TY - JOUR A1 - Holzweber, Markus A1 - Shard, A.G. A1 - Jungnickel, H. A1 - Luch, A. A1 - Unger, Wolfgang T1 - Dual beam organic depth profiling using large argon cluster ion beams N2 - Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4'-bis[N-(1-naphthyl-1-)-N-phenyl- amino]-biphenyl (NPB) and aluminium tris-(8-hydroxyquinolate) (Alq3), materials commonly used in organic light-emitting diodes industry, was carried out using time-of-flight SIMS in dual beam mode. The sample used in this study consists of a ~400-nm-thick NPB matrix with 3-nm marker layers of Alq3 at depth of ~50, 100, 200 and 300 nm. Argon cluster sputtering provides a constant sputter yield throughout the depth profiles, and the sputter yield volumes and depth resolution are presented for Ar-cluster sizes of 630, 820, 1000, 1250 and 1660 atoms at a kinetic energy of 2.5 keV. The effect of cluster size in this material and over this range is shown to be negligible. KW - SIMS KW - Organic depth profiling KW - Argon cluster KW - ToF-SIMS KW - Ar-GCIB KW - Secondary Ion Mass Spectrometry PY - 2014 DO - https://doi.org/10.1002/sia.5429 SN - 0142-2421 SN - 1096-9918 VL - 46 SP - 936 EP - 939 PB - Wiley CY - Chichester AN - OPUS4-32573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Richter, S. A1 - Traulsen, C. H.-H. A1 - Heinrich, Thomas A1 - Poppenberg, J. A1 - Leppich, C. A1 - Holzweber, Markus A1 - Unger, Wolfgang A1 - Schalley, C.A. T1 - Sequence-programmable multicomponent multilayers of nanometer-sized tetralactam macrocycles on gold surfaces N2 - Multicomponent multilayers have been deposited on gold surfaces by metal-ion-mediated layer-by-layer self-assembly of differently functionalized tetralactam macrocycles. The layer stack can be programmed with respect to the sequences of metal ions and macrocycles by the deposition sequence. KW - Organic layer KW - XPS KW - SIMS KW - NEXAFS PY - 2013 DO - https://doi.org/10.1021/jp405492v SN - 1932-7447 SN - 1089-5639 VL - 117 IS - 37 SP - 18980 EP - 18985 PB - Soc. CY - Washington, DC AN - OPUS4-32576 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Options for standards for physical-chemical characterization of ENPs derived from NanoValid achievements T2 - CEN-CENELEC NanoValid Standardization Workshop CY - Brüssel, Belgium DA - 2014-11-28 PY - 2014 AN - OPUS4-32391 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Establishing of reference methods and materials for toxilogical testing and physical-chemical characterisation of ENPs T2 - NanoValid 2nd technical review meeting CY - Brussels, Belgium DA - 2014-11-26 PY - 2014 AN - OPUS4-32393 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Surface Chemical Analysis at the Nanoscale: Status and Challenges T2 - AVS 61th International Symposium, Applied Surface Science Session CY - Baltimore, United States of Amercia DA - 2014-11-09 PY - 2014 AN - OPUS4-32394 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Holzweber, Markus A1 - Heinrich, T. A1 - Kunz, V. A1 - Richter, S. A1 - Traulsen, C.H.-H. A1 - Schalley, C.A. A1 - Unger, Wolfgang T1 - Principal component analysis (PCA)-assisted time-of-flight secondary-ion mass spectrometry (ToF-SIMS): a versatile method for the investigation of self-assembled monolayers and multilayers as precursors for the bottom-up approach of nanoscaled devices N2 - The production of high-quality self-assembled monolayers (SAMs) followed by layer-by-layer (LbL) self-assembly of macrocycles is essential for nanotechnology applications based on functional surface films. To help interpret the large amount of data generated by a standard ToF-SIMS measurement, principal component analysis (PCA) was used. For two examples, the advantages of a combination of ToF-SIMS and PCA for quality control and for the optimization of layer-by-layer self-assembly are shown. The first example investigates how different cleaning methods influence the quality of SAM template formation. The second example focuses on the LbL self-assembly of macrocycles and the corresponding stepwise surface modification. KW - ToF-SIMS KW - Principal component analysis KW - Self assembled monolayer KW - Layer by layer PY - 2014 DO - https://doi.org/10.1021/ac500059a SN - 0003-2700 SN - 1520-6882 VL - 86 IS - 12 SP - 5740 EP - 5748 PB - American Chemical Society CY - Washington, DC AN - OPUS4-30963 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales T2 - CCQM Plenary Meeting 2014 CY - Paris, France DA - 2014-04-10 PY - 2014 AN - OPUS4-30969 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Surface Chemical Analysis at the Nanoscale: Status and Challenges T2 - ALTECH Symposium 2014 - Analytical techniques for precise characterization of nanomaterials, EMRS Spring Meeting 2014 CY - Lille, France DA - 2014-05-26 PY - 2014 AN - OPUS4-30970 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Nano-Analysis: Establishing Reference Methods for Characterizing Nano-Materials T2 - Workshop on Advanced Characterization of Nanomaterials CY - Zaragoza, Spain DA - 2013-09-19 PY - 2013 AN - OPUS4-29865 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Der FB "Oberflächenanalytik und Grenzflächenchemie" der BAM: Referenzmaterialien für die Nanoanalytik und ausgewählte Beispiele angewandter Forschung T2 - TU Berlin , Institut für Optik und Atomare Physik, AG Kannengießer, Wintersemester 2013/2014, Forschungsseminar "Moderne analytische Methoden der Physik" CY - Berlin, Germany DA - 2013-10-29 PY - 2013 AN - OPUS4-29870 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Surface Chemical Analysis: Status and Challenges T2 - ECASIA 2013 CY - Cagliari, Italy DA - 2013-10-14 PY - 2013 AN - OPUS4-29873 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mozetic, M. A1 - Ostrikov, K. A1 - Ruzic, D.N. A1 - Curreli, D. A1 - Cvelbar, U. A1 - Vesel, A. A1 - Primc, G. A1 - Leisch, M. A1 - Jousten, K. A1 - Malyshev, O.B. A1 - Hendricks, J.H. A1 - Kövér, L. A1 - Tagliaferro, A. A1 - Conde, O. A1 - Silvestre, A.J. A1 - Giapintzakis, J. A1 - Buljan, M. A1 - Radic, N. A1 - Drazic, G. A1 - Bernstorff, S. A1 - Biedermann, H. A1 - Kylián, O. A1 - Hanus, J. A1 - Milosevic, S. A1 - Galtayries, A. A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Lehocky, M. A1 - Sedlarik, V. A1 - Stana-Kleinschek, K. A1 - Drmota-Petric, A. A1 - Pireaux, J.J. A1 - Rogers, J.W. A1 - Anderle, M. T1 - Recent advances in vacuum sciences and applications N2 - Recent advances in vacuum sciences and applications are reviewed. Novel optical interferometer cavity devices enable pressure measurements with ppm accuracy. The innovative dynamic vacuum standard allows for pressure measurements with temporal resolution of 2 ms. Vacuum issues in the construction of huge ultra-high vacuum devices worldwide are reviewed. Recent advances in surface science and thin films include new phenomena observed in electron transport near solid surfaces as well as novel results on the properties of carbon nanomaterials. Precise techniques for surface and thin-film characterization have been applied in the conservation technology of cultural heritage objects and recent advances in the characterization of biointerfaces are presented. The combination of various vacuum and atmospheric-pressure techniques enables an insight into the complex phenomena of protein and other biomolecule conformations on solid surfaces. Studying these phenomena at solid–liquid interfaces is regarded as the main issue in the development of alternative techniques for drug delivery, tissue engineering and thus the development of innovative techniques for curing cancer and cardiovascular diseases. A review on recent advances in plasma medicine is presented as well as novel hypotheses on cell apoptosis upon treatment with gaseous plasma. Finally, recent advances in plasma nanoscience are illustrated with several examples and a roadmap for future activities is presented. KW - Vacuum KW - Surface KW - Plasma KW - Interface KW - Nanoscience PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-304884 DO - https://doi.org/10.1088/0022-3727/47/15/153001 SN - 0022-3727 SN - 1361-6463 VL - 47 IS - 15 SP - 153001-1 EP - 153001-23 PB - IOP Publ. CY - Bristol AN - OPUS4-30488 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Non-destructive surface measurements N2 - Materials and chemical producers require detailed knowledge of surface chemistry for research into new products. One way to understand a surface without damaging it is to bombard it with an electron beam, causing its atoms to emit characteristic X-rays enabling identification. The measurement of these must be precise as many elements emissions are close in energy – traceable reference materials will ensure instruments using this technique are stable and accurate. KW - Metrology KW - EDS KW - EDX PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-388647 UR - http://www.euramet.org/metrology-for-societys-challenges/metrology-for-industry/impact-case-studies-emrp-industry-theme/ SP - 1 EP - 2 CY - Teddington AN - OPUS4-38864 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Measuring organic layers N2 - Many innovative products - from touchscreens to solar panels to pharmaceuticals – utilise multiple organic layers to create complex functionality. New techniques have been developed to remove and measure layers individually enabling improved product development and assisting with quality assurance. However, manufacturers cannot be certain of the depth of layer being removed and new reference materials for these techniques are needed to increase uptake, and remove a major barrier to innovation. KW - Organic layers KW - XPS KW - SIMS PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-388656 UR - http://www.euramet.org/metrology-for-societys-challenges/metrology-for-industry/impact-case-studies-emrp-industry-theme/ SP - 1 EP - 2 CY - Teddington AN - OPUS4-38865 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Surface analysis for Alzheimer’s N2 - Modifying or controlling surface chemistry is important in new product development, quality control and research. This is particularly true where functionality of surfaces, thin films and interfaces are key to the application, such as organic solar cells and devices for medical diagnostics. Surface chemical analysis aims to provide quantitative elemental, chemical state and functional group information from the surface of materials, but requires comparable test data and improved measurement traceability. KW - Liposomes KW - Proteins KW - ToF-SIMS KW - Peptides KW - Mapping PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-388663 UR - http://www.euramet.org/metrology-for-societys-challenges/metrology-for-industry/impact-case-studies-emrp-industry-theme/ SP - 1 EP - 2 CY - Teddington AN - OPUS4-38866 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Treu, Dieter A1 - Kalbe, Henryk A1 - Krumrey, M. A1 - Gross, Thomas A1 - Marti, K. A1 - Unger, Wolfgang T1 - Experimental determination of the effective attenuation length of palladium 3d 5/2 photoelectrons in a magnetron sputtered Pd nanolayer N2 - An electron effective attenuation length (EAL) of 1.68nm for Al Kα excited Pd 3d 5/2 photoelectrons with a kinetic energy of 1.152 keV has been determined experimentally using a sputtered Pd film deposited on an ultra flat fused quartz substrate. The film thickness was reduced by Ar ion sputtering several times in order to obtain different Pd film thicknesses which are used to determine experimental EAL values. These results are compared to data generated by using a Simulation of Electron Spectra for Surface Analysis (SESSA) simulation using an inelastic mean free path (IMFP) calculated with the Tanuma–Powell–Penn (TPP)-2M formula and with ‘elastic scattering on and off’. Contributions to the uncertainty budget related to the experimental approach are discussed in detail. Proposals on how to further improve the approach are suggested. KW - Pd 3d KW - Electron effective attenuation length KW - XPS PY - 2017 UR - http://onlinelibrary.wiley.com/doi/10.1002/sia.6141/abstract?campaign=woletoc DO - https://doi.org/10.1002/sia.6141 SN - 0142-2421 SN - 1096-9918 VL - 49 IS - 5 SP - 464 EP - 468 PB - John Wiley & Sons, Ltd AN - OPUS4-39682 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales - Surface analysis working group (SAWG) - Report for 15th meeting (2016/17) N2 - CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references. Originally initiated by Dr Martin P Seah, NPL, the Surface Analysis Working Group (SAWG) has been formally founded in 2003. The following terms of reference were presented to CCQM in April 2002. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference: - to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis; - to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis; - to establish and update a work plan to be adopted by CCQM; - to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology. Following the 2016 meeting, the Key Comparison K-129 "Measurement of atomic fractions in Cu(In,Ga)Se2 Films" lead by KRISS and the Key Comparison K-136 on "BET specific surface area of nanoporous Al2O3" lead by UNIIM&BAM have been finished in 2016. The 15th meeting of SAWG will focus on - survey on CMC claim submitted with reference to K-129 and K-136. - the overall and SAWG specific aspects of the CCQM Strategy process, - a joint meeting with the Inorganic Working Group addressing number concentrations of nano particles, - discussion of future comparisons. T2 - CCQM Plenary Meeting at BIPM 2017 CY - Paris, France DA - 27.4.17 KW - Metrology KW - Comparisons KW - CCQM PY - 2017 AN - OPUS4-40277 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Unger, Wolfgang T1 - IND15 JRP SurfChem: Traceable quantitative surface chemical analysis for industrial applications N2 - The SurfChem project has made a significant contribution to traceable quantitative surface chemical analysis for industrial applications by delivering new certified reference materials and test samples for specific technical applications. Regular performance tests of instruments, metrological methodology for the detection of (bio)organic surface species, ambient and non-destructive surface chemical analysis for in-line process control and new in situ characterisation techniques of catalytically active surfaces have been achieved. KW - Surface analysis KW - Metrology KW - Euramet EMRP PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-388673 UR - http://www.euramet.org/research-innovation/search-research-projects/details/?eurametCtcp_project_show%5Bproject%5D=1115&eurametCtcp_project%5Bback%5D=893&cHash=5fd23fc7f759db18176584b5d8a5fe89 SP - 1 EP - 39 CY - Teddington AN - OPUS4-38867 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Dietrich, P. A1 - Thissen, A. A1 - Kulak, N. A1 - Kjaervik, Marit A1 - Unger, Wolfgang T1 - XPS surface chemical analysis of aqueous solutions with EnviroESCA N2 - Water and aqueous reagents are essential in any biological process or system. But apart from a few special low vapor-pressure cases, liquids have not been accessible to any technique requiring UHV conditions. EnviroESCA opens up this exciting field of applications. In this paper first results from water based samples are presented as a proof of concept to demonstrate the special capabilities of EnviroESCA analyzing liquid samples. The following solutions were investigated under near ambient pressure conditions: i.) water, ii.) brine, iii.) an oil in water dispersion, iv.) aqueous iron(II) sulfate heptahydrate, and v.) a suspension of nano silver particles in water. KW - Surface Analysis KW - Near Ambient Pressure XPS KW - Aqueous Solutions PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-394603 UR - http://www.enviro.specs.de/cms/upload/bilder/EnviroESCA/Applications/Liquids/Application-Note_EnviroESCA_Aqueous_Solutions.pdf N1 - BAM Mitarbeiter Beitrag im Acknowledgement definiert. IS - #000394 SP - 1 PB - SPECS CY - Berlin AN - OPUS4-39460 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Lateral resolution delivered by imaging surface-analytical instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and related ISO Standards N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1-xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods T2 - SIMS Europe 2016 CY - Münster, Germany DA - 18.09.2016 KW - ISO standards KW - XPS KW - AES KW - SIMS KW - Lateral resolution PY - 2016 AN - OPUS4-37507 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -