TY - JOUR A1 - Wolff, Timo A1 - Mantouvalou, I. A1 - Malzer, W. A1 - Nissen, J. A1 - Berger, D. A1 - Zizak, I. A1 - Sokaras, D. A1 - Karydas, A. A1 - Grlj, N. A1 - Pelicon, P. A1 - Schütz, R. A1 - Zitniki, M. A1 - Kanngießer, B. T1 - Performance of a polycapillary halflens as focussing and collecting optic - a comparison JF - Journal of analytical atomic spectrometry N2 - Polycapillary halflenses are widely used to focus X-ray radiation onto a small spot. Additionally they can reduce the field of view of a semiconductor detector when placed in front of one. In 3D micro X-ray fluorescence spectroscopy (3D Micro-XRF) with synchrotron radiation, two polycapillary halflenses are used in a confocal geometry. Up until now, characterization measurements in the focal plane have only been performed in the case of the lens focusing parallel radiation. Assumptions have been made, that in the other case, when isotropic radiation from a spot source is transported to a detector, the acceptance distribution in the focal plane is also Gaussian. We performed measurements with an electron beam as well as a proton beam which confirm this assumption. In addition, a comparison between measurements in collecting and focusing mode show differences in spot size and transmission. These differences exemplify the fact that there is not one global spot size or transmission function of a polycapillary halflens. Illumination and divergence effects can alter both characteristic lens parameters. PY - 2009 DO - https://doi.org/10.1039/b817828c SN - 0267-9477 SN - 1364-5544 VL - 24 SP - 669 EP - 675 PB - Royal Society of Chemistry CY - London AN - OPUS4-19415 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Vogel, F. A1 - Cheng, J. A1 - Liang, S. B. A1 - Ke, C. B. A1 - Cao, S. S. A1 - Zhang, X. P. A1 - Zizak, I. A1 - Manzoni, Anna Maria A1 - Yu, J. M. A1 - Wanderka, N. A1 - Li, W. T1 - Formation and evolution of hierarchical microstructures in a Ni-based superalloy investigated by in situ high-temperature synchrotron X-ray diffraction JF - Journal of alloys and compounds N2 - Hierarchical microstructures are created when additional γ particles form in γ’ precipitates and they are linked to improved strength and creep properties in high-temperature alloys. Here, we follow the formation and evolution of a hierarchical microstructure in Ni86.1Al8.5Ti5.4 by in situ synchrotron X-ray diffraction at 1023 K up to 48 h to derive the lattice parameters of the γ matrix, γ’ precipitates and γ particles and misfits between phases. Finite element method-based computer simulations of hierarchical microstructures allow obtaining each phase's lattice parameter, thereby aiding peak identification in the in situ X-ray diffraction data. The simulations further give insight into the heterogeneous strain distribution between γ’ precipitates and γ particles, which gives rise to an anisotropic diffusion potential that drives the directional growth of γ particles. We rationalize a schematic model for the growth of γ particles, based on the Gibbs-Thomson effect of capillary and strain-induced anisotropic diffusion potentials. Our results highlight the importance of elastic properties, elastic anisotropy, lattice parameters, and diffusion potentials in controlling the behavior and stability of hierarchical microstructures. KW - XRD KW - Superalloy KW - Finite element method KW - Transmission electron microscopy PY - 2022 DO - https://doi.org/10.1016/j.jallcom.2022.165845 SN - 0925-8388 VL - 919 SP - 1 EP - 17 PB - Elsevier CY - Lausanne AN - OPUS4-55394 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schumacher, G. A1 - Darowski, N. A1 - Zizak, I. A1 - Klingelhöffer, Hellmuth A1 - Neumann, W. T1 - Two-stage relaxation of damage structure in strongly creep-deformed single crystal superalloy SC16 measured by means of X-ray diffraction JF - Scripta materialia KW - Superalloys KW - SC16 KW - Creep-deformation KW - Relaxation KW - X-ray diffraction PY - 2009 DO - https://doi.org/10.1016/j.scriptamat.2008.09.009 SN - 1359-6462 SN - 1872-8456 VL - 60 IS - 2 SP - 88 EP - 91 PB - Elsevier CY - Oxford AN - OPUS4-18304 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Darowski, N. A1 - Zizak, I. A1 - Schumacher, G. A1 - Klingelhöffer, Hellmuth A1 - Chen, W. A1 - Neumann, W. T1 - Temperature dependence of x-ray intensity profile FWHM of the gamma' phase in the creep-deformed single crystal superalloy SC16 JF - Journal of physics D N2 - High-resolution diffraction using synchrotron x-ray radiation was applied to study γ´ precipitates with an L12 superlattice crystal structure in the single crystal superalloy SC16 after creep deformation at 1223 K with a creep strain of ±0.5% for tensile and compressive loads, respectively. The measurements of full width at half maximum (FWHM) of 001 and 100 γ´ superlattice reflections were performed at various temperatures from ambient temperature to 1173 K in vacuum. The experimental results revealed that the FWHM of both reflections decrease with increasing temperature. It is well-known that changes in particle size and lattice distortion in materials could lead to a variation of FWHM. The observed behaviour is discussed in the light of both the above-mentioned aspects. The decrease in the peak width is mainly attributed to the temperature dependence of the internal strain state. KW - Creep deformation KW - Synchrotron x-ray radiation PY - 2005 DO - https://doi.org/10.1088/0022-3727/38/10A/038 SN - 0022-3727 SN - 1361-6463 VL - 38 IS - 10A SP - A200 EP - A203 PB - IOP Publ. CY - Bristol AN - OPUS4-11967 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chen, W. A1 - Darowski, N. A1 - Zizak, I. A1 - Schumacher, G. A1 - Klingelhöffer, Hellmuth A1 - Neumann, W. T1 - Lattice distortion in precipitates of single crystal superalloy SC16 under creep deformation JF - Nuclear instruments and methods in physics research B N2 - Specimens of single crystal superalloy SC16 were creep deformed at 1223 K along [0 0 1] up to ±0.5% creep strain using stresses of -150 MPa and +150 MPa, respectively. Line widths and peak positions of superlattice reflections were measured by means of X-ray diffraction parallel and perpendicular to the load axis in the temperature range between 293 K and 1173 K. The line widths were found to decrease with the increase of temperature for both directions on the two specimens after tensile and compressive creep deformation. After both kinds of creep deformation the crystal lattice showed tetragonal distortion which decreased with increasing temperature. The tetragonality after tensile creep deformation was larger than unity while it was smaller than unity after compressive creep deformation. The peak positions and widths restored after cooling back to room temperature. The experimental results can qualitatively be explained by the creation of dislocations during deformation and their anisotropic arrangement at the γ/γ' interfaces. KW - Superalloys KW - Creep deformation KW - Lattice distortion PY - 2006 DO - https://doi.org/10.1016/j.nimb.2005.12.032 SN - 0168-583X SN - 1872-9584 VL - 246 IS - 1 SP - 201 EP - 205 PB - Elsevier CY - Amsterdam AN - OPUS4-12498 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -