TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Steers, E.B.M. A1 - Hoffmann, V. A1 - Unger, Wolfgang A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Influence of hydrogen on the analytical figures of merit of glow discharge optical emission spectroscopy - friend or foe? PY - 2003 DO - https://doi.org/10.1039/b305384a SN - 0267-9477 SN - 1364-5544 VL - 18 SP - 521 EP - 526 PB - Royal Society of Chemistry CY - London AN - OPUS4-2290 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Gesatzke, Wolfgang A1 - Scholl, A. A1 - Kilcoyne, A. D. A1 - Koprinarov, I. A1 - Ade, H. A1 - Hitchcock, A. P. A1 - Schulz, H. A1 - Scheibe, H.-J. ED - Tamura, L. S. T1 - Spectromicroscopy with inhomogeneous ta - C samples PY - 2003 UR - http://repositories.cdlib.org/lbnl/LBNL-52519/ SP - 1 EP - 3(?) AN - OPUS4-4694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Weiss, K. A1 - Wöll, Ch. T1 - Surface analysis of metaillized poly(bisphenol A cabonate) films by x-ray absorption spectroscopy (NEXAFS) KW - NEXAFS KW - Röntgenadsorptionsspektroskopie KW - Oberflächenanalyse KW - Film, metallisiert KW - Polymeroberfläche PY - 1996 SN - 0032-3861 SN - 1873-2291 VL - 37 IS - 14 SP - 3157 EP - 3160 PB - Springer CY - Berlin AN - OPUS4-649 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Schertel, A. A1 - Wöll, Ch. T1 - Surface analysis of partially crystalline and amorphous poly(ethylene terephthalate) samples by x-ray absorption spectroscopy (NEXAFS) KW - NEXAFS KW - Röntgenadsorptionsspektroskopie KW - Oberflächenanalyse KW - Polymeroberfläche PY - 1996 SN - 0032-3861 SN - 1873-2291 VL - 37 IS - 14 SP - 3151 EP - 3155 PB - Springer CY - Berlin AN - OPUS4-650 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Grohmann, I. A1 - Kemnitz, E. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Curve Fitting of Cr2p Photoelectron Spectra of Cr2O3 and CrF3 KW - Photoelektronenspektroskopie KW - Kurvenglättung KW - Chrom PY - 1995 SN - 0142-2421 SN - 1096-9918 VL - 23 SP - 887 EP - 891 PB - Wiley CY - Chichester AN - OPUS4-678 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Schertel, A. A1 - Wöll, Ch. T1 - NEXAFS analysis of a plasma treated, partially crystalline poly(ehtylene terephtalate) surface KW - NEXAFS KW - Röntgenstrukturanalyse KW - Oberflächen behandeln KW - Plasma PY - 1996 SN - 0179-4159 SP - 279 EP - 281 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-681 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Grohmann, I. A1 - Hess, A. A1 - Kemnitz, E. A1 - Frentrup, W. A1 - Unger, Wolfgang T1 - XANES-Investigations of coprecipitated AIF3/MgF2 phases KW - XANES-Spektrum KW - Kalzienieren KW - Magnesium PY - 1996 SN - 0179-4159 SP - 222 EP - 223 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-682 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gähde, J. A1 - Friedrich, Jörg Florian A1 - Fischer, T. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Falkenhagen, Jana T1 - Reactions of polymer analogous model substances with metals and oxides KW - Modellverbindung KW - Al202 KW - Chrom KW - Orientierung, molekular KW - Chemical interaction KW - Model compounds KW - Al2O3 and chromium KW - Molecular orientation KW - Formation of complexes KW - Plasma PY - 1996 SN - 0340-255x SN - 1437-8027 VL - 101 SP - 194 EP - 198 PB - Springer CY - Berlin AN - OPUS4-685 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Retzko, Iris A1 - Kühn, Gerhard A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Mittal, K. T1 - Metal doped plasma polymer films T2 - 7th Symposium on Metallized Plastics CY - Newark, NJ, USA DA - 1999-12-02 KW - Plasma polymer KW - r.f. pulsed plasma KW - Conducting films KW - Metal-polymer interface PY - 2001 SN - 90-6764-340-8 VL - 7 SP - 117 EP - 142 PB - VSP CY - Utrecht AN - OPUS4-929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Treu, Dieter A1 - Unger, Wolfgang T1 - Standard operating procedure (SOP) for the quantitative determination of organic silicon compounds at the surface of elastomeric sealants N2 - Elastomeric sealants may contain organic silicon compounds. The use of these sealants for housings for electronic components is harmful for the reliability of electric contacts inside. In order to prevent electronic components from malfunction, quality control of elastomeric sealants is required. An analytical procedure developed to fulfil this requirement was developed. It is based on electron spectroscopy for chemical analysis (ESCA). Information on the silicon compounds existing at the surface of elastomeric sealants is provided by this method. Silicon in organic and inorganic compounds can be differentiated with the help of Si 2p photoelectron spectra. Quantitative results can be obtained too. The uncertainty budget of the quantitative procedure is estimated. T2 - 11th Conference on Applied Surface Analysis (AOFA) CY - Leipzig, Germany DA - 2000-09-24 KW - ESCA KW - Silicone KW - Standard operation procedure PY - 2001 SN - 0169-4332 SN - 1873-5584 VL - 179 IS - 1-4 SP - 109 EP - 112 PB - North-Holland CY - Amsterdam AN - OPUS4-977 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. ED - Boehlig, H. T1 - Results of a VAMAS TWA 2 inter-laboratory test experimen - Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - 11th Conference on Applied Surface Analysis (AOFA) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 SN - 0169-4332 VL - 179 IS - 1 PB - Elsevier CY - Amsterdam AN - OPUS4-978 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Koenders, L. A1 - Wilkening, G. ED - Hasche, K. ED - Mirande, W. ED - Wilkening, G. T1 - Results of the inter-laboratory comparison "Determination of nanometric step heights with AFM" T2 - 5th Seminar on Quantitative Microscopy ; 1st Seminar on Nanoscale Calibration Standards and Methods ; NanoScale 2001 CY - Bergisch Gladbach, Germany DA - 2001-11-15 PY - 2002 SN - 3-89701-840-3 SN - 0179-0609 N1 - Serientitel: PTB-Bericht: PTB-F – Series title: PTB-Bericht: PTB-F VL - F-44 IS - 44 SP - 70 EP - 77 PB - Wirtschaftsverl. NW CY - Bremerhaven AN - OPUS4-1327 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Schulz, H. A1 - Scheibe, H.-J. A1 - Treu, Dieter A1 - Matsubayashi, N. T1 - Analysis of carbon materials by XPS T2 - Materials Week 2002 ; European Congress on Advanced Materials, their Processes and Applications ; 6th International Conference on Joining Ceramics, Glass and Metal CY - Munich, Germany DA - 2002-09-30 PY - 2002 SN - 3-88355-314-X PB - Werkstoff-Informationsges. AN - OPUS4-1734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive chemical depth-profiling of plasma polymers by variable excitation energy XPS PY - 2003 UR - http://pfwww.kek.jp/acr2002pdf/part_b/pf02b197.pdf SN - 1344-6339 VL - 20 SP - 197 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-2798 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive XPS depth-profiling of ta:C-films by variable excitation energy PY - 2003 UR - http://pfwww.kek.jp/acr2002pdf/part_b/pf02b198.pdf SN - 1344-6339 VL - 20 SP - 198 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-2799 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - Haftung im Verbund - Chemie und Hafteigenschaften von Metall-Polymergrenzflächen PY - 2003 SN - 0026-0797 SN - 0043-2792 VL - 57 IS - 7-8 SP - 26 EP - 31 PB - IGT, Informationsges. Technik CY - München AN - OPUS4-2843 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie T2 - FDS/NeMa Workshop und Präsentation CY - Bergisch Gladbach, Germany DA - 2000-05-11 PY - 2000 AN - OPUS4-3354 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - Verfahren zur Bestimmung des Gehaltes an organischen Siliciumverbindungen auf der Oberfläche von Elastomerformteilen KW - Elektronenspektroskopie KW - ESCA KW - Elastomere PY - 2000 SN - 0176-1625 N1 - Sprachen: Deutsch/Englisch - Languages: German/English VL - 53 IS - 2 SP - 97 EP - 99 PB - Gupta CY - Ratingen AN - OPUS4-805 LA - mul AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. A1 - Nick, L. T1 - The Use of Octadecyltrichlorosilane Self-Assembled Layers as a Model for the Assessment of Plasma Treatment and Metallization Effects on Polyolefins N2 - Self-assembled octadecyltrichlorosilane (CH3(CH2)17SiCl3, OTS) films were deposited on an oxidized silicon wafer. They were carefully exposed to a low-pressure oxygen direct current (dc) plasma and/or Cr vapor. Subsequently, they were characterized by X-ray photoelectron spectroscopy, near-edge X-ray absorption fine structure spectroscopy, and atomic force microscopy. Detailed information on the oxygen functionalization and the molecular conformation of the OTS films was obtained. The main result was that functionalization conditions can be found where the order of the film remains almost unaffected. Similarly, Cr evaporation of pure OTS films revealed only slight effects on the order in the film. Cr evaporation of an ordered but functionalized OTS film immediately changes its state toward a fully isotropic one. In the course of interaction, oxygen sites at the surface of the functionalized OTS film are reduced whereas Cr becomes oxidized. A redox reaction scheme is proposed for this interfacial reaction. Finally, it is concluded that the given study should be of importance for advanced plasma processing of polyolefins. KW - NEXAFS KW - OTS Self-Assembled Layers PY - 1999 DO - https://doi.org/10.1021/la981174l SN - 0743-7463 SN - 1520-5827 VL - 15 IS - 4 SP - 1161 EP - 1166 PB - American Chemical Society CY - Washington, DC AN - OPUS4-808 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Brzezinka, Klaus-Werner A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Ramm, M. A1 - Ata, M. T1 - Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy KW - Amorphous materials KW - Carbon KW - Plasma processing and deposition KW - Structural properties PY - 1999 SN - 0040-6090 VL - 354 SP - 106 EP - 110 PB - Elsevier CY - Amsterdam AN - OPUS4-891 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Giebler, Rainer A1 - Unger, Wolfgang A1 - Schulz, B. A1 - Reiche, J. A1 - Brehmer, L. A1 - Wühn, M. A1 - Wöll, Ch. A1 - Smith, A.P. A1 - Urquhart, S.G. T1 - Near-Edge X-ray Absorption Fine Structure Spectroscopy on Ordered Films of an Amphiphilic Derivate of 2,5-Diphenyl-1,3,4-Oxadiazole KW - NEXAFS KW - OMBD KW - X-ray Absorption Spectroscopy PY - 1999 SN - 0743-7463 SN - 1520-5827 VL - 15 IS - 4 SP - 1291 EP - 1298 PB - American Chemical Society CY - Washington, DC AN - OPUS4-828 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Web site for information on reference materials T2 - Proceedings of the Final Meeting CY - Wiener Neustadt, Austria DA - 2002-03-04 PY - 2002 SP - 1(?) EP - 3(?) AN - OPUS4-1472 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Retzko, Iris A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Time-of-flight-SIMS and XPS characterization of metal doped polymers N2 - Organic thin films with defined chemical structures and physical properties are required for various applications. Plasma polymerization is of technological interest, since the deposition of plasma polymers is possible on any material of any shape in the desired thickness. We report on the TOF-SIMS (TOF: time-of-flight) and XPS investigations of pulse plasma ‘poly(acetylene)’ and alkali metal doped pulse plasma ‘poly(acetylene)’ films. The combination of TOF-SIMS and XPS supplies detailed information on the surface chemistry of these films. Application of both methods provides the possibility for cross-checking certain results. Moreover the different sensitivities of the methods can be utilized. According to the TOF-SIMS and XPS data it can be concluded that the interaction of alkali metals with plasma ‘poly(acetylene)’ results in electrovalent bonds of the type Me?+–C?- between carbon and metal. Furthermore carbon–oxygen–metal interactions were observed. These interactions are of the type C=O?-cdots, three dots, centeredMe?+ and/or C–O?-–Me?+. KW - SIMS KW - TOF-SIMS KW - XPS KW - Plasma KW - Polymer KW - Poly(acetylene) PY - 2003 DO - https://doi.org/10.1016/S0169-4332(02)00769-9 SN - 0169-4332 SN - 1873-5584 VL - 203-204 SP - 575 EP - 579 PB - North-Holland CY - Amsterdam AN - OPUS4-2271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Reiners, Georg T1 - Quality assurance in nano-scale analysis N2 - Zusammenfassung Some methods of nano-scale analysis are on the threshold of being a standard method in industry and therefore quality assurance becomes important. But, at the present time, there are deficits in standardisation and validation of these methods. Therefore, we have organised method comparisons and interlaboratory comparisons to overcome these deficits. We report the results of an interlaboratory comparison in step-height determination by atomic force microscopy and the development of a reference material for laterally resolving methods of material analysis. PY - 2003 DO - https://doi.org/10.1007/s00339-002-1976-5 SN - 0947-8396 VL - 76 IS - 6 SP - 919 EP - 921 PB - Springer CY - Berlin AN - OPUS4-2289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Schulze, Rolf-Dieter T1 - NEXAFS - spectroscopy on plasma-polymerized films prepared from organic molecules (ethylene, allyl alcohol, styrene) KW - Plasma KW - Beschichtung KW - Organische Filme KW - Röntgenabsorptionsspektroskopie PY - 2004 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2003.pdf#page=297 SN - 0179-4159 SP - 297 EP - 299 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-3478 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Oran, Umut A1 - Ünveren, Ercan A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Poly-dimethyl-siloxane (PDMS) contamination of polystyrene (PS) oligomers samples: a comparison of time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS) results N2 - Pure and PDMS contaminated PS oligomers films were investigated both by time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS). The secondary ion spectra from the PDMS contaminated PS oligomers were almost completely related to PDMS. XPS revealed a PDMS contamination characterized by a silicon surface concentration of 6 at.%. Obviously siloxane contaminants existing on the surface of a silicon wafer may diffuse towards the PS oligomers outermost surface resulting in a rather high PDMS surface concentration of about 85%. Due to the known differences in the information depth and sensitivity of SSIMS and XPS very different detection limits are to be considered. In elimination of siloxane contaminants by ultrasonication in hexane was found to be an effective way. Another common organic cleaning procedure, which is ultrasonication in trichloroethylene (TCE), subsequently in isopropanol and finally in acetone was found to be ineffective for cleaning of PDMS contaminated silicon wafers. KW - PDMS KW - TOF-SIMS KW - Polystyrene KW - Segregation PY - 2004 DO - https://doi.org/10.1016/j.apsusc.2003.12.008 SN - 0169-4332 SN - 1873-5584 VL - 227 SP - 318 EP - 324 PB - North-Holland CY - Amsterdam AN - OPUS4-3479 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Hutton, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of highly resolved x-ray photoelectron Cr 2p spectra obtained with a Cr2O3 powder sample prepared with adhesive tape KW - High-resolution XPS KW - Cr2O3 powder KW - Multiplet splitting PY - 2004 SN - 0142-2421 SN - 1096-9918 VL - 36 SP - 92 EP - 95 PB - Wiley CY - Chichester AN - OPUS4-3427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie T2 - Workshop und Präsentation CY - Bergisch Gladbach, Deutschland DA - 2000-05-11 PY - 2000 CY - Dresden AN - OPUS4-999 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Charakterisierung von Siliziumoxidschichten auf Silizium mit ESCA - Ein Beitrag zur Präszisionsbestimmung der Avogadro-Konstanten T2 - EMASS 2000 CY - Berlin, Deutschland DA - 2000-11-10 PY - 2000 AN - OPUS4-1020 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Schichtanalyse mit der optischen Glimmentladungsspektroskopie (GD-OES) PY - 2000 SN - 1662-3096 SN - 0040-1498 SN - 0040-148X SN - 1023-0823 PB - Binkert Medien CY - Laufenburg AN - OPUS4-1055 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - 12. Jahreskolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" CY - Berlin, Deutschland DA - 2002-11-19 PY - 2002 AN - OPUS4-1997 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bücker, Michael A1 - Böcker, Wolfgang D. G. A1 - Reinsch, Stefan A1 - Unger, Brita ED - Acker, J. V. T1 - Wood Modification by Sol-Gel Derived Precursors T2 - 1st European Conference on Wood Modification ; 1st ECWM 2003 CY - Ghent, Belgium DA - 2003-04-03 KW - Silica-sol treatment KW - Wood-inorganic composite KW - Water repellency KW - Environmental stability PY - 2003 SN - 90-806565-2-6 SN - 1018-5593 SP - 255 EP - 259 PB - Univ., Laboratory of Wood Technology CY - Ghent AN - OPUS4-2521 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Teststreifen für den Nanokosmos KW - Laterale Auflösung KW - Nanometrologie KW - Nanotechnologie KW - Oberflächenanalytik KW - Zertifiziertes Referenzmaterial PY - 2004 UR - http://www.laborpraxis.de/ SN - 0344-1733 SN - 1610-8256 VL - 27 IS - Juli/Aug SP - 30 EP - 32, Sonderh. Nanotechnologie PB - Vogel CY - Würzburg AN - OPUS4-3808 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Geng, Sh. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Plasma functionalization and reorientation of macromolecules at polymer surfaces KW - Plasma KW - Polymer KW - Monolayer KW - Einschichtsystem KW - NEXAFS KW - Spektroskopie KW - Oberflächenanalyse PY - 1995 SN - 0257-8972 VL - 74-75 SP - 664 EP - 669 PB - Elsevier Science CY - Lausanne AN - OPUS4-627 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Wigan, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Barrier properties of plasma and chemically fluorinated polypropylene and polyethyleneterephthalate N2 - The functionalization, perfluorination or an coating of polypropylene (PP) and polyethyleneterephthalate (PET) surfaces in different plasma atmospheres and in an F[2] + N[2] gas mixture were investigated. The aim of this work was to form a barrier layer against solvent and fuel permeation. Typical test solvents were n-pentane, toluene, tetrachloroethylene and mixtures of n-pentane and methanol. The permeation was gravimetrically measured. The permeation of the solvent mixtures was analyzed by mass spectrometry and Fourier transform IR spectroscopy. The permeation of the solvent mixtures through the plasma-modified polymer samples was associated with increased absorption of polar solvent components in the polymer film. The thickness of the plasma-fluorinated PP surface layer was 10-100 nm and that of chemically fluorinated PP about 5000 nm. Nearly the same barrier efficiency was measured for both plasma- and chemically fluorinated samples. T2 - International Conference on Plasma Surface Engineering No. 4 CY - Garmisch-Partenkirchen, Germany DA - 1994-09-19 KW - Plasma KW - Fluor KW - Plasmapolymer KW - Sperrschicht KW - Permeation PY - 1995 UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=3158319 SN - 0257-8972 VL - 74-75 IS - 1-3 SP - 910 EP - 918 PB - Elsevier Science CY - Lausanne AN - OPUS4-628 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - Summer Workshop "Functionalized Surfaces: Applications and Analytical Tools" CY - Zurich, Switzerland DA - 1999-07-05 KW - ESCA KW - NEXAFS PY - 1999 SP - F1 EP - F12 AN - OPUS4-797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Giebler, Rainer A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Reactions and Intermediates at the Metal-Polymer Interface as Observed by XPS and NEXAFS Spectroscopy KW - XPS KW - NEXAFS KW - Interfacial polymer-metal redox reactions KW - Chromium-polymer intermediates KW - Near edge X-ray absorption fine structure spectroscopy KW - Adhesion KW - Polymer-metal bonds KW - Polymer-aluminium bonds KW - Polymer-copper bonds PY - 1999 SN - 0021-8464 SN - 1545-5823 VL - 71 SP - 297 EP - 321 PB - Gordon & Breach CY - New York, NY AN - OPUS4-798 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Güttler, J. T1 - Neues vom Urkilogramm KW - Oberflächenanalytik PY - 1999 SN - 0341-5163 SN - 1521-3854 VL - 47 IS - 7 SP - 784 EP - 786 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-791 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Böcker, Wolfgang D. G. A1 - Bücker, Michael A1 - Reinsch, Stefan A1 - Unger, Brita A1 - Britz, Roswitha T1 - Mineralisiertes Holz - Verbundwerkstoff mit verbesserten Eigenschaften PY - 2001 CY - München AN - OPUS4-1197 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas T1 - XPS/ESCA - Ringversuchsergebnisse T2 - Seminar Oberflächenanalytik "Technische Aspekte der Akkreditierung nach ISO/IEC 17025" CY - Berlin, Deutschland DA - 2003-01-24 PY - 2003 SP - 1 EP - 3 AN - OPUS4-2120 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Güttler, B. T1 - Uncertainty in measurement of overlayer thickness of thermally oxidized silicon using x-ray photoelectron spectroscopy N2 - Overlayers of SiO2 (nominally 4, 6 and 8 nm thick) on silicon, prepared by thermal oxidation, were investigated using x-ray photoelectron spectroscopy (XPS). The thickness of these overlayers was obtained from a measurement of the photoelectron intensities originating from the substrate and the oxide overlayer by applying an appropriate quantitative model. The uncertainty budget of that thickness measurement method is given. The relative combined standard uncertainty of the method was found to be 15%. The effective attenuation lengths or the corresponding electron inelastic mean free paths are of considerable importance for both the estimated values of overlayer thickness and combined standard uncertainties. The XPS results were compared with ellipsometry data. KW - XPS KW - ESCA KW - Uncertainty KW - Overlayer KW - SiO2 PY - 2000 DO - https://doi.org/10.1002/1096-9918(200012)29:12<891::AID-SIA943>3.0.CO;2-A SN - 0142-2421 SN - 1096-9918 IS - 29 SP - 891 EP - 894 PB - Wiley CY - Chichester AN - OPUS4-1075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - The Application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - Materials Week 2000 ; International Congress on Advanced Materials, Their Processes and Applications 2000 CY - Munich, Germany DA - 2000-09-25 PY - 2000 SN - 3-88355-296-8 CY - München AN - OPUS4-1106 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bücker, Michael A1 - Böcker, Wolfgang D. G. A1 - Reinsch, Stefan A1 - Unger, Brita ED - Wielage, B. ED - Leonhardt, G. T1 - Entwicklung umweltverträglicher Holzverbundwerkstoffe mit verbesserter biologischer und Feuchtebeständigkeit T2 - Tagung "Verbundwerkstoffe und Werkstoffverbunde" CY - Chemnitz, Deutschland DA - 2001-09-05 PY - 2001 SN - 3-527-30319-7 SP - 463 EP - 467 PB - Wiley-VCH CY - Weinheim AN - OPUS4-1160 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Patscheider, J. T1 - Quantitative surface chemical analysis of stainless steel 1.4301 using Surface Science Instruments XPS spectrometers: report on an interlaboratory comparison N2 - Results of an interlaboratory comparison of XPS data obtained with stainless steel are presented. Only one photoelectron spectrometer model was used. The stainless-steel sample surfaces were analysed in different states by XPS: as received, after sputtering to I(C 1s)/I(Fe 2p3/2) 0.025 and after removing a chromium-enriched oxide layer following a certain protocol. The Fe, Cr and Ni elemental concentrations were evaluated from the respective XPS data submitted by the participants of the interlaboratory test experiment. Total means, repeat standard deviations (sr) and reproducibility standard deviations (sR) are presented. The best reproducibility standard deviations were obtained for the XPS analysis after removal of a chromium-enriched oxide layer and quantification of the XPS intensities without taking the contamination elements of carbon and oxygen into account. The absolute reproducibility standard deviation of the elemental concentrations in that case is as small as 1.1-1.5 at.%. This gives 2%, 6% and 16% for the relative reproducibility standard deviation of the concentrations of iron, chromium and nickel, respectively. The total means of the iron, chromium and nickel concentrations finally obtained agree within 2sR with bulk values determined by wavelength-dispersive x-ray fluorescence spectroscopy. Comparison to an earlier interlaboratory test experiment shows that using only one model of photoelectron spectrometer reduces the reproducibility standard deviations efficiently. Copyright © 2002 John Wiley & Sons, Ltd. KW - XPS KW - ESCA KW - Quantitative surface chemical analysis KW - Stainless steel KW - Interlaboratory comparison PY - 2002 DO - https://doi.org/10.1002/sia.1229 SN - 0142-2421 SN - 1096-9918 VL - 33 IS - 5 SP - 426 EP - 432 PB - Wiley CY - Chichester AN - OPUS4-1409 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Böcker, Wolfgang D. G. A1 - Bücker, Michael A1 - Reinsch, Stefan A1 - Unger, Brita T1 - Holzverbundwerkstoffe mit verbesserten Eigenschaften N2 - Die offenporige Struktur des Holzes und dessen chemische Zusammensetzung bieten sich an, über Tränkverfahren geeignete Precursoren so an den inneren Oberflächen des Holzes zu fixieren, dass bei anschließender thermischer Behandlung ein umweltfreundlicher anorganisch-organischer Verbundwerkstoff entsteht. Aus der Literatur sind hierzu verschiedene Ansätze bekannt. - Ziel der vorliegenden Arbeit sind Verbesserungen der biologischen Beständigkeit, der Feuchtebeständigkeit unter Beibehaltung bzw. leichter Verbesserung der mechanischen Eigenschaften des Holzes. Dies wird durch eine chemische Verbindung (Haftung) zwischen den verbundbildenden Phasen Holz und Precursor und eventuell zusätzlichen Einbau von funktionellen organischen Gruppen realisiert. Als Precursoren dienen über den Sol-Gel Weg hergestellte Kieselsole, die nach vollständiger thermischer Umsetzung zu rein anorganischen Phasen (SiO2) führen. Die Sol-Gel Synthese konnte so optimiert werden, dass durch die Behandlung eine homogene Beschichtung aller Oberflächen erreicht werden kann. T2 - Integrierter Umweltschutz im Bereich der Holzwirtschaft CY - Göttingen, Deutschland DA - 2002-01-22 PY - 2002 SP - 100 EP - 102 PB - DGfH CY - München AN - OPUS4-1366 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Koenders, L. A1 - Wilkening, G. T1 - Accuracy of step height determination by Atomic Force Microscopy - results of an inter-laboratory comparison T2 - 3rd International Conference European Society for Precision Engineering and Nanotechnology (euspen) CY - Eindhoven, The Netherlands DA - 2002-05-26 PY - 2002 SP - 773 EP - 776 AN - OPUS4-1415 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Boese, O. A1 - Kemnitz, E. T1 - y-Al2O3 by Au 4f7/2-referenced XPS and XAES N2 - Powder x-ray diffraction (XRD) defined -Al2O3 has been investigated by x-ray photoelectron spectroscopy (XPS) and x-ray excited Auger electron spectroscopy (XAES). The Au 4f7/2 orbital is used for static charge referencing. This feature originates from well-defined and chemically inert 20 nm highly dispersed gold particles deposited on the sample surface. The particles, with a narrow particle size distribution, were obtained from a highly purified colloidal solution (sodium concentration below 1 mg/l). This procedure allows a determination of gold-referenced XPS and XAES data sets. ©2001 American Vacuum Society. KW - Au 4f referenced XPS data KW - Aluminium KW - Oxide PY - 2001 UR - http://scitation.aip.org/vsearch/servlet/VerityServlet?KEY=SSSPEN&ONLINE=YES&smode=strresults&sort=chron&maxdisp=25&threshold=0&possible1zone=article&possible4=lippitz&possible4zone=author&bool4=and&fromyear=2001&OUTLOG=NO&viewabs=SSSPEN&key=DISPLAY&docID DO - https://doi.org/10.1116/11.20020305 SN - 1055-5269 SN - 1520-8575 VL - 8 IS - 1-4 SP - 214 EP - 219 PB - AIP CY - Woodbury, NY AN - OPUS4-1910 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Ghode, Archana A1 - Geng, Sh. A1 - Kühn, Gerhard T1 - Plasma-based introduction of monosort functional groups of different type and density onto polymer surfaces. Part 1: Behaviour of polymers exposed to oxygen plasma N2 - Several approaches were investigated to produce monosort functionalized polymer surfaces with a high density and homogeneity of functional groups: (i) Plasma oxidation followed by wet-chemical reduction, (ii) formation of radicals and grafting on of functional group carrying molecules, (iii) plasma bromination followed by (iv) Williamson or Gabriel-like synthesis of spacer molecules, and (v) a pulsed plasma polymerization of functional groups bearing monomers or (vi) their copolymerisation with other comonomers. The formation of hydroxyl (OH), primary amino (NH2), and carboxyl (COOH) groups was studied in detail. The oxygen plasma treatment (i) in a low-pressure non-isothermal glow discharge results in the formation of a wide variety of O functional groups, polymer degradation and crosslinking. Low power densities and short exposure times (0.1 to 2 s) are required to functionalize a surface while preserving the original polymer structure. Carbonate, ester, and aromatic groups are rapidly degraded by an oxygen plasma treatment leading to scissions of polymer backbones and loss in molecular weight. Also the formation of macrocycles and C=C bonds was observed in a region of around 4 nm in depth. The investigated polymers could be classified by their degradation behaviour on exposure to the oxygen plasma.___TAGSTART___BR___TAGEND___ In order to maximize the process selectivity for OH groups, the variety of oxygen functionalities formed by the oxygen plasma was wet-chemically reduced by diborane, vitridetrade (Na complex), and LiAlH4. Typical yields were 9 to 14 OH groups per 100 carbon atoms.___TAGSTART___BR___TAGEND___ Plasma bromination (iii) (40 Br per 100 C atoms) of polymers, followed by grafting of spacer molecules (iv), has been proved to be a highly selective reaction.___TAGSTART___BR___TAGEND___ Another way to produce high densities of monosort functionalities was the pulsed plasma polymerization of functional group bearing monomers such as allylamine, allylalcohol or acrylic acid (v). The retention of chemical structure and functional groups during plasma polymerization was achieved by using low power densities and the pulsed plasma technique. The maximum yields were 30 OH, 18 NH2, and 24 COOH groups per 100 C atoms. To vary the density of functional groups a chemical copolymerization with ''chain-extending'' comonomers such as butadiene and ethylene was initiated in the pulsed plasma (vi). Additionally, the often-observed post-plasma oxidations of such layers initiated by reaction of trapped radicals with oxygen from the air were successfully suppressed by using NO gas as radical quencher. PY - 2003 DO - https://doi.org/10.1163/156855403765826865 VL - 10 IS - 2-3 SP - 139 EP - 171 PB - North-Holland CY - New York, NY AN - OPUS4-2705 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Mix, Renate A1 - Kühn, Gerhard A1 - Retzko, Iris A1 - Schönhals, Andreas A1 - Unger, Wolfgang T1 - Plasma-based introduction of monosort functional groups of different type and density onto polymer surfaces. Part 2: Pulsed plasma polymerization N2 - This new functionalization method consists of the deposition of very thin plasma polymer layers (20 to 100 nm) of functional group bearing monomers in pulsed plasma. With allylalcohol, a maximum of 30 OH groups per 100 C atoms was measured with a selectivity of about 90% and a significant stability at long-time exposure to air. Allylamine was used to produce primary amino groups, with a maximum of 18 NH2 groups per 100 C atoms. Side reactions were observed during the storage in air, such as oxidation of the amino groups. Carboxylic groups could be produced using acrylic acid with a maximum concentration of 24 COOH groups per 100 C atoms. The most prominent side reaction was the decarbonylation/ decarboxylation of the acid group during plasma deposition.___TAGSTART___BR___TAGEND___ The variation of the density of functional groups using the pulsed-plasma polymerization of functional-group-bearing monomers was possible by the chemically-initiated radical copolymerization with either a chain-extending monomer, such as ethylene, or a cross linker, such as butadiene, in plasma. The density of functional groups could be adjusted continuously (0 to 30 OH, 0 to 18 NH2 and 0 to 24 COOH groups per 100 C atoms).___TAGSTART___BR___TAGEND___ The successful application of these densely functionalized polymer surfaces for producing biocompatible surfaces and for use in metal–polymer composites is proposed. KW - Pulsed plasma polymerization KW - Plasma-initiated copolymerization KW - Charcterization of homo- and copolymers PY - 2003 DO - https://doi.org/10.1163/156855403765826874 VL - 10 IS - 2-3 SP - 173 EP - 223 PB - North-Holland CY - New York, NY AN - OPUS4-2706 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - 12. Jahreskolloquiumm "Analyse von Feststoffen unterchiedlicher Materialien aus Industrie und Umwelt" der Interessengemeinschaft Atomspektroskopie Berlin (IGAS) CY - Berlin, Germany DA - 2002-11-19 PY - 2002 AN - OPUS4-4388 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -