TY - GEN A1 - Onel, Yener A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Experiences in using a 320 kV micro focus X-ray tube and a large sized amorphous silicon detector for 3D-CT T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology N2 - A novel 3D-CT scanner was set up at BAM to extend the applicability of the X-ray transmission microtomography (µ-CT) to specimens up to 30 cm in diameter. The scanner consists of a bipolar 320 kV micro focus tube and a flat panel detector of amorphous silicon. Minimisation of scattered radiation, control of room and system temperature, and corrective preprocessing on the projection data are necessary to achieve expectable CT images. Statistical evaluations to show the limits and results of CT investigations are reported. T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 UR - http://www.ndt.net/article/ct2003/v06/v06.htm SN - 3-931381-48-X N1 - Serientitel: DGZfP-Proceedings BB – Series title: DGZfP-Proceedings BB IS - 84-CD SP - 53 EP - 59 PB - DGZfP CY - Berlin AN - OPUS4-2875 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Onel, Yener A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - 320kV Microfokusröntgenröhre und Flachdetektor, eine Kombination für die 3D-CT? T2 - DGZfP-Jahrestagung 2003: Zerstörungsfreie Materialprüfung - ZfP in Anwendung, Entwicklung und Forschung T2 - DGZfP-Jahrestagung 2003: Zerstörungsfreie Materialprüfung - ZfP in Anwendung, Entwicklung und Forschung CY - Mainz, Germany DA - 2003-05-26 PY - 2003 AN - OPUS4-3805 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Onel, Yener A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Experiences in using a 320kV micro focus X-ray tube and a large sized amorphous silicon detector for 3D-CT T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 AN - OPUS4-3810 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Redmer, Bernhard A1 - Onel, Yener A1 - Ewert, Uwe T1 - Mechanised radiation techniques - an innovative technique of the mobile in-service inspection of circumferential welds T2 - Book of abstracts of the 3rd International Conference "Pipeline Diagnostics" T2 - 3rd International Conference "Pipeline Diagnostics" CY - Moscow, Russia DA - 2001-05-21 PY - 2001 SP - I34 AN - OPUS4-1176 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Redmer, Bernhard A1 - Onel, Yener A1 - Ewert, Uwe A1 - Lunin, V. A1 - Podobedov, D. T1 - Mechanisierte Durchstrahlungsprüfung - Innovative Techniken zur Bewertung von Rundschweißnähten T2 - Schweißen und Schneiden 2001 T2 - Tagung Schweißen und Schneiden ; Große Schweißtechnische Tagung CY - Essen, Deutschland DA - 2001-09-11 PY - 2001 SN - 3-87155-674-2 N1 - Serientitel: DVS-Berichte – Series title: DVS-Berichte IS - 216 SP - 243 EP - 247 PB - Verl. für Schweißen und Verwandte Verfahren, DVS-Verl. CY - Düsseldorf AN - OPUS4-1162 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -