TY - CONF A1 - Seeger, Stefan T1 - Instruments for Fine and Ultrafine Particle Emission Characterization N2 - An overview on instruments and methods for the measurement and chemical characterization of particulate emissions from local sources is presented T2 - BAM - JBMIA (Japan Business Machine and Information System Industries Association) Meeting, JBMIA Emissions Working Group Meeting CY - Tokyo, Japan DA - 04.05.2019 KW - Aerosol spectroscopy KW - Particulate emission KW - Chemical analysis KW - Total reflection X-ray spectroscopy KW - Calibration PY - 2019 AN - OPUS4-47816 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Seeger, Stefan T1 - Overview on the EMPIR Project "AEROMET" N2 - Overview on the ongoing EU EMPIR Project "AEROMET" Aerosol Metrology for Atmospheric Science and Air Quality, Overview on preliminary resuilts in Workpackages 3 "Calibration of MPSS and CPCs" and 4 "Quantifying airborne particle compositions in the field" T2 - Meeting des ISO TC24/SC4, Joint session of Working Groups 9 "Single particle light interaction methods" and 12 "Electrical mobility and number concentration analysis for aerosol particles" CY - Graz, Austria DA - 11.04.2019 KW - Ambient air pollution KW - EU EMPIR KW - Chemical analysis KW - Total reflection X-ray spectroscopy KW - Airborne Particles PY - 2019 AN - OPUS4-47820 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -