TY - CONF A1 - Bresch, Harald T1 - Nanoparticle Characterisation - The long way to standardisation N2 - Diese Präsentation gibt einen Überblick über die Entwicklung der Nanopartikelforschung von ca. 2005 bis heute. Beginnend mit den Besonderheiten von Nanopartikeln und der Aufnahme in den menschlichen Körper über Messmethoden bis hin zur Entwicklung einer Prüfrichtlinie im Rahmen der OECD und einem Ausblick über die absehbaren digitalen Entwicklungen. T2 - Abteilungsseminar der Abteilung 4 CY - Berlin, Germany DA - 27.02.2025 KW - Nanomaterials KW - Nano KW - OECD KW - Standardisierung KW - Advanced Materials PY - 2025 AN - OPUS4-64977 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - Nano and Advanced Materials - Competences at BAM and perspectives N2 - This presentation gives an overview about the competencies and the characterization possibilities of nanoparticles at BAT, based on this the development of the OECD TG 125 at BAM. It further describes research activities at BAM concerning the characterization of nanoparticles and the way to the digital representation of these characterization possibilities. It concludes with the challenges of a digital product passport (DPP) for nanomaterial based products and the need of a digital materials passport (DMP). Finally, the activities of BAM are presented which address the former mentioned challenges from ESRP and DPP. T2 - Austausch Helmholtz Hereon / Digipass & BAM CY - Berlin, Germany DA - 07.07.2025 KW - Nanomaterials KW - ESPR KW - DPP KW - Nano KW - Advanced Materials PY - 2025 AN - OPUS4-64974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - Critical needs and stakeholder networks for engineered particles in air N2 - In the frame of CCQM a new Task Group for particle characterization is being formed. This presentation is a gap analysis and stakeholder mapping for particles in air, from engineered to natural materials. The analysis was requested for the following points: (1) critical literature on stakeholder needs and relevant metrology (2) existing reference materials and relevant interlaboratory comparisons (3) relevant metrology projects (4) critical stakeholders and stakeholder networks and stakeholder surveys T2 - CCQM IAWG/SAWG TG Particle Metrology CY - Online meeting DA - 09.07.2024 KW - CCQM KW - Particle KW - Nano KW - Characterization KW - Aerosol PY - 2024 AN - OPUS4-62067 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - Anwendungen von maschinellem Lernen und KI an der BAM N2 - Im Austausch mit den anderen Bundesoberbehörden wurden die KI-Ansätze der verschiedenen Bundesoberbehörden zu spezifischen Themen der Nanowissenschaften präsentiert. Der Vortrag der BAM fokusiert sich auf die Themen "Self driving lab", semantische Segmentierung und Auswertung von elektronenmikroskopischen Bildern sowie die Generierung von ausführbaren Machineninstruktionen aus natürlicher Sprache. Abschließend wird der neue BAM DataStore vorgestellt. T2 - Nano-Behördenklausur 2024 CY - Berlin, Germany DA - 03.07.02024 KW - Nano KW - Bundesoberbehörden KW - Künstliche Intelligenz KW - Neuronale Netzwerke KW - Elektronisches Laborbuch PY - 2024 AN - OPUS4-61819 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - OECD TG 125 Particle size and size distribution of Nanomaterials N2 - This presentation was held in an OECD Webinar introducing the newly developed and published OECD TG 125 on particle size and size distribution. The presentation is explaining the structure if the TG 125 and addresses all included methods and methodologies in a short and understandable way for the broader public. The presentation includes sections about nano-particles and nano-fibres. T2 - Webinar Series on Testing and Assessment Methodologies CY - Online meeting DA - 07.02.2023 KW - Nano KW - Nanomaterials KW - OECD KW - Test guideline KW - Size PY - 2023 UR - https://www.oecd.org/chemicalsafety/nanomet/presentations-webinar-nanomaterials-particle-size-distribution-test-guideline-125.pdf AN - OPUS4-58447 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - OECD Prüfrichtlinie 125 N2 - Diese Präsentation ist eine Einführung in die OECD TG 125 zur Bestimmung der Partikelgrößen von Nanomaterialien. Es wird auf die verchiedenen Probleme der Partikelgrößenbestimmung eingegangen wie z.B. verschiedene Oberflächenschichten, Äquivalenzdurchmesser und Verteilungsfunktionen. Gleichzeitig werden die neuen Begrifflichkeiten eingeführt, die in der TG 125 definiert neu werden. T2 - BAM Akademie Digitaler Info-Tag "Nano or not Nano" CY - Online meeting DA - 16.02.2023 KW - Nano KW - Partikel KW - Größe KW - Partikeldurchmesser KW - Äquivalenzdurchmesser PY - 2023 AN - OPUS4-58449 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bresch, Harald A1 - Schmidt, Alexandra A1 - Kämpf, K. A1 - Bachmann, V. A1 - Peters, T. A1 - Kuhlbusch, T. T1 - Test Guideline No. 125 - Nanomaterial Particle Size and Size Distribution of Nanomaterials N2 - The OECD Working Party on Manufactured Nanomaterials (WPMN) has actively worked towards understanding possible safety issues for manufactured nanomaterials and has contributed significantly to resolving these by developing Test Guidelines, Guidance Documents, Test Reports and other publications with the aim of a safe use of manufactured nanomaterials. To address the specific needs of manufactured nanomaterials, the OECD Test Guideline No. 110 “Particle Size Distribution/Fibre Length and Diameter Distributions” was identified as one of the test guidelines (TGs) to require an update. The current TG 110 (adopted in 1981) is only valid for particles and fibres with sizes above 250 nm. The WPMN prioritised to either update TG 110 to be applicable also to particles at the nanoscale or draft a new nanomaterial specific (TG). Eventually, it was decided to develop a new TG that covers the size range from 1 nm to 1000 nm, intended for particle size and particle size distribution measurements of nanomaterials. Paragraph 11 provides further justification on the need for such measurements for nanomaterials. This TG overlaps with TG 110 in the size range from 250 nm to 1000 nm. When measuring particulate or fibrous materials, the appropriate TG should be selected depending on the size range of particles tested. In line with TG 110, the new TG for nanomaterials includes separate parts for particles and fibres. For the part of this TG which addresses particles, several methods applicable to nanomaterials were reviewed and included to take into account developments since 1981 when the TG 110 was adopted. This TG includes the following methods: Atomic Force Microscopy (AFM), Centrifugal Liquid Sedimentation (CLS)/Analytical Ultracentrifugation (AUC), Dynamic Light Scattering (DLS), Differential Mobility Analysis System (DMAS), (Nano)Particle Tracking Analysis (PTA/NTA), Small Angle X-Ray Scattering (SAXS), Scanning Electron Microscopy (SEM), and Transmission Electron Microscopy (TEM). The method Single Particle Inductively Coupled Plasma Mass Spectrometry (sp-ICP-MS) could not be sufficiently validated within the interlaboratory comparison (ILC) carried out for the different methods in this TG (see also paragraph 6 for further details on the ILC). Applicability of sp-ICP-MS is strongly limited to nanomaterials with high mass values in combination with a sufficiently high particle size. However, the general method ICP-MS is widely used and the sp-mode for the size measurement of specific nanomaterials was successfully performed in ILCs elsewhere. The method is therefore included in the Appendix Part C of this TG, which further details the limitations of sp-ICP-MS. For measuring the diameter and length of fibres, analysing images captured with electron microscopy is currently the only method available. This TG includes Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). To test the validity of this TG, an ILC was performed. Test materials were chosen to reflect a broad range of nanomaterial classes, e.g. metals, metal oxides, polymers and carbon materials. Where possible, well-characterised test materials were used. Additionally, the test materials were chosen to reflect a broad range of sizes representing the size range 1 nm to 1000 nm. Specifically for fibres, a broad range of aspect ratios was included (length/diameter of 3 to > 50). Some of the test materials used are commercially available and further references are given in the validation report of the ILC. Sample preparation for physical chemical characterisation is critical for all listed methods. Due to the differences between individual nanomaterials and due to the wide range of individual material properties it is impossible to have a generic protocol to obtain the best possible sample preparation for every nanomaterial. Therefore, a generic protocol on sample preparation is not part of this TG. Information on sample preparation is given in the paragraphs 25-29, 33, 34 and 39 for particles and in paragraphs 159) for fibres. Further information on sample preparation of nanomaterials for physical chemical characterisation can be found in the OECD Guidance on Sample Preparation and Dosimetry for the Safety Testing of Manufactured Nanomaterials and elsewhere. KW - Nano KW - Nanomaterial KW - Nanoparticle KW - OECD KW - Test guideline PY - 2022 DO - https://doi.org/10.1787/20745753 SP - 1 EP - 72 PB - Organisation for Economic Co-operation and Development CY - Paris AN - OPUS4-55191 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - Übersicht zu Projekten bei DIN/ISO, VAMAS und CCQM N2 - Information der AG-Nano der Bundesoberbehörden zur Strukturierung und den laufenden Aktivitäten bei ISO und DIN sowie VAMAS und CCQM. T2 - Behördenklausur Nano der Bundesoberbehörden CY - Berlin, Germany DA - 14.09.2022 KW - Nano KW - Bundesoberbehörden KW - Behördenklausurtagung PY - 2022 AN - OPUS4-56757 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald T1 - Schwerpunktthema nano@BAM – Projekt Nanoplattform N2 - Darstellung der Digitalisierung im Rahmen des Themenfeldprojektes Nanoplattform. Es werden beleuchtet: BAM-DataStore, Voraussetzungen für ELNs, Möglichkeitenvon OpenBIS, NFDI-Antrag InnoMatSafety, Digitalisierung von Workflows. T2 - BAM Beiratssitzung Umwelt CY - Online meeting DA - 11.03.2022 KW - Nano KW - Elektronisches Laborbuch KW - Workflows KW - Digitalisierung KW - Standardarbeitsanweisungen PY - 2022 AN - OPUS4-56756 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bresch, Harald A1 - Hodoroaba, Vasile-Dan A1 - Schmidt, Alexandra A1 - Rasmussen, K. A1 - Rauscher, H. T1 - Counting Small Particles in Electron Microscopy Images — Proposal for Rules and Their Application in Practice N2 - Electron microscopy (EM) is the gold standard for the characterisation of the morphology (size and shape) of nanoparticles. Visual observation of objects under examination is always a necessary first step in the characterisation process. Several questions arise when undertaking to identify and count particles to measure their size and shape distribution. In addition to challenges with the dispersion and identification of the particles, more than one protocol for counting particles is in use. This paper focuses on precise rules for the counting of particles in EM micrographs, as this influences the measurement accuracy of the number of particles, thus implicitly affecting the size values of the counted particles. We review and compare four different, commonly used methods for counting, which we then apply in case studies. The impact of the selected counting rule on the obtained final particle size distribution is highlighted. One main aim of this analysis is to support the application of a specific, well-defined counting approach in accordance with regulatory requirements to contribute to achieving more reliable and reproducible results. It is also useful for the new harmonised measurement procedures for determining the particle size and particle size distribution of nanomaterials. KW - Nano KW - Particle size distribution KW - Nanoparticle KW - Nanomaterial KW - OECD PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-551891 DO - https://doi.org/10.3390/nano12132238 SN - 2079-4991 VL - 12 IS - 13 SP - 2238 PB - MDPI CY - Basel AN - OPUS4-55189 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -