TY - CONF A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Gesatzke, Wolfgang A1 - Scholl, A. A1 - Kilcoyne, A. D. A1 - Koprinarov, I. A1 - Ade, H. A1 - Hitchcock, A. P. A1 - Schulz, H. A1 - Scheibe, H.-J. ED - Tamura, L. S. T1 - Spectromicroscopy with inhomogeneous ta - C samples PY - 2003 UR - http://repositories.cdlib.org/lbnl/LBNL-52519/ SP - 1 EP - 3(?) AN - OPUS4-4694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bütefisch, S. A1 - Weimann, T. A1 - Busch, I. A1 - Danzebrink, H.-U. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New reference material for imaging XPS (X-ray photoelectron spectroscopy) instrument characterization N2 - Reference materials without variations in topography are essential for the characterization of imaging XPS (X-ray Photoelectron Spectroscopy) Instruments. Therefore a new fabrication process for this kind of zero-topography reference material was developed at PTB and resulted in first prototypes. The fabrication process and first measurement results will be presented in this paper. T2 - Sensor 2015 - 17th International conference on sensors and measurement technology CY - Nuremberg, Germany DA - 19.05.2015 KW - Imaging XPS KW - Reference material KW - Topography free KW - Micro technology PY - 2015 SN - 978-3-9813484-8-4 DO - https://doi.org/10.5162/sensor2015/P7.1 SP - Chapter P7, 821 EP - 825 AN - OPUS4-33837 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bücker, Michael A1 - Böcker, Wolfgang D. G. A1 - Reinsch, Stefan A1 - Unger, Brita T1 - Holzmodifikation durch Tränkung mit Nanopartikeln T2 - Tagung "Rosenheimer Fenstertage 2004" CY - Rosenheim, Deutschland DA - 2004-01-01 KW - Holzmodifikation KW - Sol-Gel KW - Tränkverfahren KW - Holzschutz PY - 2004 SP - 23 EP - 26 PB - Institut für Fenstertechnik CY - Rosenheim AN - OPUS4-4487 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang ED - Blasek, G. T1 - Plasmapolymerschichten: Zu den Möglichkeiten einer chemischen Charakterisierung mit den Methoden ESCA, ToF-SIMS und Röntgen-absorptions-Spektroskopie (XAS) T2 - 12. Neues Dresdener Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Deutschland DA - 2004-10-14 KW - ESCA KW - ToF-SIMS KW - XAS KW - Plasma-Polymerisation PY - 2004 SP - 133 EP - 140 PB - Dresdner Transferstelle für Vakuumtechnik CY - Dresden AN - OPUS4-4699 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Mix, Renate A1 - Kühn, Gerhard A1 - Unger, Wolfgang T1 - Functional groups bearing plasma homo and copolymer layers as adhesion promoters in metal-polymer composites T2 - 10. Neues Dresdner Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Germany DA - 2002-10-17 PY - 2002 SP - 6 EP - 15 PB - DTVa CY - Dresden AN - OPUS4-6970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Eine neue Generation von alterungsbeständigen Plasmapolymeren mit definierter chemischer Struktur T2 - 8. Neues Dresdner Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Deutschland DA - 2000-10-19 PY - 2000 VL - 8 SP - 110 EP - 114 CY - Dresden AN - OPUS4-6974 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. T1 - K-Edge Soft X-ray Absorption (NEXAFS) Spectroscopy In Surface Chemical Analysis of Polymers T2 - International Discussion Meeting Advanced Methods of Polymer Characterization: New Developments and Applications in Industry CY - Mainz, Germany DA - 1999-03-15 PY - 1999 SP - P3.53 CY - Mainz AN - OPUS4-6925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. A1 - Retzko, Iris A1 - Unger, Wolfgang T1 - Surface Analysis by XPS and XAS Using a High-Rsolution and High-Flux Soft X-ray from Synchrotron T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 KW - XPS KW - XAS KW - DLC KW - Synchrotron Radiation PY - 2003 SP - 67 EP - 69 AN - OPUS4-6927 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Treu, Dieter A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Schulz, H. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of carbon materials and plasma polymers by X-ray photoelectron spectroscopy and X-ray absorption spectroscopy (XPS, XAS) T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 59 EP - 65 AN - OPUS4-6928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 53 EP - 58 AN - OPUS4-6929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -