TY - CONF A1 - Bresch, Harald A1 - Rühle, Bastian A1 - Hodoroaba, Vasile-Dan A1 - Resch-Genger, Ute A1 - Kuchenbecker, Petra A1 - Abram, Sarah-Luise A1 - Löhmann, Oliver A1 - Mrkwitschka, Paul T1 - Tour de table - BAM N2 - Kurzübersicht über die neuen Aktivitäten zu Nanomaterialien in 2021. T2 - Nano-Behördenklausur der Bundesoberbehörden 2021 CY - Online meeting DA - 17.11.2021 KW - Nano KW - Nanomaterial KW - Nanopartikel KW - Bundesoberbehörden PY - 2021 AN - OPUS4-53827 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Keller, Lisa-Marie A1 - Scholz, Lena A1 - Weigert, Florian A1 - Radnik, Jörg A1 - Rühle, Bastian A1 - Bresch, Harald T1 - Nanocarriers – Challenges Imposed by Material Characterization N2 - A brief perspective of BAM on nanocarriers is presented including examples with special emphasis on the characterization of such materials and underlying challenges. In this respect, also ongoing activities at BAM on different types of core/shell nanomaterials and related systems are briefly summarized. T2 - Kolloquium BfR CY - Online meeting DA - 18.03.2021 KW - Nanomaterial KW - Nanocarrier KW - Size KW - Surface chemistry KW - Release kinetics KW - Chemical composition KW - Core/shell nanoparticle KW - Quantum dot KW - Spectroscopy KW - Fluorescence PY - 2021 AN - OPUS4-52412 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bresch, Harald A1 - Hodoroaba, Vasile-Dan A1 - Schmidt, Alexandra A1 - Rasmussen, K. A1 - Rauscher, H. T1 - Counting Small Particles in Electron Microscopy Images — Proposal for Rules and Their Application in Practice JF - Nanomaterials N2 - Electron microscopy (EM) is the gold standard for the characterisation of the morphology (size and shape) of nanoparticles. Visual observation of objects under examination is always a necessary first step in the characterisation process. Several questions arise when undertaking to identify and count particles to measure their size and shape distribution. In addition to challenges with the dispersion and identification of the particles, more than one protocol for counting particles is in use. This paper focuses on precise rules for the counting of particles in EM micrographs, as this influences the measurement accuracy of the number of particles, thus implicitly affecting the size values of the counted particles. We review and compare four different, commonly used methods for counting, which we then apply in case studies. The impact of the selected counting rule on the obtained final particle size distribution is highlighted. One main aim of this analysis is to support the application of a specific, well-defined counting approach in accordance with regulatory requirements to contribute to achieving more reliable and reproducible results. It is also useful for the new harmonised measurement procedures for determining the particle size and particle size distribution of nanomaterials. KW - Nano KW - Particle size distribution KW - Nanoparticle KW - Nanomaterial KW - OECD PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-551891 DO - https://doi.org/10.3390/nano12132238 SN - 2079-4991 VL - 12 IS - 13 SP - 2238 PB - MDPI CY - Basel AN - OPUS4-55189 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -