TY - CONF A1 - Müller, Axel A1 - Vogler, M. A1 - Grathwohl, P. A1 - Kocher, B. A1 - Braun, Ulrike T1 - Analysis of tire wear particles in soil samples from roadside using TED-GC/MS N2 - Tire wear particles (TW) are generated by the abrasions of tires on the road surface through traffic. These particles can be transported by air and surface runoff and might also infiltrate the soil and consequently affect terrestrial ecosystems. The estimated tire wear (TW) emissions are immense, with 1.33 106 t a-1 in Europe. Despite this, only little is known about the environmental contents or the fate of TW. One reason for this knowledge gap is the challenging analysis of TW in environmental samples. Detection of TW with spectroscopic methods is problematic due to high fluorescence interferences caused by contained black carbon. One analytical approach is to use zinc (Zn), a typical additive in tires, as a specific marker for the quantification of tire wear. However, any Zn originating from the sample matrix must be separated beforehand and requires elaborate sample preparation. Car tires consist partly of synthetic rubbers, such as styrene-butadiene-rubber (SBR). This SBR could be identified and quantified via Thermal-Extraction-Desorption-Gas Chromatography-Mass Spectrometry (TED-GC-MS). This newly developed and fast screening method allows the simultaneous detection of microplastics and TW mass contents and requires minimal to no sample preparation. Firstly the sample is thermally extracted in a thermobalance under a nitrogen atmosphere. The resulting specific decomposition products are sorbed on a solid phase adsorber, which is then transferred to a GC-MS via an autosampler, where the products are desorbed, separated and identified. Cyclohexenylbenzene is used as a specific marker for SBR. Here we investigated top layer soil samples, collected at the roadside of highly frequented German highways. Samples were analyzed without sample preparation, and SBR was detected in all investigated samples in mass contents ranging from 67.2 to 2230 mg kg-1. A correlation between SBR and Zn content in the soil was confirmed, while the correlation between SBR and Corg was hardly pronounced. We successfully demonstrated the application of TED-GC-MS as a screening method for tire wear in soil samples. The present study will discuss these analytical results in detail as well as sampling parameters like sampling depth and distance to the roadside, and the effect of the particle size on the particle transport by water runoff and air. T2 - SETAC 2020 SciCon CY - Online meeting DA - 03.05.2020 KW - Microplastic KW - Analysis KW - Tire wear KW - Soil PY - 2020 AN - OPUS4-51086 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Analytical & Characterisation Excellence in nanomaterial risk assessment: A tiered approach N2 - The work packages of the EU H2020 project ACEnano are presented and their activities in standardization and guidance for regulators and SMEs. T2 - ISO/TC 229 Strategy meeting CY - Online meeting DA - 10.11.2020 KW - Nanomaterials KW - Standardization KW - Risk assessment PY - 2020 AN - OPUS4-51611 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Benettoni, P. A1 - Stryhanyuk, H. A1 - Wagner, S. A1 - Hachenberger, Y. A1 - Jungnickel, H. A1 - Tentschert, J. T1 - Analytical and Characterisation Excellence in nanomaterial risk assessment: A tiered approach Task2.5 N2 - The final results of Task 2.5 "Optimization of sample preparation for characterization of ENPs using TOF-SIMS under real-life conditions (a.) UfZ: polymer template; b.) BAM: pressing of pellets)" were presented. T2 - ACEnano General Meeting CY - Amsterdam, The Netherlands DA - 05.03.2020 KW - Nanoparticles KW - ToF-SIMS KW - Preparation PY - 2020 AN - OPUS4-50572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radtke, Martin T1 - Artificial intelligence for spectroscopy examples from BAMline N2 - Various applications for artificial intelligence in the context of spectroscopy will be presented. in particular, examples from bamline will be featured. After a short introduction to synchrotron radiation, artificial intelligence algorithms for the quantification of X-ray fluorescence measurement are discussed. In the second example, information retrieval by natural language processing is reviewed. As a last example the reconstruction of measurements with the X-ray color camera and coded apertures is presented. T2 - Seminar Strahlenphysikalische Anwendungen in Technik und Medizin CY - ATi Wien, Austria DA - 22.01.2020 KW - Machine learning KW - Natural language processing KW - Neural networks KW - Synchrotron KW - BAMline PY - 2020 AN - OPUS4-51891 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mezera, Marek A1 - Richter, Anja A1 - Krüger, Jörg A1 - Bonse, Jörn A1 - Schwibbert, Karin T1 - Bacterial adhesion on femtosecond laser-induced periodic surface structures N2 - Biofilm formation in industrial or medical settings is usually unwanted and leads to serious health problems and high costs. Inhibition of initial bacterial adhesion prevents biofilm formation and is, therefore, a major mechanism of antimicrobial action of surfaces. Surface topography largely influences the interaction between bacteria and surfaces which makes topography an ideal base for antifouling strategies and eco-friendly alternatives to chemical surface modifications. Femtosecond laser-processing was used to fabricate sub-micrometric surface structures on silicon and stainless steel for the development of antifouling topographies on technical materials. T2 - Future Tech Week 2020 CY - Online meeting DA - 21.09.2020 KW - Laser-induced periodic surface structures (LIPSS) KW - Bacterial adhesion KW - Biofilm growth KW - Structural color KW - Femtosecond laser processing PY - 2020 UR - http://futuretechweek.fetfx.eu/wp-content/uploads/gravity_forms/2-5432af7ecff9e0243d7383ab3f931ed3/2020/09/BioCombs4Nanofibers_Poster-for-Future_Tech_Week_2020_08-09-2020_with_Reprint-permission_for_upload.pdf AN - OPUS4-51233 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Pauw, Brian Richard T1 - Basics and applications of good SAXS: Quantifying the fine structure of lots of materials N2 - In contrast to the crisp, clear images you can get from electron microscopy, small-angle X-ray scattering (SAXS) patterns are rather featureless. These patterns, however, contain averaged structural information of all of the finest material structures that were illuminated by the X-ray beam. With careful and precise investigation, and supplementary information from complementary techniques, this bulk material structure can be quantified to reveal structural information spanning four or even five decades in size. Additionally, while the data correction and analysis is complex, sample preparation is very straightforward, also allowing for in-situ and operando measurements to be performed without breaking a sweat. In the right hands, then, this technique can be the most powerful tool in your analytical arsenal. T2 - OpTecBB webinar within the scope of the focus area Optical Analytics CY - Online meeting DA - 27.05.2020 KW - Small-angle scattering KW - Introduction KW - Application KW - Saxs KW - Nanomaterials KW - Nanostructure PY - 2020 UR - https://www.youtube.com/watch?v=mXkYL3dSsTY UR - https://optecbb.de/veranstaltungen/veranstaltung/webinar-basics-and-applications-of-good-saxs-1238/ AN - OPUS4-50879 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Marcoulaki, E. A1 - M López de Ipiña, J. A1 - Vercauteren, S. A1 - Witters, H. A1 - Lynch, I. A1 - van Duuren-Stuurman, B. A1 - Shandilya, N. A1 - Kunz, Valentin A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan A1 - Bard, D. A1 - Evans, G. A1 - Viitanen, A.-K. A1 - Pilou, M. A1 - Bochon, A. A1 - Duschl, A. A1 - Himly, M. A1 - Geppert, M. A1 - Persson, K. A1 - Cotgreave, I. A1 - Niga, P. A1 - Scalbi, S. A1 - Caillard, B. A1 - Arevalillo, A. A1 - Jensen, K. A. A1 - Frejafon, E. A1 - Bouillard, J. A1 - Aguerre-Chariol, O. A1 - Dulio, V. T1 - Blueprint for a sustainable new European Centre to support safe innovation for nanotechnology N2 - This paper presents the blueprint for the operation of a sustainable and permanent European Centre of collaborating reference laboratories and research centres, to establish a one-stop shop for a wide variety of nanosafety related services, and to provide a central contact point for questions about nanosafety in Europe. The Centre aims to harmonise service provision, and bring novel risk assessment and management approaches closer to practice. T2 - NANOSAFE 2020 CY - Online meeting DA - 16.11.2020 KW - EC4SafeNano KW - European Centre KW - Nanomaterials KW - Nanosafety KW - Catalogue of Services (CoS) PY - 2020 UR - https://www.nanosafe.org/cea-tech/pns/nanosafe/en AN - OPUS4-51694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge. In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation. KW - Nanoparticles KW - Characterization method KW - Sample preparation KW - Inter-laboratory comparison KW - Standardisation KW - Measurement uncertainty KW - Case studies PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/C2017-0-00312-9 SP - 1 EP - 566 PB - Elsevier CY - Amsterdam AN - OPUS4-50284 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Weise, Matthias A1 - Hertwig, Andreas A1 - Beck, Uwe T1 - Characterization of Surface Topometry and Determination of Layer Thickness by Scanning White Light Interference Microscopy N2 - 3D coherence scanning interferometry (CSI) is an optical, non-contact and rapide measurement technique using a defined bandwidth of white light at normal incidence. Based on this operational principle, white light interference microscopy (WLIM) provides three-dimensional surface topometry data up to a resolution of 0.4 μm lateral and 0.1 nm vertical. Three operating modi, i.e. surface, films and advanced films, enable measurements of step heights, roughness, wear volume, cone angle, surface pattern and layer thickness of transparent coatings. The determination of layer thickness by WLIM requires the knowledge of optical constants, i.e.the refractive index n and the extinction coefficient k. For technical surfaces, data base values - if available at all - have to be determined or validated by spectroscopic ellipsometry (SE). From this oblique incidence technique both optical constants and layer thickness can be derived based on a model for at least semi-transparent coatings. For different layer thicknesses, a comparison is made between WLIM and SE. Measurement uncertainty is discussed for both topometric features and layer thickness for different use cases. Traceability to SI system is ensured by certified standards (PTB/NIST) within a DAkkS DIN EN ISO/IEC 17025:2018 accredited lab. T2 - 17th International Conference on Plasma Surface Engineering (PSE) CY - Erfurt, Germany DA - 07.09.2020 KW - Rroughness and step heights KW - Lateral surface pattern KW - Layer thickness of transparent coatings KW - Scanning white light interferometry KW - Spectroscopic ellipsometry PY - 2020 AN - OPUS4-51301 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Pauw, Brian Richard A1 - Smales, Glen Jacob T1 - Complete set of raw and processed datasets, as well as associated Jupyter notebooks for analysis, associated with manuscript entitled: "The MOUSE project: a practical approach for obtaining traceable, wide-range X-ray scattering information" N2 - This dataset is a complete set of raw, processed and analyzed data, complete with Jupiter notebooks, associated with the manuscript mentioned in the title. In the manuscript, we provide a "systems architecture"-like overview and detailed discussions of the methodological and instrumental components that, together, comprise the "MOUSE" project (Methodology Optimization for Ultrafine Structure Exploration). Through this project, we aim to provide a comprehensive methodology for obtaining the highest quality X-ray scattering information (at small and wide angles) from measurements on materials science samples. KW - X-ray scattering KW - Measurement methodology KW - Traceability derivation KW - Multi-scale measurements KW - Systems architecture KW - Nanomaterials PY - 2020 DO - https://doi.org/10.5281/zenodo.4312953 PB - Zenodo CY - Geneva AN - OPUS4-51825 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -