TY - CONF A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Gesatzke, Wolfgang A1 - Scholl, A. A1 - Kilcoyne, A. D. A1 - Koprinarov, I. A1 - Ade, H. A1 - Hitchcock, A. P. A1 - Schulz, H. A1 - Scheibe, H.-J. ED - Tamura, L. S. T1 - Spectromicroscopy with inhomogeneous ta - C samples PY - 2003 UR - http://repositories.cdlib.org/lbnl/LBNL-52519/ SP - 1 EP - 3(?) AN - OPUS4-4694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Steers, E.B.M. A1 - Hoffmann, V. A1 - Unger, Wolfgang A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Influence of hydrogen on the analytical figures of merit of glow discharge optical emission spectroscopy - friend or foe? PY - 2003 DO - https://doi.org/10.1039/b305384a SN - 0267-9477 SN - 1364-5544 VL - 18 SP - 521 EP - 526 PB - Royal Society of Chemistry CY - London AN - OPUS4-2290 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Streeck, C. A1 - Glamsch, Stephan A1 - Ehlert, Christopher A1 - Lippitz, Andreas A1 - Nutsch, A. A1 - Kulak, N. A1 - Beckhoff, B. A1 - Unger, Wolfgang T1 - Quantification of silane molecules on oxidized silicon: Are there options for a traceable and absolute determination? N2 - Organosilanes are used routinely to functionalize various support materials for further modifications. Nevertheless, reliable quantitative information about surface functional group densities after layer formation is rarely available. Here, we present the analysis of thin organic nanolayers made from nitrogen containing silane molecules on naturally oxidized silicon wafers with reference-free total reflection X-ray fluorescence (TXRF) and X-ray photoelectron spectroscopy (XPS). An areic density of 2−4 silane molecules per nm2 was calculated from the layer’s nitrogen mass deposition per area unit obtained by reference-free TXRF. Complementary energy and angle-resolved XPS (ER/ARXPS) in the Si 2p core-level region was used to analyze the outermost surface region of the organic (silane layer)−inorganic (silicon wafer) interface. Different coexisting silicon species as silicon, native silicon oxide, and silane were identified and quantified. As a result of the presented proof-of-concept, absolute and traceable values for the areic density of silanes containing nitrogen as intrinsic marker are obtained by calibration of the XPS methods with reference-free TXRF. Furthermore, ER/AR-XPS is shown to facilitate the determination of areic densities in (mono)layers made from silanes having no heteroatomic marker other than silicon. After calibration with reference-free TXRF, these areic densities of silane molecules can be determined when using the XPS component intensity of the silane’s silicon atom. PY - 2015 DO - https://doi.org/10.1021/acs.analchem.5b02846 SN - 0003-2700 SN - 1520-6882 VL - 87 IS - 19 SP - 10117 EP - 10124 PB - American Chemical Society CY - Washington, DC AN - OPUS4-34796 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Traceability of PDMS on TiO2 and HDPE substrates by a multi analytical approach T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34808 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Fabrication, microscopic and spectroscopic characterization of planar, nanopatterned,multi-metallic samples C T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34809 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Determination of lateral resolution and field of view in imaging and small area surface chemical analysis: Reference materials and standardization T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34810 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - OBERFLÄCHEN- UND GRENZFLÄCHENANALYTIK MIT DEN VERFAHREN PHOTOELEKTRONEN-, AUGER-ELEKTRONENSPEKTROSKOPIE UND SEKUNDÄRIONEN-MASSENSPEKTROMETRIE T2 - ZVO-Oberflächentage Berlin 2015 CY - Berlin DA - 2015-09-24 PY - 2015 AN - OPUS4-34817 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Programmable ordered multiayers of nanometer-sized macrocycles and switchable rotaxanes on solid support T2 - Workshop "Koordinationsnetzwerke als Bausteine für Funktionssysteme" CY - Schloss Reisenburg, Günzburg DA - 2015-06-02 PY - 2015 AN - OPUS4-34819 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales Surface Analysis Working Group (SAWG) - Report for 13th Meeting (2014/15) T2 - CCQM Plenary Meeting, BIPM CY - Paris, Frankreich DA - 2015-04-20 PY - 2015 AN - OPUS4-34820 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Nietzold, Carolin A1 - Weise, Matthias A1 - Unger, Wolfgang A1 - Alnabulsi, Saad A1 - Moulder, John T1 - XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam N2 - The growing interest in artificial bioorganic Interfaces as a platform for applications in emerging Areas as personalized medicine, clinical diagnostics, biosensing, biofilms, prevention of biofouling, and other fields of bioengineering is the origin of a need for in Detail multitechnique characterizations of such layers and interfaces. The in-depth analysis of biointerfaces is of special interest as the properties of functional bioorganic coatings can be dramatically affected by in-depth variations of composition. In worst cases, the functionality of a device produced using such coatings can be substantially reduced or even fully lost. KW - XPS KW - Ar gas cluster gun KW - Depth profiling KW - Bioorganic film PY - 2016 UR - http://scitation.aip.org/content/avs/journal/bip/11/2/10.1116/1.4948341 DO - https://doi.org/10.1116/1.4948341 SN - 1934-8630 VL - 11 IS - 2 SP - 029603-1 EP - 029603-5 PB - American Vacuum Society CY - New York AN - OPUS4-36218 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales N2 - CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references. The Surface Analysis Working Group (SAWG) has been formally founded in 2003. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference: - to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis; - to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis; - to establish and update a work plan to be adopted by CCQM; - to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology. Following the 2015 meeting of the CCQM, the pilot study CCQM-P130 “WD and ED Electron Probe Micro Analysis on Au-Cu alloys” lead by BAM&NIST has been finalized. The Key Comparison K-129 “Measurement of atomic fractions in Cu(In,Ga)Se2 Films” lead by KRISS has made substantial progress and is about to be finalized. The new Key Comparison K-136 on “BET specific surface of ” lead by UNIIM&BAM has made strong progress in 2015 and will be finished in 2016. T2 - 22nd Meeting of CCQM CY - Sevres, France DA - 21.4.16 KW - Surface chemical analysis KW - Metrology PY - 2016 AN - OPUS4-35865 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - 2-D materials standardization N2 - The implementation of new 2-D materials based technologies in production processes requires the development of quality management tools. These have to be underpinned by appropriate measurements. Consequently there is a need for the development of the metrology for measurement methods, the development of certified reference materials (CRM) and finally standardization. This chain represents the ideal way to practically useful standards. The presentation will give an overview on the main players in the field and summarize the recent status of activities. At the highest level the metrology of chemical characterization of 2D materials is in the scope of the International Meter Convention, specifically the Consultative Committee for Amount of Substance: Metrology in Chemistry and Biology (CCQM). Pre-standardization is an activity field of the Versailles Project on Advanced Materials and Standards (VAMAS). Standardization is mainly addressed by addressed ISO Technical Committees. A summary on available CRMs relevant to the characterization of nano materials has been prepared by BAM. Examples from the work of BAM’s Division 6.1 “Surface Analysis and Interfacial Chemistry” showcasing the characterization of chemically modified graphene surfaces are given and specific needs for the development of metrology are addressed. In the discussion the audience is invited to define specific needs which will be streamlined to the respective bodies! T2 - Science-Industry-Workshop 2D Materials CY - EMPA Akademie, Dübendorf, Switzerland DA - 21.3.16 KW - Standardization KW - Graphene PY - 2016 AN - OPUS4-35866 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Glamsch, Stephan A1 - Ehlert, Christopher A1 - Lippitz, Andreas A1 - Kulak, N. A1 - Unger, Wolfgang T1 - Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon N2 - The analysis of chemical and elemental in-depth variations in ultra-thin organic layers with thicknesses below 5 nm is very challenging. Energy- and angle-resolved XPS (ER/AR-XPS) opens up the possibility for non-destructive chemical ultra-shallow depth profiling of the outermost surface layer of ultra-thin organic films due to its exceptional surface sensitivity. For common organic materials a reliable chemical in-depth analysis with a lower limit of the XPS information depth z95 of about 1 nm can be performed. As a proof-of-principle example with relevance for industrial applications the ER/AR-XPS analysis of different organic monolayers made of amino- or benzamidosilane molecules on silicon oxide surfaces is presented. It is demonstrated how to use the Si 2p core-level region to non-destructively depth-profile the organic (silane monolayer) – inorganic (SiO2/Si) interface and how to quantify Si species, ranging from elemental silicon over native silicon oxide to the silane itself. The main advantage of the applied ER/AR-XPS method is the improved specification of organic from inorganic silicon components in Si 2p core-level spectra with exceptional low uncertainties compared to conventional laboratory XPS. KW - Synchrotron radiation XPS KW - Depth profiling KW - Silanes KW - Monolayer KW - Amines KW - Amides PY - 2016 DO - https://doi.org/10.1016/j.apsusc.2015.12.052 SN - 0169-4332 SN - 1873-5584 VL - 363 SP - 406 EP - 411 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-35262 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bütefisch, S. A1 - Weimann, T. A1 - Busch, I. A1 - Danzebrink, H.-U. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New reference material for imaging XPS (X-ray photoelectron spectroscopy) instrument characterization N2 - Reference materials without variations in topography are essential for the characterization of imaging XPS (X-ray Photoelectron Spectroscopy) Instruments. Therefore a new fabrication process for this kind of zero-topography reference material was developed at PTB and resulted in first prototypes. The fabrication process and first measurement results will be presented in this paper. T2 - Sensor 2015 - 17th International conference on sensors and measurement technology CY - Nuremberg, Germany DA - 19.05.2015 KW - Imaging XPS KW - Reference material KW - Topography free KW - Micro technology PY - 2015 SN - 978-3-9813484-8-4 DO - https://doi.org/10.5162/sensor2015/P7.1 SP - Chapter P7, 821 EP - 825 AN - OPUS4-33837 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, P.-L. A1 - Unger, Wolfgang A1 - Dietrich, Paul A1 - Holländer, A. T1 - Innovative and established strategies for the surface analysis of nitrogen and oxygen-rich plasma polymer films by XPS: an introductory guide N2 - Nitrogen- and oxygen-based plasma polymer films are materials with a complex and partially elusive surface chemistry. We present an overview of innovative and established X-ray photoelectron spectroscopy (XPS)-based analysis strategies developed to elucidate the surface chemistry of such films. We focus on both experimental methods and data analysis strategies and include the following topics: high-resolution spectra curve fitting, aging, chemical derivatization, and depth profiling by angle- and energy-resolved XPS. KW - Chemical derivatization KW - Functional groups KW - Plasma polymerization KW - X-ray photoelectron spectroscopy PY - 2015 DO - https://doi.org/10.1002/ppap.201500115 SN - 1612-8850 SN - 1612-8869 VL - 12 IS - 9 SP - 953 EP - 967 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-35114 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Hidde, Gundula A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Plasma bromination of graphene for covalent bonding of organic molecules N2 - Plasma-chemical bromination applied to graphitic materials, in particular to highly ordered pyrolytic graphite is reviewed. The resulting bromination efficiency of the plasma-chemical treatment was subject of systematic process optimization. The plasma of elemental bromine vapour produced bromine concentrations on graphene surfaces of more than 30 % Br/C using either inductively or capacitively coupled low-pressure radio-frequency plasmas. Plasma brominated graphite surfaces have been studied by Near Edge X-ray Absorption Fine Structure, X-ray Photoelectron Spectroscopy, Atomic Force Microscopy and Scanning Electron Microscopy. The introduction of bromine into graphene-like graphite layers and its binding situation were investigated. To study the physical effect of the plasma bromination process, Kr plasma was also used because of its chemical inertness but similar atomic mass. Covering the samples with a Faraday cage or with a LiF window should help to differentiate between physical, chemical and radiation effects of the plasma. Bromination was assigned to radical or electrophilic addition of bromine onto fully substituted aromatic double bonds (sp² C) with exothermal reaction enthalpy. Low bromination shows a strong decay of aromatic double bonds, higher bromination percentage let disappear all aromatic rings. The formed C–Br bonds were well suited for efficient grafting of organic molecules by post-plasma wet-chemical nucleophilic substitution. This grafting onto the graphene surface was demonstrated using aminosilane and different diamines. The bromination of double bonds changes the hybridization of carbon atoms from plane sp² to tetrahedral sp³ hybridization. Thus, the plane topography of graphene is destroyed and the conductivity is lost. KW - Graphene KW - Bromination KW - Grafting of diamines KW - Plasma KW - Organic graphting PY - 2014 DO - https://doi.org/10.1007/s11090-013-9509-x SN - 0272-4324 VL - 34 SP - 621 EP - 645 PB - Plenum Publ. Corp. CY - New York, NY, USA AN - OPUS4-30575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Investigation of silica nanoparticles by Auger electron spectroscopy (AES) N2 - High-priority industrial nanomaterials like SiO2, TiO2, and Ag are being characterized on a systematic basis within the framework of the EU FP7 research project NanoValid. Silica nanoparticles from an industrial source have been analyzed by Auger electron spectroscopy. Point, line, and map spectra were collected. Material specific and methodological aspects causing the special course of Auger line scan signals will be discussed. KW - Nanoparticles KW - Auger electron spectroscopy KW - Surface analysis PY - 2014 DO - https://doi.org/10.1002/sia.5378 SN - 0142-2421 SN - 1096-9918 VL - 46 IS - 10-11 SP - 952 EP - 956 PB - Wiley CY - Chichester AN - OPUS4-31604 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nietzold, Carolin A1 - Dietrich, Paul A1 - Ivanov-Pankov, S. A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Weigel, W. A1 - Unger, Wolfgang T1 - Functional group quantification on epoxy surfaces by chemical derivatization (CD)-XPS N2 - In this study, epoxy-terminated silicon oxide surfaces were chemically derivatized with trifluoroacetic anhydride (TFAA) and 4-(trifluoromethyl)-benzylamine (TFMBA) and analyzed by X-ray photoelectron spectroscopy, near-edge X-ray absorption fine structure spectroscopy and water contact angle measurements. TFAA was used for quantitative derivatization to determine the amount of reactive epoxy groups on these surfaces. Furthermore, epoxy-terminated surfaces were derivatized with TFMBA (a model compound for biomolecules with an amino linker) yielding secondary amines because of formation of covalent C–N bonds between TFMBA and the epoxy films. Fluorine being part of TFAA and TFMBA composition was used to follow the progress of the chemical derivatization reaction. Both derivatization agents – TFAA and TFMBA – gave comparable reaction yields of ~60% on epoxy silicon surfaces, whereas on epoxy glass slides, the derivatization yields were considerably lower (30–40%).The protocol for attachment of TFMBA (model compound) on epoxy-modified surfaces was adapted to (bio)molecules with an amino linker, e.g. carbohydrates to prepare carbohydrate-functionalized biointerfaces. KW - Biomolecular interfaces KW - Epoxy-functionalized surfaces KW - CD-XPS KW - Functional group quantification KW - Contact angle measurements PY - 2014 DO - https://doi.org/10.1002/sia.5433 SN - 0142-2421 SN - 1096-9918 VL - 46 IS - 10-11 SP - 668 EP - 672 PB - Wiley CY - Chichester AN - OPUS4-31605 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Stockmann, Jörg M. A1 - Senoner, Mathias A1 - Weimann, T. A1 - Bütefisch, S. A1 - Passiu, C. A1 - Spencer, N. D. A1 - Rossi, A. T1 - Introduction to lateral resolution and analysis area measurements in XPS N2 - Imaging and small-spot (small area) XPS have become increasingly important components of surface chemical analysis during the last three decades, and its use is growing. Some ambiguity in the use of terminology, understanding of concepts, and lack of appropriate reference materials leads to confusing and not always reproducible data. In this paper, it is shown that by using existing knowledge, appropriate test specimens, and standardized approaches, problems of comparability and such reproducibility issues recently observed for XPS data reported in the scientific literature can be overcome. The standardized methods of ISO 18516:2019, (i) the straight-edge, (ii) the narrow-line, and (iii) the grating method, can be used to characterize and compare the lateral resolution achieved by imaging XPS instruments and are described by reporting examples. The respective measurements are made using new test specimens. When running an XPS instrument in the small-spot (small area) mode for a quantitative analysis of a feature of interest, the question arises as to what contribution to the intensity originates from outside the analysis area. A valid measurement approach to control the intensity from outside the nominal analysis area is also described. As always, the relevant resolution depends on the specific question that needs to be addressed. The strengths and limitations of methods defining resolution are indicated. KW - Imaging XPS KW - Lateral resolution KW - Analysis area measurements KW - Small-spot XPS PY - 2020 DO - https://doi.org/10.1116/6.0000398 VL - 38 IS - 5 SP - 053206 AN - OPUS4-51394 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Senoner, M. A1 - Stockmann, Jörg Manfred A1 - Fernandez, V. A1 - Fairley, N. A1 - Passiu, C. A1 - Spencer, N. D. A1 - Rossi, A. T1 - Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis - Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X-ray photoelectron spectrometers (XPS) N2 - ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres revises ISO 18516:2006 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution. It implements three different methods delivering parameters useful to express the lateral resolution: (1) the straight edge method, (2) the narrow line method and (3) the grating method. The theoretical background of these methods is introduced in ISO/TR 19319:2013 Surface chemical analysis—Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods. The revised International Standard ISO 18516 delivers standardized procedures for the determination of the (1) effective lateral resolution by imaging of square-wave gratings, the (2) lateral resolution expressed as the parameter D12–88 characterizing the steepness of the sigmoidal edge spread function (ESF) determined by imaging a straight edge and (3) the lateral resolution expressed as the full width of half maximum of the line spread function (LSF), wLSF, determined by imaging a narrow line. The last method also delivers information on the shape of the LSF, which characterizes an individual imaging instrument. Finally, the implementation of all three standardized methods in the field of imaging laboratory X-ray photoelectron spectroscopy (XPS) is shortly presented. This part of the letter is based on the use of a new test sample developed at ETH Zurich, Switzerland. This test sample displays a micrometre scaled pattern motivated by the resolving power of recent imaging XPS instruments. KW - Grating method KW - Imaging AES KW - Imaging SIMS KW - Imaging XPS KW - Lateral resolution KW - Narrow line method KW - Noise in image KW - Resolution criterion KW - Straight edge method PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-536330 DO - https://doi.org/10.1002/sia.7025 SN - 1096-9918 VL - 54 IS - 4 SP - 320 EP - 327 PB - Wiley CY - Chichester AN - OPUS4-53633 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Improved quantitative XRF analysis of industrial thin film samples by calibration using thin film RMs certified by reference-free XRF enabling traceability to the SI N2 - Reference-free XRF is a SI traceable technique for the determination of the mass deposition (mass per unit area) of elements in films on the nano- and micro scale. The method is radiometrically calibrated instrumentation (PTB@BESSY II, Germany) and based on reliable knowledge of all relevant atomic fundamental, experimental and instrumental parameters. No calibration sample or reference materials are necessary. The approach had been validated in the CCQM-P140 pilot study and the K129 key comparison by determination of mole fractions in Cu(In,Ga)Se2 thin films. T2 - Annual Meeting of ISO TC 201 SC 10 XRR/XRF CY - Seoul, Korea DA - 12.10.2016 KW - Reference-free XRF KW - CIGS thin films PY - 2016 AN - OPUS4-38265 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Testing lateral resolution and field of view in imaging and small area analysis: reference materials and standardization N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1 xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. T2 - 7th International Symposium on Practical Surface Analysis(PSA-16) CY - Daejeon, Korea DA - 17.10.2016 KW - BAM L200 KW - SIMS KW - AES KW - XPS PY - 2016 AN - OPUS4-38266 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Schwarz, F. A1 - Heinrich, Thomas A1 - Kaufmann, J. O. A1 - Lippitz, Andreas A1 - Puttreddy, R. A1 - Rissanen, K. A1 - Schalley, C. A. T1 - Photocontrolled on-surface pseudorotaxane formation with well-ordered macrocycle multilayers N2 - The photoinduced pseudorotaxane formation between a photoresponsive axle and a tetralactam macrocycle was investigated in solution and on glass surfaces with immobilized multilayers of macrocycles. In the course of this reaction, a novel photoswitchable binding station with azobenzene as the photoswitchable unit and diketopiperazine as the binding station was synthesized and studied by NMR and UV/Vis spectroscopy. Glass surfaces have been functionalized with pyridine-terminated SAMs and subsequently withmultilayers of macrocycles through layer-by-layer self assembly. A preferred orientation of the macrocycles could be confirmed by NEXAFS spectroscopy. The photocontrolled Deposition of the axle into the surface-bound macrocycle-multilayers was monitored by UV/Vis spectroscopy and led to an increase of the molecular order, as indicated by more substantial linear dichroism effects in angle-resolved NEXAFS spectra. KW - Well-ordered macrocycle multilayers KW - XPS KW - NEXAFS PY - 2016 DO - https://doi.org/10.1002/chem.201603156 SN - 0947-6539 SN - 1521-3765 VL - 22 IS - 40 SP - 14383 EP - 14389 PB - Wiley-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-38270 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Pelster, A. A1 - Tyler, B.J. A1 - Kösgen, M. A1 - Kassenböhmer, R. A1 - Peterson, R.E. A1 - Stöver, M. A1 - Arlinghaus, H. F. T1 - Improved 3D-imaging of a sirolimus/probucol eluting stent coating using laser postionization secondary neutral mass spectrometry and time-of-flight secondary ion mass spectrometry N2 - Implantable drug delivery systems that provide controlled and sustained release of a therapeutic agent are used in a wide variety of applications. Drug eluting stents, which are used to treat coronary artery disease, are among the most widespread of these devices, with an estimated 3x10⁶ implants annually worldwide. Controlling the rate of drug release from these devices relies on precise control of the three dimensional (3D)-distribution of the drug, so methods for measuring this distribution are of great importance. The aims of this work were to determine how 3D-imaging of polymer-free sirolimus/probucol drug eluting stent coatings could be improved through the use of laser postionization secondary neutral mass spectrometry (Laser- SNMS) and Ar cluster sputtering with time-of-flight secondary ion mass spectrometry (ToF-SIMS) and to optimize conditions for this analysis. In this study, 3D-imaging of a sirolimus/probucol dual drug eluting stent has been investigated using Laser-SNMS and ToF-SIMS. Laser-SNMS studies of pure sirolimus and probucol were undertaken using 30 keV Bi₃⁺ primary Ions and a 157 nm excimer postionization laser. Under optimal conditions, a greater than 100-fold increase in detected ion yield was observed for Laser-SNMS when compared to ToF-SIMS, although ToF-SIMS provided equal or greater yields for higher mass characteristic ions. Although the optimal laser power density for detecting probucol (5x10⁶W/cm²) was significantly lower than the optimum for sirolimus(7x10⁷W/cm²), an intermediate laser power density of 1x10⁷W/cm² was sufficient to allow imaging of both drugs. Using individual selected ion signals, ToF-SIMS and Laser-SNMS produced similar images of the two drug species. When using, however, a multivariate approach (Maximum autocorrelation factors), Laser-SNMS provided significant improvements in image contrast and small area detection when compared to ToF-SIMS. Following optimization of the technique, 3D-images of the dual drug eluting stent coating were obtained using 10 keV Ar₂₀₀₀⁺ cluster ions for sputtering and 30 keV Bi₃⁺ cluster ions for Analysis for both ToF-SIMS and Laser-SNMS. This work demonstrates the advantages of Laser-SNMS for 3D-imaging of pharmaceutical devices, which has not been previously published. Both ToF-SIMS and Laser-SNMS revealed that the outermost surface of the drug eluting coating contained pure sirolimus to a depth of a few tens of nanometers, with a few channels of sirolimus extending to a depth of around 1 lm. Below about 1 lm, the two drugs were uniformly mixed. Using the 10 keV Ar₂₀₀₀⁺ sputter beam, the authors were able to sputter through the complete drug coating (~6 μm) without observing any accumulated damage in the organic layer. The two techniques showed complementary strengths: ToF-SIMS offers faster data collection and better detected ion yield for larger characteristic ions than Laser-SNMS, and Laser-SNMS offers significantly enhanced detected ion yield for smaller fragment ions, allowing for improved Image contrast and Resolution of smaller features. KW - Imaging ToF SIMS KW - Eluting stent PY - 2016 DO - https://doi.org/10.1116/1.4964687 SN - 1934-8630 SN - 1559-4106 VL - 11 IS - 4 SP - 041001-1 EP - 041001-10 PB - AVS: Science & Technology of Materials, Interfaces, and Processing AN - OPUS4-38272 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Kalbe, Henryk A1 - Rades, Steffi T1 - Determining shell thicknesses in stabilised CdSe@ZnS core-shell nanoparticles by quantitative XPS analysis using an infinitesimal columns model N2 - A novel Infinitesimal Columns (IC) simulation model is introduced in this study for the quantitativeanalysis of core-shell nanoparticles (CSNP) by means of XPS, which combines the advantages of exist-ing approaches. The IC model is applied to stabilised Lumidot™CdSe/ZnS 610 CSNP for an extensiveinvestigation of their internal structure, i.e. calculation of the two shell thicknesses (ZnS and stabiliser)and exploration of deviations from the idealised CSNP composition. The observed discrepancies betweendifferent model calculations can be attributed to the presence of excess stabiliser as well as synthesisresidues, demonstrating the necessity of sophisticated purification methods. An excellent agreement isfound in the comparison of the IC model with established models from the existing literature, the Shardmodel and the software SESSA. KW - XPS KW - Quantum dot KW - Core shell nano particle PY - 2016 DO - https://doi.org/10.1016/j.elspec.2016.08.002 SN - 0368-2048 VL - 212 SP - 34 EP - 43 PB - Elsevier B.V. AN - OPUS4-38273 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Swaraj, S. A1 - Dietrich, Paul M. T1 - X-ray spectromicroscopy of nanoparticulate iron oxide phases N2 - Soft x-ray spectromicroscopy techniques have seen great amount of development in the recent years, and with the development of new diffraction limited synchrotron source, many new nanoscale and mesoscale characterization opportunities of applied materials are foreseen. In this perspective, the authors present some examples that illustrate the capabilities of spectromicroscopy techniques, namely, 2D and 3D spatially resolved chemical quantification, surface and bulk sensitive measurements, and polarization dependent measurements as applied to iron oxide nanoparticulate materials of biological, geological, and other origins. KW - X-ray spectromicroscopy KW - STXM KW - Iron oxide PY - 2016 DO - https://doi.org/10.1116/1.4966654 SN - 1934-8630 SN - 1559-4106 VL - 11 IS - 4 SP - 04B402-1 EP - 04B402-6 PB - AVS: Science & Technology of Materials, Interfaces, and Processing AN - OPUS4-38274 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Surfchem - Traceable quantitative surface chemical analysis for industrial applications N2 - The project addresses chemical and topographical metrology at surfaces. The new methodologies of measurements at surfaces will be developed as good practice guides and new work item proposals for industrial ISO standards. The objectives of the Joint research project (JRP) are to provide measurement standards and methods with traceability wherever it is practicable to do so for quantitative surface chemical analysis for industrial applications. KW - Method development KW - Surface chemical analysis KW - Analytical methods KW - Reference material PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-386319 SP - 1 EP - 4 PB - Bundesanstalt für Materialforschung und -prüfung (BAM) CY - Berlin AN - OPUS4-38631 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lange, Nele A1 - Dietrich, Paul M. A1 - Lippitz, Andreas A1 - Kulak, N. A1 - Unger, Wolfgang T1 - New azidation methods for the functionalization of silicon nitride and application in copper-catalyzed azide-alkyne cycloaddition (CuAAC) N2 - In this study, a new direct functionalization method of silicon nitride (Si3N4) using azidation and click chemistry is presented. First, amino groups (NHx) were created on a Si3N4 substrate by fluoride etching. These NHx-terminated Si3N4 surfaces were analyzed by chemical derivatization X-ray photoelectron spectroscopy (CD-XPS) with 4-trifluoromethylbenzaldehyde (TFBA) and a derivatization yield of 20% was concluded. In the second step freshly prepared NHx surfaces were transformed into azides which were used immediately in a click reaction with halogenated alkynes. The presented combination of amination, azidation and click reaction is a promising alternative for common silane-based Si3N4 functionalization methods. T2 - 16th European Conference on Applications of Surface and Interface Analysis CY - Granada, Spain DA - 28.09.2015 KW - XPS KW - Azidation KW - Click chemistry KW - Silicon nitride KW - Chemical derivatization PY - 2016 UR - http://onlinelibrary.wiley.com/doi/10.1002/sia.5950/full DO - https://doi.org/10.1002/sia.5950 VL - 48 SP - 621 EP - 625 PB - John Wiley & Sons, Ltd AN - OPUS4-36841 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fréjafon, E. A1 - Salvi, O. A1 - Hazebrouck, B. A1 - Le Feber, M. A1 - López de Ipiña Peña, J. A1 - Unger, Wolfgang T1 - Creation of the European centre for risk management and safe innovation in nanomaterials & nanotechnologies (EC4SafeNano) N2 - Safe innovation & sustainable production with MNMs need that we: Understand risks and benefits (diagnostic, assessment) Identify and implement risk reduction strategies (manage) Communicate on residual risks (acceptance) Huge knowledge on characterization, hazards, diagnostic (science) Little effective use of it for operational risk management (expertise) Objectives of the centre: Bridge the gap between research and application (public, private), Bridge the gap between knowledge on risks and risk management, Balance between Science and Appliance, in a sustainable way: Efficient & Sustainable structure Collective, harmonized, shared expertise EU scale, internationally connected. T2 - Workshop "NanoSafety: from research to implementation" CY - Amsterdam, The Netherlands DA - 22.06.2016 KW - Nano materials KW - Risk management KW - Safe innovation PY - 2016 UR - http://nanomile.eu-vri.eu/news.aspx?lan=230&tab=2361&nid=991#n991 AN - OPUS4-36966 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Advanced surface chemical analysis of plasma modified polymers and plasma-polymers N2 - A comprehensive characterization of plasma modified polymer surfaces or plasma-polymerized thin films needs access to parameters as - concentration of saturated/unsaturated carbon species (e.g. aromaticity) or other double bonds as C=N or C=O, - branching, and - losses of crystallinty or other degrees of structural order. Furthermore the complex ageing phenomena of plasma modified polymers/plasma-polymers and the measurement of an in-depth distribution of chemical species are challenges for the analyst. The talk will display selected examples where such challenges have been met by using advanced methods of surface chemical analyses as Photoelectron Spectroscopy with variable excitation energy (“SyncXPS”), X-ray Absorption Spectroscopy (NEXAFS) at C, N and O K-edges and Time-of-Flight Secondary Mass Spectroscopy (ToF-SIMS) combined with Principal Component analysis (PCA). T2 - IAP workshop – IAP 2016 "Organic surface modifications by plasmas and plasma-polymers" CY - Nancy, France DA - 08.06.2016 KW - XPS KW - NEXAFS KW - SIMS KW - Plasmapolymer PY - 2016 AN - OPUS4-36725 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Zhang, Zhiyang A1 - Merk, V. A1 - Müller, Anja A1 - Unger, Wolfgang A1 - Kneipp, Janina T1 - Role of metal cations in plasmon-catalyzed oxidation: A case study of p-aminothiophenol dimerization N2 - The mechanism of the plasmon-catalyzed reaction of p-aminothiophenol (PATP) to 4,4′-dimercaptoazobenzene (DMAB) on the surface of metal nanoparticles has been discussed using data from surface-enhanced Raman scattering of DMAB. Oxides and hydroxides formed in a plasmon-catalyzed process were proposed to play a central role in the reaction. Here, we report DMAB formation on gold nanoparticles occurring in the presence of the metal cations Ag+, Au3+, Pt4+, and Hg2+. The experiments were carried out under conditions where formation of gold oxide or hydroxide from the nanoparticles can be excluded and at high pH where the formation of the corresponding oxidic species from the metal ions is favored. On the basis of our results, we conclude that, under these conditions, the selective oxidation of PATP to DMAB takes place via formation of a metal oxide from the ionic species in a plasmon-catalyzed process. By evidencing the necessity of the presence of the metal cations, the reported results underpin the importance of metal oxides in the reaction. KW - Metal ions KW - Plasmonic catalysis KW - p-aminothiophenol KW - 4,4'-dimercaptoazobenzene KW - Surface-enhanced Raman scattering PY - 2017 UR - http://pubs.acs.org/doi/abs/10.1021/acscatal.7b02700 DO - https://doi.org/10.1021/acscatal.7b02700 SN - 2155-5435 N1 - Geburtsname von Müller, Anja: Hermanns, A. - Birth name of Müller, Anja: Hermanns, A. VL - 7 IS - 11 SP - 7803 EP - 7809 PB - American Chemical Society CY - Washington AN - OPUS4-43001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kjaervik, Marit A1 - Müller, Anja A1 - Dietrich, P. A1 - Thissen, A. A1 - Bahr, S. A1 - Ritter, B. A1 - Kemnitz, E. A1 - Unger, Wolfgang T1 - Detection of suspended nanoparticles with near-ambient pressure x-ray photoelectron spectroscopy N2 - Two systems of suspended nanoparticles have been studied with near-ambient pressure x-ray photoelectron spectroscopy: silver nanoparticles in water and strontium fluoride—calcium fluoride core-shell nanoparticles in ethylene glycol. The corresponding dry samples were measured under ultra high vacuum for comparison. The results obtained under near-ambient pressure were overall comparable to those obtained under ultra high vacuum, although measuring silver nanoparticles in water requires a high pass energy and a long acquisition time. A shift towards higher binding energies was found for the silver nanoparticles in aqueous Suspension compared to the corresponding dry sample, which can be assigned to a change of surface potential at the water-nanoparticle interface. The shell-thickness of the core-shell nanoparticles was estimated based on simulated spectra from the National Institute of Standards and Technology database for simulation of electron spectra for surface analysis. With the instrumental set-up presented in this paper, nanoparticle suspensions in a suitable Container can be directly inserted into the analysis chamber and measured without prior sample preparation. KW - Nanoparticles KW - Suspensions KW - Core-shell nanoparticles KW - NAP-XPS PY - 2017 DO - https://doi.org/10.1088/1361-648X/aa8b9d SN - 1361-648X SN - 0953-8984 N1 - Geburtsname von Müller, Anja: Hermanns, A. - Birth name of Müller, Anja: Hermanns, A. VL - 29 IS - 47 SP - 474002, 1 EP - 474002, 9 PB - IOP Publishing CY - UK AN - OPUS4-42951 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Streeck, C. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Beckhoff, B. T1 - Qualifying calibration samples for advanced thin film materials characterisation N2 - In this article the question of the certification of calibration samples for the characterisation of advanced thin film materials is addressed within the framework of reliable process control or quality management purposes. Reference measurement techniques can be used in order to address the gap in appropriate certified reference materials (CRMs) for thin film analyses. They allow for qualifying out-of-production samples originating from an operating production line as calibration samples. As a template for this procedure, CIGS [Cu(In,Ga)Se2] layers, that are absorber layers for high efficiency thin-film solar cells, have been used for establishing and validating reference-free X-ray fluorescence (XRF) analysis and Auger-electron spectroscopy (AES) as reference measurement techniques. The focus was on determining the average mole fractions in the CIGS layers obtaining results traceable to the SI unit system. Reference-free XRF is physically traceable and is based upon radiometrically calibrated instrumentation and knowledge of atomic fundamental data. Sputter-assisted AES can be established as a chemically traceable method after careful calibration using a certified reference material (CRM) based on a total number counting method. KW - CIGS KW - X-ray fluorescence (XRF) KW - Auger-electron spectroscopy (AES) PY - 2018 UR - https://www.spectroscopyeurope.com/article/qualifying-calibration-samples-advanced-thin-film-materials-characterisation VL - 30 IS - 1 SP - 11 EP - 14 PB - John Wiley & Sons Ltd CY - Chichester, West Sussex PO19 8SQ, UK AN - OPUS4-44260 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Bütefisch, S. A1 - Busch, I. T1 - Lateral resolution delivered by imaging surface-analytical instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and related ISO Standards N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1 xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. KW - Standardization KW - AES KW - XPS KW - SIMS KW - Lateral resolution KW - Certified reference material PY - 2017 SN - 1341-1756 VL - 24 IS - 2 SP - 123 EP - 128 AN - OPUS4-43138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Poppenberg, J. A1 - Richter, S. A1 - Traulsen, Ch. H.-H. A1 - Darlatt, Erik A1 - Baytekin, B. A1 - Heinrich, Thomas A1 - Deutinger, P. M. A1 - Huth, K. A1 - Unger, Wolfgang A1 - Schalley, Ch. T1 - Programmable multilayers of nanometer-sized macrocycles on solid support and stimuli-controlled on-surface pseudorotaxane formation N2 - Mechanically interlocked molecules (MIMs) such as rotaxanes and catenanes are capable of mechanical motion on the nanoscale and are therefore promising prototypes for molecular machines in recent nanotechnology. However, most of the existing examples are isotropically distributed in solution, which prohibits concerted movement and with it the generation of macroscopic effects. Thus, arranging them in ordered arrays is of huge interest in recent research. We report the deposition of quite densely packed multilayers of tetralactam macrocycles on gold surfaces by metal-coordinated layer-by-layer self-assembly. Linear dichroism effects in angle-resolved NEXAFS spectra indicate a preferential orientation of the macrocycles. The sequence of the metal ions can be programmed by the use of different transition metal ions at each deposition step. Additionally, reversible on-surface pseudorotaxane formation was successfully realized by repeated uptake and release of axle molecules inside the macrocycles cavities. KW - NEXAFS KW - XPS KW - Supramolecular Chemistry KW - Multilayers KW - Pyridine KW - UV/Vis KW - Macrocycles KW - Pseudorotaxanes PY - 2013 DO - https://doi.org/10.1039/c3sc50558h VL - 4 IS - 8 SP - 3131 EP - 3139 AN - OPUS4-42668 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Acquiring and Documenting Reproducible Spectra, Depth Profiles and Images: XPS, AES and SIMS N2 - In this talk sample prep/handling, instrument calibration and data acquisition methods with examples from XPS, Auger and SIMS will be addressed in terms of their contributions to the reproducibility of data delivered by the methods. Active parties in the field are VAMAS TWA 2 “Surface chemical analysis” (http://www.vamas.org/twa2/index.html), ISO/TC 201 “Surface chemical analysis” (https://www.iso.org/committee/54618.html) and the Surface Analysis Working Group (SAWG) at the International Meter Convention (https://www.bipm.org/en/ committees/cc/wg/sawg.html). The tools to improve the reproducibility of spectra, depth profiles and images at these international platforms are inter-laboratory comparisons, validated SOPs, standards and certified reference materials (CRM) as well as uncertainty budgets and establishment of traceability chains. The last point is of specific importance because all the methods, XPS, Auger and SIMS, are not primary methods. To address quantitative XPS, AES and SIMS results of relevant inter-laboratory comparisons organized by SAWG considering measurands as alloy surface composition and thickness of thin films will be introduced. These comparisons delivered results which are viewed to be benchmarking, some of them resulted in ISO/TC 201 standards. For quantitative XPS and AES the principal outline of an uncertainty budget will be discussed together with the audience. Another issue of quantitative XPS which definitely needs consideration are valid methods for a determination of the transmission function of the instruments and even for the emission angle in the respective experiments. Concerning the field of depth profiling it has to be investigated together with the audience whether the ISO (or ASTM) standards we have are sufficient to guarantee comparable results. Having in mind the number of different sputter ion species available today and range of samples of interest (metals, semiconductors, organic films) this might be questionable. And, how do depth profiling by AR-XPS and variable excitation energy XPS compete here? For imaging surface chemical analysis, the characterization of the imaging system is an issue to be investigated. Here the determination of lateral resolution is a relevant topic. Finally, the future needs to develop metrology for new applications e.g., ambient-pressure XPS, bio samples, and core-shell nanoparticles, will be issues raised for a discussion with the audience. T2 - 17th Topical Conference on Quantitative Surface Analysis (QSA 17) CY - Long Beach, CA, USA DA - 21.10.2018 KW - Depth Profiles and Images KW - X-ray Photoelectron Spectroscopy (XPS) KW - Auger Electron Spectroscopy (AES) KW - SIMS KW - Reproducible Spectra PY - 2018 AN - OPUS4-46470 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Kjaervik, Marit T1 - New work item proposal for a technical report for ISO/TC 201 WG 4 “Surface characterization of biomaterials”: Surface chemical analysis – Surface chemical analysis of cells and biofilms N2 - The proposed ISO Technical Report provides a description of a variety of physical methods of analytical chemistry by which bacteria and biofilms can be analysed. The state of the art, sample requirements and strengths associated with each method are identified. T2 - 27th Plenary Meeting of ISO/TC 201 CY - Cancun, Mexico DA - 2018-09-20 KW - Surface chemical analysis of biofilms KW - XPS KW - Fourier-Transform Infrared Spectroscopy KW - 3D nano SIMS KW - Raman-spectroscopy PY - 2018 AN - OPUS4-46214 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Anja A1 - Swaraj, S. A1 - Sparnacci, K. A1 - Unger, Wolfgang T1 - Shell thickness determination for PTFE‐PS core‐shell nanoparticles using scanning transmission X‐ray microscopy (STXM) N2 - A scanning transmission X‐ray microscopy (STXM)‐based methodology is introduced for determining the dimensions (shell thickness, core and total diameter) of core‐shell nanoparticles, which exhibit a strong X‐ray absorption contrast and a well‐defined interface between core and shell material. A low radiation dosage during data acquisition and, therefore, less X‐ray beam‐induced damage of the sample is achieved by recording STXM images only at 2 predetermined energies of maximum Absorption contrast, instead of recording a stack of images across the whole absorption edge. A model core‐shell nanoparticle, polytetrafluoroethylene (PTFE) cores with polystyrene (PS) shell, is used for demonstration. Near‐edge X‐ray absorption fine structure spectroscopy confirms the significant difference in X‐ray absorption behavior between PTFE and PS. Additionally, because of the insolubility of styrene in PTFE a well‐defined interface between particle core and shell is expected. To validate the STXM results, both the naked PTFE cores as well as the complete core‐shell nanoparticles are examined by scanning electron microscopy (SEM). The introduced STXM‐based methodology yields particle dimensions in agreement with the SEM results and provides additional information such as the position of the particle core, which cannot be extracted from a SEM micrograph. T2 - European conference on applications of surface and interface analysis (ECASIA'17) CY - Montpellier, France DA - 24.09.2017 KW - Core-shell nanoparticles KW - Polymers KW - PS KW - PTFE KW - SEM KW - STXM PY - 2018 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-449700 DO - https://doi.org/10.1002/sia.6464 SN - 1096-9918 SN - 0142-2421 VL - 50 IS - 11 SP - 1077 EP - 1082 PB - John Wiley & Sons CY - Hoboken, New Jersey, USA AN - OPUS4-44970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales Surface Analysis Working Group (SAWG) - Report for 16th Meeting (2017/18) N2 - Following the 2017 meeting, progress with the Key Comparison CCQM-K153 related to the BET specific surface lead by UNIIM and the Pilot Study P-190 “Thickness Measurement of nm HfO2 Films” lead by KRISS will be discussed. The 16th meeting of SAWG will focus on •survey on CMC claims submitted with reference to K-129 and K-136. •the overall and SAWG specific aspects of the CCQM Strategy process, •a consideration of comparisons on convention methods as recommended by the CCQM Plenary Meeting 2017, •the 2019 CCQM Workshop and paper(s) for Metrologia’s Special Issue, •discussion of future comparisons. T2 - 24th meeting of the CCQM 2018 CY - Paris, France DA - 19.04.2018 KW - Surface chemical analysis KW - Metrology KW - Inter-laboratory comparisons PY - 2018 AN - OPUS4-44998 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Busch, I. A1 - Unger, Wolfgang T1 - Analytical and topographical Reference Material for the Nanoscale N2 - Reliable standards are required to support research and development as well as end-user in application. Appropriate standards have to fulfill three requirements: small uncertainty, easy to use and low overall costs of application. For calibration of microscopes at nanoscale and/or element analysis special requirements for standards are given, which are challenging in manufacture. T2 - Workshop on Reference Nanomaterials CY - Berlin, Germany DA - 14.05.2018 KW - XPS KW - Imaging KW - Reference material KW - NoStep Standards PY - 2018 AN - OPUS4-45156 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Designing a sustainable European centre for risk management and safe innovation in nanomaterials & nanotechnologies (EC4SafeNano) N2 - A central challenge to ensure the sustainable production and use of nanotechnologies is to understand the risks for environment, health and safety associated with this technology and resulting materials and products, and to identify and implement practical strategies to minimize these risks. Knowledge about nanotechnology-enabled processes and products and related environment, health and safety issues is growing rapidly, achieved through numerous European or national R&D programs over the last decade, but effective use of this knowledge for risk management by market actors is lagging behind. The EC4SafeNano initiative (www.EC4SafeNano.eu) is an ongoing effort to build a European Centre for Risk Management and Safe Innovation in Nanomaterials and Nanotechnologies. EC4SafeNano aims to bridge the gap between scientific knowledge on hazard and risk, and ‘fit-for-purpose’ risk management tools and strategies supported by measurement and control methods. The consortium comprises 15 partners (INERIS (coordinator), EU-VRi, TNO, BAM, FIOH, VITO, SP, DEMOKRITOS, TECNALIA, Health and Safety Executive, NRCWE, Paris Lodron University Salzburg, Université Libre de Bruxelles, University of Birmingham and ENEA) from 11 European Member States with significant expertise on risk assessment and management, who already provide knowledge and technical services to public and private organizations, to industry and to public authorities and regulatory bodies. The overall objective of the EC4SafeNano project is to develop a distributed Centre of European Organisations offering services for Risk Management and Safe Innovation for Nanomaterials & Nanotechnologies. The Centre will be structured as a hub-based network of organizations managed by a core group of public-oriented bodies providing risk management and safe innovation support to all stakeholders. It will be operated with the support of Associated Partners so as to expand its capabilities, resources and services. It will interact with existing platforms and centres of excellence in nanosafety and foster the organization or development of national hubs mirroring the European hub. The Centre will seek financial support from stakeholders and service users to sustain the services in the longer term. The operational objectives of the project involve understanding and mapping the needs of the various stakeholders (private and public). It will identify the resources and capabilities and develop a range of harmonized services required to meet these needs. The construction of the centre will include putting in place and implementing processes to deliver and update services, to test and benchmark services, to evaluate the governance of the Centre, and developing a business plan to ensure self-sufficiency of the Centre beyond the project lifetime. A cornerstone of the project is to build a community for risk management and safe innovation for nanotechnology. Interested persons or organisations are invited to join this initiative as registered stakeholders or Associated Partners, to engage in focus networks and to help shape the future Centre. The poster will present the EC4SafeNano initiative and will detail the role of registered stakeholders and Associated Partners. T2 - UBA Scientific Stakeholder Meeting on Nanomaterials in the Environment CY - Dessau, Germany DA - 10.10.2017 KW - Risk management KW - Nanomaterials KW - Nanotechnologies PY - 2017 AN - OPUS4-42788 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Grötzsch, D. A1 - Streeck, C. A1 - Nietzold, Carolin A1 - Malzer, W. A1 - Mantouvalou, I. A1 - Nutsch, A. A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Beckhoff, B. A1 - Kanngießer, B. T1 - A sealable ultrathin window sample cell for the study of liquids by means of soft X-ray spectroscopy N2 - A new sample cell concept for the analysis of liquids or solid-liquid interfaces using soft X-ray spectroscopy is presented, which enables the complete sealing of the cell as well as the Transport into vacuum via, for example, a load-lock system. The cell uses pressure monitoring and active as well as passive pressure regulation systems, thereby facilitating the full control over the pressure during filling, sealing, evacuation, and measurement. The cell design and sample preparation as well as the crucial sealing procedure are explained in detail. As a first proof-of-principle experiment, successful nitrogen K-edge fluorescence yield near-edge X-ray absorption fine structure experiments of a biomolecular solution are presented. For this purpose, it is shown that the careful evaluation of all involved parameters, such as window type or photon flux, is desirable for optimizing the experimental result. KW - X-ray spectroscopy KW - Analysis of liquids KW - Wet cell KW - Concanavalin A KW - NEXAFS PY - 2017 DO - https://doi.org/10.1063/1.5006122 SN - 0034-6748 SN - 1089-7623 VL - 88 IS - 12 SP - 123112-1 EP - 123112-7 PB - American Institute of Physics AN - OPUS4-43611 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Khosravi, Z. A1 - Kotula, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Klages, C.-P. T1 - IR- and NEXAFS-spectroscopic characterization of plasma-nitrogenated polyolefin surfaces N2 - Modification of polyethylene and polypropylene surfaces by atmospheric-pressure plasmas using mixtures of nitrogen and hydrogen was studied using Fouriertransform infrared spectroscopy in the attenuated total reflection mode (FTIR-ATR) and by near-edge x-ray absorption fine structure spectroscopy (NEXAFS) in order to shed some light on the chemical nature of nitrogen-containing functional Groups on the polymer surface. Using FTIR-ATR spectroscopy combined with hydrogendeuterium isotope exchange of active hydrogen atoms, it was shown that the direct treatment of PE foils by dielectric barrier discharges (DBDs) in N2/H2 mixtures and a subsequent exposure of the samples to the ambient air results in the formation of –NH2 moieties of primary amides on the polymer surface. Corresponding in situ experiments with streaming N2/H2 DBD post-discharges virtually free of H2O and O2, on the other hand, showing the absence of –NH2, proving that no primary amines or amides are formed by this treatment although substantial amounts of nitrogen are incorporated. Moreover, directly N2/H2-plasma-treated polymer surfaces, similar to afterglow-treated low-density polyethylene (LDPE), show amphiphilic character as to be seen by chemical derivatization with nucleophilic reagents 4-(trifluoromethyl) phenylhydrazine and 4-(trifluoromethyl)benzylamine, in addition to electrophilic aromatic aldehydes normally used to derivatize such surfaces. The presence of imines or other functional groups with CN moieties which may be invoked to explain the dual (amphiphilic) reactivity is proven by NEXAFS studies on ultrathin plasma-treated PE films, confirming significant amounts of nitrogen in CN bonds and carbon in CC bonds. KW - X-ray spectroscopy KW - IR spectroscopy KW - Plasma-nitrogenated polyolefin surfaces KW - Unsaturated CN bonds KW - NEXAFS PY - 2017 DO - https://doi.org/10.1002/ppap.201700066 SN - 1612-8869 SN - 1612-8850 VL - 15 IS - 1 SP - e1700066, 1 EP - 15 PB - WILEY-VCH Verlag GmbH & Co. KGaA, CY - Weinheim AN - OPUS4-43786 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Summary of ISO/TC 201 technical report: ISO/TR 19693 surface chemical analysis—characterization of functional glass substrates for biosensing applications N2 - ISO/TR 19693:2018—Surface chemical analysis—Characterization of functional glass substrates for biosensing applications gives an overview of methods, strategies, and guidance to identify possible sources of problems related to substrates, device production steps (cleaning, activation, and chemical modification), and shelf life (storage conditions and aging). It is particularly relevant for surface chemical analysts characterizing glass‐based biosensors, and developers or quality managers in the biosensing device production community. Based on quantitative and qualitative surface chemical analysis, strategies for identifying the cause of poor Performance during device manufacturing can be developed and implemented. A review of measurement capabilities of surface analytical methods is given to assist readers from the biosensing community. KW - Bio sensing device KW - Surface chemical analysis KW - XPS KW - SIMS KW - Standardization PY - 2018 DO - https://doi.org/10.1002/sia.6481 SN - 0142-2421 SN - 1096-9918 VL - 50 IS - 8 SP - 835 EP - 838 PB - John Wiley & Sons, Ltd. AN - OPUS4-45829 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Baer, D. R. A1 - Karakoti, A. S. A1 - Clifford, C. A. A1 - Minelli, C. A1 - Unger, Wolfgang T1 - Importance of sample preparation on reliable surface characterisation of nano‐objects: ISO standard 20579‐4 N2 - The international ISO Standard 20579‐4, dealing with the history and preparation of nano‐objects for surface analysis, has been developed to help address some of the replication and reproducibility issues caused by the fundamental nature of nanoobjects. Although all types of samples requiring surface analysis need thoughtful preparation, nano‐objects, for which many properties are controlled by their surfaces, present additional challenges in order to avoid variations and artefacts due to the handling and preparation of materials prior to analysis. This international standard is part of a series of standards related to preparation of samples for surface chemical analysis. Parts 1 and 2 of ISO Standard series 20579 address general issues that apply to many samples. Part 3, which is still in development, will focus on biomaterials. Part 4 specifically considers issues that arise due to the inherent nature of nano‐objects. Because of sensitivity to their environment, the standard indicates the minimum Information that needs to be reported about the handling and preparation of nano‐objects prior to surface analysis. This information should become part of sample provenance information that helps assure the reliability and usefulness of data obtained from surface‐analysis in the context of the synthesis, processing, and analysis history of a batch of material. Application of this standard can help address reproducibility and traceability issues associated with synthesis, processing, and characterization of nano‐objects in research and commercial applications. KW - Nano‐object characterization KW - Nanoparticle characterization KW - Provenance information KW - Sample preparation KW - Surface analysis PY - 2018 DO - https://doi.org/10.1002/sia.6490 SN - 0142-2421 SN - 1096-9918 VL - 50 IS - 9 SP - 902 EP - 906 PB - John Wiley & Sons, Ltd. AN - OPUS4-45830 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kjaervik, Marit A1 - Unger, Wolfgang T1 - New work item proposal for a technical report for ISO/TC 201 WG4 “Surface characterization of biomaterials”: Surface chemical analysis – Surface chemical analysis of cells and biofilms N2 - The proposed ISO Technical Report provides a description of a variety of physical methods of analytical chemistry by which bacteria and biofilms can be analysed. The state of the art, sample requirements and strengths associated with each method are identified. Presented at the DIN-meeting for NA 062-08-16 AA „Chemische Oberflächenanalyse und Rastersondenmikroskopie“ T2 - 18. Sitzung des DIN-meeting NA 062-08-16 AA "Chemische Oberflächenanalyse und Rastersondenmikroskopie“ CY - Berlin, Germany DA - 08.11.2018 KW - 3D nano SIMS KW - Fourier transform infrared spectroscopy KW - Raman-spectroscopy KW - Biofilms KW - XPS PY - 2018 AN - OPUS4-46548 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Chemical Analysis at BAM: R&D, Metrology, Standardization T2 - Analytikseminar, Insitute of Chemical Technologies and Analytics, Vienna University of Technology CY - Vienna, Austria DA - 2015-01-09 PY - 2015 AN - OPUS4-32927 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Heinrich, Thomas A1 - Traulsen, Christoph Hans-Henning A1 - Holzweber, Markus A1 - Richter, S. A1 - Kunz, V. A1 - Kastner, S.K. A1 - Krabbenborg, S.O. A1 - Huskens, J. A1 - Unger, Wolfgang A1 - Schalley, C.A. T1 - Coupled molecular switching processes in ordered mono- and multilayers of stimulus-responsive rotaxanes on gold surfaces N2 - Interfaces provide the structural basis for function as, for example, encountered in nature in the membrane-embedded photosystem or in technology in solar cells. Synthetic functional multilayers of molecules cooperating in a coupled manner can be fabricated on surfaces through layer-by-layer self-assembly. Ordered arrays of stimulus-responsive rotaxanes undergoing well-controlled axle shuttling are excellent candidates for coupled mechanical motion. Such stimulus-responsive surfaces may help integrate synthetic molecular machines in larger systems exhibiting even macroscopic effects or generating mechanical work from chemical energy through cooperative action. The present work demonstrates the successful deposition of ordered mono- and multilayers of chemically switchable rotaxanes on gold surfaces. Rotaxane mono- and multilayers are shown to reversibly switch in a coupled manner between two ordered states as revealed by linear dichroism effects in angle-resolved NEXAFS spectra. Such a concerted switching process is observed only when the surfaces are well packed, while less densely packed surfaces lacking lateral order do not exhibit such effects. KW - Molecular machine KW - Rotaxane KW - LBL growth KW - XPS KW - NEXAFS KW - SIMS PY - 2015 DO - https://doi.org/10.1021/ja512654d SN - 0002-7863 SN - 1520-5126 VL - 137 IS - 13 SP - 4382 EP - 4390 PB - American Chemical Society CY - Washington, DC, USA AN - OPUS4-33077 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Holzweber, Markus A1 - Lippitz, Andreas A1 - Krüger, K. A1 - Jankowski, J. A1 - Unger, Wolfgang T1 - Surface characterization of dialyzer polymer membranes by imaging ToF-SIMS and quantitative XPS line scans N2 - The surfaces of polymeric dialyzer membranes consisting of polysulfone and polyvinylpyrrolidone were investigated regarding the lateral distribution and quantitative surface composition using time-of-flight secondary-ion-mass-spectrometry and x-ray photoelectron spectroscopy. Knowledge of the distribution and composition on the outer surface region is of utmost importance for understanding the biocompatibility of such dialyzer membranes. Both flat membranes and hollow fiber membranes were studied. KW - Tof SIMS KW - XPS KW - Dialyzer membrane KW - Surface analysis KW - Polymer PY - 2015 DO - https://doi.org/10.1116/1.4907937 SN - 1934-8630 SN - 1559-4106 VL - 10 IS - 1 SP - 019011-1 EP - 019011-7 PB - AVS CY - New York, NY, USA AN - OPUS4-32740 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Guo, Y. A1 - Lippitz, Andreas A1 - Saftien, P. A1 - Unger, Wolfgang A1 - Kemnitz, E. T1 - Tuning the surface properties of novel ternary iron(III) fluoride-based catalysts using the template effect of the matrix N2 - Sol–gel prepared ternary FeF3–MgF2 materials have become promising heterogeneous catalysts due to their porosity and surface Lewis/Brønsted acidity (bi-acidity). Despite the good catalytic performance, nanoscopic characterisations of this type of material are still missing and the key factors controlling the surface properties have not yet been identified, impeding both a better understanding and further development of ternary fluoride catalysts. In this study, we characterised the interaction between the bi-acidic component (FeF3) and the matrix (MgF2) on the nano-scale. For the first time, the formation pathway of FeF3–MgF2 was profiled and the template effect of MgF2 during the synthesis process was discovered. Based on these new insights two novel materials, FeF3–CaF2 and FeF3–SrF2, were established, revealing that with decreasing the atomic numbers (from Sr to Mg), the ternary fluorides exhibited increasing surface acidity and surface area but decreasing pore size. These systematic changes gave rise to a panel of catalysts with tuneable surface and bulk properties either by changing the matrix alkaline earth metal fluoride or by adjusting their ratios to Fe or both. The template effect of the alkaline earth metal fluoride matrix was identified as the most probable key factor determining the surface properties and further influencing the catalytic performance in ternary fluoride based catalysts, and paves the way to targeted design of next-generation catalysts with tunable properties. KW - Catalysis KW - Surface analysis KW - XPS PY - 2015 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-327410 DO - https://doi.org/10.1039/c4dt03229b SN - 1477-9226 SN - 1477-9234 SN - 1364-5447 VL - 44 IS - 11 SP - 5076 EP - 5085 PB - RSC CY - Cambridge AN - OPUS4-32741 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -