TY - JOUR A1 - Nolze, Gert A1 - Tokarski, T. A1 - Rychlowski, L. T1 - Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 3. Pseudosymmetry JF - Journal of Applied Crystallography N2 - A pseudosymmetric description of the crystal lattice derived from a single wideangle Kikuchi pattern can have several causes. The small size (<15%) of the sector covered by an electron backscatter diffraction pattern, the limited precision of the projection centre position and the Kikuchi band definition are crucial. Inherent pseudosymmetries of the crystal lattice and/or structure also pose a challenge in the analysis of Kikuchi patterns. To eliminate experimental errors as much as possible, simulated Kikuchi patterns of 350 phases have been analysed using the software CALM [Nolze et al. (2021). J. Appl. Cryst. 54, 1012–1022] in order to estimate the frequency of and reasons for pseudosymmetric crystal lattice descriptions. Misinterpretations occur in particular when the atomic scattering factors of non-equivalent positions are too similar and reciprocal-lattice points are systematically missing. As an example, a pseudosymmetry prediction depending on the elements involved is discussed for binary AB compounds with B1 and B2 structure types. However, since this is impossible for more complicated phases, this approach cannot be directly applied to compounds of arbitrary composition and structure. KW - Bravais lattices KW - Pseudosymmetry KW - Lattice point density KW - Ordered/disordered structures KW - Lattice distortion PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-573169 DO - https://doi.org/10.1107/s1600576723000845 SN - 0021-8898 VL - 56 IS - Pt. 2 SP - 367 EP - 380 AN - OPUS4-57316 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cios, G. A1 - Winkelmann, A. A1 - Nolze, Gert A1 - Tokarski, T. A1 - Rychlowski, L. A1 - Dan, L. A1 - Bala, P. T1 - Mapping of lattice distortion in martensitic steelβ€”Comparison of different evaluation methods of EBSD patterns JF - Ultramicroscopy N2 - To visualize the varying tetragonal distortions in high carbon martensitic steels by EBSD, two different approaches have been applied on backscattered Kikuchi diffraction (BKD) patterns. A band-edge refinement technique called Refined Accuracy (RA) (Oxford Instruments) is compared with a technique called Pattern Matching (PM), which optimizes the fit to a simulated BKD signal. RA distinguishes between hypothetical phases of different fixed π‘βˆ•π‘Ž, while PM determines a best fitting continuous π‘βˆ•π‘Ž by projective transformation of a master pattern. Both techniques require stored BKD patterns. The sensitivity of the π‘βˆ•π‘Ž-determination was tested by investigating the microstructure of a ferritic steel with an expected π‘βˆ•π‘Ž = 1. The influence of the Kikuchi pattern noise on π‘βˆ•π‘Ž was compared for a single or 40 averaged frames per measuring point, and turned out to be not significant. The application of RA and PM on the martensitic microstructure delivered qualitatively similar maps of π‘βˆ•π‘Ž. The comparison of RA and PM shows that RA is suitably fast and precise during mapping the martensite π‘βˆ•π‘Ž ratio in analyses of high carbon martensite, especially for fast initial surveys. As RA leads quantitatively to higher noise in π‘βˆ•π‘Ž, the PM analysis can be used for higher precision results. KW - EBSD KW - Steel KW - Martensite KW - Tetragonality KW - Strain PY - 2023 DO - https://doi.org/10.1016/j.ultramic.2023.113824 VL - 253 SP - 1 EP - 11 AN - OPUS4-58158 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nolze, Gert A1 - Tokarski, T. A1 - Rychlowski, L. T1 - Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 1. Where is the Bragg angle? JF - Journal of Applied Crystallography N2 - The derivation of a crystal structure and its phase-specific parameters from a single wide-angle backscattered Kikuchi diffraction pattern requires reliable extraction of the Bragg angles. By means of the first derivative of the lattice profile, an attempt is made to determine fully automatically and reproducibly the band widths in simulated Kikuchi patterns. Even under such ideal conditions (projection centre, wavelength and lattice plane traces are perfectly known), this leads to a lattice parameter distribution whose mean shows a linear offset that correlates with the mean atomic number Z of the pattern-forming phase. The consideration of as many Kikuchi bands as possible reduces the errors that typically occur if only a single band is analysed. On the other hand, the width of the resulting distribution is such that higher image resolution of diffraction patterns, employing longer wavelengths to produce wider bands or the use of higher interference orders is less advantageous than commonly assumed. KW - Bragg angles KW - Kikuchi bands KW - Kikuchi patterns KW - First derivative KW - Lattice parameters PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-573141 DO - https://doi.org/10.1107/S1600576723000134 SN - 0021-8898 VL - 56 IS - Pt. 2 SP - 349 EP - 360 AN - OPUS4-57314 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nolze, Gert A1 - Tokarski, T. A1 - Rychlowski, L. T1 - Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections JF - Journal of Applied Crystallography N2 - A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Ξ”a/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simulated Kikuchi patterns, Ξ”a/a can reach up to 8% for phases with a high mean atomic number Z, whereas for much more common low-Z materials the offset decreases linearly. A predicted offset Ξ”a/a = f(Z) is therefore proposed, which also includes the unit-cell volume and thus takes into account the packing density of the scatterers in the material. Since Z is not always available for unknown phases, its substitution by Zmax, i.e. the atomic number of the heaviest element in the compound, is still acceptable for an approximate correction. For simulated Kikuchi patterns the offset-corrected lattice parameter deviation is Ξ”a/a < 1.5%. The lattice parameter ratios, and the angles Ξ±, Ξ² and Ξ³ between the basis vectors, are not affected at all.1.5%. The lattice parameter ratios, and the angles οΏ½ , οΏ½ and οΏ½ between the basis vectors, are not affected at all. KW - Mean atomic number KW - Kikuchi patterns KW - Lattice parameters KW - Automated Bragg angle determination KW - Lattice parameter determination PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-573153 DO - https://doi.org/10.1107/s1600576723000146 SN - 0021-8898 VL - 56 IS - Pt. 2 SP - 361 EP - 366 AN - OPUS4-57315 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Petrushin, N. V. A1 - Epishin, A. I. A1 - Svetlov, I. L. A1 - Nolze, Gert A1 - Elyutin, E. S. A1 - Solov'ev, A. E. T1 - Influence of the Sign of the Ξ³/Ξ³' Misfit on the Structure and Creep Strength of Single Crystals of Nickel-Based Superalloys JF - Inorganic Materials: Applied Research N2 - Using the method of directional solidification, single crystals of experimental nickel-based superalloys with negative, zero, and positive Ξ³/Ξ³' misfits are obtained. The Ξ³' solvus, solidus, and liquidus temperatures of the alloys are determined, and the microstructures of the alloys after directional solidification, heat treatment, and creep tests are investigated. Creep tests are performed at temperatures of 800 and 1000Β°C. It is found that single crystals of the alloy with a negative Ξ³/Ξ³' misfit have the highest creep resistance and lifetime (the crystal lattice period of the Ξ³' phase is smaller than that of the Ξ³ matrix). KW - Nickel-based superalloys KW - Single crystal KW - Creep KW - Creep strength KW - Microstructure, Ξ³/Ξ³' misfit PY - 2023 DO - https://doi.org/10.1134/s207511332301029x SN - 2075-1133 VL - 14 IS - 1 SP - 13 EP - 22 AN - OPUS4-59505 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -