hydrated double-stranded DNA. The results allow us to distinguish direct damage, by photons and secondary low-energy electrons (LEE), from damage by hydroxyl radicals or hydration induced modifications of damage pathways. The exposure of dry DNA to x-rays leads to strand-breaks at the sugar-phosphate backbone, while deoxyribose and nucleobases are less affected. In contrast, a strong increase of DNA damage is observed in water, where OH-radicals are produced. In consequence, base damage and base release become predominant, even though the number of strand-breaks increases further. KW - DNA KW - XPS KW - NAP-XPS KW - Radiation damage KW - Single-strand break (SSB) KW - Double-strand break (DSB) KW - Xray KW - OH radical KW - Hydroxyl radical KW - LEE KW - Low energy electrons KW - Dosimetry KW - Geant4 KW - Geant4-DNA KW - TOPAS KW - TOPAS-nbio KW - Microdosimetry KW - DNA radiation damage KW - Direct damage KW - Indirect damage KW - Quasi-direct damage KW - Hydration shell KW - Dry DNA KW - Hydrated DNA KW - ROS KW - Radical KW - Reactive oxygen species KW - Net-ionization reaction KW - Radiation therapy KW - Cancer therapy KW - Xray photo electron spectrocopy KW - Near ambient pressure xray photo electron spectroscopy KW - Base damage KW - Base loss KW - Dissociative electron transfer (DET) KW - Dissociative electron attachment (DEA) KW - Hydrated electron KW - Prehydrated electron KW - Ionization KW - PES PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-524060 DO - https://doi.org/10.1038/s42004-021-00487-1 SN - 2399-3669 VL - 4 IS - 1 SP - 50 PB - Springer Nature CY - London AN - OPUS4-52406 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -