TY - JOUR A1 - Kar, S. A1 - Ikeda, Yuki A1 - Lünser, K. A1 - Woodcock, Th. G. A1 - Nielsch, K. A1 - Reith, H. A1 - Maaß, Robert A1 - Fähler, S. T1 - Growth Twins and Premartensite Microstructure in Epitaxial Ni-Mn-Ga Films N2 - Magnetic shape memory alloys have been examined intensively due to their multifunctionality and multitude of physical phenomena. For both areas, epitaxial films are promising since the absence of grain boundaries is beneficial for applications in microsystems and they also allow to understand the influence of a reduced dimension on the physical effects. Despite many efforts on epitaxial films, two particular aspects remain open. First, it is not clear how to keep epitaxial growth up to high film thickness, which is required for most microsystems. Second, it is unknown how the microstructure of premartensite, a precursor state during the martensitic transformation, manifests in films and differs from that in bulk. Here, we focus on micrometer-thick austenitic Ni-Mn-Ga films and explain two distinct microstructural features by combining high-resolution electron microscopy and X-ray diffraction methods. First, we identify pyramid-shaped defects, which originate from {1 1 1} growth twinning and cause the breakdown of epitaxial growth. We show that a sufficiently thick Cr buffer layer prevents this breakdown and allows epitaxial growth up to a thickness of at least 4 μm. Second, premartensite exhibits a hierarchical microstructure in epitaxial films. The reduced dimension of films results in variant selection and regions with distinct premartensite variants, unlike its microstructure in bulk. KW - Alloy KW - Epitaxial films KW - Hierarchical microstructure Premartensite KW - Twinning KW - Magnetic shape memory PY - 2023 DO - https://doi.org/10.1016/j.actamat.2023.118902 SN - 1359-6454 VL - 252 SP - 1 EP - 10 PB - Elsevier B.V. AN - OPUS4-57301 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kar, Satyakam A1 - Ikeda, Yuki A1 - Nielsch, Kornelius A1 - Reith, Heiko A1 - Maaß, Robert A1 - Fähler, Sebastian T1 - Multiferroic Microstructure Created from Invariant Line Constraint N2 - Ferroic materials enable a multitude of emerging applications, and optimum functional properties are achieved when ferromagnetic and ferroelectric properties are coupled to a first‐order ferroelastic transition. In bulk materials, this first‐order transition involves an invariant habit plane, connecting coexisting phases: austenite and martensite. Theory predicts that this plane should converge to a line in thin films, but experimental evidence is missing. Here, the martensitic and magnetic microstructure of a freestanding epitaxial magnetic shape memory film is analyzed. It is shown that the martensite microstructure is determined by an invariant line constraint using lattice parameters of both phases as the only input. This line constraint explains most of the observable features, which differ fundamentally from bulk and constrained films. Furthermore, this finite‐size effect creates a remarkable checkerboard magnetic domain pattern through multiferroic coupling. The findings highlight the decisive role of finite‐size effects in multiferroics. KW - Epitaxial films KW - Finite-size effects KW - Multiferroics KW - Martensite KW - Magnetic shape memory alloys PY - 2024 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-637910 DO - https://doi.org/10.1002/adfm.202416638 SN - 1616-301X VL - 35 IS - 10 SP - 1 EP - 11 PB - Wiley AN - OPUS4-63791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -