TY - JOUR A1 - von Bohlen, A. A1 - Hergenröder, R. A1 - Sternemann, C. A1 - Paulus, M. A1 - Radtke, Martin A1 - Riesemeier, Heinrich T1 - Wavelenght Dispersive Synchrotron Microprobe Used for Material Analysis JF - Instrumentation science & technology N2 - Synchrotron radiation (SR) has been used in recent years as an excellent excitation source for X-ray fluorescence spectrometry. SR offers, in contrast to conventional X-ray sources, highly brilliant polychromatic, polarized radiation with which micro-domain X-ray fluorescence spectrometry becomes possible. A feasibility study of utility, conducted at BESSY (Berlin) and at DELTA (Dortmund), both synchrotron facilities of the third generation, to evaluate the use of wavelength dispersive X-ray fluorescence spectrometry in combination with synchrotron radiation is presented. First results for material analysis, obtained by combining the synchrotron radiation and a commercially available spectrometer commonly attached to a scanning electron microscope, are presented. The spectrometer, of the linear type, uses curved focusing Bragg-crystals of the Johann type which leads to a high spectral resolution up to 3 eV. Examples of micro-domain analyses are presented and compared with those obtained by synchrotron radiation induced energy dispersive X-ray fluorescence. KW - Synchrotron radiation KW - WDXRF KW - EDXRF KW - Micro analysis KW - Material analysis PY - 2005 DO - https://doi.org/10.1081/CI-200048048 SN - 1073-9149 SN - 1525-6030 VL - 33 IS - 2 SP - 137 EP - 150 PB - Dekker CY - New York, NY AN - OPUS4-14235 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Brücher, M. A1 - von Bohlen, A. A1 - Jacob, P. A1 - Franzke, J. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Müller, Bernd R. A1 - Scharf, Oliver A1 - Hergenröder, R. T1 - The charge of solid-liquid interfaces measured by X-ray standing waves and streaming current JF - ChemPhysChem : a European journal of chemical physics and physical chemistry N2 - Measurements of ion distributions at a charged solid–liquid interface using X-ray standing waves (XSW) are presented. High energy synchrotron radiation (17.48 keV) is used to produce an XSW pattern inside a thin water film on a silicon wafer. The liquid phase is an aqueous solution containing Br and Rb ions. The surface charge is adjusted by titration. Measurements are performed over a pH range from 2.2–9, using the native Si oxide layer and functional (amine) groups as surface charge. The Debye length, indicating the extension of the diffuse layer, could be measured with values varying between 1–4 nm. For functionalized wafers, the pH dependent change from attraction to repulsion of an ion species could be detected, indicating the isoelectric point. In combination with the measurement of the streaming current, the surface charge of the sample could be quantified. KW - Interfacial charge KW - Solid/liquid interfaces KW - Surface analysis KW - Surface functionalization KW - X-ray spectrometry KW - X-ray KW - Standing waves KW - XSW KW - Streaming current KW - Synchrotron radiation PY - 2010 DO - https://doi.org/10.1002/cphc.201000166 SN - 1439-4235 SN - 1439-7641 VL - 11 IS - 10 SP - 2118 EP - 2123 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-22057 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -