TY - CONF A1 - Agudo Jácome, Leonardo A1 - Pöthkow, K. A1 - Paetsch, O. A1 - Hege, H.-C. T1 - 3D reconstruction and quantification of dislocation substructures from TEM stereo pairs N2 - Dislocations are the carriers of plastic deformation. As such, their characterization offers important information on the properties they affect. In this contribution, a new tool is presented, which is incorporated in Amira ZIB Edition and allows for three-dimensional (3D) imaging and quantification of dislocations substructures from thick regions an electron-transparent specimen. In the tool, the dislocation segments are traced on diffraction contrast images that are obtained in the transmission electron microscope (TEM). The uncertainties related to the experimental setup and to the proposed method are discussed on the base of a tilt series. T2 - AVIZO / AMIRA User Meeting CY - Berlin, Germany DA - 14.11.2018 KW - Dislocation KW - Diffraction contrast KW - Scanning transmission electron microscopy (STEM) PY - 2018 AN - OPUS4-47394 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Agudo Jácome, Leonardo A1 - Pöthkow, K. A1 - Paetsch, O. A1 - Hege, H.-C. T1 - Three-dimensional reconstruction and quantification of dislocation substructures from transmission electron microscopy stereo pairs N2 - A great amount of material properties is strongly influenced by dislocations, the carriers of plastic deformation. It is therefore paramount to have appropriate tools to quantify dislocation substructures with regard to their features, e.g., dislocation density, Burgers vectors or line direction. While the transmission electron microscope (TEM) has been the most widely-used equipment implemented to investigate dislocations, it usually is limited to the two-dimensional (2D) observation of three-dimensional (3D) structures. We reconstruct, visualize and quantify 3D dislocation substructure models from only two TEM images (stereo pairs) and assess the results. The reconstruction is based on the manual interactive tracing of filiform objects on both images of the stereo pair. The reconstruction and quantification method are demonstrated on dark field (DF) scanning (S)TEM micrographs of dislocation substructures imaged under diffraction contrast conditions. For this purpose, thick regions (> 300 nm) of TEM foils are analyzed, which are extracted from a Ni-base superalloy single crystal after high temperature creep deformation. It is shown how the method allows 3D quantification from stereo pairs in a wide range of tilt conditions, achieving line length and orientation uncertainties of 3% and 7°, respectively. Parameters that affect the quality of such reconstructions are discussed. KW - Dislocation KW - Diffraction contrast KW - Scanning transmission electron microscopy (STEM) KW - Stereoscopy KW - Visualization PY - 2018 U6 - https://doi.org/10.1016/j.ultramic.2018.08.015 SN - 0304-3991 VL - 195 SP - 157 EP - 170 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-46355 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -